The document discusses algorithms for testing embedded memories in FPGAs. It introduces the March C algorithm for memory testing and proposes an optimized March C algorithm. The optimized algorithm reduces testing time by applying concurrency - it tests multiple memory subgroups simultaneously. The document implements BIST architectures using both the basic and optimized March C algorithms and compares their performance in terms of time, area and speed for testing embedded memory in FPGAs. The optimized March C algorithm requires less time to test memory compared to other architectures.
Loc, los and loes at speed testing methodologies for automatic test pattern g...eSAT Journals
Abstract Faults, caused by timing-related defects in very large scale integrated circuits, are important to detect to optimize coverage and test time. Delay faults are only due to timing malfunction. At-speed test is only method to detect these delay faults. This paper describes and compares different at-speed testing techniques on vivid point of views along with them practical implementation. This paper also shows results generated by automatic test pattern generation tool for these techniques. Next, generated test patterns are simulated by using simulator and correctness of these methods are verified. Keywords: LOC (Launch on capture), LOS (Launch on shift), LOES (Launch on extra shift), At-speed testing.
Level sensitive scan design(LSSD) and Boundry scan(BS)Praveen Kumar
This presentation contains,
Introduction,design for testability, scan chain, operation, scan structure, test vectors, Boundry scan, test logic, operation, BS cell, states of TAP controller, Boundry scan instructions.
Loc, los and loes at speed testing methodologies for automatic test pattern g...eSAT Journals
Abstract Faults, caused by timing-related defects in very large scale integrated circuits, are important to detect to optimize coverage and test time. Delay faults are only due to timing malfunction. At-speed test is only method to detect these delay faults. This paper describes and compares different at-speed testing techniques on vivid point of views along with them practical implementation. This paper also shows results generated by automatic test pattern generation tool for these techniques. Next, generated test patterns are simulated by using simulator and correctness of these methods are verified. Keywords: LOC (Launch on capture), LOS (Launch on shift), LOES (Launch on extra shift), At-speed testing.
Level sensitive scan design(LSSD) and Boundry scan(BS)Praveen Kumar
This presentation contains,
Introduction,design for testability, scan chain, operation, scan structure, test vectors, Boundry scan, test logic, operation, BS cell, states of TAP controller, Boundry scan instructions.
The System Verilog UVM promises to improve verification productivity while enabling teams to share tests and test benches between projects and divisions. This promise can be achieved; the UVM is a powerful methodology for using constrained randomization to reach higher functional coverage goals and to explore combinations of tests without having to write each one individually. Unfortunately the UVM promise can be hard to reach without training, practice and some significant expertise. Verification is one of the most important activities in the flow of ASIC/VLSI design. Verification consumes large amount of design flow cycle & efforts to ensure design is bug free. Hence it becomes intense requirement for powerful and reusable methodology for verification.
Introduction to SOC Verification Fundamentals and System Verilog language coding. Explains concepts on Functional Verification methodologies used in industry like OVM, UVM
In VLSI design, Design for Testability (DFT) is an approach that aims to make digital circuits easier to test during the manufacturing and debugging process. DFT in VLSI design involves incorporating additional circuitry and design features such as scan chains, built-in self-test (BIST) circuits, and boundary scan cells into the chip design to facilitate testing. Design for testability in VLSI design is essential to ensure that the fabricated chips are free from any kind of manufacturing defects. It also reduces the overall test time and thereby the cost of testing, and debugging. By incorporating DFT techniques into the chip design, it becomes easier to test the structural correctness of the chip, leading to higher-quality products and faster time-to-market.
