The document compares and contrasts scanning electron microscopes (SEM) and transmission electron microscopes (TEM). SEMs detect reflected electrons to image surface details in 3D, have lower resolution but larger fields of view than TEMs, and require less sample preparation. In contrast, TEMs transmit electrons through thin samples to image internal structures in 2D with higher resolution but smaller fields of view, and require more complex sample preparation. Both use vacuum environments and have adjustable magnification, but TEMs provide atomic-scale resolution and additional material characterization compared to SEMs.

1. Difference between Sem and Tem:
Scanning electron microscope (Sem)
• Sem stands for Scanning electron microscope
• SEM creates an image by detecting reflected or knocked-
off electrons.
• Surface of the sample
• Image is 3 dimensional.
• The magnification is maximum 2 million .
• The resolution is 0.4nanometers
• The medium of SEM is vaccum .
• Field of view is large
• Voltage require is high .(50 to 30000).
• Required less time compared with TEM.
• Sample can be thick or thin
• Less preparation sample required
Transmission electron microscope
(tem)
• Tem stands for transmission electron microscope.
• TEM uses transmitted electrons (electrons that are
passing through the sample) to create an image.
• Internal surface of the sample
• Image is 2 Dimensional
• The magnification is maximum of 50 million.
• The resolution is 0.5angstroms
• The medium of TEM is vaccum
• Field of view is small
• Voltage require is low
• Long process Required more times when
compared to SEM
• Sample can be ultrathin
• More sample preparation required

2. SEM and TEM:

3. • Similarities of Scanning electron microscope and Transmission
electron microscope :
• some similarities between the scanning electron microscope
(SEM) and Transmission electron microscope (TEM) are as follows:
• Object types
• Source of radiation
• Medium
• Nature of lenses
• Magnification adjustment.
• Focusing
Similarities between SEM and TEM:

4. SEM vs TEM summary of advantages :
Both SEMs and TEMs have unique advantages when compared to one another.
• Compared to TEMs, SEMs cost less to procure, take less time to
generate an image, require less time for specimen preparation,
accept thicker samples that are much larger.
• Compared to SEMs, TEMs generate higher-resolution images, provide
atomic and crystallographic data, produce 2D images that are easier to
interpret than 3D SEM images, and allow users to examine additional
characteristics of a given sample.

5. Difference between XRD and SEM
XRD
• XRD stands for X-ray diffraction
• XRD is limited to small samples, and works best
with flat things.
SEM
• SEM stands for Scanning electron microscope
• SEM-EDS can produce structural information or
material composition information. It additionally
provides images of the surface of an object at
extremely high magnifications.
• XRD shows particle size of 40 nm • SEM reveals particle size of 20 nm
• SEM is used for particle size. Both are
different.
• XRD is used for crystalline size

6. Difference between XRD and TEM
XRD
• XRD can gives a crystal size distribution related to
the millions of diffracted crystals illuminated by X
ray during the experiment.
TEM
• TEM is good for morphology scan but it required a
quite huge number of images for statistical
reliability which is not an easy and cheap thing.
• From the XRD patterns, you can calculate the
average crystallite size b
• From TEM, you can calculate the
particle size.