This document describes the design of a low transition, low power test pattern generator using a fault coverage circuit. It begins with background on the need for built-in self-test (BIST) techniques due to challenges with external testing. It then presents a new technique that generates three intermediate patterns between random patterns to reduce switching activity and power. The design is implemented using a linear feedback shift register (LFSR) modified with additional logic. Simulation results on a C17 benchmark circuit show the fault coverage achieved by the low power patterns.
Vlsi Design of Low Transition Low Power Test Pattern Generator Using Fault Co...iosrjce
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Now a dayâs highly integrated multi layer board with ICâs is virtually impossible to be accessed
physically for testing. The major problem detected during testing a circuit includes test generation and gate to
I/O pin problems. In design of any circuit, consuming low power and less hardware utilization is an important
design parameter. Therefore reliable testing methods are introduced which reduces the cost of the hardware
required and also power consumed by the device. In this project a new fault coverage test pattern generator is
generated using a linear feedback shift register called FC-LFSR which can perform fault analysis and reduces
the total power of the circuit. In this test, it generates three intermediate patterns between the random patterns
which reduces the transitional activities of primary inputs so that the switching activities inside the circuit under
test will be reduced. The test patterns generated are applied to c17 benchmark circuit, whose results with fault
coverage of the circuit being tested. The simulation for this design is performed using Xilinx ISE software using
Verilog hardware description language
Design for Testability in Timely Testing of Vlsi CircuitsIJERA Editor
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Even though a circuit is designed error-free, manufactured circuits may not function correctly. Since the manufacturing process is not perfect, some defects such as short-circuits, open-circuits, open interconnections, pin shorts, etc., may be introduced. Points out that the cost of detecting a faulty component increases ten times at each step between prepackage component test and system warranty repair. It is important to identify a faulty component as early in the manufacturing process as possible. Therefore, testing has become a very important aspect of any VLSI manufacturing system.Two main issues related to test and security domain are scan-based attacks and misuse of JTAG interface. Design for testability presents effective and timely testing of VLSI circuits. The project is to test the circuits after design and then reduce the area, power, delay and security of misuse. BIST architecture is used to test the circuits effectively compared to scan based testing. In built-in self-test (BIST), on-chip circuitry is added to generate test vectors or analyze output responses or both. BIST is usually performed using pseudorandom pattern generators (PRPGs). Among the advantages of pseudorandom BIST are: (1) the low cost compared to testing from automatic test equipment (ATE). (2) The speed of the test, which is much faster than when it is applied from ATE. (3) The applicability of the test while the circuit is in the field, and (4) the potential for high quality of test.
Digital standard cell library Design flowijsrd.com
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Commercial library cells are companies 'proprietary information and understandably companies usually impose certain restrictions on the access and use of their library cells. Those restrictions on commercial library cells severely hamper VLSI research and teaching activities of academia. To address the problem the goal of this paper is to discuss the development of standard cell library. This involves in creating new standard cells, layout design, simulation and verification of each standard cell and finally characterization of all cells for timing and functional properties.
Nexgen Technology Address:
Nexgen Technology
No :66,4th cross,Venkata nagar,
Near SBI ATM,
Puducherry.
Email Id: praveen@nexgenproject.com.
www.nexgenproject.com
Mobile: 9751442511,9791938249
Telephone: 0413-2211159.
NEXGEN TECHNOLOGY as an efficient Software Training Center located at Pondicherry with IT Training on IEEE Projects in Android,IEEE IT B.Tech Student Projects, Android Projects Training with Placements Pondicherry, IEEE projects in pondicherry, final IEEE Projects in Pondicherry , MCA, BTech, BCA Projects in Pondicherry, Bulk IEEE PROJECTS IN Pondicherry.So far we have reached almost all engineering colleges located in Pondicherry and around 90km
Extremely Low Power FIR Filter for a Smart Dust Sensor ModuleCSCJournals
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Digital filters are common components in many applications today, also in for sensor systems, such as large-scale distributed smart dust sensors. For these applications the power consumption is very critical, it has to be extremely low. With the transistor technology scaling becoming more and more sensitive to e.g. gate leakage, it has become a necessity to find ways to minimize the flow of leakage in current CMOS logic. This paper studies sub-threshold source coupled logic (STSCL) in a 45-nm process. The STSCL can be used instead of traditional CMOS to meet the low power and energy consumption requirements. The STSCL style is in this paper used to design a digital filter, applicable for the audio interface of a smart dust sensor where the sample frequency will be 44.1 kHz. A finite-length impulse response (FIR) filter is used with transposed direct form structure and for the coefficient multiplication five-bit canonic signed digit [7] based serial/parallel multipliers were used. The power consumption is calculated along with the delay in order to present the power delay product (PDP) such that the performance of the sub-threshold logic can be compared with corresponding CMOS implementation. The simulated results shows a significant reduction in energy consumption (in terms of PDP) with the system running at a supply voltage as low as 0.2 V using STSCL.
Vlsi Design of Low Transition Low Power Test Pattern Generator Using Fault Co...iosrjce
Â
Now a dayâs highly integrated multi layer board with ICâs is virtually impossible to be accessed
physically for testing. The major problem detected during testing a circuit includes test generation and gate to
I/O pin problems. In design of any circuit, consuming low power and less hardware utilization is an important
design parameter. Therefore reliable testing methods are introduced which reduces the cost of the hardware
required and also power consumed by the device. In this project a new fault coverage test pattern generator is
generated using a linear feedback shift register called FC-LFSR which can perform fault analysis and reduces
the total power of the circuit. In this test, it generates three intermediate patterns between the random patterns
which reduces the transitional activities of primary inputs so that the switching activities inside the circuit under
test will be reduced. The test patterns generated are applied to c17 benchmark circuit, whose results with fault
coverage of the circuit being tested. The simulation for this design is performed using Xilinx ISE software using
Verilog hardware description language
Design for Testability in Timely Testing of Vlsi CircuitsIJERA Editor
Â
Even though a circuit is designed error-free, manufactured circuits may not function correctly. Since the manufacturing process is not perfect, some defects such as short-circuits, open-circuits, open interconnections, pin shorts, etc., may be introduced. Points out that the cost of detecting a faulty component increases ten times at each step between prepackage component test and system warranty repair. It is important to identify a faulty component as early in the manufacturing process as possible. Therefore, testing has become a very important aspect of any VLSI manufacturing system.Two main issues related to test and security domain are scan-based attacks and misuse of JTAG interface. Design for testability presents effective and timely testing of VLSI circuits. The project is to test the circuits after design and then reduce the area, power, delay and security of misuse. BIST architecture is used to test the circuits effectively compared to scan based testing. In built-in self-test (BIST), on-chip circuitry is added to generate test vectors or analyze output responses or both. BIST is usually performed using pseudorandom pattern generators (PRPGs). Among the advantages of pseudorandom BIST are: (1) the low cost compared to testing from automatic test equipment (ATE). (2) The speed of the test, which is much faster than when it is applied from ATE. (3) The applicability of the test while the circuit is in the field, and (4) the potential for high quality of test.
Digital standard cell library Design flowijsrd.com
Â
Commercial library cells are companies 'proprietary information and understandably companies usually impose certain restrictions on the access and use of their library cells. Those restrictions on commercial library cells severely hamper VLSI research and teaching activities of academia. To address the problem the goal of this paper is to discuss the development of standard cell library. This involves in creating new standard cells, layout design, simulation and verification of each standard cell and finally characterization of all cells for timing and functional properties.
Nexgen Technology Address:
Nexgen Technology
No :66,4th cross,Venkata nagar,
Near SBI ATM,
Puducherry.