01 Transition Fault Detection methods by Swethaswethamg18
Fault Models
Stuck-at fault test covers
Shorts and opens
Resistive shorts – Not covered
Delay fault test covers
Resistive opens and coupling faults
Resistive power supply lines
Process variations
Delay Fault Testing
Propagation delay of all paths in a circuit must be less than clock period for correct operation
Functional tests applied at operational speed of circuit are often used for delay faults
Scan based stuck-at tests are often applied at speed
However, functional and stuck-at testing even if done at-speed do not specifically target delay faults
IMPLEMENTATION AND VALIDATION OF MEMORY BUILT IN SELF TEST (MBIST) - SURVEYIAEME Publication
This paper provides a survey of Implementation and Validation involved in Memory Built in Self-Test (MBIST). This paper comprises of the various strategies involved in the implementation and Validation of the Memory Built in Self-Test (MBIST). MBIST (Memory built-in self-test) provides an effective solution for testing of such large memories. Verification of functioning MBIST is an essential part in any SoC design cycle, as it enables the designer to detect beforehand any issues related to MBIST [11] . The advantages of MBIST are simplicity of test program, Possibility to run different algorithm, Reduction in test cost, Possibility to run user defined algorithm on memories.
In today’s world, there is an ever-increasing demand for SOC speed, performance, and features. To cater to all those needs, the industry is moving toward lower technology nodes. The current market has become more and more demanding, in turn forcing complex architectures and reduced time to market. The complex integrations and smaller design cycle emphasize the importance of floorplanning, i.e., the first step in netlist-to-GDSII design flow. Floorplanning not only captures designer’s intent, but also presents the challenges and opportunities that affect the entire design flow, from design to implementation and chip assembly.
A typical SOC can include many hard- and soft-IP macros, memories, analog blocks, and multiple power domains. Because of the increases in gate count, power domains, power modes, and special architectural requirements, most SOCs these days are hierarchical designs. The SOC interacts with the outside world through sensors, antennas, displays, and other elements, which introduce a lot of analog component in the chip. All of these limitations directly result in various challenges in floorplanning.
Floorplanning includes macro/block placement, design partitioning, pin placement, power planning, and power grid design. What make the job more important is that the decisions taken for macro/block placement, partitioning, I/O-pad placement, and power planning directly or indirectly impact the overall implementation cycle.
Lots of iterations happen to get an optimum floorplan. The designer takes care of the design parameters, such as power, area, timing, and performance during floorplanning. These estimations are repeatedly reviewed, based on the feedback of other stakeholders such as the implementation team, IP owners, and RTL designers. The outcome of floorplanning is a proper arrangement of macros/blocks, power grid, pin placement, and partitioned blocks that can be implemented in parallel.
In hierarchical designs, the quality of the floorplan is analyzed after the blocks are integrated at the top level. That can results in unnecessary iterative work, wasted resource hours, and longer cycle times, which could mean missed market opportunities. This underscores the importance of floorplanning.
In this paper, we will discuss some of the good practices, techniques, and complex cases that arise while floorplanning in an SOC.
The first rule of thumb for floorplanning is to arrange the hard macros and memories in such a manner that you end up with a core area (to be used for SOG placement) square in shape. This is always not possible, however, because of the large number of analog-IP blocks, memories, and various other requirements in design.
This is the first session from a series of sessions on Verification of VLSI Design. It focus on the basic flow of verification in context of system design flow, types of verification, Functional, formal and semi-formal verification, Simulation, Emulation and Static Timing Analysis.
The System Verilog UVM promises to improve verification productivity while enabling teams to share tests and test benches between projects and divisions. This promise can be achieved; the UVM is a powerful methodology for using constrained randomization to reach higher functional coverage goals and to explore combinations of tests without having to write each one individually. Unfortunately the UVM promise can be hard to reach without training, practice and some significant expertise. Verification is one of the most important activities in the flow of ASIC/VLSI design. Verification consumes large amount of design flow cycle & efforts to ensure design is bug free. Hence it becomes intense requirement for powerful and reusable methodology for verification.
