JTAG
https://www.corelis.com/education/tutorials/jtag-tutorial/jtag-test-overview/
JTAG is an integrated method for testing interconnects on printed circuit boards (PCBs) that are implemented at the integrated circuit (IC) level.
One of the key benefits of JTAG is that it provides access to the internal circuitry of a device without the need for additional hardware such as a test probe or emulator. This is possible because JTAG uses a series of test access ports (TAPs) that are built into a device's boundary-scan architecture.
https://www.corelis.com/education/tutorials/jtag-tutorial/what-is-jtag/
JTAG allows for the testing and programming of digital and analog circuits, including microprocessors, memory devices, and other digital and mixed-signal components.
#JTAG
IRJET- PCB Test, Debug & Programming Made Easy with Universal Test JigIRJET Journal
This document discusses a universal test jig that uses XJTAG technology to test printed circuit boards. XJTAG allows testing, troubleshooting, and programming of PCBs containing both JTAG and non-JTAG devices. The universal test jig includes an I/O board connected to an XJLink 2.0 adapter to interface between the computer and device under test on the PCB. XJDeveloper software is used to develop and execute test programs, while the XJLink 2.0 hardware connects to the computer via USB to drive signals to and from the device under test.
Abstract: Design verification is an essential step in the development of any product. It ensures that the product as designed is the same as the product as intended. Software simulation is the common approach for validating hardware design unfortunately, it will take hours together to execute. Difficulties in validation arise due to the complexity of the design and also due to the lack of on chip observability. One common solution to this problem is to instrument the prototype using trace-buffers to record a subset of internal signals into on-chip memory for subsequent analysis. In the proposed system, an example circuit is implemented to perform the tracing operation and various trace buffers are designed to record the different stages of internal signal states. The resulting signal states are to be stored, like a error outputs. Low power methodologies are also implemented to achieve low power consumption. Thus the errors are separately stored in the memory for analyzing the signals. This might be used for changes in the logic wherever needed. Thus this tracing is performed to monitor signal states of an FPGA.
This document discusses hardware design verification and testing techniques. It covers emulation architectures like FPGA-based and processor-based systems. It also discusses formal property verification methods, software formal verification, design for test objectives, chip-level DFT techniques, automatic test pattern generation, and testing techniques for analog/mixed-signal circuits like ADCs, PLLs and oscillators.
This document discusses JTAG (Joint Test Action Group) interface, which is a standard interface used for testing, debugging, and programming embedded systems. It allows full control and observability of chips via a 5-pin interface. Key points include:
- JTAG allows boundary scan testing which tests interconnects without physical test points.
- It has advantages like simpler board layouts, cheaper test fixtures, and faster debugging.
- Many devices like FPGAs and microcontrollers support JTAG for programming and debugging.
- Open source software like OpenOCD and proprietary tools support various JTAG adapters and devices.
- Real applications include manufacturing testing, system configuration/maintenance, and design verification
As the complexity of the scan algorithm is dependent on the number of design registers, large SoC scan
designs can no longer be verified in RTL simulation unless partitioned into smaller sub-blocks. This paper
proposes a methodology to decrease scan-chain verification time utilizing SCE-MI, a widely used
communication protocol for emulation, and an FPGA-based emulation platform. A high-level (SystemC)
testbench and FPGA synthesizable hardware transactor models are developed for the scan-chain ISCAS89
S400 benchmark circuit for high-speed communication between the host CPU workstation and the FPGA
emulator. The emulation results are compared to other verification methodologies (RTL Simulation,
Simulation Acceleration, and Transaction-based emulation), and found to be 82% faster than regular RTL
simulation. In addition, the emulation runs in the MHz speed range, allowing the incorporation of software
applications, drivers, and operating systems, as opposed to the Hz range in RTL simulation or submegahertz
range as accomplished in transaction-based emulation. In addition, the integration of scan
testing and acceleration/emulation platforms allows more complex DFT methods to be developed and
tested on a large scale system, decreasing the time to market for products.
This document provides an overview of JTAG (Joint Test Action Group) devices, including their basic chip architecture, capabilities, and common system configurations. It describes the JTAG standard architecture which defines boundary-scan cells and a test access port. It also summarizes common JTAG instructions, the TAP controller state machine, typical JTAG interfaces and connectors, BSDL description files, and how JTAG devices can be daisy-chained to form a scan chain for testing connections between components.
One of the key benefits of JTAG is that it provides access to the internal circuitry of a device without the need for additional hardware such as a test probe or emulator. This is possible because JTAG uses a series of test access ports (TAPs) that are built into a device's boundary-scan architecture.
https://www.corelis.com/education/tutorials/jtag-tutorial/what-is-jtag/
JTAG allows for the testing and programming of digital and analog circuits, including microprocessors, memory devices, and other digital and mixed-signal components.
#JTAG
IRJET- PCB Test, Debug & Programming Made Easy with Universal Test JigIRJET Journal
This document discusses a universal test jig that uses XJTAG technology to test printed circuit boards. XJTAG allows testing, troubleshooting, and programming of PCBs containing both JTAG and non-JTAG devices. The universal test jig includes an I/O board connected to an XJLink 2.0 adapter to interface between the computer and device under test on the PCB. XJDeveloper software is used to develop and execute test programs, while the XJLink 2.0 hardware connects to the computer via USB to drive signals to and from the device under test.