Email Id: praveen@nexgenproject.com.
www.nexgenproject.com
Mobile: 9751442511,9791938249
Telephone: 0413-2211159.
NEXGEN TECHNOLOGY as an efficient Software Training Center located at Pondicherry with IT Training on IEEE Projects in Android,IEEE IT B.Tech Student Projects, Android Projects Training with Placements Pondicherry, IEEE projects in pondicherry, final IEEE Projects in Pondicherry , MCA, BTech, BCA Projects in Pondicherry, Bulk IEEE PROJECTS IN Pondicherry.So far we have reached almost all engineering colleges located in Pondicherry and around 90km
Extremely Low Power FIR Filter for a Smart Dust Sensor ModuleCSCJournals
Â
Digital filters are common components in many applications today, also in for sensor systems, such as large-scale distributed smart dust sensors. For these applications the power consumption is very critical, it has to be extremely low. With the transistor technology scaling becoming more and more sensitive to e.g. gate leakage, it has become a necessity to find ways to minimize the flow of leakage in current CMOS logic. This paper studies sub-threshold source coupled logic (STSCL) in a 45-nm process. The STSCL can be used instead of traditional CMOS to meet the low power and energy consumption requirements. The STSCL style is in this paper used to design a digital filter, applicable for the audio interface of a smart dust sensor where the sample frequency will be 44.1 kHz. A finite-length impulse response (FIR) filter is used with transposed direct form structure and for the coefficient multiplication five-bit canonic signed digit [7] based serial/parallel multipliers were used. The power consumption is calculated along with the delay in order to present the power delay product (PDP) such that the performance of the sub-threshold logic can be compared with corresponding CMOS implementation. The simulated results shows a significant reduction in energy consumption (in terms of PDP) with the system running at a supply voltage as low as 0.2 V using STSCL.
The signal processing algorithms can be implemented on hardware using various strategies such as DSP processors and ASIC. This PPT compares and contrasts the two methods.
Abstract: Design verification is an essential step in the development of any product. It ensures that the product as designed is the same as the product as intended. Software simulation is the common approach for validating hardware design unfortunately, it will take hours together to execute. Difficulties in validation arise due to the complexity of the design and also due to the lack of on chip observability. One common solution to this problem is to instrument the prototype using trace-buffers to record a subset of internal signals into on-chip memory for subsequent analysis. In the proposed system, an example circuit is implemented to perform the tracing operation and various trace buffers are designed to record the different stages of internal signal states. The resulting signal states are to be stored, like a error outputs. Low power methodologies are also implemented to achieve low power consumption. Thus the errors are separately stored in the memory for analyzing the signals. This might be used for changes in the logic wherever needed. Thus this tracing is performed to monitor signal states of an FPGA.
Nexgen Technology Address:
Nexgen Technology
No :66,4th cross,Venkata nagar,
Near SBI ATM,
Puducherry.
Email Id: praveen@nexgenproject.com.
www.nexgenproject.com
Mobile: 9751442511,9791938249
Telephone: 0413-2211159.
NEXGEN TECHNOLOGY as an efficient Software Training Center located at Pondicherry with IT Training on IEEE Projects in Android,IEEE IT B.Tech Student Projects, Android Projects Training with Placements Pondicherry, IEEE projects in pondicherry, final IEEE Projects in Pondicherry , MCA, BTech, BCA Projects in Pondicherry, Bulk IEEE PROJECTS IN Pondicherry.So far we have reached almost all engineering colleges located in Pondicherry and around 90km
Nexgen Technology Address:
Nexgen Technology
No :66,4th cross,Venkata nagar,
Near SBI ATM,
Puducherry.
Email Id: praveen@nexgenproject.com.
www.nexgenproject.com
Mobile: 9751442511,9791938249
Telephone: 0413-2211159.
NEXGEN TECHNOLOGY as an efficient Software Training Center located at Pondicherry with IT Training on IEEE Projects in Android,IEEE IT B.Tech Student Projects, Android Projects Training with Placements Pondicherry, IEEE projects in pondicherry, final IEEE Projects in Pondicherry , MCA, BTech, BCA Projects in Pondicherry, Bulk IEEE PROJECTS IN Pondicherry.So far we have reached almost all engineering colleges located in Pondicherry and around 90km
A Two Channel Analog Front end Design AFE Design with Continuous Time â-â Mod...IJECEIAES
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In this context, the AFE with 2-channels is described, which has high impedance for low power application of bio-medical electrical activity. The challenge in obtaining accurate recordings of biomedical signals such as EEG/ECG to study the human body in research work. This paper is to propose Multi-Vt in AFE circuit design cascaded with CT modulator. The new architecture is anticipated with two dissimilar input signals filtered from 2-channel to one modulator. In this methodology, the amplifier is low powered multi-VT Analog Front-End which consumes less power by applying dual threshold voltage. Type -I category 2 channel signals of the first mode: 50 and 150 Hz amplified from AFE are given to 2nd CT sigmadelta ADC. Depict the SNR and SNDR as 63dB and 60dB respectively, consuming the power of 11mW. The design was simulated in a 0.18 um standard UMC CMOS process at 1.8V supply. The AFE measured frequency response from 50 Hz to 360 Hz, depict the SNR and SNDR as 63dB and 60dB respectively, consuming the power of 11mW. The design was simulated in 0.18 m standard UMC CMOS process at 1.8V supply. The AFE measured frequency response from 50 Hz to 360 Hz, programmable gains from 52.6 dB to 72 dB, input referred noise of 3.5 ÂľV in the amplifier bandwidth, NEF of 3.
IJERA (International journal of Engineering Research and Applications) is International online, ... peer reviewed journal. For more detail or submit your article, please visit www.ijera.com
Comparative analysis of lector and stack technique to reduce the leakage curr...eSAT Journals
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Abstract CMOS is the latest technology available in todayâs world. And the biggest advantage of this technology is it does not consume any power. So the total power consumption is dependent on its leakage power. Since leakage exists in the circuit even if it is in stand by state i.e. the state in which gate of the circuit is not getting power supply. So the power loss in the circuit is high. And thatâs why our major concern is to reduce the leakage current in the circuit. Varieties of different techniques are available to reduce the leakage current and still continue to derive more, better techniques. In this paper two different techniques LECTOR and STACK technique which are based on the same principle have been comparatively analyzed. Keywords: Delay, Leakage current, Lector technique, Stack technique.
Enhanced Built-In Self Test for MSP 430IJTET Journal
Â
The enhanced Built in self test (BIST) is a combined form of both hardware and software together to resolve the memory problem in self testing. So it automatically comprises own test using self test pattern generation. The implementation can be done using the microcontroller MSP 430 series. Here we are using the Xilinx software for compilation in the design implementation. Also its functional can be done using dynamic RAM and reduces the external testing methods also includes diagnosis of test.
Reducing Area & Power Overhead In Design of Light Weight Sensor For Detection...IJERA Editor
Â
The counterfeiting and recycling of integrated circuits (ICs) have become major issues in recent years, potentially impacting the security and reliability of electronic systems bound for military, financial, or other critical applications. With identical functionality and packaging, it would be extremely difficult to distinguish recycled ICs from unused ICs. In the existing Ring Oscillator (RO) based sensor with 90nm technology test chip shows the effective detection of recycled ICs. The impact of RO based sensor is that, it is difficult to identify recycled ICs used shorter than one month and it requires more power and area overhead. To provide a solution to the existing system, Clock Anti fuses (CAF) based sensor is implemented to enhance the effective recognition of recycled ICs even if the IC used for a very short period. MAF is implemented in FPGA to verify its effectiveness.