Introduction to SOC Verification Fundamentals and System Verilog language coding. Explains concepts on Functional Verification methodologies used in industry like OVM, UVM
In VLSI design, Design for Testability (DFT) is an approach that aims to make digital circuits easier to test during the manufacturing and debugging process. DFT in VLSI design involves incorporating additional circuitry and design features such as scan chains, built-in self-test (BIST) circuits, and boundary scan cells into the chip design to facilitate testing. Design for testability in VLSI design is essential to ensure that the fabricated chips are free from any kind of manufacturing defects. It also reduces the overall test time and thereby the cost of testing, and debugging. By incorporating DFT techniques into the chip design, it becomes easier to test the structural correctness of the chip, leading to higher-quality products and faster time-to-market.
01 Transition Fault Detection methods by Swethaswethamg18
Fault Models
Stuck-at fault test covers
Shorts and opens
Resistive shorts – Not covered
Delay fault test covers
Resistive opens and coupling faults
Resistive power supply lines
Process variations
Delay Fault Testing
Propagation delay of all paths in a circuit must be less than clock period for correct operation
Functional tests applied at operational speed of circuit are often used for delay faults
Scan based stuck-at tests are often applied at speed
However, functional and stuck-at testing even if done at-speed do not specifically target delay faults
IMPLEMENTATION AND VALIDATION OF MEMORY BUILT IN SELF TEST (MBIST) - SURVEYIAEME Publication
This paper provides a survey of Implementation and Validation involved in Memory Built in Self-Test (MBIST). This paper comprises of the various strategies involved in the implementation and Validation of the Memory Built in Self-Test (MBIST). MBIST (Memory built-in self-test) provides an effective solution for testing of such large memories. Verification of functioning MBIST is an essential part in any SoC design cycle, as it enables the designer to detect beforehand any issues related to MBIST [11] . The advantages of MBIST are simplicity of test program, Possibility to run different algorithm, Reduction in test cost, Possibility to run user defined algorithm on memories.
In today’s world, there is an ever-increasing demand for SOC speed, performance, and features. To cater to all those needs, the industry is moving toward lower technology nodes. The current market has become more and more demanding, in turn forcing complex architectures and reduced time to market. The complex integrations and smaller design cycle emphasize the importance of floorplanning, i.e., the first step in netlist-to-GDSII design flow. Floorplanning not only captures designer’s intent, but also presents the challenges and opportunities that affect the entire design flow, from design to implementation and chip assembly.
A typical SOC can include many hard- and soft-IP macros, memories, analog blocks, and multiple power domains. Because of the increases in gate count, power domains, power modes, and special architectural requirements, most SOCs these days are hierarchical designs. The SOC interacts with the outside world through sensors, antennas, displays, and other elements, which introduce a lot of analog component in the chip. All of these limitations directly result in various challenges in floorplanning.
Floorplanning includes macro/block placement, design partitioning, pin placement, power planning, and power grid design. What make the job more important is that the decisions taken for macro/block placement, partitioning, I/O-pad placement, and power planning directly or indirectly impact the overall implementation cycle.
Lots of iterations happen to get an optimum floorplan. The designer takes care of the design parameters, such as power, area, timing, and performance during floorplanning. These estimations are repeatedly reviewed, based on the feedback of other stakeholders such as the implementation team, IP owners, and RTL designers. The outcome of floorplanning is a proper arrangement of macros/blocks, power grid, pin placement, and partitioned blocks that can be implemented in parallel.
In hierarchical designs, the quality of the floorplan is analyzed after the blocks are integrated at the top level. That can results in unnecessary iterative work, wasted resource hours, and longer cycle times, which could mean missed market opportunities. This underscores the importance of floorplanning.
In this paper, we will discuss some of the good practices, techniques, and complex cases that arise while floorplanning in an SOC.
The first rule of thumb for floorplanning is to arrange the hard macros and memories in such a manner that you end up with a core area (to be used for SOG placement) square in shape. This is always not possible, however, because of the large number of analog-IP blocks, memories, and various other requirements in design.
This is the first session from a series of sessions on Verification of VLSI Design. It focus on the basic flow of verification in context of system design flow, types of verification, Functional, formal and semi-formal verification, Simulation, Emulation and Static Timing Analysis.