Abstract: Design verification is an essential step in the development of any product. It ensures that the product as designed is the same as the product as intended. Software simulation is the common approach for validating hardware design unfortunately, it will take hours together to execute. Difficulties in validation arise due to the complexity of the design and also due to the lack of on chip observability. One common solution to this problem is to instrument the prototype using trace-buffers to record a subset of internal signals into on-chip memory for subsequent analysis. In the proposed system, an example circuit is implemented to perform the tracing operation and various trace buffers are designed to record the different stages of internal signal states. The resulting signal states are to be stored, like a error outputs. Low power methodologies are also implemented to achieve low power consumption. Thus the errors are separately stored in the memory for analyzing the signals. This might be used for changes in the logic wherever needed. Thus this tracing is performed to monitor signal states of an FPGA.
This document discusses hardware design verification and testing techniques. It covers emulation architectures like FPGA-based and processor-based systems. It also discusses formal property verification methods, software formal verification, design for test objectives, chip-level DFT techniques, automatic test pattern generation, and testing techniques for analog/mixed-signal circuits like ADCs, PLLs and oscillators.
This document discusses JTAG (Joint Test Action Group) interface, which is a standard interface used for testing, debugging, and programming embedded systems. It allows full control and observability of chips via a 5-pin interface. Key points include:
- JTAG allows boundary scan testing which tests interconnects without physical test points.
- It has advantages like simpler board layouts, cheaper test fixtures, and faster debugging.
- Many devices like FPGAs and microcontrollers support JTAG for programming and debugging.
- Open source software like OpenOCD and proprietary tools support various JTAG adapters and devices.
- Real applications include manufacturing testing, system configuration/maintenance, and design verification
As the complexity of the scan algorithm is dependent on the number of design registers, large SoC scan
designs can no longer be verified in RTL simulation unless partitioned into smaller sub-blocks. This paper
proposes a methodology to decrease scan-chain verification time utilizing SCE-MI, a widely used
communication protocol for emulation, and an FPGA-based emulation platform. A high-level (SystemC)
testbench and FPGA synthesizable hardware transactor models are developed for the scan-chain ISCAS89
S400 benchmark circuit for high-speed communication between the host CPU workstation and the FPGA
emulator. The emulation results are compared to other verification methodologies (RTL Simulation,
Simulation Acceleration, and Transaction-based emulation), and found to be 82% faster than regular RTL
simulation. In addition, the emulation runs in the MHz speed range, allowing the incorporation of software
applications, drivers, and operating systems, as opposed to the Hz range in RTL simulation or submegahertz
range as accomplished in transaction-based emulation. In addition, the integration of scan
testing and acceleration/emulation platforms allows more complex DFT methods to be developed and
tested on a large scale system, decreasing the time to market for products.
This document provides an overview of JTAG (Joint Test Action Group) devices, including their basic chip architecture, capabilities, and common system configurations. It describes the JTAG standard architecture which defines boundary-scan cells and a test access port. It also summarizes common JTAG instructions, the TAP controller state machine, typical JTAG interfaces and connectors, BSDL description files, and how JTAG devices can be daisy-chained to form a scan chain for testing connections between components.
To Get any Project for CSE, IT ECE, EEE Contact Me @ 09666155510, 09849539085 or mail us - ieeefinalsemprojects@gmail.com-Visit Our Website: www.finalyearprojects.org
To Get any Project for CSE, IT ECE, EEE Contact Me @ 09666155510, 09849539085 or mail us - ieeefinalsemprojects@gmail.com-Visit Our Website: www.finalyearprojects.org
JTAG
https://www.corelis.com/education/tutorials/jtag-tutorial/
JTAG is an integrated method for testing interconnects on printed circuit boards (PCBs) that are implemented at the integrated circuit (IC) level. JTAG is commonly referred to as boundary-scan and defined by the Institute of Electrical and Electronic Engineers (IEEE) 1149.1, which originally began as an integrated method for testing interconnects on printed circuit boards (PCBs) implemented at the integrated circuit (IC) level.
Advancing VLSI Design Reliability: A Comprehensive Examination of Embedded De...IRJET Journal
The document summarizes research on Embedded Deterministic Test (EDT) logic insertion's impact on VLSI designs. Key findings include:
1) EDT insertion enhances test and fault coverage, but also increases the number of test patterns required.
2) There are significant shifts in fault sub-classes like untestable faults and tied cells after EDT insertion, highlighting its nuanced effects.
3) Results provide empirical evidence for designers to optimize testability by strategically integrating EDT logic.
Microcontroller Based Testing of Digital IP-CoreVLSICS Design
Testing core based System on Chip [1] is a challenge for the test engineers. To test the complete SOC at one time with maximum fault coverage, test engineers prefer to test each IP-core separately. At speed testing using external testers is more expensive because of gigahertz processor. The purpose of this paper is to develop cost efficient and flexible test methodology for testing digital IP-cores [2]. The prominent feature of the approach is to use microcontroller to test IP-core. The novel feature is that there is no need of test pattern generator and output response analyzer as microcontroller performs the function of both. This approach has various advantages such as at speed testing, low cost, less area overhead and greater flexibility since most of the testing process is based on software.
