Electrical, Electronics and Computer Engineering,
Information Engineering and Technology,
Mechanical, Industrial and Manufacturing Engineering,
Automation and Mechatronics Engineering,
Material and Chemical Engineering,
Civil and Architecture Engineering,
Biotechnology and Bio Engineering,
Environmental Engineering,
Petroleum and Mining Engineering,
Marine and Agriculture engineering,
Aerospace Engineering.
PAOD: a predictive approach for optimization of design in FinFET/SRAMIJECEIAES
The evolutions in the modern memory units are comeup with FinFET/SRAM which can be utilized over high scaled computing units and in other devices. Some of the recent systems were surveyed through which it is known that existing systems lags with improving the performance and optimization of FinFET/SRAM design. Thus, the paper introduces an optimized model based on Search Optimization mechanism that uses Predictive Approach to optimize the design structure of FinFET/SRAM (PAOD). Using this can achieve significant fault tolerance under dynamic cumpting devices and applications. The model uses mathematical methodology which helps to attain less computational time and significant output even at more simulation iteration. This POAD is cost effective as it provides better convergence of FinFET/SRAM design than recursive design.
Power minimization of systems using Performance Enhancement Guaranteed CachesIJTET Journal
Caches have long been an instrument for speeding memory access from microcontrollers to center based ASIC plans. For hard ongoing frameworks however stores are tricky because of most pessimistic scenario execution time estimation. As of late, an on-chip scratch cushion memory (SPM) to decrease the force and enhance execution. SPM does not productively reuse its space while execution. Here, an execution improvement ensured reserves (PEG-C) to improve the execution. It can likewise be utilized like a standard reserve to progressively store guidelines and information in view of their runtime access examples prompting attain to great execution. All the earlier plans have corruption of execution when contrasted with PEG-C. It has a superior answer for equalization time consistency and normal case execution
International Journal of Engineering Research and Applications (IJERA) is an open access online peer reviewed international journal that publishes research and review articles in the fields of Computer Science, Neural Networks, Electrical Engineering, Software Engineering, Information Technology, Mechanical Engineering, Chemical Engineering, Plastic Engineering, Food Technology, Textile Engineering, Nano Technology & science, Power Electronics, Electronics & Communication Engineering, Computational mathematics, Image processing, Civil Engineering, Structural Engineering, Environmental Engineering, VLSI Testing & Low Power VLSI Design etc.
PAOD: a predictive approach for optimization of design in FinFET/SRAMIJECEIAES
The evolutions in the modern memory units are comeup with FinFET/SRAM which can be utilized over high scaled computing units and in other devices. Some of the recent systems were surveyed through which it is known that existing systems lags with improving the performance and optimization of FinFET/SRAM design. Thus, the paper introduces an optimized model based on Search Optimization mechanism that uses Predictive Approach to optimize the design structure of FinFET/SRAM (PAOD). Using this can achieve significant fault tolerance under dynamic cumpting devices and applications. The model uses mathematical methodology which helps to attain less computational time and significant output even at more simulation iteration. This POAD is cost effective as it provides better convergence of FinFET/SRAM design than recursive design.
Power minimization of systems using Performance Enhancement Guaranteed CachesIJTET Journal
Caches have long been an instrument for speeding memory access from microcontrollers to center based ASIC plans. For hard ongoing frameworks however stores are tricky because of most pessimistic scenario execution time estimation. As of late, an on-chip scratch cushion memory (SPM) to decrease the force and enhance execution. SPM does not productively reuse its space while execution. Here, an execution improvement ensured reserves (PEG-C) to improve the execution. It can likewise be utilized like a standard reserve to progressively store guidelines and information in view of their runtime access examples prompting attain to great execution. All the earlier plans have corruption of execution when contrasted with PEG-C. It has a superior answer for equalization time consistency and normal case execution
International Journal of Engineering Research and Applications (IJERA) is an open access online peer reviewed international journal that publishes research and review articles in the fields of Computer Science, Neural Networks, Electrical Engineering, Software Engineering, Information Technology, Mechanical Engineering, Chemical Engineering, Plastic Engineering, Food Technology, Textile Engineering, Nano Technology & science, Power Electronics, Electronics & Communication Engineering, Computational mathematics, Image processing, Civil Engineering, Structural Engineering, Environmental Engineering, VLSI Testing & Low Power VLSI Design etc.
