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Digital Integrated Circuits © Prentice Hall 1995Introduction
MOS Transistor
Digital Integrated Circuits © Prentice Hall 1995Introduction
MOS Structure
( Two Terminal MOS Structure )
Digital Integrated Circuits © Prentice Hall 1995Introduction
Metal Oxide(Sio2) Semiconductor
MOS Structure
( Energy band diagram for Metal, Oxide(Sio2) and
Semiconductor )
Digital Integrated Circuits © Prentice Hall 1995Introduction
MOS Structure
Digital Integrated Circuits © Prentice Hall 1995Introduction
( Energy band diagram of Combined MOS system )
E0
E0
E0 E0
MOS Structure
Digital Integrated Circuits © Prentice Hall 1995Introduction
MOS System under External Bias
Digital Integrated Circuits © Prentice Hall 1995Introduction
MOS System under External Bias
Digital Integrated Circuits © Prentice Hall 1995Introduction
MOS System under External Bias
( N MOS operating in surface inversion region )
Digital Integrated Circuits © Prentice Hall 1995Introduction
Structure and Operation of MOSFET
( N channel Enhancement MOSFET )
Digital Integrated Circuits © Prentice Hall 1995Introduction
Structure and Operation of MOSFET
Digital Integrated Circuits © Prentice Hall 1995Introduction
Structure and Operation of MOSFET
( Formation of Depletion Region in N type
Enhancement type MOSFET )
Digital Integrated Circuits © Prentice Hall 1995Introduction
Structure and Operation of MOSFET
Digital Integrated Circuits © Prentice Hall 1995Introduction
Threshold voltage
( N channel depletion MOSFET )
Digital Integrated Circuits © Prentice Hall 1995Introduction
Operation of MOSFET Transistor
a) Linear region
Digital Integrated Circuits © Prentice Hall 1995Introduction
Operation of MOSFET Transistor
b) Saturation region
Digital Integrated Circuits © Prentice Hall 1995Introduction
Operation of MOSFET Transistor
c) Beyond Saturation region
Digital Integrated Circuits © Prentice Hall 1995Introduction
Characteristics of MOSFET
a) Gradual Channel Approximation
Digital Integrated Circuits © Prentice Hall 1995Introduction
Characteristics of MOSFET
a) Gradual Channel Approximation
( V- I characteristics of nMOS Transistor )
Digital Integrated Circuits © Prentice Hall 1995Introduction
Characteristics of MOSFET
Digital Integrated Circuits © Prentice Hall 1995Introduction
Characteristics of MOSFET
Digital Integrated Circuits © Prentice Hall 1995Introduction
Characteristics of MOSFET
Digital Integrated Circuits © Prentice Hall 1995Introduction
Characteristics of MOSFET
Digital Integrated Circuits © Prentice Hall 1995Introduction
Digital Integrated Circuits © Prentice Hall 1995Introduction
Digital Integrated Circuits © Prentice Hall 1995Introduction
Digital Integrated Circuits © Prentice Hall 1995Introduction
Digital Integrated Circuits © Prentice Hall 1995Introduction
Digital Integrated Circuits © Prentice Hall 1995Introduction
Digital Integrated Circuits © Prentice Hall 1995Introduction
Depletion Region
hole diffusion
electron diffusion
p n
hole drift
electron drift
Charge
Density
Distance
x+
-
Electrical
xField
x
Potential
V


W2-W1

(a) Current flow.
(b) Charge density.
(c) Electric field.
(d) Electrostatic
potential.