SCR-Based ESD Protection Designs for RF ICsjournal ijrtem
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Abstract: CMOS technology has been used to implement the radio-frequency integrated circuits (RF ICs). However, it was known that advanced CMOS technologies seriously degrade the electrostatic discharge (ESD) robustness of ICs. Therefore, on-chip ESD protection devices must be added into the chip, including RF ICs. To minimize the impacts from ESD protection devices on RF performances, the ESD protection at RF pads must be carefully designed. A review on ESD protection designs with silicon-controlled rectifier (SCR) devices in RF ICs is presented in this article. Keywords: CMOS, ESD, RF, SCR.
Wavelet Based on the Finding of Hard and Soft Faults in Analog and Digital Si...ijcisjournal
Â
In this paper methods for testing both software and hardware faults are implemented in analog and digital
signal circuits are presented. They are based on the wavelet transform (WT). The limit which affected by
faults detect ability, for the reference circuits is set by statistical processing data obtained from a set of
faults free circuits .In wavelet analysis it has two algorithm one is based on a discrimination factor using
Euclidean distances and the other mahalanobis distances, are introduced both methods on wavelet energy
calculation. Simulation result from proposed test methods in the testing known analog and digital signal
circuit benchmark are given. The results shows that effectiveness of existing methods two test metrics
against three other test methods, namely a test method based on rms value of the measured signal, a test
method utilizing the harmonic magnitude component of the measured signal waveform
The signal processing algorithms can be implemented on hardware using various strategies such as DSP processors and ASIC. This PPT compares and contrasts the two methods.
Abstract: Design verification is an essential step in the development of any product. It ensures that the product as designed is the same as the product as intended. Software simulation is the common approach for validating hardware design unfortunately, it will take hours together to execute. Difficulties in validation arise due to the complexity of the design and also due to the lack of on chip observability. One common solution to this problem is to instrument the prototype using trace-buffers to record a subset of internal signals into on-chip memory for subsequent analysis. In the proposed system, an example circuit is implemented to perform the tracing operation and various trace buffers are designed to record the different stages of internal signal states. The resulting signal states are to be stored, like a error outputs. Low power methodologies are also implemented to achieve low power consumption. Thus the errors are separately stored in the memory for analyzing the signals. This might be used for changes in the logic wherever needed. Thus this tracing is performed to monitor signal states of an FPGA.
Nexgen Technology Address:
Nexgen Technology
No :66,4th cross,Venkata nagar,
Near SBI ATM,
Puducherry.
Email Id: praveen@nexgenproject.com.
www.nexgenproject.com
Mobile: 9751442511,9791938249
Telephone: 0413-2211159.
NEXGEN TECHNOLOGY as an efficient Software Training Center located at Pondicherry with IT Training on IEEE Projects in Android,IEEE IT B.Tech Student Projects, Android Projects Training with Placements Pondicherry, IEEE projects in pondicherry, final IEEE Projects in Pondicherry , MCA, BTech, BCA Projects in Pondicherry, Bulk IEEE PROJECTS IN Pondicherry.So far we have reached almost all engineering colleges located in Pondicherry and around 90km
Nexgen Technology Address:
Nexgen Technology
No :66,4th cross,Venkata nagar,
Near SBI ATM,
Puducherry.
Email Id: praveen@nexgenproject.com.
www.nexgenproject.com
Mobile: 9751442511,9791938249
Telephone: 0413-2211159.
NEXGEN TECHNOLOGY as an efficient Software Training Center located at Pondicherry with IT Training on IEEE Projects in Android,IEEE IT B.Tech Student Projects, Android Projects Training with Placements Pondicherry, IEEE projects in pondicherry, final IEEE Projects in Pondicherry , MCA, BTech, BCA Projects in Pondicherry, Bulk IEEE PROJECTS IN Pondicherry.So far we have reached almost all engineering colleges located in Pondicherry and around 90km
A Two Channel Analog Front end Design AFE Design with Continuous Time â-â Mod...IJECEIAES
Â
In this context, the AFE with 2-channels is described, which has high impedance for low power application of bio-medical electrical activity. The challenge in obtaining accurate recordings of biomedical signals such as EEG/ECG to study the human body in research work. This paper is to propose Multi-Vt in AFE circuit design cascaded with CT modulator. The new architecture is anticipated with two dissimilar input signals filtered from 2-channel to one modulator. In this methodology, the amplifier is low powered multi-VT Analog Front-End which consumes less power by applying dual threshold voltage. Type -I category 2 channel signals of the first mode: 50 and 150 Hz amplified from AFE are given to 2nd CT sigmadelta ADC. Depict the SNR and SNDR as 63dB and 60dB respectively, consuming the power of 11mW. The design was simulated in a 0.18 um standard UMC CMOS process at 1.8V supply. The AFE measured frequency response from 50 Hz to 360 Hz, depict the SNR and SNDR as 63dB and 60dB respectively, consuming the power of 11mW. The design was simulated in 0.18 m standard UMC CMOS process at 1.8V supply. The AFE measured frequency response from 50 Hz to 360 Hz, programmable gains from 52.6 dB to 72 dB, input referred noise of 3.5 ÂľV in the amplifier bandwidth, NEF of 3.
IJERA (International journal of Engineering Research and Applications) is International online, ... peer reviewed journal. For more detail or submit your article, please visit www.ijera.com
Comparative analysis of lector and stack technique to reduce the leakage curr...eSAT Journals
Â
Abstract CMOS is the latest technology available in todayâs world. And the biggest advantage of this technology is it does not consume any power. So the total power consumption is dependent on its leakage power. Since leakage exists in the circuit even if it is in stand by state i.e. the state in which gate of the circuit is not getting power supply. So the power loss in the circuit is high. And thatâs why our major concern is to reduce the leakage current in the circuit. Varieties of different techniques are available to reduce the leakage current and still continue to derive more, better techniques. In this paper two different techniques LECTOR and STACK technique which are based on the same principle have been comparatively analyzed. Keywords: Delay, Leakage current, Lector technique, Stack technique.
Enhanced Built-In Self Test for MSP 430IJTET Journal
Â
The enhanced Built in self test (BIST) is a combined form of both hardware and software together to resolve the memory problem in self testing. So it automatically comprises own test using self test pattern generation. The implementation can be done using the microcontroller MSP 430 series. Here we are using the Xilinx software for compilation in the design implementation. Also its functional can be done using dynamic RAM and reduces the external testing methods also includes diagnosis of test.
Reducing Area & Power Overhead In Design of Light Weight Sensor For Detection...IJERA Editor
Â
The counterfeiting and recycling of integrated circuits (ICs) have become major issues in recent years, potentially impacting the security and reliability of electronic systems bound for military, financial, or other critical applications. With identical functionality and packaging, it would be extremely difficult to distinguish recycled ICs from unused ICs. In the existing Ring Oscillator (RO) based sensor with 90nm technology test chip shows the effective detection of recycled ICs. The impact of RO based sensor is that, it is difficult to identify recycled ICs used shorter than one month and it requires more power and area overhead. To provide a solution to the existing system, Clock Anti fuses (CAF) based sensor is implemented to enhance the effective recognition of recycled ICs even if the IC used for a very short period. MAF is implemented in FPGA to verify its effectiveness.
SCR-Based ESD Protection Designs for RF ICsjournal ijrtem
Â
Abstract: CMOS technology has been used to implement the radio-frequency integrated circuits (RF ICs). However, it was known that advanced CMOS technologies seriously degrade the electrostatic discharge (ESD) robustness of ICs. Therefore, on-chip ESD protection devices must be added into the chip, including RF ICs. To minimize the impacts from ESD protection devices on RF performances, the ESD protection at RF pads must be carefully designed. A review on ESD protection designs with silicon-controlled rectifier (SCR) devices in RF ICs is presented in this article. Keywords: CMOS, ESD, RF, SCR.