ИТ-парк "Комета" в г. Ульяновске
Технические характеристики
- площадь: 20000 кв./м.
- собственная управляющая компания
- широкополосный интернет
- частная собственность
- электрические мощности 700 КВт
- автостоянка на 300 м/м
- огороженная территория
- все меры безопасности
- централизованная вентиляция с контролем температуры
и т.д.
Robust Fault Tolerance in Content Addressable Memory InterfaceIOSRJVSP
With the rapid improvement in data exchange, large memory devices have come out in recent past. The operational controlling for such large memory has became a tedious task due to faster, distributed nature of memory units. In the process of memory accessing it is observed that data written or fetched are often encounter with fault location and faulty data are written or fetched from the addressed locations. In real time applications, this error cannot be tolerated as it leads to variation in the operational condition dependent on the memory data. Hence, It is required to have an optimal controlling fault tolerance in content addressable memory. In this paper, we present an approach of fault tolerance approach by controlling the fault addressing overhead, by introducing a new addressing approach using redundant control modeling of fault address unit. The presented approach achieves the objective of fault controlling over multiple fault location in different dimensions with redundant coding.
Improvement in Error Resilience in BIST using hamming codeIJMTST Journal
In the current scenario of IP core based SoC, to test the CUT we need to communication link between Circuit Under Test and ATPG, so before applying to actual DUT. If there is a problem with this link, there may be a lip in bit of test data. Compared to original test data, if there is a bit lip in the original data, the codeword may change and hence the decompressed data will have a large number of bit deviation. This deviation in bits can severely degrade the test quality and overall fault coverage which may affect yield. The error resilience is the capability of the test data to resist against such bit lips. Here in this paper, the earlier methods of error resilience is compared and a Hamming code based error resilience technique is proposed to improve the error resilience capacity of compressed test data. This method is applied on Huffman code based compressed test data of widely used ISCAS benchmark circuits. The fault coverage measurement results show the effectiveness of the proposed method. The basic goal here is to survey the effect of bit lips on fault coverage and prepare a platform for further development in this avenue.
Implementation of FSM-MBIST and Design of Hybrid MBIST for Memory cluster in ...Editor IJCATR
In current scenario, power efficient MPSoC’s are of great demand. The power efficient asynchronous MPSoC’s with
multiple memories are thought-off to replace clocked synchronous SoC, in which clock consumes more than 40% of the total power. It
is right time to develop the test compliant asynchronous MpSoC. In this paper, Traditional MBIST and FSM based MBIST schemes
are designed and applied to single port RAM. The results are discussed based on the synthesis reports obtained from RTL Complier
from Cadence. FSM based MBIST is power and area efficient method for single memory testing. It consumes 40% less power when
compared with traditional MBIST. But, in case of multiple memory scenarios, separate MBIST controllers are required to test each
individual memories. Thus this scheme consumes huge area and becomes inefficient. A novel technique for testing different memories
which are working at different frequencies is in need. Therefore, an area efficient Hybrid MBIST is proposed with single MBIST
controller to test multiple memories in an Asynchronous SoC. It also includes multiple test algorithms to detect various faults. An
Asynchronous SoC with DWT processor and multiple memories is discussed in this paper, which will used as Design under Test
[DUT] and Hybrid MBIST is built around it to test the heterogeneous memories. The design is coded in Verilog and Validated in
Spartan-3e FPGA kit.
Memory built-in self-test (BIST) is a widely used technique to allow the self-test and self-checking of the embedded memories on chips after the fabrication process. It can be used by implementing a standard testing algorithm available in the EDA tool library or a user-defined algorithm (UDA). This paper presents the development of software that automatically generates a description file of a UDA to be deployed for memory BIST circuit implementation using Tessent memory BIST software. It comprises the test setup and also the microprogram coding for each instruction to be executed when performing tests on embedded memories. The proposed automation software was tested by using March SR as the input algorithm and the results obtained from the simulations show that the output test patterns generated by the implemented memory BIST match the expected patterns and passed all the tests, which validated the correct functionality of the UDA description file generation. The proposed automation software also fast generation the UDA description file, which was completed in less than 500 ms.