Digital Integrated Circuits © Prentice Hall 1995Introduction
The Diode
n
p
p
n
B A
SiO2
Al
A
B
Al
A
B
Cross-section of pn-junction in an IC process
One-dimensional
representation diode symbol
Digital Integrated Circuits © Prentice Hall 1995Introduction
Diode Current
Digital Integrated Circuits © Prentice Hall 1995Introduction
Forward Bias
x
pn0
np0
-W1 W2
0
pn(W2)
n-regionp-region
Lp
diffusion
Digital Integrated Circuits © Prentice Hall 1995Introduction
Reverse Bias
x
pn0
np0
-W1 W2
0
n-regionp-region
diffusion
Digital Integrated Circuits © Prentice Hall 1995Introduction
SPICE Parameters
Digital Integrated Circuits © Prentice Hall 1995Introduction
Digital Integrated Circuits © Prentice Hall 1995Introduction
nMOS Transistor - Structure
Digital Integrated Circuits © Prentice Hall 1995Introduction
The MOS Transistor
n+n+
p-substrate
Field-Oxyde
(SiO2)
p+ stopper
Polysilicon
Gate Oxyde
DrainSource
Gate
Bulk Contact
CROSS-SECTION of NMOS Transistor
Digital Integrated Circuits © Prentice Hall 1995Introduction
Carriers and Current
 Carriers always flow from the Source to Drain
 NMOS: Free electrons move from Source to Drain.
 Current direction is from Drain to Source.
• PMOS: Free holes move from Source to Drain.
 Current direction is from Source to Drain.
Digital Integrated Circuits © Prentice Hall 1995Introduction
IGFET
 The dimension of SiO2 layer is about 0.02 to 0.1
micron.
 Gate is isolated thus Insulated-Gate FET
 Due to insulation the current flowing through the gate
terminal is extremely small of the order of 10^-15 A.
 Drain is always kept as more positive than the
source.
 The current flows from the Drain to Source
 P-n junctions are kept under the reverse bias
conditions
 Typically the Length of the device is from 1 to 10
micron.
Digital Integrated Circuits © Prentice Hall 1995Introduction
MOS Transistor
structure
 Polysilicon –Heavily doped noncrystalline silicon.
 Polysilicon allows the dimensions of the transistor to
be realized accurately.
 Gate Oxide – Silicon dioxide.
 Thickness of gate oxide – 7 to 20nm.
 No d.c. through gate.
 Normally, p substrate is connected to 0V in digital
circuits and to negative voltage in analog circuits.
Digital Integrated Circuits © Prentice Hall 1995Introduction
Symmetry
The transistor is symmetric: The Drain
(which is equivalent to a BJT’s
Collector) and the Source (which is
equivalent to a BJT’s Emitter) are fully
symmetric and therefore
interchangeable
Digital Integrated Circuits © Prentice Hall 1995Introduction
All MOS p-n Junctions
Unlike a BJT transistor, in which one of
the p-n junctions is typically forwardly
biased, and the other reversely biased,
in a MOSFET all p-n junctions must
always be kept reversely biased!
Digital Integrated Circuits © Prentice Hall 1995Introduction
The MOSFET Channel
 Under certain conditions, a thin channel can
be formed right underneath the Silicon-
Dioxide insulating layer, electrically
connecting the Drain to the Source. The
depth of the channel (and hence its
resistance) can be controlled by the Gate’s
voltage. The length of the channel (shown in
the figures above as L) and the channel’s
width W, are important design parameters.
Digital Integrated Circuits © Prentice Hall 1995Introduction
REGION OF OPERATION
CASE-1 (No Gate Voltage)
 Two diodes back to back exist in series.
 One diode is formed by the pn junction
between the n+ drain region and the p-type
substrate
 Second is formed by the pn junction between
the n+ source region and the p-type substrate
 These diodes prevent any flow of the current.
 There exist a very high resistance.
Digital Integrated Circuits © Prentice Hall 1995Introduction
Digital Integrated Circuits © Prentice Hall 1995Introduction
Digital Integrated Circuits © Prentice Hall 1995Introduction
REGION OF OPERATION
Creating a channel
 Apply some positive voltage on the gate
terminal.
 This positive voltage pushes the holes
downward in the substrate region.
 This causes the electrons to accumulate
under the gate terminal.
