There are two main types of electron microscopes: transmission electron microscopes (TEM) and scanning electron microscopes (SEM). TEM uses a beam of electrons to image the inside of thin samples, achieving resolutions of less than 1 nanometer. SEM images surfaces by detecting signals from electrons that interact with the sample surface, allowing for resolutions better than 1 nanometer and 3D imaging of bulk samples up to a few centimeters in size. While TEM provides higher magnification and resolution for thin samples, SEM is better suited for larger, surface-level imaging and analysis of composition.