MODIFIED MARCH C- WITH CONCURRENCY IN TESTING FOR EMBEDDED MEMORY APPLICATIONSVLSICS Design
March algorithms are known for memory testing because March-based tests are all simple and possess good fault coverage hence they are the dominant test algorithms implemented in most modern memory BIST. As March algorithms are well known algorithms for testing embedded RAMS, out of which March Cis known for finding all SAF, SOF, CF. This March C- is used frequently in the industry also. The proposed march algorithm is modified march c- algorithm which uses concurrent technique. Using this modified march c- algorithm the complexity is reduced to 8n as well as the test time is reduced greatly. Because of concurrency in testing the sequences the test results were observed in less time than the traditional March tests. This technique is applied for a memory of size 256x8 and can be extended to any memory size.
IMPLEMENTATION AND VALIDATION OF MEMORY BUILT IN SELF TEST (MBIST) - SURVEYIAEME Publication
This paper provides a survey of Implementation and Validation involved in Memory Built in Self-Test (MBIST). This paper comprises of the various strategies involved in the implementation and Validation of the Memory Built in Self-Test (MBIST). MBIST (Memory built-in self-test) provides an effective solution for testing of such large memories. Verification of functioning MBIST is an essential part in any SoC design cycle, as it enables the designer to detect beforehand any issues related to MBIST [11] . The advantages of MBIST are simplicity of test program, Possibility to run different algorithm, Reduction in test cost, Possibility to run user defined algorithm on memories.
Complex Test Pattern Generation for high speed fault diagnosis in FPGA based ...IJMERJOURNAL
ABSTRACT: The memory blocks testing is a separate testing procedure followed in VLSI testing. The memory block testing involves writing a specific bit sequences in the memory locations and reading them again. This type of test is called March test. A particular March test consists of a sequence of writes followed by reads with increasing or decreasing address. For example the March C- test has the following test pattern. There are several test circuits available for testing the memory chips. However no test setup is developed so far for testing the memory blocks inside the FPGA. The BRAM blocks of FPGA are designed to work at much higher frequency than the FPGA core logic. Hence testing the BRAMs at higher speed is essential. The conventional memory test circuits cannot be used for this purpose. Hence the proposed work develops a memory testing tool based on March tests for FPGA based BRAM (block RAM testing). The code modules for March test generator shall be developed in VHDL and shall be synthesized for Xilinx Spartan 3 Family device. A PC based GUI tool shall send command to FPGA using serial port for selecting the type of test. The FPGA core gets the command through UART and performs the appropriate and sends the test report back to PC. The results shall be verified in simulation with Xilinx ISE simulator and also in hardware by using Chip scope. Xilinx Spartan 3 family FPGA board shall be used for hardware verification of the developed March test generator
Memory built-in self-repair and correction for improving yield: a reviewIJECEIAES
Nanometer memories are highly prone to defects due to dense structure, necessitating memory built-in self-repair as a must-have feature to improve yield. Today’s system-on-chips contain memories occupying an area as high as 90% of the chip area. Shrinking technology uses stricter design rules for memories, making them more prone to manufacturing defects. Further, using 3D-stacked memories makes the system vulnerable to newer defects such as those coming from through-silicon-vias (TSV) and micro bumps. The increased memory size is also resulting in an increase in soft errors during system operation. Multiple memory repair techniques based on redundancy and correction codes have been presented to recover from such defects and prevent system failures. This paper reviews recently published memory repair methodologies, including various built-in self-repair (BISR) architectures, repair analysis algorithms, in-system repair, and soft repair handling using error correcting codes (ECC). It provides a classification of these techniques based on method and usage. Finally, it reviews evaluation methods used to determine the effectiveness of the repair algorithms. The paper aims to present a survey of these methodologies and prepare a platform for developing repair methods for upcoming-generation memories.
Designing of telecommand system using system on chip soc for spacecraft contr...IAEME Publication
The emerging developments in semiconductor technology have made possible to design
entire system onto a single chip, commonly known as System-On-Chip (SoC). The increase in Space
System‘s capabilities by the On-board data processing capabilities can be overcome by optimizing
the SoCs to provide cost effective, high performance, and reliable data. This is achieved by
embedding pre-designed functions into a single SoC, which utilizes specialized reusable core (IP
cores) architecture into complex chip. This paper is concerned with the design of Telecommand
system for transfer of signals from ground station to space station by the integration of SRAM (Static
Random Access Memory), ARM (Advanced RISC Machine) Processor, EDAC unit (Error Detection
and Correction) and CCSDS (Consultative Committee for Space Data System) decoder system. In
this paper we designed the Telecommand SoC by using Verilog code. The implementations have
been done using XILINX FPGA platform and the functionality of the system is verified using
Modelsim simulation. The results are analyzed for SPARTAN 3E device and ARM board and two
devices are being controlled by the signal transfer.
