XRD and XRF are analytical techniques used to characterize materials. XRD determines the crystalline structure of materials by measuring diffraction patterns of X-rays. It can identify phases and minerals present in a sample. XRF determines the elemental composition of materials by detecting X-ray fluorescence emitted from a sample. Both techniques are non-destructive and provide qualitative and quantitative analysis of materials' composition and structure.

1. XRD And XRF
PRESENTED BY :-
DR. REKHA RAM
P.G. 1ST YEAR
Guided BY :-
DR. AVADHESH KUMAR BHATT
PROFESSOR & HOD
M.D. [Ayu.]
POST GRADUATE DEPARTMENT OF
RAS SHASTRA AND BHAISHAJYA KALPANA
M.M.M. GOVERNMENT AYURVED COLLEGE,
UDAIPUR (RAJ.)

2. What is XRD And XRF :-
 X-ray Fluorescence (XRF) and X-ray Diffraction (XRD) Analyzers
provide qualitative and quantitative material characterization for
detection, identification, analysis, quality control, process control,
regulatory compliance, and screening, for metals and alloys,
mining and geology, scrap and recycling, environmental and
consumer safety, education and research, and general
manufacturing.
 X-ray diffraction analysis (XRD) is a technique used in materials
science to determine the crystallographic structure of a material.
XRD works by irradiating a material with incident X-rays and then
measuring the intensities and scattering angles of the X-rays that
leave the material.
 XRD identifies and measures the presence and amounts of
minerals and their species in the sample, as well as identify phases.

3.  XRD is a versatile and nondestructive analytical technique that
reveals detailed structural and chemical information about the
crystallography of materials.
 XRD looks at a crystalline material’s characteristic X-ray scattering,
or diffraction pattern, which reveals the material’s atomic structure.
 Qualitative analysis is possible by comparing the XRD pattern of an
unknown material with a library of known patterns.
 A primary use of XRD analysis is the identification of materials
based on their diffraction pattern. As well as phase identification,
XRD also yields information on how the actual structure deviates
from the ideal one, owing to internal stresses and defects.

4. Basic Principal Of XRD :-
 X-ray diffraction is based on constructive interference of
monochromatic x-rays and a crystalline sample. These x-rays
are generated by a cathode ray tube, filtered to produce
monochromatic radiation ,collimated to concentrate and
directed towards the sample. The interaction of incident rays
with the sample produces constructive interference when
conditions satisfy Bragg’s law.
XRD determines the minerology of a sample i.e. phase
identification

5. BRAGG’s EQUATION :-

6.  The path difference between ray 1 and ray 2 = 2d Sinθ
 For constructive interference: nλ = 2d Sinθ
 “Constructive interference of the reflected beams emerging from
two different planes will take place if the path lengths of two rays
is equal to whole number of wavelengths”.
 This is called as BRAGG’S LAW.
INSTRUMENTATION :-
 Production of x-rays
 Collimator
 Monochromator
a.Filter
b.Crystal monochromator

7.  Detectors
a.Photographic methods
b.Counter methods

8. Advantages and Disadvantages of XRD :-
Advantage :-
 It is a rapid and powerful technique for identifying unknown
minerals and materials
 It only requires preparation of a minimal sample for analysis
 Interpreting the resulting data is relatively straightforward
 XRD measurement instruments are widely available
Disadvantage :-
 To best identify an unknown powder material, the sample should be
homogeneous.
 Typically XRD analysis requires access to standard reference data .

9.  Preparation of samples often requires grinding them down to a
powder
 If the crystal sample is non-isometric, then the indexing of patterns
can be complex when determining unit cells
Uses Of XRD :-
 Geology
 Engineering
 Biology
 Material science
 Environmental science
 Battery Research
 Thin-film coatings
 Electronics
 Pharmaceuticals

10. •XRF :- X-RAY FLUORESCENCE :-
• XRF determines the chemistry of a sample i.e. elemental composition
• X-ray fluorescence (XRF) spectrometry is an elemental analysis
technique with broad application in science and industry.
• XRF is routinely used for the simultaneous determination of elemental
composition and film thickness.
• Modern XRF instruments are capable of analyzing solid, liquid, and
thin-film samples for both major and trace (ppm-level) components.
• The analysis is rapid and usually sample preparation is minimal or not
required at all.
• XRF will produces and assay by giving information on the chemical
composition of your sample without indicating what phases they are
present in your sample.

