This document provides an overview of X-ray diffraction (XRD) and X-ray fluorescence (XRF) techniques. It discusses the principles, methods, applications, advantages, and limitations of both XRD and XRF. XRD is described as a technique that uses X-ray scattering from crystalline materials to determine their atomic structure, while XRF involves bombarding a material with X-rays and analyzing the characteristic secondary X-rays emitted to determine its elemental composition. A variety of applications are outlined for each technique in fields such as materials science, geology, and chemistry.