 At the same time the positive voltage on the
gate also attracts the electrons from the n+
region to accumulate under the gate terminal.
Digital Integrated Circuits © Prentice Hall 1995Introduction
Digital Integrated Circuits © Prentice Hall 1995Introduction
Digital Integrated Circuits © Prentice Hall 1995Introduction
Digital Integrated Circuits © Prentice Hall 1995Introduction
REGION OF OPERATION
Creating a channel
 When sufficient electrons are accumulated under the
gate an n-region is created, connecting the drain and
the source
 This causes the current to flow from the drain to
source
 The channel is formed by inverting the substrate
surface from p to n, thus induced channel is also
called as the inversion layer.
 The voltage between gate and source called vgs at
which there are sufficient electron under the gate to
form a conducting channel is called threshold voltage
Vth.
Digital Integrated Circuits © Prentice Hall 1995Introduction
MOS Channel Formation
Digital Integrated Circuits © Prentice Hall 1995Introduction
Current-Voltage Relations
n+
n+
p-substrate
D
S
G
B
VGS
xL
V(x)
+–
VDS
ID
MOS transistor and its bias conditions
Digital Integrated Circuits © Prentice Hall 1995Introduction
MOS Transistor Current direction
 The source terminal of an n-channel(p-channel)
transistor is defined as whichever of the two terminals
has a lower(higher) voltage.
 When a transistor is turned ON, current flows from
the drain to source in an n-channel device and from
source to drain in a p-channel transistor.
 In both cases, the actual carriers travel from the
source to drain.
 The current directions are different because n-
channel carriers are negative, whereas p-channel
carriers are positive.
Digital Integrated Circuits © Prentice Hall 1995Introduction
Threshold Voltage: Concept
n+n+
p-substrate
DS
G
B
VGS
+
-
Depletion
Region
n-channel
Digital Integrated Circuits © Prentice Hall 1995Introduction
MOS I/V
For a NMOS, a necessary
condition for the channel to exist is:
THGS VV 
Digital Integrated Circuits © Prentice Hall 1995Introduction
REGION OF OPERATION
Applying small Vds
 Now we applying some small voltage
between source and drain say 0.3V.
 The voltage Vds causes a current to flow from
drain to gate.
 Now as we increase the gate voltage, more
current will flow.
 Increasing the gate voltage above the
threshold voltage enhances the channel,
hence this mode is called as enhancement
mode operation.
Digital Integrated Circuits © Prentice Hall 1995Introduction
MOSFET Current-Voltage Relationships
•The DC gate current is always zero: IG = 0
•Therefore, when a channel is created, the drain
current equals the source current: ID =IS
Digital Integrated Circuits © Prentice Hall 1995Introduction
MOS Transistor - Symbols
pMOS Transistor nMOS Transistor
Digital Integrated Circuits © Prentice Hall 1995Introduction
Operation – nMOS Transistor
 Accumulation Mode - If Vgs < 0, then an electric field
is established across the substrate.
 Depletion Mode -If 0<Vgs< Vtn, the region under gate
will be depleted of charges.
 Inversion Mode – If Vgs > Vtn, the region below the
gate will be inverted.
