This document discusses combinational logic design and CMOS transistor implementation. It covers topics such as logic analysis techniques like loop and cut-set analysis, primitive logic gates, transistor-level implementations, and layout considerations. Primitive gates like NAND and NOR are shown along with complex functions. Optimization techniques for transistor count and layout area are presented, including Euler path analysis and ensuring a continuous diffusion path. Design rules for lambda-based layout and considerations for transistor sizing are also outlined.
VLSI power estimation is vital component of the modern electronic designs. Rapid changes in the advanced electronic infrastructure may causes the power to become paramount important in the VLSI designs.
Very Large Scale Integration is the technology used now a day everywhere. Diploma as well as degree students can refer this
(For Downloads, send me mail
agarwal.avanish@yahoo.com)
As we push through lower technology nodes in the IC and chip design, the wire width goes thinner along with transistor size. This makes the wire resistance more dominant on 16nm and below technology nodes. This increasing resistance and the decreasing width of metal wires introduce many Electromigration and IR drop issues. These two issues play major roles in reducing the lifespan of an electronic device and are the causes of functionality failure in any electronic devices with lower technology nodes.
In this article, we will discuss the problems of electromigration and IR drop, and techniques to prevent the occurrence of these issues in electronic devices.
Electromigration is the gradual displacement of metal atoms in a semiconductor. It occurs when the current density is high enough to cause the drift of metal ions in the direction of the electron flow, and is characterized by the ion flux density. This density depends on the magnitude of forces that tend to hold the ions in place, i.e., the nature of the conductor, crystal size, interface and grain-boundary chemistry, and the magnitude of forces that tend to dislodge them, including the current density, temperature and mechanical stresses.
The Power supply in the chip is distributed uniformly through metal layers (Vdd & Vss) across the design. These metal layers have finite amount of resistance. When voltage is applied to this metal wires current starts flowing through the metal layers and some voltage is dropped due to that resistance of metal wires and current. this drop is called as IR drop.
VLSI power estimation is vital component of the modern electronic designs. Rapid changes in the advanced electronic infrastructure may causes the power to become paramount important in the VLSI designs.
Very Large Scale Integration is the technology used now a day everywhere. Diploma as well as degree students can refer this
(For Downloads, send me mail
agarwal.avanish@yahoo.com)
As we push through lower technology nodes in the IC and chip design, the wire width goes thinner along with transistor size. This makes the wire resistance more dominant on 16nm and below technology nodes. This increasing resistance and the decreasing width of metal wires introduce many Electromigration and IR drop issues. These two issues play major roles in reducing the lifespan of an electronic device and are the causes of functionality failure in any electronic devices with lower technology nodes.
In this article, we will discuss the problems of electromigration and IR drop, and techniques to prevent the occurrence of these issues in electronic devices.
Electromigration is the gradual displacement of metal atoms in a semiconductor. It occurs when the current density is high enough to cause the drift of metal ions in the direction of the electron flow, and is characterized by the ion flux density. This density depends on the magnitude of forces that tend to hold the ions in place, i.e., the nature of the conductor, crystal size, interface and grain-boundary chemistry, and the magnitude of forces that tend to dislodge them, including the current density, temperature and mechanical stresses.
The Power supply in the chip is distributed uniformly through metal layers (Vdd & Vss) across the design. These metal layers have finite amount of resistance. When voltage is applied to this metal wires current starts flowing through the metal layers and some voltage is dropped due to that resistance of metal wires and current. this drop is called as IR drop.
Ahhh.... It's a pain ... right !! I can tell you exactly, why the above happens. Stay with me!!
On a circuit, fabricated on silicon, there are trillions of wires packed in a small area, something like below, and as me and you demand for higher speed and huge number of applications, poor engineers [:(] try to pack even more devices and wires in that tiny area
This presentation discusses the basics of Pass Transistor Logic, its advantages, limitation and finally implementation of Boolean functions/Combinational Logic circuits using Pass Transistor Logic.
I have prepared it to create an understanding of delay modeling in VLSI.
Regards,
Vishal Sharma
Doctoral Research Scholar,
IIT Indore
vishalfzd@gmail.com
Ahhh.... It's a pain ... right !! I can tell you exactly, why the above happens. Stay with me!!
On a circuit, fabricated on silicon, there are trillions of wires packed in a small area, something like below, and as me and you demand for higher speed and huge number of applications, poor engineers [:(] try to pack even more devices and wires in that tiny area
This presentation discusses the basics of Pass Transistor Logic, its advantages, limitation and finally implementation of Boolean functions/Combinational Logic circuits using Pass Transistor Logic.