This document discusses using JTAG (Joint Test Action Group) testing to test system-on-chip (SoC) interconnects. It proposes adding boundary scan cells to interconnect wires to test for faults like opens, shorts, and crosstalk-induced signal integrity issues. An Integrity Loss Sensor Cell is described that can detect voltage and delay violations. Experimental results show these sensor cells add only modest area overhead. The approach extends standard JTAG to enable comprehensive testing of SoC interconnects.
Printed circuit board (PCB) functional tester performs critical validation process performed on manufactured PCBs to verify the board’s functionality meets the original design requirements and specifications. Thorough functional testing helps ensure the reliability and performance of PCBs before deployment.
Testing coverage-
Validate continuity and isolation: Verify electrical connectivity and isolation between traces using in-circuit testing (ICT) and flying probe testing to check for opens and shorts.
Confirm impedance: Match measured impedance of traces and interconnects to design values to prevent signal degradation.
Verify power integrity: Check PCB operation under different power conditions to avoid errors from insufficient power delivery.
Assess signal integrity: Examine signal quality under high-speed conditions to prevent distortion and interference.
Test functionality: Stimulate the PCB with input signals and power to check outputs match expected responses based on design.
Confirm robustness: Subject PCB to temperature cycling, vibration, shock to validate resilience and durability.
Execute regression testing: Retest functionality after modifications to ensure no side effects.
Star Test Topology for Testing Printed Circuits BoardsIRJET Journal
This document presents a new testing methodology called star test topology (STT) for testing printed circuit boards. STT aims to address limitations of traditional testing methods such as being manual, limited by chip complexity, and requiring expensive test equipment. STT involves developing a shared test access port over the entire PCB and redesigning on-chip design-for-testability circuitry. In STT, devices under test are connected in a star topology with a central test access port acting as a hub. This allows test patterns to be broadcast to devices and results returned, with minimal pins/resources required. The document describes simulating STT using circuit design software and capturing output signals with a logic analyzer.
System Development for Verification of General Purpose Input OutputRSIS International
In SoC no. of IP block inside it depends upon specific
application, increase in the Ip block increases no. of digital
control lines causes increase in the size of the chip. GPIO helps
internal IP blocks to share digital control lines using MUX and
avoids additional circuitry. Since design productivity cannot
follow the pace of nanoelectronics technology innovation, it has
been required to develop various design methodologies to
overcome this gap. In system level design, various design
methodologies such as IP reuse, automation of platform
integration and verification process have been proposed. GPIO
configuration register decides in which mode system has to work
GPIO has four modes i.e input, output, functional, interrupt. As
per operation particular mode is selected and the operation get
performed. Devices with pin scarcity like integrated circuits such
as system-on-a-chip, embedded and custom hardware, and
programmable logic devices cannot compromise with size can
perform well without additional digital control line circuitry.
The document discusses various computer hardware troubleshooting tools, including in-circuit emulators, logic state/timing analyzers, digital multimeters, and cathode-ray oscilloscopes. It provides details on what each tool is used for and how it functions. In-circuit emulators are used to debug software on embedded systems by allowing observation and alteration of the system. Logic analyzers capture and display digital signals and can trigger on patterns. Digital multimeters combine voltage, current and resistance measurements. Cathode-ray oscilloscopes provide time and amplitude measurements of voltage signals.
Automatic Analyzing System for Packet Testing and Fault MappingIRJET Journal
This document proposes an Automatic Analyzing System for Packet Testing and Fault Mapping. The system would read router configurations and generate a minimum set of test packets to check every link and rule in the network. Test packets would be sent periodically, and any detected failures would trigger fault localization. The system uses symbolic execution, a technique from compilers, to check more general network properties than just basic reachability. It aims to track possible packet field values as packets travel through the network. This approach could help automate network testing and debugging, which are currently difficult tasks relying on network administrators' expertise.
Design of IEEE 1149.1 Tap Controller IP Core csandit
An implementation of IEEE 1149.1 TAP controller is presented in this paper. JTAG is an
established technology and industry standard for on-chip boundary scan testing of SoCs. JTAG
TAP controllers are becoming a delivery and control mechanism for Design For Test. The
objective of this work is to design and implement a TAP controller IP core compatible with
IEEE 1149.1-2013 revision of the standard. The test logic architecture also includes the Test
Mode Persistence controller and its associated logic. This work is expected to serve as a ready
to use module that can be directly inserted in to a new digital IC designs with little
modifications.
DESIGN OF IEEE 1149.1 TAP CONTROLLER IP COREcscpconf
An implementation of IEEE 1149.1 TAP controller is presented in this paper. JTAG is an established technology and industry standard for on-chip boundary scan testing of SoCs. JTAG
TAP controllers are becoming a delivery and control mechanism for Design For Test. The objective of this work is to design and implement a TAP controller IP core compatible with IEEE 1149.1-2013 revision of the standard. The test logic architecture also includes the Test Mode Persistence controller and its associated logic. This work is expected to serve as a ready to use module that can be directly inserted in to a new digital IC designs with little modifications.
The document discusses JTAG (Joint Test Action Group), which defines a standard interface for debugging, programming, and testing microcontrollers and other components. JTAG enables components to be tested and programmed using a single connector and allows controlling the clock cycles of a microcontroller through software, enabling hardware breakpoints. It works by shifting test vectors into boundary scan registers connected to input/output pins to test connections between components.