Our money-making formula: We do 5 things: Generate Traffic (a lot of eye balls), Capture Leads (build a database so you can market to them long-term), Qualify prospects (eliminate tire kickers so people you talk to are ready, willing and able to buy), Convert Sales (money for you in your bank!) and Nurture (create long-term customers who give you raving review and generate a massive amount of referrals)Our money-making formula: We do 5 things: Generate Traffic (a lot of eye balls), Capture Leads (build a database so you can market to them long-term), Qualify prospects (eliminate tire kickers so people you talk to are ready, willing and able to buy), Convert Sales (money for you in your bank!) and Nurture (create long-term customers who give you raving review and generate a massive amount of referrals)
Design Encryption for Video Streaming with Brain Storm OptimizationJun Steed Huang
The basic concept of wireless video streaming system, the
main requirements from the law enforcement communities and related encryption algorithm of the wireless system are described. The major challenge in this research area is providing a low computation algorithm that runs easily on an embedded Java application, within pre-optimized key space. The key space is optimized under the object of minimizing the standard deviation of the spectrum of the key. Due to the large space of the key, the brain storm optimization is used to rule out the likely weak key set.
Complex Test Pattern Generation for high speed fault diagnosis in FPGA based ...IJMERJOURNAL
ABSTRACT: The memory blocks testing is a separate testing procedure followed in VLSI testing. The memory block testing involves writing a specific bit sequences in the memory locations and reading them again. This type of test is called March test. A particular March test consists of a sequence of writes followed by reads with increasing or decreasing address. For example the March C- test has the following test pattern. There are several test circuits available for testing the memory chips. However no test setup is developed so far for testing the memory blocks inside the FPGA. The BRAM blocks of FPGA are designed to work at much higher frequency than the FPGA core logic. Hence testing the BRAMs at higher speed is essential. The conventional memory test circuits cannot be used for this purpose. Hence the proposed work develops a memory testing tool based on March tests for FPGA based BRAM (block RAM testing). The code modules for March test generator shall be developed in VHDL and shall be synthesized for Xilinx Spartan 3 Family device. A PC based GUI tool shall send command to FPGA using serial port for selecting the type of test. The FPGA core gets the command through UART and performs the appropriate and sends the test report back to PC. The results shall be verified in simulation with Xilinx ISE simulator and also in hardware by using Chip scope. Xilinx Spartan 3 family FPGA board shall be used for hardware verification of the developed March test generator
MODIFIED MARCH C- WITH CONCURRENCY IN TESTING FOR EMBEDDED MEMORY APPLICATIONSVLSICS Design
March algorithms are known for memory testing because March-based tests are all simple and possess good fault coverage hence they are the dominant test algorithms implemented in most modern memory BIST. As March algorithms are well known algorithms for testing embedded RAMS, out of which March Cis known for finding all SAF, SOF, CF. This March C- is used frequently in the industry also. The proposed march algorithm is modified march c- algorithm which uses concurrent technique. Using this modified march c- algorithm the complexity is reduced to 8n as well as the test time is reduced greatly. Because of concurrency in testing the sequences the test results were observed in less time than the traditional March tests. This technique is applied for a memory of size 256x8 and can be extended to any memory size.
International Journal of Engineering Research and DevelopmentIJERD Editor
Electrical, Electronics and Computer Engineering,
Information Engineering and Technology,
Mechanical, Industrial and Manufacturing Engineering,
Automation and Mechatronics Engineering,
Material and Chemical Engineering,
Civil and Architecture Engineering,
Biotechnology and Bio Engineering,
Environmental Engineering,
Petroleum and Mining Engineering,
Marine and Agriculture engineering,
Aerospace Engineering.
Complex test pattern generation for high speed fault diagnosis in Embedded SRAMIJMER
International Journal of Modern Engineering Research (IJMER) is Peer reviewed, online Journal. It serves as an international archival forum of scholarly research related to engineering and science education.