11. Basic Principal Of XRF :-
 XRF is based on the principle that individual atoms, when excited
by an external energy source, emit X-ray photons of a
characteristic energy or wavelength. By counting the number of
photons of each energy emitted from a sample, the elements
present may be identified and quantitated.
 When an electron beam of high energy strikes a material, one of
the results of the interaction is the emission of photons which
have a broad continuum of energies. This radiation, called
“braking radiation”, is the result of the deceleration of the
electrons inside the material.

12.  Another result of the interaction between the electron beam and the
material is the ejection of photoelectrons from the inner shells of the
atoms making up the material. These photoelectrons leave with a
kinetic energy (E-φ) which is the difference in energy between that
of the incident particle (E) and the binding energy (φ) of the atomic
electron. This ejected electron leaves a “hole” in the electronic
structure of the atom, and after a brief period, the atomic electrons
rearrange, with an electron from a higher energy shell filling the
vacancy. By way of this relaxation the atom undergoes fluorescence,
or the emission of an X-ray photon whose energy is equal to the
difference in energies of the initial and final states. Detecting this
photon and measuring its energy allows us to determine the element
and specific electronic transition from which it originated.

14. INSTRUMENTATION :-
 Most of the XRF instruments in use today fall into two categories:
energy-dispersive (ED) and wavelength-dispersive (WD) spectrometers.
 Within these two categories is a tremendous variety of differing
configurations, X-ray sources and optics, and detector technologies.
 WD Spectrometers :The instrument operates based on the principle of
Bragg diffraction of a collimated X-ray beam, in this case the beam
emanating from the sample. A detector is angularly scanned relative to
the analyzing crystal, registering the spectrum.
 Energy Dispersive (ED): The entire polychromatic spectrum from the
sample is incident upon a detector that is capable of registering the
energy of each photon that strikes it. The detector electronics and data
system then build the X-ray spectrum as a histogram, with number of
counts versus energy.

15. Advantages of XRF :-
 XRF is a versatile, rapid technique .
 It is non destructive method of chemical analysis. Important as in
case of samples in limited amounts, or valuable or irreplaceable.
 It is precise and with skilled operations it is accurate.
 Applicable to a wide variety of samples from powders to liquids.
 It is convenient and economical to use.
 XRF allows for simple and fast sample preparation, and it has low
running costs. It does not involve applying any gasses, liquids or acids
in the testing process, which means it is a highly adaptable technique
for use on-site in different locations. This is especially valuable for
production line testing.
 XRF spectroscopy instruments require no daily re-calibration.

16. Disadvantages Of XRF :-
 The reliance of EDXRF on quantity can limit measurements, with
5ml to 10 ml typically being the typical volume required for best
performance
 It can also face limitations in measuring lighter elements
 As an alternative, WDXRF can handle more complex samples, but
it is more expensive, more time-consuming and requires more
expertise to operate.
 XRF also can’t be used to determine Beryllium content, which is a
distinct disadvantage when measuring alloys or other materials
that might contain Beryllium.

17. Uses Of XRF :-
 Mining
 Food and drink
 Continuous process industries
 Environment
 Forensic science
 Pharmaceuticals
 Medicine
 Recycling

18. Difference Between XRD and XRF :-
XRD
 XRD is x-ray diffraction.
 XRD can determine the presence and
amounts of minerals species in
sample, as well as identify phases.
 Compound analysis
 Contains Fe2O3 vs Fe3O4
 Polymorphs : CaCO3 calcite vs
aragonite vs vatrite
XRF
 XRF is x-ray fluorescence.
 XRF will give details as to the
chemical composition of a sample but
will not indicate what phases are
present in the sample.
 Elemental analysis
 Contains Fe
 Contains Ca