Michael J. Ledford has a Bachelor of Science in Computer Engineering and Electrical Engineering from North Carolina State University. He has experience in hardware and software design, verification, and testing roles at Qualcomm, Intel, and Cisco. His skills include SystemVerilog, Perl/Python scripting, hardware debugging, and signal integrity analysis. He is looking for a role as a system hardware/software designer and tester in the consumer electronics industry.
We are good IEEE java projects development center in Chennai and Pondicherry. We guided advanced java technologies projects of cloud computing, data mining, Secure Computing, Networking, Parallel & Distributed Systems, Mobile Computing and Service Computing (Web Service).
For More Details:
http://jpinfotech.org/final-year-ieee-projects/2014-ieee-projects/java-projects/
This document describes a prototype application for remotely controlling parameters such as gain and filter frequency in electronics and data acquisition systems using LabVIEW software and a CAN interface. The prototype uses a ZC702 evaluation board containing an XC7Z020CLG484 SoC chip with an ARM Cortex A9 processor, FPGA, and integrated CAN controller. LabVIEW provides the user interface. CAN packets are used to communicate control signals and data between the PC, ZC702 SoC, and an electronics board. The SoC processes data and the FPGA generates control signals based on the data. Testing on the ZC702 board imitated hardware using switches to demonstrate functionality.
3 Simple Steps To Buy Verified Payoneer Account In 2024SEOSMMEARTH
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If You Want To More Information just Contact Now:
Skype: SEOSMMEARTH
Telegram: @seosmmearth
Gmail: seosmmearth@gmail.com
To Get any Project for CSE, IT ECE, EEE Contact Me @ 09666155510, 09849539085 or mail us - ieeefinalsemprojects@gmail.com-Visit Our Website: www.finalyearprojects.org
To Get any Project for CSE, IT ECE, EEE Contact Me @ 09666155510, 09849539085 or mail us - ieeefinalsemprojects@gmail.com-Visit Our Website: www.finalyearprojects.org
JTAG
https://www.corelis.com/education/tutorials/jtag-tutorial/
JTAG is an integrated method for testing interconnects on printed circuit boards (PCBs) that are implemented at the integrated circuit (IC) level. JTAG is commonly referred to as boundary-scan and defined by the Institute of Electrical and Electronic Engineers (IEEE) 1149.1, which originally began as an integrated method for testing interconnects on printed circuit boards (PCBs) implemented at the integrated circuit (IC) level.
Advancing VLSI Design Reliability: A Comprehensive Examination of Embedded De...IRJET Journal
The document summarizes research on Embedded Deterministic Test (EDT) logic insertion's impact on VLSI designs. Key findings include:
1) EDT insertion enhances test and fault coverage, but also increases the number of test patterns required.
2) There are significant shifts in fault sub-classes like untestable faults and tied cells after EDT insertion, highlighting its nuanced effects.
3) Results provide empirical evidence for designers to optimize testability by strategically integrating EDT logic.
Microcontroller Based Testing of Digital IP-CoreVLSICS Design
Testing core based System on Chip [1] is a challenge for the test engineers. To test the complete SOC at one time with maximum fault coverage, test engineers prefer to test each IP-core separately. At speed testing using external testers is more expensive because of gigahertz processor. The purpose of this paper is to develop cost efficient and flexible test methodology for testing digital IP-cores [2]. The prominent feature of the approach is to use microcontroller to test IP-core. The novel feature is that there is no need of test pattern generator and output response analyzer as microcontroller performs the function of both. This approach has various advantages such as at speed testing, low cost, less area overhead and greater flexibility since most of the testing process is based on software.
This document discusses using JTAG (Joint Test Action Group) testing to test system-on-chip (SoC) interconnects. It proposes adding boundary scan cells to interconnect wires to test for faults like opens, shorts, and crosstalk-induced signal integrity issues. An Integrity Loss Sensor Cell is described that can detect voltage and delay violations. Experimental results show these sensor cells add only modest area overhead. The approach extends standard JTAG to enable comprehensive testing of SoC interconnects.
Printed circuit board (PCB) functional tester performs critical validation process performed on manufactured PCBs to verify the board’s functionality meets the original design requirements and specifications. Thorough functional testing helps ensure the reliability and performance of PCBs before deployment.
Testing coverage-
Validate continuity and isolation: Verify electrical connectivity and isolation between traces using in-circuit testing (ICT) and flying probe testing to check for opens and shorts.
Confirm impedance: Match measured impedance of traces and interconnects to design values to prevent signal degradation.
Verify power integrity: Check PCB operation under different power conditions to avoid errors from insufficient power delivery.
Assess signal integrity: Examine signal quality under high-speed conditions to prevent distortion and interference.
Test functionality: Stimulate the PCB with input signals and power to check outputs match expected responses based on design.
Confirm robustness: Subject PCB to temperature cycling, vibration, shock to validate resilience and durability.
Execute regression testing: Retest functionality after modifications to ensure no side effects.
Star Test Topology for Testing Printed Circuits BoardsIRJET Journal
This document presents a new testing methodology called star test topology (STT) for testing printed circuit boards. STT aims to address limitations of traditional testing methods such as being manual, limited by chip complexity, and requiring expensive test equipment. STT involves developing a shared test access port over the entire PCB and redesigning on-chip design-for-testability circuitry. In STT, devices under test are connected in a star topology with a central test access port acting as a hub. This allows test patterns to be broadcast to devices and results returned, with minimal pins/resources required. The document describes simulating STT using circuit design software and capturing output signals with a logic analyzer.
