Random access scan
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This document discusses limitations of traditional serial scan design for testing integrated circuits and proposes an alternative called Random Access Scan (RAS). RAS addresses three key limitations of serial scan: 1) test data volume, 2) test application time, and 3) test power. In RAS, flip-flops act as addressable memory elements during test mode, reducing time to set and observe flip-flop states compared to serial scan. While RAS requires more gates and test pins than serial scan, it significantly reduces switching activity and power consumption during testing.
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The document discusses current challenges in physical design for ASICs. Delays, especially from interconnects as technologies scale down, are a major challenge. Not all physical effects are accurately modeled in design tools. Some key challenges discussed are meeting timing constraints during floorplanning when interconnects are unknown, handling hard IP blocks, and balancing skew, insertion delay, and transition time during clock tree synthesis. Continued research is needed to better model physical effects and close remaining gaps in design flows.
Implementing Electrical and Simulation Rule Checks to ensure Signal Quality
Join Matthew Harms as he discusses a unique multi-tiered strategy to board analysis & verification designed to enable designers of all skill levels to analyze their PCB designs early in the development cycle when the cost of change is the lowest. Matthew will show how Cadence has created a multi-tier analysis environment that lets designers start with a set of pre-defined Electrical Rule Checks (ERC) that can be run on the board to quickly identify areas of interest or concern all without the need for any complex models or configurations. Based on these initial 1st order results Matthew will show how design teams can then effectively target critical nets with 2nd order (Simulation Rule Checks) and 3rd order (Power Aware Signal Integrity) analysis as needed to simulate with greater detail and achieve complete electrical design signoff.
Implementation of Low Power Test Pattern Generator Using LFSR
Implementation of Low Power Test Pattern Generator Using LFSRInternational Journal of Science and Research (IJSR)
In our project, we propose a novel architecture which generates the test patterns with reduced switching activities. LP-TPG (Test pattern Generator) structure consists of modified low power linear feedback shift register (LP-LFSR), m-bit counter; gray counter, NOR-gate structure and XOR-array. The m-bit counter is initialized with Zeros and which generates 2m test patterns in sequence. The m-bit counter and gray code generator are controlled by common clock signal [CLK]. The output of m-bit counter is applied as input to gray code generator and NOR-gate structure. When all the bits of counter output are Zero, the NOR-gate output is one. Only when the NOR-gate output is one, the clock signal is applied to activate the LP-LFSR which generates the next seed. The seed generated from LP-LFSR is Exclusive–OR ed with the data generated from gray code generator. The patterns generated from the Exclusive–OR array are the final output patterns. The proposed architecture is simulated using Modelsim and synthesized using Xilinx ISE 13.2 and it will be implemented on XC3S500e Spartan 3E FPGA board for hardware implementation and testing. The Xilinx Chip scope tool will be used to test the FPGA inside results while the logic running on FPGA.
Ig3415411546
International Journal of Engineering Research and Applications (IJERA) is an open access online peer reviewed international journal that publishes research and review articles in the fields of Computer Science, Neural Networks, Electrical Engineering, Software Engineering, Information Technology, Mechanical Engineering, Chemical Engineering, Plastic Engineering, Food Technology, Textile Engineering, Nano Technology & science, Power Electronics, Electronics & Communication Engineering, Computational mathematics, Image processing, Civil Engineering, Structural Engineering, Environmental Engineering, VLSI Testing & Low Power VLSI Design etc.
Queuing theory and traffic analysis in depth
This document provides a summary of concepts in queuing theory and network traffic analysis. It discusses queuing theory concepts like Little's Law, M/M/1 queues, and Kendall's notation. It then covers an empirical study of router delay that models delays using a fluid queue and reports on busy period metrics. Finally, it discusses the concept of network traffic self-similarity found in measurements of Ethernet LAN traffic.
HDT TOOLS PRESENTATION (2000)
HDT Italia produces EDA tools for signal integrity, hardware modeling, and EMC/EMI analysis and validation. Their main product is PRESTO, which uses the SPRINT simulation engine to enable fast, exhaustive simulation of entire printed circuit boards. PRESTO can analyze signal integrity issues, EMC/EMI compliance, and validate design functionality. It produces detailed reports and can interface with measurement equipment for validation. HDT also provides consulting services and the EmiR tool for predicting radiated emissions from PCB designs.