I have prepared it to create an understanding of delay modeling in VLSI.
Regards,
Vishal Sharma
Doctoral Research Scholar,
IIT Indore
vishalfzd@gmail.com
For training sessions, demonstration sessions by vendors of diagnostic tools and for stress testing of PROFIBUS DP networks, a compact “error generator” tool was developed. The decoding of UART characters, testing for trigger conditions, generation of errors on RS485, the HMI, etc. of an FPGA based error generator is discussed.
Literature Review Basics and Understanding Reference Management.pptxDr Ramhari Poudyal
Three-day training on academic research focuses on analytical tools at United Technical College, supported by the University Grant Commission, Nepal. 24-26 May 2024
Water billing management system project report.pdfKamal Acharya
Our project entitled “Water Billing Management System” aims is to generate Water bill with all the charges and penalty. Manual system that is employed is extremely laborious and quite inadequate. It only makes the process more difficult and hard.
The aim of our project is to develop a system that is meant to partially computerize the work performed in the Water Board like generating monthly Water bill, record of consuming unit of water, store record of the customer and previous unpaid record.
We used HTML/PHP as front end and MYSQL as back end for developing our project. HTML is primarily a visual design environment. We can create a android application by designing the form and that make up the user interface. Adding android application code to the form and the objects such as buttons and text boxes on them and adding any required support code in additional modular.
MySQL is free open source database that facilitates the effective management of the databases by connecting them to the software. It is a stable ,reliable and the powerful solution with the advanced features and advantages which are as follows: Data Security.MySQL is free open source database that facilitates the effective management of the databases by connecting them to the software.
ACEP Magazine edition 4th launched on 05.06.2024Rahul
This document provides information about the third edition of the magazine "Sthapatya" published by the Association of Civil Engineers (Practicing) Aurangabad. It includes messages from current and past presidents of ACEP, memories and photos from past ACEP events, information on life time achievement awards given by ACEP, and a technical article on concrete maintenance, repairs and strengthening. The document highlights activities of ACEP and provides a technical educational article for members.
We have compiled the most important slides from each speaker's presentation. This year’s compilation, available for free, captures the key insights and contributions shared during the DfMAy 2024 conference.
Harnessing WebAssembly for Real-time Stateless Streaming PipelinesChristina Lin
Traditionally, dealing with real-time data pipelines has involved significant overhead, even for straightforward tasks like data transformation or masking. However, in this talk, we’ll venture into the dynamic realm of WebAssembly (WASM) and discover how it can revolutionize the creation of stateless streaming pipelines within a Kafka (Redpanda) broker. These pipelines are adept at managing low-latency, high-data-volume scenarios.
Using recycled concrete aggregates (RCA) for pavements is crucial to achieving sustainability. Implementing RCA for new pavement can minimize carbon footprint, conserve natural resources, reduce harmful emissions, and lower life cycle costs. Compared to natural aggregate (NA), RCA pavement has fewer comprehensive studies and sustainability assessments.
2. Before we start……
• Logic with Switching Circuits….
• Logic can be done with switches
as well as gates.
• A parallel connection implements OR. A series connection
implements AND. Series and parallel combinations can do
complex logic.
• Loop Analysis
• Construct all paths between a logic “1” and the output.
Each path is a string of ANDs. which are ORed together. The
expression comes out as a Sum-of-Products (Σ of Π)
• Cut-Set Analysis
• Make all the cuts that completely separate the output and
Vcc. The cuts must only pass through switches. The
switches in the cut are ORed together. The expression
comes out as a Product-of-Sums (Π of Σ)
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3. In case you forgot…..
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9. Pull Up / Pull Down…..
• For nMOS
• Vgs >= Vt
• 5-Vs>=1
• Vs = [0,4) i.e. ( 0 to Vg-Vt only, never Vg full is
coming to Vs)
• For pMOS
• Vgs =< Vt
• Vg-Vs =< Vt
• 0-Vs =< -1
• Vs = (1,5] i.e. ( 0 to Vg-Vt only, never Vg full is
coming to Vs)
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18. Which is better?
NAND or NOR? Why?
• Considering propagation delay….
• Do remember
• For pMOS and nMOS :
• Hence nMOS is speedier than pMOS.
• So overall delay of CMOS is delay of pMOS
• So to reduce the delay of pMOS, reduce the Ron
of pMOS and hence widen the pMOS i.e. double
size.
