1. The document discusses short channel effects in MOSFETs that occur when the channel length becomes small compared to other dimensions. This includes effects like hot carrier injection, dielectric breakdown, and threshold voltage shift. 2. Short channel effects arise due to improper scaling of the source potential and non-scalable properties like junction depth and built-in potentials. They can degrade device characteristics such as output impedance, mobility, and threshold voltage. 3. Specific short channel effects discussed include hot electron injection, dielectric breakdown, drain-induced barrier lowering, mobility degradation, and threshold voltage variation with channel length. Models for threshold voltage shift due to short channel effects are presented.