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Level sensitive scan design(LSSD) and Boundry scan(BS)
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Design for testability and automatic test pattern generation
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学校原版美国波士顿大学毕业证学历学位证书原版一模一样
原版一模一样【微信：741003700 】【美国波士顿大学毕业证学历学位证书】【微信：741003700 】学位证，留信认证（真实可查，永久存档）offer、雅思、外壳等材料/诚信可靠,可直接看成品样本，帮您解决无法毕业带来的各种难题！外壳，原版制作，诚信可靠，可直接看成品样本。行业标杆！精益求精，诚心合作，真诚制作！多年品质 ,按需精细制作，24小时接单,全套进口原装设备。十五年致力于帮助留学生解决难题，包您满意。
本公司拥有海外各大学样板无数，能完美还原海外各大学 Bachelor Diploma degree, Master Degree Diploma
1:1完美还原海外各大学毕业材料上的工艺：水印，阴影底纹，钢印LOGO烫金烫银，LOGO烫金烫银复合重叠。文字图案浮雕、激光镭射、紫外荧光、温感、复印防伪等防伪工艺。材料咨询办理、认证咨询办理请加学历顾问Q/微741003700
留信网认证的作用:
1:该专业认证可证明留学生真实身份
2:同时对留学生所学专业登记给予评定
3:国家专业人才认证中心颁发入库证书
4:这个认证书并且可以归档倒地方
5:凡事获得留信网入网的信息将会逐步更新到个人身份内，将在公安局网内查询个人身份证信息后，同步读取人才网入库信息
6:个人职称评审加20分
7:个人信誉贷款加10分
8:在国家人才网主办的国家网络招聘大会中纳入资料，供国家高端企业选择人才
Use PyCharm for remote debugging of WSL on a Windo cf5c162d672e4e58b4dde5d797...
This document serves as a comprehensive step-by-step guide on how to effectively use PyCharm for remote debugging of the Windows Subsystem for Linux (WSL) on a local Windows machine. It meticulously outlines several critical steps in the process, starting with the crucial task of enabling permissions, followed by the installation and configuration of WSL.
The guide then proceeds to explain how to set up the SSH service within the WSL environment, an integral part of the process. Alongside this, it also provides detailed instructions on how to modify the inbound rules of the Windows firewall to facilitate the process, ensuring that there are no connectivity issues that could potentially hinder the debugging process.
The document further emphasizes on the importance of checking the connection between the Windows and WSL environments, providing instructions on how to ensure that the connection is optimal and ready for remote debugging.
It also offers an in-depth guide on how to configure the WSL interpreter and files within the PyCharm environment. This is essential for ensuring that the debugging process is set up correctly and that the program can be run effectively within the WSL terminal.
Additionally, the document provides guidance on how to set up breakpoints for debugging, a fundamental aspect of the debugging process which allows the developer to stop the execution of their code at certain points and inspect their program at those stages.
Finally, the document concludes by providing a link to a reference blog. This blog offers additional information and guidance on configuring the remote Python interpreter in PyCharm, providing the reader with a well-rounded understanding of the process.
Computational Engineering IITH Presentation
This Presentation will give you a brief idea about what Computational Engineering at IIT Hyderabad has to offer.
22CYT12-Unit-V-E Waste and its Management.ppt
Introduction- e - waste – definition - sources of e-waste– hazardous substances in e-waste - effects of e-waste on environment and human health- need for e-waste management– e-waste handling rules - waste minimization techniques for managing e-waste – recycling of e-waste - disposal treatment methods of e- waste – mechanism of extraction of precious metal from leaching solution-global Scenario of E-waste – E-waste in India- case studies.
Embedded machine learning-based road conditions and driving behavior monitoring
Car accident rates have increased in recent years, resulting in losses in human lives, properties, and other financial costs. An embedded machine learning-based system is developed to address this critical issue. The system can monitor road conditions, detect driving patterns, and identify aggressive driving behaviors. The system is based on neural networks trained on a comprehensive dataset of driving events, driving styles, and road conditions. The system effectively detects potential risks and helps mitigate the frequency and impact of accidents. The primary goal is to ensure the safety of drivers and vehicles. Collecting data involved gathering information on three key road events: normal street and normal drive, speed bumps, circular yellow speed bumps, and three aggressive driving actions: sudden start, sudden stop, and sudden entry. The gathered data is processed and analyzed using a machine learning system designed for limited power and memory devices. The developed system resulted in 91.9% accuracy, 93.6% precision, and 92% recall. The achieved inference time on an Arduino Nano 33 BLE Sense with a 32-bit CPU running at 64 MHz is 34 ms and requires 2.6 kB peak RAM and 139.9 kB program flash memory, making it suitable for resource-constrained embedded systems.
AI + Data Community Tour - Build the Next Generation of Apps with the Einstei...