Wavelet Based on the Finding of Hard and Soft Faults in Analog and Digital Si...ijcisjournal
Â
In this paper methods for testing both software and hardware faults are implemented in analog and digital
signal circuits are presented. They are based on the wavelet transform (WT). The limit which affected by
faults detect ability, for the reference circuits is set by statistical processing data obtained from a set of
faults free circuits .In wavelet analysis it has two algorithm one is based on a discrimination factor using
Euclidean distances and the other mahalanobis distances, are introduced both methods on wavelet energy
calculation. Simulation result from proposed test methods in the testing known analog and digital signal
circuit benchmark are given. The results shows that effectiveness of existing methods two test metrics
against three other test methods, namely a test method based on rms value of the measured signal, a test
method utilizing the harmonic magnitude component of the measured signal waveform
Design analysis and Commissioning Of High Mast Lighting PolesIOSR Journals
Â
Along a major highway, luminaire pole structures may be seen every 101 of a mile.From documented
cases, it appears that these structures started to experience fatigue problems in the last three decades. The
general public might not be aware of the problem, because if such a failure occurs, the structure is replaced.
Those working in the fatigue area realize that this issue is a serious matter[15][16]. Clearly, the damage is
costly, costing up to thousands of dollars per occurrence. For this purpose, a high mast lighting poles are
fabricated using steel due to its high strength, ductilityproperty and wear resistance. The high mast structure
(HMS) has the characters of light weight and high cost efficiency. It possess large ratio of height (H) to least
horizontal dimension (D) that makes it more slender and wind-sensitive than any other structures[17].
Therefore, the purpose of this research is to design optimal high mast poles taking into account its specification,
environmental conditions for placement and economy. Initially, among various pole designs, the high mast pole
is considered to be in tapered section as it is more reliable and economical. Then, analysis is performed in solid
works by keeping the base section to be fixed and applying compressive load on the top section of the pole due
to heavy weight of cantilever mast arm and luminaire. This project illustrates the theoretical basis and the
analytical development of the high mast lighting poles
A Novel Edge Detection Technique for Image Classification and AnalysisIOSR Journals
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Abstract: The main aim of this project is to propose a new method for image segmentation. Image
Segmentation is concerned with splitting an image up into segments (also called regions or areas) that each
holds some property distinct from their neighbor. Simply, another word for the Object Detection is
âSegmentation â. Segmentation is divided into two types they are Supervised Segmentation and Unsupervised
Segmentation. Segmentation consists of three types of methods which are divided on the basis of threshold, edge
and region. Thresholding is a commonly used enhancement whose goal is to segment an image into object and
background. Edge-based segmentations rely on edges found in an image by edge detecting operators. Region
based segmentations basic idea is to divide an image into zones of maximum homogeneity, where homogeneity
is an important property of regions. Edge detection has been a field of fundamental importance in digital image
processing research. Edge can be defined as a pixels located at points where abrupt changes in gray level take
place in this paper one novel approach for edge detection in gray scale images, which is based on diagonal
pixels in 2*2 region of the image, is proposed. This method first uses a threshold value to segment the image
and binary image. And then the proposed edge detector. In order to validate the results, seven different
kinds of test images are considered to examine the versatility of the proposed edge detector. It has been
observed that the proposed edge detector works effectively for different gray scale digital images. The results of
this study are quite promising. In this project we proposed a new algorithm for edge Detection. The main
advantage of this algorithm is with running mask on the original image we can detect the edges in the images by
using the proposed scheme for edge detection.
Keywords: Edge detection, segmentation, thresholding.
IOSR Journal of Mathematics(IOSR-JM) is an open access international journal that provides rapid publication (within a month) of articles in all areas of mathemetics and its applications. The journal welcomes publications of high quality papers on theoretical developments and practical applications in mathematics. Original research papers, state-of-the-art reviews, and high quality technical notes are invited for publications.
International Journal of Engineering Research and Applications (IJERA) is an open access online peer reviewed international journal that publishes research and review articles in the fields of Computer Science, Neural Networks, Electrical Engineering, Software Engineering, Information Technology, Mechanical Engineering, Chemical Engineering, Plastic Engineering, Food Technology, Textile Engineering, Nano Technology & science, Power Electronics, Electronics & Communication Engineering, Computational mathematics, Image processing, Civil Engineering, Structural Engineering, Environmental Engineering, VLSI Testing & Low Power VLSI Design etc.
International Journal of Engineering Research and Applications (IJERA) is an open access online peer reviewed international journal that publishes research and review articles in the fields of Computer Science, Neural Networks, Electrical Engineering, Software Engineering, Information Technology, Mechanical Engineering, Chemical Engineering, Plastic Engineering, Food Technology, Textile Engineering, Nano Technology & science, Power Electronics, Electronics & Communication Engineering, Computational mathematics, Image processing, Civil Engineering, Structural Engineering, Environmental Engineering, VLSI Testing & Low Power VLSI Design etc.
In our project, we propose a novel architecture which generates the test patterns with reduced switching activities. LP-TPG (Test pattern Generator) structure consists of modified low power linear feedback shift register (LP-LFSR), m-bit counter; gray counter, NOR-gate structure and XOR-array. The m-bit counter is initialized with Zeros and which generates 2m test patterns in sequence. The m-bit counter and gray code generator are controlled by common clock signal [CLK]. The output of m-bit counter is applied as input to gray code generator and NOR-gate structure. When all the bits of counter output are Zero, the NOR-gate output is one. Only when the NOR-gate output is one, the clock signal is applied to activate the LP-LFSR which generates the next seed. The seed generated from LP-LFSR is ExclusiveâOR ed with the data generated from gray code generator. The patterns generated from the ExclusiveâOR array are the final output patterns. The proposed architecture is simulated using Modelsim and synthesized using Xilinx ISE 13.2 and it will be implemented on XC3S500e Spartan 3E FPGA board for hardware implementation and testing. The Xilinx Chip scope tool will be used to test the FPGA inside results while the logic running on FPGA.
International Journal of Engineering Research and Applications (IJERA) is an open access online peer reviewed international journal that publishes research and review articles in the fields of Computer Science, Neural Networks, Electrical Engineering, Software Engineering, Information Technology, Mechanical Engineering, Chemical Engineering, Plastic Engineering, Food Technology, Textile Engineering, Nano Technology & science, Power Electronics, Electronics & Communication Engineering, Computational mathematics, Image processing, Civil Engineering, Structural Engineering, Environmental Engineering, VLSI Testing & Low Power VLSI Design etc.
Reduced Test Pattern Generation of Multiple SIC Vectors with Input and Output...IJERA Editor
Â
In recent years, the design for low power has become one of the greatest challenges in high-performance very
large scale integration (VLSI) design. Most of the methods focus on the power consumption during normal mode
operation, while test mode operation has not normally been a predominant concern. However, it has been found
that the power consumed during test mode operation is often much higher than during normal mode operation
[1]. This is because most of the consumed power results from the switching activity in the nodes of the circuit
under test (CUT), which is much higher during test mode than during normal mode operation [1]â[3]. In the
proposed pattern, each generated vector applied to each scan chain is an SIC vector, which can minimize the
input transition and reduce test power. In VLSI testing, power reduction is achieved by increasing the correlation
between consecutive test patterns.