Digital Integrated Circuits © Prentice Hall 1995Introduction
Operation – nMOS Transistor
Digital Integrated Circuits © Prentice Hall 1995Introduction
V =0
Operation – nMOS Transistor
Digital Integrated Circuits © Prentice Hall 1995Introduction
Operation – nMOS Transistor
Digital Integrated Circuits © Prentice Hall 1995Introduction
Operation – nMOS Transistor
Digital Integrated Circuits © Prentice Hall 1995Introduction
Operation – nMOS Transistor
Digital Integrated Circuits © Prentice Hall 1995Introduction
Operation – nMOS Transistor

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mos transistor

  • 1. Digital Integrated Circuits © Prentice Hall 1995Introduction MOS Transistor
  • 2. Digital Integrated Circuits © Prentice Hall 1995Introduction MOS Structure ( Two Terminal MOS Structure )
  • 3. Digital Integrated Circuits © Prentice Hall 1995Introduction Metal Oxide(Sio2) Semiconductor MOS Structure ( Energy band diagram for Metal, Oxide(Sio2) and Semiconductor )
  • 4. Digital Integrated Circuits © Prentice Hall 1995Introduction MOS Structure
  • 5. Digital Integrated Circuits © Prentice Hall 1995Introduction ( Energy band diagram of Combined MOS system ) E0 E0 E0 E0 MOS Structure
  • 6. Digital Integrated Circuits © Prentice Hall 1995Introduction MOS System under External Bias
  • 7. Digital Integrated Circuits © Prentice Hall 1995Introduction MOS System under External Bias
  • 8. Digital Integrated Circuits © Prentice Hall 1995Introduction MOS System under External Bias ( N MOS operating in surface inversion region )
  • 9. Digital Integrated Circuits © Prentice Hall 1995Introduction Structure and Operation of MOSFET ( N channel Enhancement MOSFET )
  • 10. Digital Integrated Circuits © Prentice Hall 1995Introduction Structure and Operation of MOSFET
  • 11. Digital Integrated Circuits © Prentice Hall 1995Introduction Structure and Operation of MOSFET ( Formation of Depletion Region in N type Enhancement type MOSFET )
  • 12. Digital Integrated Circuits © Prentice Hall 1995Introduction Structure and Operation of MOSFET
  • 13. Digital Integrated Circuits © Prentice Hall 1995Introduction Threshold voltage ( N channel depletion MOSFET )
  • 14. Digital Integrated Circuits © Prentice Hall 1995Introduction Operation of MOSFET Transistor a) Linear region
  • 15. Digital Integrated Circuits © Prentice Hall 1995Introduction Operation of MOSFET Transistor b) Saturation region
  • 16. Digital Integrated Circuits © Prentice Hall 1995Introduction Operation of MOSFET Transistor c) Beyond Saturation region
  • 17. Digital Integrated Circuits © Prentice Hall 1995Introduction Characteristics of MOSFET a) Gradual Channel Approximation
  • 18. Digital Integrated Circuits © Prentice Hall 1995Introduction Characteristics of MOSFET a) Gradual Channel Approximation ( V- I characteristics of nMOS Transistor )
  • 19. Digital Integrated Circuits © Prentice Hall 1995Introduction Characteristics of MOSFET
  • 20. Digital Integrated Circuits © Prentice Hall 1995Introduction Characteristics of MOSFET
  • 21. Digital Integrated Circuits © Prentice Hall 1995Introduction Characteristics of MOSFET
  • 22. Digital Integrated Circuits © Prentice Hall 1995Introduction Characteristics of MOSFET
  • 23. Digital Integrated Circuits © Prentice Hall 1995Introduction
  • 24. Digital Integrated Circuits © Prentice Hall 1995Introduction
  • 25. Digital Integrated Circuits © Prentice Hall 1995Introduction
  • 26. Digital Integrated Circuits © Prentice Hall 1995Introduction
  • 27. Digital Integrated Circuits © Prentice Hall 1995Introduction
  • 28. Digital Integrated Circuits © Prentice Hall 1995Introduction
  • 29. Digital Integrated Circuits © Prentice Hall 1995Introduction Depletion Region hole diffusion electron diffusion p n hole drift electron drift Charge Density Distance x+ - Electrical xField x Potential V   W2-W1  (a) Current flow. (b) Charge density. (c) Electric field. (d) Electrostatic potential.