• R 1/IDD , IDD W/L => R 1/(W/L)
• Now using inverter model,
• Delay
• For nMOS,
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19. Which is better?
NAND or NOR? Why?
• Now using inverter model,
• Delay
• For NAND
• Worst case rise time delay is
• Worst case ( and only) fall time delay is
• For NOR
• Worst case (and only) rise time delay is :
• Worst case fall time delay is:
• Consider Rn = 1 Unit, analyse delay for NOR
and NAND
• in case of pMOS and nMOS of equal size
• Consider widening of pMOS
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20. Gates with large Fan-ins
• The earlier slide’s analysis draws the attentions
towards the deficiency of CMOS for large Fan-
in gates
• Larger Fan-ins means
• Either the series connected pMOSes or nMOSes
• Large difference in rise time and fall time
• Need to find out solutions..
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29. Complimentary Static CMOS
Gates
• At any time, the output is connected to either
power supply or ground with low resistance
path.
• Conduction of Pull-up network (PUN)and Pull-
down network (PDN) should be mutually
exclusive. (Why?)
• PDN and PUN are dual.
• Complimentary static CMOS are inverting.
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37. DO REMEBER
• Find and simplify F’
• Make sure that complements are down to the
literal level.
• Implement F’ as nMOS net and connect it
between ground and output
• OR operations by parallel connected nMOS
• AND operations are series connected nMOS
• Find dual of F’, implement it as pMOS net and
connect it between output and power supply.
• AND operations by parallel connected pMOS
• OR operations are series connected pMOS
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38. Optimize the transistor level
schematic for # of transistor
• F’
• F
• Literals are available in normal form only
• Literals are available in normal form and
complement form.
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39. STICK DIAGRAM FOR TRANSISTOR
LEVEL SCHEMATIC OF COMPLEX
BOOLEAN FUNCTION ( SIZE IS NO
BAR HERE!)
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42. Stick Diagram
• Stick diagrams help plan layout quickly
• Need not be to scale
• Draw with color pencils or dry-erase markers
• Estimate area by counting wiring tracks and
other areas
Vin
Vout
VDD
GND
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43. Stick Diagram Colour Notation
Silicon layers are typically colour coded as follows :
This colour representation is used during mask layer definition
Translation from circuit format to a mask layout (and vice-versa) is relatively straightforward
diffusion (device well, local interconnect)
polysilicon (gate electrode, interconnect)
metal (contact, interconnect)
contact windows
depletion implant
P well (CMOS devices)
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44. Layer contact mask layout representation
A transistor is formed when device well is crossed by polysilicon.
Device well oxide : thin gate oxide
Metal contacting diffusion
Metal contacting polysilicon
Metal contacting diffusion (no contact, electricall
isolated
with thick oxide)
Metal crossing polysilicon (no contact, electrically
isolated
with thick oxide and so can carry separate voltages)
diffusion
polysilicon
metal
contact windows
depletion implant
P well
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45. Transistor Mask Layout Preparation
A transistor is formed when device well is crossed by polysilicon.
Device well oxide : thin gate oxide
Depletion mode transistor (extra well implant to
provide Vth -0.6Vdd )
Enhancement mode transistor (Vth 0.2Vdd )
diffusion
polysilicon
metal
contact windows
depletion implant
P well
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51. Static CMOS Design Example Layout
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52. Layout 2 (Different layout style to previous but same function being
implemented)
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53. Two Stick Diagrams of F =
(C*(A+B))’
A B C
X
VDD
GND
X
CA B
VDD
GND
uninterrupted diffusion strip
crossover requiring vias
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54. To construct a minimum area
layout…
• For a complex logic function, if we choose
arbitrary ordering of polysilicon gates column:
• The separation between the polysilicon columns
must allow
• Diffusion to diffusion separation
• Diffusion to metal separation
• Hence, to reduce the number of diffusion area
break, the ordering of gate column should be
properly planned.
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57. Euler Path
• Find a common Euler path for both p and n
graphs
• Euler Path:
• Uninterrupted path which traverse each edge of
the graph exactly once.
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63. Let’s have one magic!!!!!
• Pl. find the Euler path for x = !(a + bc + de)
• Ok…..
• Now try x = !(bc + a + de)
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64. Duality of Function
• Pl. find Euler’s path for
• F=!(AB+BC+CA)
• Now try with duality concept….
• F = dual of F
• Now pl. check the n and p graph and find the
Euler’s path
• So easy to draw the stick diagram…
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66. LAYOUT
(W/L IS A BIG CONCERN HERE!)
