Level sensitive scan design(LSSD) and Boundry scan(BS)Praveen Kumar
This presentation contains,
Introduction,design for testability, scan chain, operation, scan structure, test vectors, Boundry scan, test logic, operation, BS cell, states of TAP controller, Boundry scan instructions.
Level sensitive scan design(LSSD) and Boundry scan(BS)Praveen Kumar
This presentation contains,
Introduction,design for testability, scan chain, operation, scan structure, test vectors, Boundry scan, test logic, operation, BS cell, states of TAP controller, Boundry scan instructions.
Spyglass DFT is comprehensive process of resolving RTL Design issues, thereby ensuring high quality RTL with fewer design bugs.
Improves test quality by diagnosing DFT issues early at RTL or netlist.
Shortens test implementation time and cost by ensuring RTL or netlist is scan-compliant.
Scan design is currently the most popular structured DFT approach. It is implemented by Connecting selected storage elements present in the design into multiple shift registers, called Scan chains.
Scannability Rules -->
The tool perform basic two check
1) It ensures all the defined clocks including set/Reset are at their off-states, the sequential element remain stable and inactive. (S1)
2) It ensures for each defined clocks can capture data when all other defined clocks are off. (S2)
Routing in Integrated circuits is an important task which requires extreme care while placing the modules and circuits and connecting them with each other.
FPGA are a special form of Programmable logic devices(PLDs) with higher densities as compared to custom ICs and capable of implementing functionality in a short period of time using computer aided design (CAD) software....by mathewsubin3388@gmail.com
October 8, 2014 Webcast Identifying PCI Express 3.0 Dynamic Equalization Problems
Dynamic equalization training is a unique capability in modern day serial data communication. Through optimization of transmitter and receiver equalization parameters we can push the limits of serial data rates. Troubleshooting dynamic equalization problems at the Physical and Protocol layers requires testing for proper functionality and compliance.
Join Teledyne LeCroy's Stephen Mueller for this webinar to understand how to address this measurement challenge. The presentation will include real measurement examples and debugging techniques to pinpoint problems in the physical and protocol layers.
Veryx ATTEST range of testing solutions enable NEMs and NSPs reduce the time taken to test with automated test suites in an integrated testing framework providing many tester-friendly features such as flexible DUT control, GUI or CLI-based access, easy debugging and detailed reporting.
Spyglass DFT is comprehensive process of resolving RTL Design issues, thereby ensuring high quality RTL with fewer design bugs.
Improves test quality by diagnosing DFT issues early at RTL or netlist.
Shortens test implementation time and cost by ensuring RTL or netlist is scan-compliant.
Scan design is currently the most popular structured DFT approach. It is implemented by Connecting selected storage elements present in the design into multiple shift registers, called Scan chains.
Scannability Rules -->
The tool perform basic two check
1) It ensures all the defined clocks including set/Reset are at their off-states, the sequential element remain stable and inactive. (S1)
2) It ensures for each defined clocks can capture data when all other defined clocks are off. (S2)
Routing in Integrated circuits is an important task which requires extreme care while placing the modules and circuits and connecting them with each other.
FPGA are a special form of Programmable logic devices(PLDs) with higher densities as compared to custom ICs and capable of implementing functionality in a short period of time using computer aided design (CAD) software....by mathewsubin3388@gmail.com
October 8, 2014 Webcast Identifying PCI Express 3.0 Dynamic Equalization Problems
Dynamic equalization training is a unique capability in modern day serial data communication. Through optimization of transmitter and receiver equalization parameters we can push the limits of serial data rates. Troubleshooting dynamic equalization problems at the Physical and Protocol layers requires testing for proper functionality and compliance.
Join Teledyne LeCroy's Stephen Mueller for this webinar to understand how to address this measurement challenge. The presentation will include real measurement examples and debugging techniques to pinpoint problems in the physical and protocol layers.
Veryx ATTEST range of testing solutions enable NEMs and NSPs reduce the time taken to test with automated test suites in an integrated testing framework providing many tester-friendly features such as flexible DUT control, GUI or CLI-based access, easy debugging and detailed reporting.
Essential quality criteria for planning and validation of PROFINET networks
For PROFINET devices the quality criteria that are checked within the scope of the device certification are described in published specifications, standards and test specifications. Interoperability is protected by both the specification and the test procedures in the cooperation of the devices. From practical experience in the realization of network arrangements it appears that beside the device qualities also the planning quality and the quality of the validation of a whole arrangement can have an influence on the functionality.
In the task force CB / PG3 "Installation Guidelines" the suitable planning directives and introduction directives are now integrated into the quality criteria for the planning and validation of the PROFINET networks. The methods, measuring procedures and also the background will be fully explained.
Challenges in Protection Relay Testing for Tomorrow’s Power Grid
Very many challenges related to protection relay testing are met today in the field and in the research industry.
There are often new and more complex applications such as wind turbines, very fast switching power electronics, photovoltaic cells and the battery and electric vehicle technologies. This implies among other things new converter topologies and smart grid considerations. These systems cannot be protected the same way as what was already being done, so this increases the complexity of the algorithms used.
Real-time simulation is a novel approach to design and test protection relay algorithms.
Презентация для доклада, сделанного в рамках конференции Juniper New Network Day 01.01.2014.
Докладчик -- Product Line Manager компании Juniper Дмитрий Шокарев.
Видеозапись этого доклада с онлайн-трансляции конференции вы можете увидеть здесь: http://www.youtube.com/watch?v=R2groq4YMaQ
The SIPROTEC 4 7SJ64 can be used as a protective control and monitoring relay for distribution feeders and transmission lines of any voltage in networks that are earthed (grounded), low-resistance earthed, unearthed, or of a compensated neutral point structure. The relay is suited for networks that are radial or looped, and for lines with single or multi-terminal feeds. The SIPROTEC 4 7SJ64 is equipped with a synchronization function which provides the operationmodes ‘synchronization check’ (classical) and ‘synchronous/asynchronous switching’ (which takes the CBmechanical delay into consideration). Motor protection comprises undercurrent monitoring, starting time supervision, restart inhibit, locked rotor, load jamprotection as well asmotor statistics.
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The IEEE 1149.1 Boundary-scan test standard
1. Tallinn Technical University :: May 4th 2009 This presentation is available at http://www.slideshare.net/josemmf Tallinn Technical University :: May 4th 2009 This presentation is available at http://www.slideshare.net/josemmf J. M. Martins Ferreira FEUP / DEEC - Rua Dr. Roberto Frias 4200-537 Porto - PORTUGAL Tel. 351 225 081 889 / Fax: 351 225 081 443 [ jmf@fe.up.pt ] Boundary-scan test for structural fault detection
19. Short break! Tallinn Technical University :: May 4th 2009 Boundary-scan test for structural fault detection Tallinn Technical University :: May 4th 2009 This presentation is available at http://www.slideshare.net/josemmf
32. Tallinn Technical University :: May 4th 2009 This presentation is available at http://www.slideshare.net/josemmf Tallinn Technical University :: May 4th 2009 This presentation is available at http://www.slideshare.net/josemmf Boundary-scan test for structural fault detection Thanks for your attention! J. M. Martins Ferreira [ jmf@fe.up.pt ]