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Electric propulsion technology is widely used in many kinds of vehicles in recent years, and aircrafts are no exception. Technically, UAVs are electrically propelled but tend to produce a significant amount of noise and vibrations. Ion propulsion technology for drones is a potential solution to this problem. Ion propulsion technology is proven to be feasible in the earth’s atmosphere. The study presented in this article shows the design of EHD thrusters and power supply for ion propulsion drones along with performance optimization of high-voltage power supply for endurance in earth’s atmosphere.
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一比一原版(爱大毕业证书)爱荷华大学毕业证如何办理
原版一模一样【微信：741003700 】【(爱大毕业证书)爱荷华大学毕业证成绩单】【微信：741003700 】学位证，留信认证（真实可查，永久存档）原件一模一样纸张工艺/offer、雅思、外壳等材料/诚信可靠,可直接看成品样本，帮您解决无法毕业带来的各种难题！外壳，原版制作，诚信可靠，可直接看成品样本。行业标杆！精益求精，诚心合作，真诚制作！多年品质 ,按需精细制作，24小时接单,全套进口原装设备。十五年致力于帮助留学生解决难题，包您满意。
本公司拥有海外各大学样板无数，能完美还原。
1:1完美还原海外各大学毕业材料上的工艺：水印，阴影底纹，钢印LOGO烫金烫银，LOGO烫金烫银复合重叠。文字图案浮雕、激光镭射、紫外荧光、温感、复印防伪等防伪工艺。材料咨询办理、认证咨询办理请加学历顾问Q/微741003700
【主营项目】
一.毕业证【q微741003700】成绩单、使馆认证、教育部认证、雅思托福成绩单、学生卡等！
二.真实使馆公证(即留学回国人员证明,不成功不收费)
三.真实教育部学历学位认证（教育部存档！教育部留服网站永久可查）
四.办理各国各大学文凭(一对一专业服务,可全程监控跟踪进度)
如果您处于以下几种情况：
◇在校期间，因各种原因未能顺利毕业……拿不到官方毕业证【q/微741003700】
◇面对父母的压力，希望尽快拿到；
◇不清楚认证流程以及材料该如何准备；
◇回国时间很长，忘记办理；
◇回国马上就要找工作，办给用人单位看；
◇企事业单位必须要求办理的
◇需要报考公务员、购买免税车、落转户口
◇申请留学生创业基金
留信网认证的作用:
1:该专业认证可证明留学生真实身份
2:同时对留学生所学专业登记给予评定
3:国家专业人才认证中心颁发入库证书
4:这个认证书并且可以归档倒地方
5:凡事获得留信网入网的信息将会逐步更新到个人身份内，将在公安局网内查询个人身份证信息后，同步读取人才网入库信息
6:个人职称评审加20分
7:个人信誉贷款加10分
8:在国家人才网主办的国家网络招聘大会中纳入资料，供国家高端企业选择人才
办理(爱大毕业证书)爱荷华大学毕业证【微信：741003700 】外观非常简单，由纸质材料制成，上面印有校徽、校名、毕业生姓名、专业等信息。
办理(爱大毕业证书)爱荷华大学毕业证【微信：741003700 】格式相对统一，各专业都有相应的模板。通常包括以下部分：
校徽：象征着学校的荣誉和传承。
校名:学校英文全称
授予学位：本部分将注明获得的具体学位名称。
毕业生姓名：这是最重要的信息之一，标志着该证书是由特定人员获得的。
颁发日期：这是毕业正式生效的时间，也代表着毕业生学业的结束。
其他信息：根据不同的专业和学位，可能会有一些特定的信息或章节。
办理(爱大毕业证书)爱荷华大学毕业证【微信：741003700 】价值很高，需要妥善保管。一般来说，应放置在安全、干燥、防潮的地方，避免长时间暴露在阳光下。如需使用，最好使用复印件而不是原件，以免丢失。
综上所述，办理(爱大毕业证书)爱荷华大学毕业证【微信：741003700 】是证明身份和学历的高价值文件。外观简单庄重，格式统一，包括重要的个人信息和发布日期。对持有人来说，妥善保管是非常重要的。
2008 BUILDING CONSTRUCTION Illustrated - Ching Chapter 02 The Building.pdf
2008 BUILDING CONSTRUCTION Illustrated - Ching Chapter 02 The Building
一比一原版(osu毕业证书)美国俄勒冈州立大学毕业证如何办理
原版一模一样【微信：741003700 】【(osu毕业证书)美国俄勒冈州立大学毕业证成绩单】【微信：741003700 】学位证，留信认证（真实可查，永久存档）原件一模一样纸张工艺/offer、雅思、外壳等材料/诚信可靠,可直接看成品样本，帮您解决无法毕业带来的各种难题！外壳，原版制作，诚信可靠，可直接看成品样本。行业标杆！精益求精，诚心合作，真诚制作！多年品质 ,按需精细制作，24小时接单,全套进口原装设备。十五年致力于帮助留学生解决难题，包您满意。