International Journal of Modern Engineering Research (IJMER) covers all the fields of engineering and science: Electrical Engineering, Mechanical Engineering, Civil Engineering, Chemical Engineering, Computer Engineering, Agricultural Engineering, Aerospace Engineering, Thermodynamics, Structural Engineering, Control Engineering, Robotics, Mechatronics, Fluid Mechanics, Nanotechnology, Simulators, Web-based Learning, Remote Laboratories, Engineering Design Methods, Education Research, Students' Satisfaction and Motivation, Global Projects, and Assessment…. And many more.
PAOD: a predictive approach for optimization of design in FinFET/SRAMIJECEIAES
The evolutions in the modern memory units are comeup with FinFET/SRAM which can be utilized over high scaled computing units and in other devices. Some of the recent systems were surveyed through which it is known that existing systems lags with improving the performance and optimization of FinFET/SRAM design. Thus, the paper introduces an optimized model based on Search Optimization mechanism that uses Predictive Approach to optimize the design structure of FinFET/SRAM (PAOD). Using this can achieve significant fault tolerance under dynamic cumpting devices and applications. The model uses mathematical methodology which helps to attain less computational time and significant output even at more simulation iteration. This POAD is cost effective as it provides better convergence of FinFET/SRAM design than recursive design.
Implementation of FSM-MBIST and Design of Hybrid MBIST for Memory cluster in ...Editor IJCATR
In current scenario, power efficient MPSoC’s are of great demand. The power efficient asynchronous MPSoC’s with
multiple memories are thought-off to replace clocked synchronous SoC, in which clock consumes more than 40% of the total power. It
is right time to develop the test compliant asynchronous MpSoC. In this paper, Traditional MBIST and FSM based MBIST schemes
are designed and applied to single port RAM. The results are discussed based on the synthesis reports obtained from RTL Complier
from Cadence. FSM based MBIST is power and area efficient method for single memory testing. It consumes 40% less power when
compared with traditional MBIST. But, in case of multiple memory scenarios, separate MBIST controllers are required to test each
individual memories. Thus this scheme consumes huge area and becomes inefficient. A novel technique for testing different memories
which are working at different frequencies is in need. Therefore, an area efficient Hybrid MBIST is proposed with single MBIST
controller to test multiple memories in an Asynchronous SoC. It also includes multiple test algorithms to detect various faults. An
Asynchronous SoC with DWT processor and multiple memories is discussed in this paper, which will used as Design under Test
[DUT] and Hybrid MBIST is built around it to test the heterogeneous memories. The design is coded in Verilog and Validated in
Spartan-3e FPGA kit.
Robust Fault Tolerance in Content Addressable Memory InterfaceIOSRJVSP
With the rapid improvement in data exchange, large memory devices have come out in recent past. The operational controlling for such large memory has became a tedious task due to faster, distributed nature of memory units. In the process of memory accessing it is observed that data written or fetched are often encounter with fault location and faulty data are written or fetched from the addressed locations. In real time applications, this error cannot be tolerated as it leads to variation in the operational condition dependent on the memory data. Hence, It is required to have an optimal controlling fault tolerance in content addressable memory. In this paper, we present an approach of fault tolerance approach by controlling the fault addressing overhead, by introducing a new addressing approach using redundant control modeling of fault address unit. The presented approach achieves the objective of fault controlling over multiple fault location in different dimensions with redundant coding.