Clock gating is an effective method of reducing the dynamic power consumption in synchronous circuits.
One of the ways to achieve this is by masking the clock that goes to the idle portion of the circuit. In This paper
we will present a comparative analysis of existing clock gating techniques on some synchronous digital design
like ALU (Arithmetic logical unit) etc. Also a new clock gating technique that provides more immunity to the
existing problem in available technique. In new proposed clock gating the Gated Clock Generation Circuit is using
tri state buffer and Gated logic is used which is created by the combination of double gated (AND, OR, AND
logic gate) with bubbled input respectively. This circuit saves power even when Target device's clock is ON. All
experiments are done on Xilinx14.1 EDA tool. Mentor Graphics Model SIM. For power calculation we are using
XPOWER. Sparten-3 (90nm) FPGA platform is used for result and analysis. The proposed design will reduce the
hardware complexity with approximately 10-20%. Similar clock power complexity will reduce with 5-10%.
Keywords â Tri state buffer; VLSI; Xilinx; glitches; hazards;Sparten.
Online and Offline Testing Of C-Bist Using Sramiosrjce
Â
Built-in self test techniques constitute a class of schemes that provide the capability of performing atspeed
testing with high fault coverage hence; they constitute an attractive solution to the problem of testing
VLSI devices. Concurrent BIST schemes perform testing during the circuit normal operation without imposing a
need to set the circuit offline to perform the test; therefore they can circumvent problems appearing in offline
BIST techniques. In this brief, a novel input vector monitoring concurrent BIST architecture has been presented,
based on the use of a SRAM-cell like register for storing the information of whether an input vector has
appeared or not during normal operation. The evaluation criteria for this class of schemes are the hardware
overhead and the CTL, i.e., the time required for the test to complete, while the circuit operates normally. The
simulation results shown to be more efficient than previously proposed Concurrent BIST techniques in terms of
hardware overhead and CTL.
International Journal of Engineering Research and Applications (IJERA) is an open access online peer reviewed international journal that publishes research and review articles in the fields of Computer Science, Neural Networks, Electrical Engineering, Software Engineering, Information Technology, Mechanical Engineering, Chemical Engineering, Plastic Engineering, Food Technology, Textile Engineering, Nano Technology & science, Power Electronics, Electronics & Communication Engineering, Computational mathematics, Image processing, Civil Engineering, Structural Engineering, Environmental Engineering, VLSI Testing & Low Power VLSI Design etc.
A BIST GENERATOR CAD TOOL FOR NUMERIC INTEGRATED CIRCUITSVLSICS Design
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This paper describes a training and research tool for learning basic issues related to BIST (Built-In Self- Test) generator. The main didactic aim of the tool is presenting complicated concepts in a comprehensive graphical and analytical way. The paper describes a computer-aided design (CAD) that is used to generate automatically the BIST to any digital circuit. This software technique attempts to reduce the amount of extra hardware and cost of the circuit. In order to make our software being easily available, we used the Java platform, which is supported by most operating systems. The multi-platform JAVA runtime environment allows for easy access and usage of
the tool.
Back track input vector algorithm for leakage reduction in cmos vlsi digital ...VLSICS Design
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A new algorithm based on Input Vector Control (IVC) technique is proposed, which shifts logic gate of a
circuit to its minimum leakage state, when device goes into its idle state. Leakage current in CMOS VLSI
circuit has become a major constrain in a battery operated device for technology node below 90nm, as it
drains the battery even when a circuit is in standby mode. Major concern is the leakage even in run time
condition, here aim is to focus on run time leakage reduction technique of integrated Circuit. It is inherited
by stacking effect when the series transistors are maximized in OFF state condition. This method is
independent of process technology and does not require any additional power supply. This paper gives an
optimized solution of input pattern determination of some small circuit to find minimum leakage vector
considering promising and non-promising node which helps to reduce the time complexity of the algorithm.
Proposed algorithm is simulated using HSPICE simulator for 2 input NAND gate and different standard
logic cells and achieved 94.2% and 54.59 % average leakage power reduction for 2 input NAND cell and
different logics respectively.
Data Volume Compression Using BIST to get Low-Power Pseudorandom Test Pattern...IJMTST Journal
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This project describes a low-power (LP) programmable generator capable of producing pseudorandom test patterns with desired toggling levels and enhanced fault coverage gradient compared with the best-to-date built-in self-test (BIST)- based pseudorandom test pattern generators. It is comprised of a linear finite state machine (a linear feedback shift register or a ring generator) driving an appropriate phase shifter, and it comes with a number of features allowing this device to produce binary sequences with preselected toggling (PRESTO) activity. We introduce a method to automatically select several controls of the generator offering easy and precise tuning. The same technique is subsequently employed to deterministically guide the generator toward test sequences with improved fault-coverage-to pattern-count ratios. Furthermore, this proposes an LP test compression method that allows shaping the test power envelope in a fully predictable, accurate, and flexible fashion by adapting the PRESTO based logic BIST (LBIST) infrastructure. The proposed architecture is extended in such that the patterns generated from PRPG is gone through CUT and then to TRA to perform ATE.
Optimal and Power Aware BIST for Delay Testing of System-On-ChipIDES Editor
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Test engineering for fault tolerant VLSI systems is
encumbered with optimization requisites for hardware
overhead, test power and test time. The high level quality of
these complex high-speed VLSI circuits can be assured only
through delay testing, which involves checking for accurate
temporal behavior. In the present paper, a data-path based
built-in test pattern generator (TPG) that generates iterative
pseudo-exhaustive two-patterns (IPET) for parallel delay
testing of modules with different input cone capacities is
implemented. Further, in the present study a CMOS
implementation of low power architecture (LPA) for scan based
built-in self test (BIST) for delay testing and combinational
testing is carried out. This reduces test power dissipation in
the circuit under test (CUT). Experimental results and
comparisons with pre-existing methods prove the reduction
in hardware overhead and test-time.
Encryption in Microsoft 365 - ExpertsLive Netherlands 2024Albert Hoitingh
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In this session I delve into the encryption technology used in Microsoft 365 and Microsoft Purview. Including the concepts of Customer Key and Double Key Encryption.
UiPath Test Automation using UiPath Test Suite series, part 3DianaGray10
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Welcome to UiPath Test Automation using UiPath Test Suite series part 3. In this session, we will cover desktop automation along with UI automation.
Topics covered:
UI automation Introduction,
UI automation Sample
Desktop automation flow
Pradeep Chinnala, Senior Consultant Automation Developer @WonderBotz and UiPath MVP
Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP
Dev Dives: Train smarter, not harder â active learning and UiPath LLMs for do...UiPathCommunity
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đĽ Speed, accuracy, and scaling â discover the superpowers of GenAI in action with UiPath Document Understanding and Communications Miningâ˘:
See how to accelerate model training and optimize model performance with active learning
Learn about the latest enhancements to out-of-the-box document processing â with little to no training required
Get an exclusive demo of the new family of UiPath LLMs â GenAI models specialized for processing different types of documents and messages
This is a hands-on session specifically designed for automation developers and AI enthusiasts seeking to enhance their knowledge in leveraging the latest intelligent document processing capabilities offered by UiPath.
Speakers:
đ¨âđŤ Andras Palfi, Senior Product Manager, UiPath
đŠâđŤ Lenka Dulovicova, Product Program Manager, UiPath
Smart TV Buyer Insights Survey 2024 by 91mobiles.pdf91mobiles
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91mobiles recently conducted a Smart TV Buyer Insights Survey in which we asked over 3,000 respondents about the TV they own, aspects they look at on a new TV, and their TV buying preferences.