本公司拥有海外各大学样板无数，能完美还原。
1:1完美还原海外各大学毕业材料上的工艺：水印，阴影底纹，钢印LOGO烫金烫银，LOGO烫金烫银复合重叠。文字图案浮雕、激光镭射、紫外荧光、温感、复印防伪等防伪工艺。材料咨询办理、认证咨询办理请加学历顾问Q/微741003700
【主营项目】
一.毕业证【q微741003700】成绩单、使馆认证、教育部认证、雅思托福成绩单、学生卡等！
二.真实使馆公证(即留学回国人员证明,不成功不收费)
三.真实教育部学历学位认证（教育部存档！教育部留服网站永久可查）
四.办理各国各大学文凭(一对一专业服务,可全程监控跟踪进度)
如果您处于以下几种情况：
◇在校期间，因各种原因未能顺利毕业……拿不到官方毕业证【q/微741003700】
◇面对父母的压力，希望尽快拿到；
◇不清楚认证流程以及材料该如何准备；
◇回国时间很长，忘记办理；
◇回国马上就要找工作，办给用人单位看；
◇企事业单位必须要求办理的
◇需要报考公务员、购买免税车、落转户口
◇申请留学生创业基金
留信网认证的作用:
1:该专业认证可证明留学生真实身份
2:同时对留学生所学专业登记给予评定
3:国家专业人才认证中心颁发入库证书
4:这个认证书并且可以归档倒地方
5:凡事获得留信网入网的信息将会逐步更新到个人身份内，将在公安局网内查询个人身份证信息后，同步读取人才网入库信息
6:个人职称评审加20分
7:个人信誉贷款加10分
8:在国家人才网主办的国家网络招聘大会中纳入资料，供国家高端企业选择人才
办理(osu毕业证书)美国俄勒冈州立大学毕业证【微信：741003700 】外观非常简单，由纸质材料制成，上面印有校徽、校名、毕业生姓名、专业等信息。
办理(osu毕业证书)美国俄勒冈州立大学毕业证【微信：741003700 】格式相对统一，各专业都有相应的模板。通常包括以下部分：
校徽：象征着学校的荣誉和传承。
校名:学校英文全称
授予学位：本部分将注明获得的具体学位名称。
毕业生姓名：这是最重要的信息之一，标志着该证书是由特定人员获得的。
颁发日期：这是毕业正式生效的时间，也代表着毕业生学业的结束。
其他信息：根据不同的专业和学位，可能会有一些特定的信息或章节。
办理(osu毕业证书)美国俄勒冈州立大学毕业证【微信：741003700 】价值很高，需要妥善保管。一般来说，应放置在安全、干燥、防潮的地方，避免长时间暴露在阳光下。如需使用，最好使用复印件而不是原件，以免丢失。
综上所述，办理(osu毕业证书)美国俄勒冈州立大学毕业证【微信：741003700 】是证明身份和学历的高价值文件。外观简单庄重，格式统一，包括重要的个人信息和发布日期。对持有人来说，妥善保管是非常重要的。
Null Bangalore | Pentesters Approach to AWS IAM
#Abstract:
- Learn more about the real-world methods for auditing AWS IAM (Identity and Access Management) as a pentester. So let us proceed with a brief discussion of IAM as well as some typical misconfigurations and their potential exploits in order to reinforce the understanding of IAM security best practices.
- Gain actionable insights into AWS IAM policies and roles, using hands on approach.
#Prerequisites:
- Basic understanding of AWS services and architecture
- Familiarity with cloud security concepts
- Experience using the AWS Management Console or AWS CLI.
- For hands on lab create account on [killercoda.com](https://killercoda.com/cloudsecurity-scenario/)
# Scenario Covered:
- Basics of IAM in AWS
- Implementing IAM Policies with Least Privilege to Manage S3 Bucket
- Objective: Create an S3 bucket with least privilege IAM policy and validate access.
- Steps:
- Create S3 bucket.
- Attach least privilege policy to IAM user.
- Validate access.
- Exploiting IAM PassRole Misconfiguration
-Allows a user to pass a specific IAM role to an AWS service (ec2), typically used for service access delegation. Then exploit PassRole Misconfiguration granting unauthorized access to sensitive resources.