  • 30. Digital Integrated Circuits © Prentice Hall 1995Introduction The Diode n p p n B A SiO2 Al A B Al A B Cross-section of pn-junction in an IC process One-dimensional representation diode symbol
  • 31. Digital Integrated Circuits © Prentice Hall 1995Introduction Diode Current
  • 32. Digital Integrated Circuits © Prentice Hall 1995Introduction Forward Bias x pn0 np0 -W1 W2 0 pn(W2) n-regionp-region Lp diffusion
  • 33. Digital Integrated Circuits © Prentice Hall 1995Introduction Reverse Bias x pn0 np0 -W1 W2 0 n-regionp-region diffusion
  • 34. Digital Integrated Circuits © Prentice Hall 1995Introduction SPICE Parameters
  • 35. Digital Integrated Circuits © Prentice Hall 1995Introduction
  • 36. Digital Integrated Circuits © Prentice Hall 1995Introduction nMOS Transistor - Structure
  • 37. Digital Integrated Circuits © Prentice Hall 1995Introduction The MOS Transistor n+n+ p-substrate Field-Oxyde (SiO2) p+ stopper Polysilicon Gate Oxyde DrainSource Gate Bulk Contact CROSS-SECTION of NMOS Transistor
  • 38. Digital Integrated Circuits © Prentice Hall 1995Introduction Carriers and Current  Carriers always flow from the Source to Drain  NMOS: Free electrons move from Source to Drain.  Current direction is from Drain to Source. • PMOS: Free holes move from Source to Drain.  Current direction is from Source to Drain.
  • 39. Digital Integrated Circuits © Prentice Hall 1995Introduction IGFET  The dimension of SiO2 layer is about 0.02 to 0.1 micron.  Gate is isolated thus Insulated-Gate FET  Due to insulation the current flowing through the gate terminal is extremely small of the order of 10^-15 A.  Drain is always kept as more positive than the source.  The current flows from the Drain to Source  P-n junctions are kept under the reverse bias conditions  Typically the Length of the device is from 1 to 10 micron.
  • 40. Digital Integrated Circuits © Prentice Hall 1995Introduction MOS Transistor structure  Polysilicon –Heavily doped noncrystalline silicon.  Polysilicon allows the dimensions of the transistor to be realized accurately.  Gate Oxide – Silicon dioxide.  Thickness of gate oxide – 7 to 20nm.  No d.c. through gate.  Normally, p substrate is connected to 0V in digital circuits and to negative voltage in analog circuits.
  • 41. Digital Integrated Circuits © Prentice Hall 1995Introduction Symmetry The transistor is symmetric: The Drain (which is equivalent to a BJT’s Collector) and the Source (which is equivalent to a BJT’s Emitter) are fully symmetric and therefore interchangeable
  • 42. Digital Integrated Circuits © Prentice Hall 1995Introduction All MOS p-n Junctions Unlike a BJT transistor, in which one of the p-n junctions is typically forwardly biased, and the other reversely biased, in a MOSFET all p-n junctions must always be kept reversely biased!
  • 43. Digital Integrated Circuits © Prentice Hall 1995Introduction The MOSFET Channel  Under certain conditions, a thin channel can be formed right underneath the Silicon- Dioxide insulating layer, electrically connecting the Drain to the Source. The depth of the channel (and hence its resistance) can be controlled by the Gate’s voltage. The length of the channel (shown in the figures above as L) and the channel’s width W, are important design parameters.
  • 44. Digital Integrated Circuits © Prentice Hall 1995Introduction REGION OF OPERATION CASE-1 (No Gate Voltage)  Two diodes back to back exist in series.  One diode is formed by the pn junction between the n+ drain region and the p-type substrate  Second is formed by the pn junction between the n+ source region and the p-type substrate  These diodes prevent any flow of the current.  There exist a very high resistance.
  • 45. Digital Integrated Circuits © Prentice Hall 1995Introduction
  • 46. Digital Integrated Circuits © Prentice Hall 1995Introduction
  • 47. Digital Integrated Circuits © Prentice Hall 1995Introduction REGION OF OPERATION Creating a channel  Apply some positive voltage on the gate terminal.  This positive voltage pushes the holes downward in the substrate region.  This causes the electrons to accumulate under the gate terminal.  At the same time the positive voltage on the gate also attracts the electrons from the n+ region to accumulate under the gate terminal.