System Development for Verification of General Purpose Input OutputRSIS International
In SoC no. of IP block inside it depends upon specific
application, increase in the Ip block increases no. of digital
control lines causes increase in the size of the chip. GPIO helps
internal IP blocks to share digital control lines using MUX and
avoids additional circuitry. Since design productivity cannot
follow the pace of nanoelectronics technology innovation, it has
been required to develop various design methodologies to
overcome this gap. In system level design, various design
methodologies such as IP reuse, automation of platform
integration and verification process have been proposed. GPIO
configuration register decides in which mode system has to work
GPIO has four modes i.e input, output, functional, interrupt. As
per operation particular mode is selected and the operation get
performed. Devices with pin scarcity like integrated circuits such
as system-on-a-chip, embedded and custom hardware, and
programmable logic devices cannot compromise with size can
perform well without additional digital control line circuitry.
The document discusses various computer hardware troubleshooting tools, including in-circuit emulators, logic state/timing analyzers, digital multimeters, and cathode-ray oscilloscopes. It provides details on what each tool is used for and how it functions. In-circuit emulators are used to debug software on embedded systems by allowing observation and alteration of the system. Logic analyzers capture and display digital signals and can trigger on patterns. Digital multimeters combine voltage, current and resistance measurements. Cathode-ray oscilloscopes provide time and amplitude measurements of voltage signals.
Automatic Analyzing System for Packet Testing and Fault MappingIRJET Journal
This document proposes an Automatic Analyzing System for Packet Testing and Fault Mapping. The system would read router configurations and generate a minimum set of test packets to check every link and rule in the network. Test packets would be sent periodically, and any detected failures would trigger fault localization. The system uses symbolic execution, a technique from compilers, to check more general network properties than just basic reachability. It aims to track possible packet field values as packets travel through the network. This approach could help automate network testing and debugging, which are currently difficult tasks relying on network administrators' expertise.
Design of IEEE 1149.1 Tap Controller IP Core csandit
An implementation of IEEE 1149.1 TAP controller is presented in this paper. JTAG is an
established technology and industry standard for on-chip boundary scan testing of SoCs. JTAG
TAP controllers are becoming a delivery and control mechanism for Design For Test. The
objective of this work is to design and implement a TAP controller IP core compatible with
IEEE 1149.1-2013 revision of the standard. The test logic architecture also includes the Test
Mode Persistence controller and its associated logic. This work is expected to serve as a ready
to use module that can be directly inserted in to a new digital IC designs with little
modifications.
DESIGN OF IEEE 1149.1 TAP CONTROLLER IP COREcscpconf
An implementation of IEEE 1149.1 TAP controller is presented in this paper. JTAG is an established technology and industry standard for on-chip boundary scan testing of SoCs. JTAG
TAP controllers are becoming a delivery and control mechanism for Design For Test. The objective of this work is to design and implement a TAP controller IP core compatible with IEEE 1149.1-2013 revision of the standard. The test logic architecture also includes the Test Mode Persistence controller and its associated logic. This work is expected to serve as a ready to use module that can be directly inserted in to a new digital IC designs with little modifications.
The document discusses JTAG (Joint Test Action Group), which defines a standard interface for debugging, programming, and testing microcontrollers and other components. JTAG enables components to be tested and programmed using a single connector and allows controlling the clock cycles of a microcontroller through software, enabling hardware breakpoints. It works by shifting test vectors into boundary scan registers connected to input/output pins to test connections between components.
Michael J. Ledford has a Bachelor of Science in Computer Engineering and Electrical Engineering from North Carolina State University. He has experience in hardware and software design, verification, and testing roles at Qualcomm, Intel, and Cisco. His skills include SystemVerilog, Perl/Python scripting, hardware debugging, and signal integrity analysis. He is looking for a role as a system hardware/software designer and tester in the consumer electronics industry.
We are good IEEE java projects development center in Chennai and Pondicherry. We guided advanced java technologies projects of cloud computing, data mining, Secure Computing, Networking, Parallel & Distributed Systems, Mobile Computing and Service Computing (Web Service).
For More Details:
http://jpinfotech.org/final-year-ieee-projects/2014-ieee-projects/java-projects/
This document describes a prototype application for remotely controlling parameters such as gain and filter frequency in electronics and data acquisition systems using LabVIEW software and a CAN interface. The prototype uses a ZC702 evaluation board containing an XC7Z020CLG484 SoC chip with an ARM Cortex A9 processor, FPGA, and integrated CAN controller. LabVIEW provides the user interface. CAN packets are used to communicate control signals and data between the PC, ZC702 SoC, and an electronics board. The SoC processes data and the FPGA generates control signals based on the data. Testing on the ZC702 board imitated hardware using switches to demonstrate functionality.
3 Simple Steps To Buy Verified Payoneer Account In 2024SEOSMMEARTH
Buy Verified Payoneer Account: Quick and Secure Way to Receive Payments
Buy Verified Payoneer Account With 100% secure documents, [ USA, UK, CA ]. Are you looking for a reliable and safe way to receive payments online? Then you need buy verified Payoneer account ! Payoneer is a global payment platform that allows businesses and individuals to send and receive money in over 200 countries.