UiPath Test Automation using UiPath Test Suite series, part 4DianaGray10
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Welcome to UiPath Test Automation using UiPath Test Suite series part 4. In this session, we will cover Test Manager overview along with SAP heatmap.
The UiPath Test Manager overview with SAP heatmap webinar offers a concise yet comprehensive exploration of the role of a Test Manager within SAP environments, coupled with the utilization of heatmaps for effective testing strategies.
Participants will gain insights into the responsibilities, challenges, and best practices associated with test management in SAP projects. Additionally, the webinar delves into the significance of heatmaps as a visual aid for identifying testing priorities, areas of risk, and resource allocation within SAP landscapes. Through this session, attendees can expect to enhance their understanding of test management principles while learning practical approaches to optimize testing processes in SAP environments using heatmap visualization techniques
What will you get from this session?
1. Insights into SAP testing best practices
2. Heatmap utilization for testing
3. Optimization of testing processes
4. Demo
Topics covered:
Execution from the test manager
Orchestrator execution result
Defect reporting
SAP heatmap example with demo
Speaker:
Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP
Key Trends Shaping the Future of Infrastructure.pdfCheryl Hung
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Keynote at DIGIT West Expo, Glasgow on 29 May 2024.
Cheryl Hung, ochery.com
Sr Director, Infrastructure Ecosystem, Arm.
The key trends across hardware, cloud and open-source; exploring how these areas are likely to mature and develop over the short and long-term, and then considering how organisations can position themselves to adapt and thrive.
GDG Cloud Southlake #33: Boule & Rebala: Effective AppSec in SDLC using Deplo...James Anderson
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Effective Application Security in Software Delivery lifecycle using Deployment Firewall and DBOM
The modern software delivery process (or the CI/CD process) includes many tools, distributed teams, open-source code, and cloud platforms. Constant focus on speed to release software to market, along with the traditional slow and manual security checks has caused gaps in continuous security as an important piece in the software supply chain. Today organizations feel more susceptible to external and internal cyber threats due to the vast attack surface in their applications supply chain and the lack of end-to-end governance and risk management.
The software team must secure its software delivery process to avoid vulnerability and security breaches. This needs to be achieved with existing tool chains and without extensive rework of the delivery processes. This talk will present strategies and techniques for providing visibility into the true risk of the existing vulnerabilities, preventing the introduction of security issues in the software, resolving vulnerabilities in production environments quickly, and capturing the deployment bill of materials (DBOM).
Speakers:
Bob Boule
Robert Boule is a technology enthusiast with PASSION for technology and making things work along with a knack for helping others understand how things work. He comes with around 20 years of solution engineering experience in application security, software continuous delivery, and SaaS platforms. He is known for his dynamic presentations in CI/CD and application security integrated in software delivery lifecycle.
Gopinath Rebala
Gopinath Rebala is the CTO of OpsMx, where he has overall responsibility for the machine learning and data processing architectures for Secure Software Delivery. Gopi also has a strong connection with our customers, leading design and architecture for strategic implementations. Gopi is a frequent speaker and well-known leader in continuous delivery and integrating security into software delivery.
Essentials of Automations: Optimizing FME Workflows with ParametersSafe Software
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Are you looking to streamline your workflows and boost your projectsâ efficiency? Do you find yourself searching for ways to add flexibility and control over your FME workflows? If so, youâre in the right place.
Join us for an insightful dive into the world of FME parameters, a critical element in optimizing workflow efficiency. This webinar marks the beginning of our three-part âEssentials of Automationâ series. This first webinar is designed to equip you with the knowledge and skills to utilize parameters effectively: enhancing the flexibility, maintainability, and user control of your FME projects.
Hereâs what youâll gain:
- Essentials of FME Parameters: Understand the pivotal role of parameters, including Reader/Writer, Transformer, User, and FME Flow categories. Discover how they are the key to unlocking automation and optimization within your workflows.
- Practical Applications in FME Form: Delve into key user parameter types including choice, connections, and file URLs. Allow users to control how a workflow runs, making your workflows more reusable. Learn to import values and deliver the best user experience for your workflows while enhancing accuracy.
- Optimization Strategies in FME Flow: Explore the creation and strategic deployment of parameters in FME Flow, including the use of deployment and geometry parameters, to maximize workflow efficiency.
- Pro Tips for Success: Gain insights on parameterizing connections and leveraging new features like Conditional Visibility for clarity and simplicity.
Weâll wrap up with a glimpse into future webinars, followed by a Q&A session to address your specific questions surrounding this topic.
Donât miss this opportunity to elevate your FME expertise and drive your projects to new heights of efficiency.
DevOps and Testing slides at DASA ConnectKari Kakkonen
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My and Rik Marselis slides at 30.5.2024 DASA Connect conference. We discuss about what is testing, then what is agile testing and finally what is Testing in DevOps. Finally we had lovely workshop with the participants trying to find out different ways to think about quality and testing in different parts of the DevOps infinity loop.
Transcript: Selling digital books in 2024: Insights from industry leaders - T...BookNet Canada
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The publishing industry has been selling digital audiobooks and ebooks for over a decade and has found its groove. Whatâs changed? What has stayed the same? Where do we go from here? Join a group of leading sales peers from across the industry for a conversation about the lessons learned since the popularization of digital books, best practices, digital book supply chain management, and more.
Link to video recording: https://bnctechforum.ca/sessions/selling-digital-books-in-2024-insights-from-industry-leaders/
Presented by BookNet Canada on May 28, 2024, with support from the Department of Canadian Heritage.
Elevating Tactical DDD Patterns Through Object CalisthenicsDorra BARTAGUIZ
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After immersing yourself in the blue book and its red counterpart, attending DDD-focused conferences, and applying tactical patterns, you're left with a crucial question: How do I ensure my design is effective? Tactical patterns within Domain-Driven Design (DDD) serve as guiding principles for creating clear and manageable domain models. However, achieving success with these patterns requires additional guidance. Interestingly, we've observed that a set of constraints initially designed for training purposes remarkably aligns with effective pattern implementation, offering a more âmechanicalâ approach. Let's explore together how Object Calisthenics can elevate the design of your tactical DDD patterns, offering concrete help for those venturing into DDD for the first time!
Assuring Contact Center Experiences for Your Customers With ThousandEyes
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H010613642
1. IOSR Journal of Electronics and Communication Engineering (IOSR-JECE)
e-ISSN: 2278-2834,p- ISSN: 2278-8735.Volume 10, Issue 6, Ver. I (Nov - Dec .2015), PP 36-42
www.iosrjournals.org
DOI: 10.9790/2834-10613642 www.iosrjournals.org 36 | Page
Vlsi Design of Low Transition Low Power Test Pattern Generator
Using Fault Coverage Circuits
1
B.Praveen Kumar , 2
M.Ravindra Kumar , 3
Rajesh.Ch
1,2,3
(Electronics & Communication Engineering, Pydah College of Engineering & Technology, India)
Abstract: Now a dayâs highly integrated multi layer board with ICâs is virtually impossible to be accessed
physically for testing. The major problem detected during testing a circuit includes test generation and gate to
I/O pin problems. In design of any circuit, consuming low power and less hardware utilization is an important
design parameter. Therefore reliable testing methods are introduced which reduces the cost of the hardware
required and also power consumed by the device. In this project a new fault coverage test pattern generator is
generated using a linear feedback shift register called FC-LFSR which can perform fault analysis and reduces
the total power of the circuit. In this test, it generates three intermediate patterns between the random patterns
which reduces the transitional activities of primary inputs so that the switching activities inside the circuit under
test will be reduced. The test patterns generated are applied to c17 benchmark circuit, whose results with fault
coverage of the circuit being tested. The simulation for this design is performed using Xilinx ISE software using
Verilog hardware description language.
