Electron microscopy provides high resolution imaging of nanoscale structures using electron beams. There are two main types: transmission electron microscopy (TEM) and scanning electron microscopy (SEM). TEM uses transmitted electrons to image ultra thin samples, allowing visualization of structures less than an angstrom in size. SEM scans a focused electron beam across a sample to generate topographical and compositional information from electron interactions within microns of the surface. Both techniques require specialized sample preparation and equipment to produce high quality images for research applications across biology, materials science, and other fields.