If You Want To More Information just Contact Now:
Skype: SEOSMMEARTH
Telegram: @seosmmearth
Gmail: seosmmearth@gmail.com
How are Lilac French Bulldogs Beauty Charming the World and Capturing Hearts....Lacey Max
“After being the most listed dog breed in the United States for 31
years in a row, the Labrador Retriever has dropped to second place
in the American Kennel Club's annual survey of the country's most
popular canines. The French Bulldog is the new top dog in the
United States as of 2022. The stylish puppy has ascended the
rankings in rapid time despite having health concerns and limited
color choices.”
Unveiling the Dynamic Personalities, Key Dates, and Horoscope Insights: Gemin...my Pandit
Explore the fascinating world of the Gemini Zodiac Sign. Discover the unique personality traits, key dates, and horoscope insights of Gemini individuals. Learn how their sociable, communicative nature and boundless curiosity make them the dynamic explorers of the zodiac. Dive into the duality of the Gemini sign and understand their intellectual and adventurous spirit.
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[To download this presentation, visit:
https://www.oeconsulting.com.sg/training-presentations]
This PowerPoint compilation offers a comprehensive overview of 20 leading innovation management frameworks and methodologies, selected for their broad applicability across various industries and organizational contexts. These frameworks are valuable resources for a wide range of users, including business professionals, educators, and consultants.
Each framework is presented with visually engaging diagrams and templates, ensuring the content is both informative and appealing. While this compilation is thorough, please note that the slides are intended as supplementary resources and may not be sufficient for standalone instructional purposes.
This compilation is ideal for anyone looking to enhance their understanding of innovation management and drive meaningful change within their organization. Whether you aim to improve product development processes, enhance customer experiences, or drive digital transformation, these frameworks offer valuable insights and tools to help you achieve your goals.
INCLUDED FRAMEWORKS/MODELS:
1. Stanford’s Design Thinking
2. IDEO’s Human-Centered Design
3. Strategyzer’s Business Model Innovation
4. Lean Startup Methodology
5. Agile Innovation Framework
6. Doblin’s Ten Types of Innovation
7. McKinsey’s Three Horizons of Growth
8. Customer Journey Map
9. Christensen’s Disruptive Innovation Theory
10. Blue Ocean Strategy
11. Strategyn’s Jobs-To-Be-Done (JTBD) Framework with Job Map
12. Design Sprint Framework
13. The Double Diamond
14. Lean Six Sigma DMAIC
15. TRIZ Problem-Solving Framework
16. Edward de Bono’s Six Thinking Hats
17. Stage-Gate Model
18. Toyota’s Six Steps of Kaizen
19. Microsoft’s Digital Transformation Framework
20. Design for Six Sigma (DFSS)
To download this presentation, visit:
https://www.oeconsulting.com.sg/training-presentations
The Most Inspiring Entrepreneurs to Follow in 2024.pdfthesiliconleaders
In a world where the potential of youth innovation remains vastly untouched, there emerges a guiding light in the form of Norm Goldstein, the Founder and CEO of EduNetwork Partners. His dedication to this cause has earned him recognition as a Congressional Leadership Award recipient.
Starting a business is like embarking on an unpredictable adventure. It’s a journey filled with highs and lows, victories and defeats. But what if I told you that those setbacks and failures could be the very stepping stones that lead you to fortune? Let’s explore how resilience, adaptability, and strategic thinking can transform adversity into opportunity.
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1. What is JTAG?
Introduction
JTAG is an integrated method for testing interconnects on printed circuit boards
(PCBs) that are implemented at the integrated circuit (IC) level. Since its introduction
as an industry standard in 1990, JTAG has continuously grown in adoption,
popularity, and usefulness—even today, new revisions and supplements to the IEEE
Std.-1149.1 standard are being developed and implemented. This document is a brief
introduction to the nature and history of JTAG, from its introduction to new
extensions in current development.
While originally developed to address the needs of testing printed circuit board
assembly (PCBA) interconnects, JTAG test methods can be used to address many
needs beyond simple structural test. This overview will briefly examine popular types
of JTAG tests and applications.
JTAG Test Basics
Most JTAG/boundary-scan systems are composed of two main components: a test
program generator for test development and creation, and a test program executive for
running tests and reporting results.
JTAG Test Program Generator
Test program generators accept computer aided design (CAD) data as input in the
form of a netlist, bill of materials, schematic, and layout information. The test program
generator (TPG) uses the information provided in these files, along with guidance from
the test developer, to automatically create test patterns for fault detection and
isolation using JTAG-testable nets on the PCB. Full-featured test program generation
software will generally also include the capability to automatically generate tests for
non-scannable components including logic clusters and memories that are connected
to boundary-scan devices. A sample of faults that can be detected with automatically
generated tests is shown in Figure 1.
JTAG Test Program Executive
Test program executives are used to run the tests created by the test program
generation software. The test executive interfaces with the JTAG hardware to execute
test patterns on a unit under test (UUT), then compares the results with expected
values and attempts to diagnose any failures. Modern test executives include
advanced features such as flow control, support for third party test types, and often
include an application programming interface (API) for integration with additional test
systems or development of simplified operator interfaces.
2. JTAG Benefits
The continuous drive toward higher density interconnects and finer pitch ball-grid-
array (BGA) components has fueled the need for test strategies that minimize the
number of test points required. By embedding the test logic within the IC itself and
limiting the physical interface to just a few signals, JTAG/boundary-scan presents an
elegant solution to testing, debugging, and diagnosing modern electronic systems.