I. Introduction
Test Pattern generation has long been carried out by using conventional Linear Feedback Shift
Registers (LFSRâs). LFSRâs are a series of flip-flopâs connected in series with feedback taps defined by the
generator polynomial. The seed value is loaded into the outputs of the flip-flops. The only input required to
generate a random sequence is an external clock where each clock pulse can produce a unique pattern at the
output of the flip-flops.
The number of inputs required by the circuit under test must match with the number of flip-flop outputs
of the LFSR. This test pattern is run on the circuit under test for desired fault coverage. The power consumed by
the chip under test is a measure of the switching activity of the logic inside the chip which depends largely on
the randomness of the applied input stimulus. Reduced correlation between the successive vectors of the applied
stimulus into the circuit under test can result in much higher power consumption by the device than the
budgeted power. A new low power pattern generation technique is implemented using a modified conventional
Linear Feedback Shift Register [1].
Need for using BIST technique
Todayâs highly integrated multi-layer boards with fine-pitch ICs are virtually impossible to be accessed
physically for testing. Traditional board test methods which include functional test, only accesses the board's
primary I/Os, providing limited coverage and poor diagnostics for board-network fault. In circuit testing, an-
other traditional test method works by physically accessing each wire on the board via costly "bed of nails"
probes and testers. To identify reliable testing methods which will reduce the cost of test equipment, a research
to verify each VLSI testing problems has been conducted. The major problems detected so far are as follows:
1.1 Test Generation Problems
The large number of gates in VLSI circuits has pushed computer automatic-test-generation times to
weeks or months of computation. The numbers of test patterns are becoming too large to be handled by an
external tester and this has resulted in high computation costs and has outstripped reasonable available time for
production testing.
1.2 The Gate to I/O Pin Ratio Problem
As ICs grow in gate counts, it is no longer true that most gate nodes are directly accessible by one of
the pins on the package. This makes testing of internal nodes more difficult as they could neither no longer be
easily controlled by signal from an input pin (controllability) nor easily observed at an output pin (observe
ability). Pin counts go at a much slower rate than gate counts, which worsens the controllability and observe
ability of internal gate nodes.
2. Vlsi Design of Low Transition Low Power Test Pattern Generator Using Fault Coverage Circuits
DOI: 10.9790/2834-10613642 www.iosrjournals.org 37 | Page
II. Testing Schemes
Power dissipation is a challenging problem for todayâs Sys-tem-on-Chips (SoCs) design and test. The
power dissipation in CMOS technology is either static or dynamic. Static power dissipation is primarily due to
the leakage currents and contribution to the total power dissipation is very small. The dominant factor in the
power dissipation is the dynamic power which is consumed when the circuit nodes switch from 0 to 1. During
switching, the power is consumed due to the short circuit current flow and the charging of load capacitances [1].
Automatic test equipment (ATE) is the instrumentation used in external testing to apply test patterns to
the CUT, to analyze the responses from the CUT, and to mark the CUT as good or bad according to the
analyzed responses. External testing using ATE has a serious disadvantage, since the ATE (control unit and
memory) is extremely expensive and cost is expected to grow in the future as the number of chip pins increases.
As the complexity of modern chips increases, external testing with ATE becomes extremely expensive. Instead,
Built-In Self-Test (BIST) is becoming more common in the testing of digital VLSI circuits since it overcomes
the problems of external testing using ATE. BIST test patterns are not generated ex-eternally as in case of ATE
[3].
BIST perform self-testing and reducing dependence on an external ATE. BIST is a Design-for-
Testability (DFT) technique makes the electrical testing of a chip easier, faster, more efficient and less costly.
The important to choose the proper LFSR architecture for achieving appropriate fault coverage and consume
less power. Every architecture consumes different power for same polynomial. Applications of LFSR: Pattern
generator, Low power testing, Data compression, and Pseudo Random Bit Sequences (PRBS).
2.1. Bist Architecture
A typical BIST architecture consists of
⢠TPG - Test Pattern Generator
⢠TRA â Test Response Analyzer
⢠Control Unit
As Shown in âFig. 1â
âFig.1 Test Pattern Generator In BISTâ
It generates test pattern for CUT. It will be dedicated circuit or a micro processor. Pattern generated
may be pseudo random numbers or deterministic sequence. Here we are using a linear feedback shift register for
generating random number. The Architecture for LFSR is as shown in âFig. 2â
3. Vlsi Design of Low Transition Low Power Test Pattern Generator Using Fault Coverage Circuits
DOI: 10.9790/2834-10613642 www.iosrjournals.org 38 | Page
âFig.2 The Architecture for LFSRâ
Tapping can be taken as we wish but as per taping change the LFSR output generate will change and as
we change in no of flip-flop the probability of repetition of random number will reduce. The initial value
loading to the LFSR is known as seed value.
B. Test Response Analyzer (TRA)
TRA will check the output of MISR and verify with the input of LFSR & give the result as error or not.
C. BIST control unit (BCU)
Control unit is used to control all the operations. Mainly control unit will do configuration of CUT in
test mode/Normal mode, feed seed value to LFSR, and control MISR & TRA. It will generate interrupt if an
error occurs. You can clear interrupt by interrupt clear signal.
D. Circuit under Test (CUT)
CUT is the circuit or chip in which we are going to apply BIST for testing stuck at zero or stuck at one
error.
III. Low Transition Pattern Generations
The technique of inserting 3 intermediate vectors is achieved by modifying the conventional LFSR
circuit with two additional levels of logic between the conventional flip flop outputs and the low power outputs
as shown in âFig: 3â The first level of hierarchy from the top down includes logic circuit design for propagating
either the present or the next state of flip flop to the second level of hierarchy [4]. The second level of hierarchy
is a multiplexer function that provides for selecting between the two states (present or next) to be propagated to
the outputs as low power output. Minimal at best consisting of few logic gates.
âFig.3 Low Power Test Pattern LFSRâ
In the simulation environment the outputs of the flip-flops are loaded with the seed vector. The
feedback taps are selected pertinent to the characteristic polynomial xg
+x+1. Only 2 inputs pins namely test
enable and clock are required to activate the generation of the pattern as well as simulation of the design circuit.
It is also noteworthy here that the intermediate vectors in addition to aiding in reducing the number of
transitions can also empirically assist in detecting faults just as good as the conventional lsfr pattern [1][5]
description of the technique to produce low power pattern for bit the following is a description of a low power
test pattern generation technique as depicted in the 9 âbit lsfr. The feedback taps are designed for maximal
length lsfr generating all zeros and all oneâs as well.
4. Vlsi Design of Low Transition Low Power Test Pattern Generator Using Fault Coverage Circuits
DOI: 10.9790/2834-10613642 www.iosrjournals.org 39 | Page
3.1 Algorithm For Low Power Lfsr
The first step is to generate it, the first vector by enabling (clocking) the first 4 bits of the LFSR and
disabling (not clocking) the last 4 bits .this shifts the first 4 bits to the right by one bit .the feedback bits of the
lsfr are the outputs of the 8th
and the first flip-flop.the output of the 8th
flip-flop is 1 and the output of the first
flip-flop is 0. The exclusive-or of the 8th
flip-flop (logic 1 in this case) and the first flip-flop (logic 0 in this case)
is input (1 exor 0 =1) into the first d flip flop the new pattern in the first four bits of the lsfr is 1010.note that the
shaded register is clocked along with the first 4 bits of the lsfr.