- Objective: Demonstrate how a PassRole misconfiguration can grant unauthorized access.
- Steps:
- Allow user to pass IAM role to EC2.
- Exploit misconfiguration for unauthorized access.
- Access sensitive resources.
- Exploiting IAM AssumeRole Misconfiguration with Overly Permissive Role
- An overly permissive IAM role configuration can lead to privilege escalation by creating a role with administrative privileges and allow a user to assume this role.
- Objective: Show how overly permissive IAM roles can lead to privilege escalation.
- Steps:
- Create role with administrative privileges.
- Allow user to assume the role.
- Perform administrative actions.
- Differentiation between PassRole vs AssumeRole
Try at [killercoda.com](https://killercoda.com/cloudsecurity-scenario/)
Object Oriented Analysis and Design - OOAD
This ppt gives detailed description of Object Oriented Analysis and design.
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Embedded machine learning-based road conditions and driving behavior monitoring
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AI + Data Community Tour - Build the Next Generation of Apps with the Einstei...
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Random access scan
- 1. Presented by: Harish Peta – IMI2013002
- 2. • Scan design has been the backbone of design for testability (DFT) in industry for about three decades • However, as the complexity of circuits has grown, the serial-scan has some inherent problems • test data volume • test application time • test power • Switching activity and power consumption of serial-scan based DFT method is known to be much higher than normal circuit operation
- 3. • Excessive heat dissipation in high-speed and high density deep sub- micron (DSM) integrated circuits with the system-on-chip (SoC) scheme • produce incorrect responses • permanently damage a circuit under test (CUT) • reduce its reliability due to accelerated electromigration • An alternate to serial scan architecture is Random Access Scan (RAS)
- 4. • In RAS, flip-flops work as addressable memory elements in the test mode. • This approach reduces the time of setting and observing the flip-flop states. • Requires a large overhead both in gates and test pins. • Address three limitations of the traditional serial scan • test data volume • test application time • test power
- 6. • In the previous design, a single decoder was used. • A more feasible decoder has been designed. • There are only sqrt(N) address wires in modified decoder when compared to N address wires in the basic architecture decoder.
- 8. • Assuming a circuit has 𝑛𝑔 gates and 𝑛𝑓𝑓 FFs each consisting of 10 gates • Gate overhead of scan = 4∗𝑛𝑓𝑓 𝑛𝑔+10∗𝑛𝑓𝑓 ∗ 100% ------------------ (1) • Gate overhead of RAS = 6∗𝑛𝑓𝑓+ 𝑐+𝑑 2 𝑛𝑔+10∗𝑛𝑓𝑓 ∗ 100% ------------------ (2) • Let us consider a circuit with 5,120 gates and assume that there are 512 FFs in the circuit. The gate overhead of serial scan is 20% from Equation (1) and the gate overhead of RAS is 30.2% from Equation (2). Hence there is an increase of 10%.
- 9. • The FFs are cleared initially and then the following test is performed { (w0); (r0,w1); (r1,w0,r0) } • All the stuck at faults (SAF) are detected because, from each cell a `0' and a `1' is read uniquely.
- 10. Test vector generating algorithm is as follows: 1. Obtain the combinational vectors along with good circuit responses and store the results in a stack 2. Find the FFs where faults are propagated at each vector 3. While number of vectors > 0 (a) Read all the FF where the faults are detected (b) Choose the next vector from stack that has least hamming distance from current FF states 4. End While
- 11. • During scan-in, the CUT is subject to unnecessary activity and all the FFs are subject to change state. • Assuming that the power dissipation in the CUT, is directly proportional to the number of transitions in the primary inputs and the transitions in the states of FFs, the power dissipation in RAS is reduced drastically, since, the only activity during scan mode is the transition in state of a single FF under consideration and transitions at the primary input pins that control the decoder.
- 12. • [1] Dong Hyun Baik, Kewal K. Saluja, Seiji Kajihara, “Random Access Scan: A solution to test power, test data volume and test time”, Proceedings of the 17th International Conference on VLSI Design, 2004 • [2] H. Ando, “Testing VLSI with Random Access Scan”, in Proc. Of the COMPCON, Feb. 1980 • [3] V. D. Agrawal, K.-T. Cheng, D. D. Johnson, and T. Lin, “Designing Circuits with Partial Scan”, IEEE Design & Test of Computers, vol. 5, pp. 8 - 15, Apr. 1988. • [4] Fan Wang, Auburn University, Dept. of Electrical and Computer Engineering, “Random Access Scan”, Term Paper, 2006 • [5] www.Wikipedia.org