Today, JTAG provides the access mechanism for a variety of different system
operations. Just some of the benefits provided by JTAG are:
Reuse through the product life cycle. The simple access mechanism provided by the
JTAG TAP can be used at all stages of the product lifecycle—from benchtop prototype
debugging to high volume manufacturing and even in the field.
Test point reduction. JTAG provides test access through just 4 pins (2 pins for IEEE-
1149.7 compliant devices), reducing the number of test points required, resulting in
lower PCB fabrication costs and reduced test fixture complexity.
Independent observation and control. Boundary-scan tests operate independently of
the system logic, meaning they can be used to diagnose systems that may not operate
functionally.
3. Extensibility. JTAG has seen continuous development and new applications are
frequently being discovered. Additional standards have been developed to address AC-
coupled testing, reduced pin counts, and control of test instruments embedded within
ICs.
JTAG Scan Chain Infrastructure Test
JTAG testing usually begins by checking the underlying infrastructure to ensure that
all devices are connected and test capabilities are operational. Test patterns are used
to exercise the instruction register and boundary-scan register for comparison against
expected lengths and values. If present, device ID codes can also be read and
compared against expected values to ensure that the correct component has been
placed.
JTAG Interconnect, Bus Wire, and Resistor Tests
After verifying that the scan chain is working properly, test patterns can be used to
verify interconnectivity between system components. Nets that involve three or more
boundary-scan pins represent a special case, called a bus wire, where additional
patterns can be used to isolate faults to a specific pin, as shown in Figure 2. During a
buswire test, boundary-scan driver pins are tested one at a time to ensure that all
possible opens are tested.
Devices that are transparent to DC signals can be modeled as “short” signal paths and
included in the test; for example, series resistors can be tested for component
presence and open faults, while directional buffers can be constrained and tested to
ensure that signals sampled at the buffer output pins match the signals that are
applied to the buffer input pins. Additionally, tests for AC-coupled signals can be
integrated with interconnect and buswire tests in systems with IEEE-1149.6 standard
components, allowing capacitors to be tested for AC signal transparency.
Special tests can also be used to check pull-up and pull-down resistors, ensuring that
resistors are present in the assembled system in addition to testing the nets for open
and short faults. To accomplish this, resistors are tested by first driving the signal to a
state opposite the pulled value. The net is then tri-stated, allowing the resistor to pull
the signal back to the original state. Finally, the signal is sampled and the value is
compared to the expected.
JTAG Embedded Test
Many modern processors use JTAG as the main interface for on-chip debugging
(OCD), allowing the processor to be controlled over the JTAG port within an embedded
system.
4. Using this same interface, the JTAG port can be used to initialize a processor,
download and run a test program, and then obtain results; this test technique is a
fast, convenient method for developing and executing peripheral tests and in-system-
programming operations in embedded systems.
Because these tests run at the system processor speed, defects that may not be
identified during low-speed execution can be detected.
In-System-Programming with JTAG
In addition to test applications, JTAG is also frequently used as the primary method to
program devices such as flash memory and CPLDs. To program flash devices, the pins
of a connected boundary-scan-compatible component can be used to control the
memory and erase, program, and verify the component using the boundary-scan
chain. FPGA and CPLD devices that support IEEE-1532 standard instructions can be
accessed and programmed directly using the JTAG port.
Faster performance can be achieved using a CPU or FPGA to program the flash. In
these cases, a small flash programming application is downloaded to the controlling
device over the JTAG port, which is then used to interface between the test system and
the flash programming application running on the embedded system. The program
can run at much higher speeds than boundary-scan, increasing production
throughput and rivaling or surpassing the speeds of USB and Ethernet-based
programming solutions, without requiring an operating system or high-level software
be present on the embedded system.
5. The IEEE-1149.1 JTAG team had the foresight to design an extensible standard—one
that could employ additional data registers for many different applications. As a
result, JTAG has grown from its original roots for board testing into a ubiquitous port
that can be used for diverse applications such as in-system-programming, on-chip
debugging, and more recently control of instruments embedded within ICs.
History of JTAG
In the 1980s, the Joint Test Action Group (JTAG) set out to develop a specification for
boundary-scan testing that was standardized in 1990 as the IEEE Std. 1149.1-1990.
A few years later in 1993, a new revision to the standard—1149.1a—was introduced to
clarify, correct, and enhance the original specification. An additional supplement,
1149.1b, was published in 1994 to add Boundary-Scan Description Language (BSDL)
to the standard, paving the way for fast, automated test development and spurring
continuous adoption by major electronics producers all over the world. The lessons
that were learned became formalized in an update to the core standard in 2001 and
IEEE-1149.1-2001 was published.
As new applications of JTAG were discovered, new standards were developed to extend
the capabilities of JTAG. Standards such as the IEEE-1149.5 module test and
maintenance bus standard in 1995 and the IEEE-1149.4 standard for mixed-signal
testing in 1999 were met with low adoption rates and are not widely used at present.
The IEEE-1149.6 standard introduced in 2003, on the other hand, began with slow
adoption but has since become standard in many ICs as the technology it addressed—
high-speed, AC-coupled signals—became a common feature of electronic systems.
IEEE-1149.7, published in 2009 to address the need for JTAG in low-pin-count
systems, is now standard on many popular microcontrollers.