Dominant block guided optimal cache size estimation to maximize ipc of embedd...ijesajournal
Embedded system software is highly constrained from performance, memory footprint, energy consumption and implementing cost view point. It is always desirable to obtain better Instructions per Cycle (IPC). Instruction cache has major contribution in improving IPC. Cache memories are realized on the same chip where the processor is running. This considerably increases the system cost as well. Hence, it is required to maintain a trade-off between cache sizes and performance improvement offered. Determining the number of cache lines and size of cache line are important parameters for cache designing. The design space for cache is quite large. It is time taking to execute the given application with different cache sizes on an instruction set simulator (ISS) to figure out the optimal cache size. In this paper, a technique is proposed to identify a number of cache lines and cache line size for the L1 instruction cache that will offer best or nearly best IPC. Cache size is derived, at a higher abstraction level, from basic block analysis in the Low Level Virtual Machine (LLVM) environment. The cache size estimated from the LLVM environment is cross validated by simulating the set of benchmark applications with different cache sizes in SimpleScalar’s out-of-order simulator. The proposed method seems to be superior in terms of estimation accuracy and/or estimation time as compared to the existing methods for estimation of optimal cache size parameters (cache line size, number of cache lines).
Dominant block guided optimal cache size estimation to maximize ipc of embedd...ijesajournal
Embedded system software is highly constrained from performance, memory footprint, energy consumption
and implementing cost view point. It is always desirable to obtain better Instructions per Cycle (IPC).
Instruction cache has major contribu
tion in improving IPC. Cache memories are realized on the same chip
where the processor is running. This considerably increases the system cost as well. Hence, it is required to
maintain a trade
-
off between cache sizes and performance improvement offered.
Determining the number
of cache lines and size of cache line are important parameters for cache designing. The design space for
cache is quite large. It is time taking to execute the given application with different cache sizes on an
instruction set simula
tor (ISS) to figure out the optimal cache size. In this paper, a technique is proposed to
identify a number of cache lines and cache line size for the L1 instruction cache that will offer best or
nearly best IPC. Cache size is derived, at a higher abstract
ion level, from basic block analysis in the Low
Level Virtual Machine (LLVM) environment. The cache size estimated from the LLVM environment is cross
validated by simulating the set of benchmark applications with different cache sizes in SimpleScalar’s out
-
of
-
order simulator. The proposed method seems to be superior in terms of estimation accuracy and/or
estimation time as compared to the existing methods for estimation of optimal cache size parameters (cache
line size, number of cache lines).
This paper presentsa novel data flow architecturethat utilizes data from engineering simulations to
generate a reduced order model within Apache Spark. The reduced order model from Spark is then utilized by
anevolutionary algorithm in the optimization of an industrial system component. This work is presented in the
context of the shape optimization of a heat exchanger fin and demonstrates the ability of theengineering
simulation, the reduced order model and the evolutionary algorithm to exchange data with each other by
utilizing Spark as the common data-processing framework. In order to enable a user to monitor the input design
parameter space,self-organizing maps are generated for visualization. The results of theevolutionary
optimization utilizing this data flow are compared with results from invoking high-fidelity engineering
simulations. This novel data flow architecture decouples the evolutionary algorithm from the reduced order
model and allows improvement of the optimization results by continuously augmenting the reduced order model
with data from the evolutionary algorithm.Additionally, when constraints on the optimization algorithm are
modifiedthe evolutionary algorithm canadapt and evolve good solutions. Themethodology presented in this
articlealso makes it feasible to simultaneously tune evolutionary optimization experiments along with
engineering simulations at a relatively low computational cost.
Artificial Intelligence Database Performance TuningRoel Van de Paar
In this presentation viewers will see the performance of a MySQL Server increase by automatic tuning using an open source GA (Genetic Algorithm) with surrounding smart bits.
The full interface code has been made publicly available as open source on GitHub - https://github.com/Percona-QA/gaai
Genetic Algorithms - a kind of Artificial Intelligence - have been used for a long time, but only recently the interest towards database applications has spiked.
You will see the transactions per second increase and increase again as the server is being adjusted automatically.
You will walk away with a better understanding of Genetic Algorithms, it's application to automated database tuning, and how to start with (or continue) your own experiments in this area.
All new work, this setup has not been showcased anywhere before.