So the input of the shaded flip-flop is the output of the 4th
flip-flop which in this case is 0. Also note
that prior to the first clock, the input of the shaded register was the seed value of the 4 th
at the output of the 4 th
flip-flop which in this case is 0. So after the first clock this value of 0 will now appear at the output of the
shaded flip-flop. In other words the value of the 4 th
output is stored in this shaded register and is used in the next
few steps. The first 4 shifted bits of the LFSR and the last 4 Th
un-shifted bits (i.e. the seed value) are propagated
as ti (1010 1011) to the final outputs. Next few steps involve generating the 3 intermediate patterns from it.
These patterns are defined as Tk1, Tk2 and Tk3 shown in âFig. 4.âbelow flow.Tk1 is generated by
maintaining (disabling the clock to the first 4 bits)the first four bits of the LFSR outputs(as is from it) as the
final first four low power outputs 1010.note that the clock to the last four bits of the I.fsr is also disabled.
The last four bits however are the outputs from the injector circuits. The injector circuit compares the
next value (the inputs of the D âflip-flop) with the current value (the output of the D flip-flop). According to Ti,
the outputs(current values) of the last 4 bits of the LFSR are 1011. The next values are the values at the inputs of
the D-flip-flops which in this case are 0101. Compare the current values (1011) bit by bit with the next values
(0101). if the values bit by bit are not the same then use the random generator feedback R (in this case is logic
1)as the bit value as shown in the schematic above. If however both values bit by bit are the same then
propagate that bit value to output as opposed to the R bit. This bit by bit comparison gives us the last four bits of
Tk1 to be 1111.therfore Tk1=10101111.next step is to generate Tk2.shift the last 4 flip-flops to the right one bit
but do not shift the first 4 flip âflops to the right. The clock to the first 4 bits the shaded flip-flop is disabled .the
clock to the last 4 bits is enabled. Propagate the outputs of the flip-flops of the entire LFSR as opposed to the
outputs of the injection circuits to the outputs (low power). The injection circuits are disabled .as in Tk1,
maintain the first four LFSR outputs (1010) as the low power outputs. Again from Tk1, the inputs of the last
four d flip-flops from the previous step (generating Tk1) are 0101.also note that the output of the shaded register
is 0 from the previous step (generating Tk1).therefore the input of the 5 th
flip-flop is a 0. The outputs of the last
4flip-flops are 0101resulting in Tk2=10100101.
The 3rd
intermediate vector Tk3 is generated via disabling the clock to the entire LFSR. Propagate the
first 4 outputs from the injection circuit as the first 4 low power outputs and maintain the last 4low power
outputs the same as Tk2. generating injection circuit outputs for Tk3 is conceptually the same as explained
above in generating Tk1current values (the outputs of the flip-flops) of the first four flip-flops are compared
with the next values (the inputs of the flip-flops) of the flip-flops therefore the logical feed forward value of r is
1. The feedback value from the first flip-flop is also 1as per the current values above. The exclusive or of two
ones is a 0. Therefore the input to the first flip-flop is a 0 which is also the next state of the first flip-flop. Hence
the next values are 0 for the first flip-flop and 101 for the 2nd
3 rd
and4 rd
flip-floprespectively.the next values are
0101.the first four outputs from the injection circuit are 1111. The last 4 outputs are the same as Tk2 which are
0101 resulting in the 3rd
and final intermediate vector Tk3=1111 0101.generating Ti2 is quite similar to
generating it. As in Tk3 the outputs of the last four LFSR flops are 0101.the outputs of the first 4 flip-flops of
the LFSR are the current values which are 1010.therefore the seed vector for generating Ti2 is 1010 0101.shift
the first four bits of the LFSR plus the shadedflip-flop.do not clock the last four flip-flops. Propagate the outputs
of the entire LFSR to the final low power outputs. The output of the 8th
flip-flop from the previous step
(generating Tk3) is a 1 and the output of the first flip-flop from the previous step(generating Tk3) is also a 1 .
The exclusive or of the output of the 8th
flip-flop and the first flip-flop is 0 .therefore the input to the
first flip-flop will be a 0.
The inputs to the 2nd
,3 rd
and 4th
the shaded flip-flops are 1010.these are also the current values from the
previous step (generating Tk3).shifting the first four flip-flops of the LFSR to the right by one bit results in 0101
as the outputs of the first four flip-flops. Therefore Ti2 generated is 0101 0101.
5. Vlsi Design of Low Transition Low Power Test Pattern Generator Using Fault Coverage Circuits
DOI: 10.9790/2834-10613642 www.iosrjournals.org 40 | Page
Fig.4 C17 Bench Mark Circuit
IV. Simulation Results
The design is verified by performing behavioral simulation in âFig.5â,âFig.6â and âFig.7â to do a high
âlevel or behavioral simulator is used, which executes the design by interpreting the verilog code like any other
programming language, i.e. regardless of the target architecture .at this stage, FPGA development is much like
software development signals and variables may be watched procedures and functions may be traced and
breakpoints may be set. The entire process is very fast, as the design is not synthesized, thus giving the
developer a quick and complete understanding of the design. The downside of behavioral simulation is that
specific properties of the target architecture namely timing and resource usage are not covered.
âFig.5 RTL Schematic of LTâLFSR.â
âFig.6 Simulation Report of LT-LFSR with Faultâ
6. Vlsi Design of Low Transition Low Power Test Pattern Generator Using Fault Coverage Circuits
DOI: 10.9790/2834-10613642 www.iosrjournals.org 41 | Page
âFig.7 Simulation Report Of LT-LFSR Without Faultâ
V. Synthesis Result
Synthesis is the process of translating verilog HDL to a net list ,which is built from a structure of
micros, e.g. adders, multiplexers and shift registers chip synthesizers perform optimizations especially hierarchy
flattening and optimization of combinational paths. Specific cores like RAMS or ROMS are treated as black
boxes. Recent tool can duplicate registers, perform re-timing or optimize this result according to given
constraints shown in âFig. 9â, âTable 1â and âTable 2â
âFig.8 Synthesis Results For LT-LFSR.â
Existing results Proposed result
Logic Utilization Used(Available) Used(Available)
Number of slice Flip-flops 251(3,840) 18(4,800)
Number of 4 input LUTs 12(3,840) 16(2,400)
Number of occupied slices 45(1,920) 9(600)
Number of slices
containing only related
logic
45(21) 9(20)
Number of slices
containing unrelated logic
0(21) 7(20)
Number of bounded IOBS 64(173) 14(102)
Power consumption 14 mw 12.19 mw
Fault coverage 100% 100%
âTable I. Synthesis And Par Reportâ
7. Vlsi Design of Low Transition Low Power Test Pattern Generator Using Fault Coverage Circuits
DOI: 10.9790/2834-10613642 www.iosrjournals.org 42 | Page
Circuit Frequency(
MHZ)
Total
power(
mw)
Dynamic
power(mw)
Quiescent
power(mw)
C17 139 12.19 0.96 11.23
âTable Ii. Power Analysis Reportâ
VI. Conclusion
The proposed approach shows the concept of reducing the transitions in the test pattern generated; the
transition is reduced by increasing the correlation between the successive bits. The simulation results shows that
how the patterns are generated for the applied seed vector. This paper presents the implementation with regard
to verilog language. Synthesizing and implementation (i.e. Translate, Map And Place And Route) of the code is
carried out on Xilinx- project navigator, ISE12.li suite .the power reports shows that the proposed low power
LFSR consumes less power (12.19mw) during testing by taking the benchmark circuit C17.in future there is a
chance to reduce the power somewhat more by doing modifications in the proposed architecture.
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