6. JTAG Technology
JTAG is commonly referred to as boundary-scan and defined by the Institute of
Electrical and Electronic Engineers (IEEE) 1149.1, which originally began as an
integrated method for testing interconnects on printed circuit boards (PCBs)
implemented at the integrated circuit (IC) level. As PCBs grew in complexity and
density—a trend that continues today—limitations in the traditional test methods of
in-circuit testers (ICTs) and bed of nails fixtures became evident. Packaging formats,
specifically Ball Grid Array (BGA, depicted in Figure 1) and other fine pitch
components, designed to meet ever-increasing physical space constraints, also led to a
loss of physical access to signals.
These new technology developments led to dramatic increases in costs related to
designing and building bed of nails fixtures; at the same time, circuit board test
coverage also suffered. JTAG/boundary-scan presented an elegant solution to this
problem: build functionality into the IC to assist in testing assembled electronic
systems.
Today, JTAG is used for everything from testing interconnects and functionality on ICs
to programming flash memory of systems deployed in the field and everything in-
between. JTAG and its related standards have been and will continue to be extended
to address additional challenges in electronic test and manufacturing, including test of
3D ICs and complex, hierarchical systems.
What is JTAG?
Additional standards have also been published to add specific test capabilities. In
2002, the IEEE-1532 standard for in-system configuration of programmable devices
was released and is now a common feature of FPGAs and their supporting software
systems. IEEE-1581 was developed in 2011 to provide a convenient method of testing
interconnects of high-speed memories with slow-speed test vectors; a version of this
capability is implemented in some DDR4 memory components. To address the new
application of combined capacitive sensing and boundary-scan test, IEEE-1149.8.1
was published in 2012. The extensibility of JTAG has been proven time and again.
More recently, efforts have been made to standardize JTAG access to instruments
embedded within ICs. The IEEE-1149.1 standard was updated once more in 2013 for
some housekeeping and to add extensions to access these instruments. Just one year
later, an alternative standard for accessing these instruments, IEEE-1687, was
published. Looking to the future, industry activities to extend JTAG into 3D-IC testing,
system-level testing, and high-speed testing are already underway, proving that the
versatility and extensibility of JTAG is here to stay.
7. How Does JTAG Work?
The JTAG/boundary-scan test architecture was originally developed as a method to
test interconnects between ICs mounted on a PCB without using physical test probes.
Boundary-scan cells created using multiplexer and latch circuits are attached to each
pin on the device. These cells, embedded in the device, can capture data from pin or
core logic signals as well as force data onto pins. Captured data is serially shifted out
through the JTAG Test Access Port (TAP) and can be compared to expected values to
determine a pass or fail result. Forced test data is serially shifted into the boundary-
scan cells. All of this is controlled from a serial data path called the scan path or scan
chain.
Because each pin can be individually controlled, boundary-scan eliminates a large
number of test vectors that would normally needed to properly initialize sequential
logic. Using JTAG, tens or hundreds of test vectors may do the job that had previously
required thousands. Boundary-scan enables shorter test times, higher test coverage,
increased diagnostic capability, and lower capital equipment cost.
The principles of interconnect test using boundary-scan components are illustrated in
Figure 3. Two boundary-scan compliant devices are connected with four nets. The first
device includes four outputs that are driving the four inputs of the other with
predefined values. In this case, we assume that the circuit includes two faults: a short
fault between Net2 and Net3, and an open fault on Net4. We will also assume that a
short between two nets behaves as a wired-AND and an open fault behaves as a stuck-
at-1 condition.
To detect and isolate defects, the tester shifts the patterns shown in Figure 3 into the
first boundary-scan register and applies these patterns to the inputs of the second
device.
Of course, interconnect testing is just one of many uses of JTAG—the aforementioned
JTAG TAP has been extended to support additional capabilities including in-system-
programming (ISP), in-circuit-emulation (ICE), embedded functional testing, and many
more. The standard accounts for the addition of device-specific instructions and
registers that can be used to interact with additional IC capabilities. For example, a
microprocessor device may have embedded functionality for data download, program
execution, or register peek-and-poke activities accessible using JTAG TAP; using the
same tools, FPGA and CPLD devices can be erased, configured, read-back, and
controlled using JTAG instructions through the IEEE-1532 standard. More recently,
embedded IC instrumentation—from instruments that measure voltage and current to
devices that can execute high-speed test on the chip—has used the JTAG TAP as the
access mechanism, providing new visibility into the IC and further expanding the
scope of JTAG testing.The input values captured in the boundary-scan register of the
second device are shifted out and compared to the expected values. In this case, the
results, underlined and marked in red on Net2, Net3, and Net4, do not match the
8. expected values and the tester tags these nets as faulty. Sophisticated algorithms are
used to automatically generate the minimal set of test vectors to detect, isolate, and
diagnose faults to specific nets, devices, and pins.
JTAG for Product Life-Cycle Phases and Applications
While JTAG/boundary-scan was originally regarded as a method to test electronic
products during the production phase, new developments and applications of the
IEEE-1149.1 standard have enabled the use of JTAG in many other product life cycle
phases. Boundary-scan technology is commonly applied to product design, prototype
debugging, and field service as depicted in Figure 4.
The same test suite used to validate design testability can adapted and utilized for
board bring-up, high-volume manufacturing test, troubleshooting and repairs, and
even field service and reprogramming. The versatility of JTAG/boundary-scan tools
delivers immense value to organizations beyond the production phase.
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