The International Journal of Engineering and Science (The IJES)theijes
The International Journal of Engineering & Science is aimed at providing a platform for researchers, engineers, scientists, or educators to publish their original research results, to exchange new ideas, to disseminate information in innovative designs, engineering experiences and technological skills. It is also the Journal's objective to promote engineering and technology education. All papers submitted to the Journal will be blind peer-reviewed. Only original articles will be published.
Water scarcity is the lack of fresh water resources to meet the standard water demand. There are two type of water scarcity. One is physical. The other is economic water scarcity.
Student information management system project report ii.pdfKamal Acharya
Our project explains about the student management. This project mainly explains the various actions related to student details. This project shows some ease in adding, editing and deleting the student details. It also provides a less time consuming process for viewing, adding, editing and deleting the marks of the students.
Welcome to WIPAC Monthly the magazine brought to you by the LinkedIn Group Water Industry Process Automation & Control.
In this month's edition, along with this month's industry news to celebrate the 13 years since the group was created we have articles including
A case study of the used of Advanced Process Control at the Wastewater Treatment works at Lleida in Spain
A look back on an article on smart wastewater networks in order to see how the industry has measured up in the interim around the adoption of Digital Transformation in the Water Industry.
Forklift Classes Overview by Intella PartsIntella Parts
Discover the different forklift classes and their specific applications. Learn how to choose the right forklift for your needs to ensure safety, efficiency, and compliance in your operations.
For more technical information, visit our website https://intellaparts.com
Sachpazis:Terzaghi Bearing Capacity Estimation in simple terms with Calculati...Dr.Costas Sachpazis
Terzaghi's soil bearing capacity theory, developed by Karl Terzaghi, is a fundamental principle in geotechnical engineering used to determine the bearing capacity of shallow foundations. This theory provides a method to calculate the ultimate bearing capacity of soil, which is the maximum load per unit area that the soil can support without undergoing shear failure. The Calculation HTML Code included.
CFD Simulation of By-pass Flow in a HRSG module by R&R Consult.pptxR&R Consult
CFD analysis is incredibly effective at solving mysteries and improving the performance of complex systems!
Here's a great example: At a large natural gas-fired power plant, where they use waste heat to generate steam and energy, they were puzzled that their boiler wasn't producing as much steam as expected.
R&R and Tetra Engineering Group Inc. were asked to solve the issue with reduced steam production.
An inspection had shown that a significant amount of hot flue gas was bypassing the boiler tubes, where the heat was supposed to be transferred.
R&R Consult conducted a CFD analysis, which revealed that 6.3% of the flue gas was bypassing the boiler tubes without transferring heat. The analysis also showed that the flue gas was instead being directed along the sides of the boiler and between the modules that were supposed to capture the heat. This was the cause of the reduced performance.
Based on our results, Tetra Engineering installed covering plates to reduce the bypass flow. This improved the boiler's performance and increased electricity production.
It is always satisfying when we can help solve complex challenges like this. Do your systems also need a check-up or optimization? Give us a call!
Work done in cooperation with James Malloy and David Moelling from Tetra Engineering.
More examples of our work https://www.r-r-consult.dk/en/cases-en/
Explore the innovative world of trenchless pipe repair with our comprehensive guide, "The Benefits and Techniques of Trenchless Pipe Repair." This document delves into the modern methods of repairing underground pipes without the need for extensive excavation, highlighting the numerous advantages and the latest techniques used in the industry.
Learn about the cost savings, reduced environmental impact, and minimal disruption associated with trenchless technology. Discover detailed explanations of popular techniques such as pipe bursting, cured-in-place pipe (CIPP) lining, and directional drilling. Understand how these methods can be applied to various types of infrastructure, from residential plumbing to large-scale municipal systems.
Ideal for homeowners, contractors, engineers, and anyone interested in modern plumbing solutions, this guide provides valuable insights into why trenchless pipe repair is becoming the preferred choice for pipe rehabilitation. Stay informed about the latest advancements and best practices in the field.