  • 48. Digital Integrated Circuits © Prentice Hall 1995Introduction
  • 49. Digital Integrated Circuits © Prentice Hall 1995Introduction
  • 50. Digital Integrated Circuits © Prentice Hall 1995Introduction
  • 51. Digital Integrated Circuits © Prentice Hall 1995Introduction REGION OF OPERATION Creating a channel  When sufficient electrons are accumulated under the gate an n-region is created, connecting the drain and the source  This causes the current to flow from the drain to source  The channel is formed by inverting the substrate surface from p to n, thus induced channel is also called as the inversion layer.  The voltage between gate and source called vgs at which there are sufficient electron under the gate to form a conducting channel is called threshold voltage Vth.
  • 52. Digital Integrated Circuits © Prentice Hall 1995Introduction MOS Channel Formation
  • 53. Digital Integrated Circuits © Prentice Hall 1995Introduction Current-Voltage Relations n+ n+ p-substrate D S G B VGS xL V(x) +– VDS ID MOS transistor and its bias conditions
  • 54. Digital Integrated Circuits © Prentice Hall 1995Introduction MOS Transistor Current direction  The source terminal of an n-channel(p-channel) transistor is defined as whichever of the two terminals has a lower(higher) voltage.  When a transistor is turned ON, current flows from the drain to source in an n-channel device and from source to drain in a p-channel transistor.  In both cases, the actual carriers travel from the source to drain.  The current directions are different because n- channel carriers are negative, whereas p-channel carriers are positive.
  • 55. Digital Integrated Circuits © Prentice Hall 1995Introduction Threshold Voltage: Concept n+n+ p-substrate DS G B VGS + - Depletion Region n-channel
  • 56. Digital Integrated Circuits © Prentice Hall 1995Introduction MOS I/V For a NMOS, a necessary condition for the channel to exist is: THGS VV 
  • 57. Digital Integrated Circuits © Prentice Hall 1995Introduction REGION OF OPERATION Applying small Vds  Now we applying some small voltage between source and drain say 0.3V.  The voltage Vds causes a current to flow from drain to gate.  Now as we increase the gate voltage, more current will flow.  Increasing the gate voltage above the threshold voltage enhances the channel, hence this mode is called as enhancement mode operation.
  • 58. Digital Integrated Circuits © Prentice Hall 1995Introduction MOSFET Current-Voltage Relationships •The DC gate current is always zero: IG = 0 •Therefore, when a channel is created, the drain current equals the source current: ID =IS
  • 59. Digital Integrated Circuits © Prentice Hall 1995Introduction MOS Transistor - Symbols pMOS Transistor nMOS Transistor
  • 60. Digital Integrated Circuits © Prentice Hall 1995Introduction Operation – nMOS Transistor  Accumulation Mode - If Vgs < 0, then an electric field is established across the substrate.  Depletion Mode -If 0<Vgs< Vtn, the region under gate will be depleted of charges.  Inversion Mode – If Vgs > Vtn, the region below the gate will be inverted.
  • 61. Digital Integrated Circuits © Prentice Hall 1995Introduction Operation – nMOS Transistor
  • 62. Digital Integrated Circuits © Prentice Hall 1995Introduction V =0 Operation – nMOS Transistor
  • 63. Digital Integrated Circuits © Prentice Hall 1995Introduction Operation – nMOS Transistor
  • 64. Digital Integrated Circuits © Prentice Hall 1995Introduction Operation – nMOS Transistor
  • 65. Digital Integrated Circuits © Prentice Hall 1995Introduction Operation – nMOS Transistor
  • 66. Digital Integrated Circuits © Prentice Hall 1995Introduction Operation – nMOS Transistor