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67. CMOS Inverter Mask Layout (using Microwind)
diffusion
polysilicon
metal
contact windows
depletion implant
P well
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70. CMOS NAND2 Mask Layout
diffusion
polysilicon
metal
contact windows
depletion implant
P well
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71. Layout Design rules & Lambda ()
• Lambda () : distance by which a geometrical feature or
any one layer may stay from any other geometrical feature
on the same layer or any other layer.
• All processing factors are included plus a safety margin.
• used to prevent IC manufacturing problems due to mask
misalignment
• or exposure & development variations on every feature,
which otherwise could lead to :
• over-diffusion
• over-etching
• inadvertent transistor creation etc
• is the minimum dimension which can be accurately re-
produced on the silicon wafer for a particular technology.
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72. Layout Design rules & Lambda ()
• Minimum photolithographic dimension (width, not
separation) is 2.
• Hence, the minimum channel length dimension is 2.
• Where a 0.25m gate length is quoted, is 0.125 microns
(m).
• Minimum distance rules between device layers are used,
e.g.,
• polysilicon metal
• metal metal
• diffusion diffusion and
• minimum layer overlaps
• Layout design rule checker (DRC) automatically verifies
that no design rules have been broken
• Note however, the use of Lambda is not optimal but supports
design reuse
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73. Layout Design rules &
Lambda ()
Lambda based design: half of technology since 1985. As technology
changes with smaller dimensions, a simple change in the value of can
be used to produce a new mask set.
6
2
6
4
Hcmos6 technology : =0.2µm
Hcmos8 technology : =0.1µm
All device mask dimensions are based on multiples of , e.g., polysilicon
minimum width = 2. Minimum metal to metal spacing = 3
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75. Basic Design Rules
• Same N and P alters symmetry • L min
• Wpmos=2 Wnmos
Width of pMOS
should be twice the
width of nMOS
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76. CALCULATION OF SIZE
BASICALLY CALCULATION OF
W/L……..
ALL OTHER SIZE IS WITH
REFERENCE TO W/L
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77. Design Strategy
• Fan-out, Rise time, Fall time…
• Load Current, VOL, VOH..…
• Depends on W/L and other parameters…
• Designable parameter is (W/L).
• Find the worst case of above parameters and
design for that (W/L)
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78. • Performing a manual analysis of the dynamic
behavior of complex gates is only tractable via
a switch model.
• Here, the transistor is modelled as a switch
with an infinite off-resistance and a finite on
resistance, Ron.
• Ron is chosen so that the equivalent RC-circuit
has a propagation delay identical to the
original transistor-capacitor model.
• Ron is inversely proportional to the W/L ratio
but varies during the switching transient.
• Deriving propagation delay can be done by
analysing the RC network.
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84. To calculate W/L….
• Specify maximum allowable VOL value
• Calculate equivalent (W/L)driver using for that
VOL
• Determine worst case path (class-1)
• Determine worst case path transistor size to
give the equivalent worst path VOL same as
equivalent (W/L)driver
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85. Layout Optimization
Device Folding / Fingering & Sharing
• When we have to make the devices for large
current (like drivers), the width of the devices
should be very high compared to the other
devices
• Large transistors can be split into smaller ones
and then shorting the corresponding terminals
making up the required W/L
• In such an arrangement we can share the
diffusion drain and source of adjacent
transistors and then we can short the
terminals
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86. Folding & Sharing (Cont...)
Why to have folding / fingering?
Poly resistance is reduced as single poly is
divided in multiple parts of poly
To maintain the uniformity in diffusion area
Process variations are less
Why to have sharing?
To save the diffusion area
To reduce the parasitic associated with the
devices
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87. Folding and Sharing
D SG
D S
D S
G
Equivalence of devices connected in parallel
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88. Folding and Sharing…..
88
D SG D SD SG G
Equivalence of devices connected in series
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89. Folding and Sharing
S & D sharing in devices
G
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90. Static CMOS
Do remember…
• Every point in time, gate output is connected
to either supply or ground via low resistance
path
• Rail to rail output voltage
• Ratioless design
• Low output and Extremely High input
impedance
• No static power dissipation
• Good Noise Margin
• BUT what about Rise and Fall Time????
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97. Pseudo nMOS Gates
• Only single pMOS in load, permanently gate of
pMOS connected to ground
• Disadvantages:
• Always on load i.e. steady state current, static
power
• o/p voltage < Vdd
• Ratioed logic
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