Automobile Management System Project Report.pdfKamal Acharya
The proposed project is developed to manage the automobile in the automobile dealer company. The main module in this project is login, automobile management, customer management, sales, complaints and reports. The first module is the login. The automobile showroom owner should login to the project for usage. The username and password are verified and if it is correct, next form opens. If the username and password are not correct, it shows the error message.
When a customer search for a automobile, if the automobile is available, they will be taken to a page that shows the details of the automobile including automobile name, automobile ID, quantity, price etc. “Automobile Management System” is useful for maintaining automobiles, customers effectively and hence helps for establishing good relation between customer and automobile organization. It contains various customized modules for effectively maintaining automobiles and stock information accurately and safely.
When the automobile is sold to the customer, stock will be reduced automatically. When a new purchase is made, stock will be increased automatically. While selecting automobiles for sale, the proposed software will automatically check for total number of available stock of that particular item, if the total stock of that particular item is less than 5, software will notify the user to purchase the particular item.
Also when the user tries to sale items which are not in stock, the system will prompt the user that the stock is not enough. Customers of this system can search for a automobile; can purchase a automobile easily by selecting fast. On the other hand the stock of automobiles can be maintained perfectly by the automobile shop manager overcoming the drawbacks of existing system.
About
Indigenized remote control interface card suitable for MAFI system CCR equipment. Compatible for IDM8000 CCR. Backplane mounted serial and TCP/Ethernet communication module for CCR remote access. IDM 8000 CCR remote control on serial and TCP protocol.
• Remote control: Parallel or serial interface.
• Compatible with MAFI CCR system.
• Compatible with IDM8000 CCR.
• Compatible with Backplane mount serial communication.
• Compatible with commercial and Defence aviation CCR system.
• Remote control system for accessing CCR and allied system over serial or TCP.
• Indigenized local Support/presence in India.
• Easy in configuration using DIP switches.
Technical Specifications
Indigenized remote control interface card suitable for MAFI system CCR equipment. Compatible for IDM8000 CCR. Backplane mounted serial and TCP/Ethernet communication module for CCR remote access. IDM 8000 CCR remote control on serial and TCP protocol.
Key Features
Indigenized remote control interface card suitable for MAFI system CCR equipment. Compatible for IDM8000 CCR. Backplane mounted serial and TCP/Ethernet communication module for CCR remote access. IDM 8000 CCR remote control on serial and TCP protocol.
• Remote control: Parallel or serial interface
• Compatible with MAFI CCR system
• Copatiable with IDM8000 CCR
• Compatible with Backplane mount serial communication.
• Compatible with commercial and Defence aviation CCR system.
• Remote control system for accessing CCR and allied system over serial or TCP.
• Indigenized local Support/presence in India.
Application
• Remote control: Parallel or serial interface.
• Compatible with MAFI CCR system.
• Compatible with IDM8000 CCR.
• Compatible with Backplane mount serial communication.
• Compatible with commercial and Defence aviation CCR system.
• Remote control system for accessing CCR and allied system over serial or TCP.
• Indigenized local Support/presence in India.
• Easy in configuration using DIP switches.
Cosmetic shop management system project report.pdfKamal Acharya
Buying new cosmetic products is difficult. It can even be scary for those who have sensitive skin and are prone to skin trouble. The information needed to alleviate this problem is on the back of each product, but it's thought to interpret those ingredient lists unless you have a background in chemistry.
Instead of buying and hoping for the best, we can use data science to help us predict which products may be good fits for us. It includes various function programs to do the above mentioned tasks.
Data file handling has been effectively used in the program.
The automated cosmetic shop management system should deal with the automation of general workflow and administration process of the shop. The main processes of the system focus on customer's request where the system is able to search the most appropriate products and deliver it to the customers. It should help the employees to quickly identify the list of cosmetic product that have reached the minimum quantity and also keep a track of expired date for each cosmetic product. It should help the employees to find the rack number in which the product is placed.It is also Faster and more efficient way.