ИТ-парк "Комета" в г. Ульяновске
Технические характеристики
- площадь: 20000 кв./м.
- собственная управляющая компания
- широкополосный интернет
- частная собственность
- электрические мощности 700 КВт
- автостоянка на 300 м/м
- огороженная территория
- все меры безопасности
- централизованная вентиляция с контролем температуры
и т.д.
Robust Fault Tolerance in Content Addressable Memory InterfaceIOSRJVSP
With the rapid improvement in data exchange, large memory devices have come out in recent past. The operational controlling for such large memory has became a tedious task due to faster, distributed nature of memory units. In the process of memory accessing it is observed that data written or fetched are often encounter with fault location and faulty data are written or fetched from the addressed locations. In real time applications, this error cannot be tolerated as it leads to variation in the operational condition dependent on the memory data. Hence, It is required to have an optimal controlling fault tolerance in content addressable memory. In this paper, we present an approach of fault tolerance approach by controlling the fault addressing overhead, by introducing a new addressing approach using redundant control modeling of fault address unit. The presented approach achieves the objective of fault controlling over multiple fault location in different dimensions with redundant coding.
Improvement in Error Resilience in BIST using hamming codeIJMTST Journal
In the current scenario of IP core based SoC, to test the CUT we need to communication link between Circuit Under Test and ATPG, so before applying to actual DUT. If there is a problem with this link, there may be a lip in bit of test data. Compared to original test data, if there is a bit lip in the original data, the codeword may change and hence the decompressed data will have a large number of bit deviation. This deviation in bits can severely degrade the test quality and overall fault coverage which may affect yield. The error resilience is the capability of the test data to resist against such bit lips. Here in this paper, the earlier methods of error resilience is compared and a Hamming code based error resilience technique is proposed to improve the error resilience capacity of compressed test data. This method is applied on Huffman code based compressed test data of widely used ISCAS benchmark circuits. The fault coverage measurement results show the effectiveness of the proposed method. The basic goal here is to survey the effect of bit lips on fault coverage and prepare a platform for further development in this avenue.
Implementation of FSM-MBIST and Design of Hybrid MBIST for Memory cluster in ...Editor IJCATR
In current scenario, power efficient MPSoC’s are of great demand. The power efficient asynchronous MPSoC’s with
multiple memories are thought-off to replace clocked synchronous SoC, in which clock consumes more than 40% of the total power. It
is right time to develop the test compliant asynchronous MpSoC. In this paper, Traditional MBIST and FSM based MBIST schemes
are designed and applied to single port RAM. The results are discussed based on the synthesis reports obtained from RTL Complier
from Cadence. FSM based MBIST is power and area efficient method for single memory testing. It consumes 40% less power when
compared with traditional MBIST. But, in case of multiple memory scenarios, separate MBIST controllers are required to test each
individual memories. Thus this scheme consumes huge area and becomes inefficient. A novel technique for testing different memories
which are working at different frequencies is in need. Therefore, an area efficient Hybrid MBIST is proposed with single MBIST
controller to test multiple memories in an Asynchronous SoC. It also includes multiple test algorithms to detect various faults. An
Asynchronous SoC with DWT processor and multiple memories is discussed in this paper, which will used as Design under Test
[DUT] and Hybrid MBIST is built around it to test the heterogeneous memories. The design is coded in Verilog and Validated in
Spartan-3e FPGA kit.
Memory built-in self-test (BIST) is a widely used technique to allow the self-test and self-checking of the embedded memories on chips after the fabrication process. It can be used by implementing a standard testing algorithm available in the EDA tool library or a user-defined algorithm (UDA). This paper presents the development of software that automatically generates a description file of a UDA to be deployed for memory BIST circuit implementation using Tessent memory BIST software. It comprises the test setup and also the microprogram coding for each instruction to be executed when performing tests on embedded memories. The proposed automation software was tested by using March SR as the input algorithm and the results obtained from the simulations show that the output test patterns generated by the implemented memory BIST match the expected patterns and passed all the tests, which validated the correct functionality of the UDA description file generation. The proposed automation software also fast generation the UDA description file, which was completed in less than 500 ms.
MODIFIED MARCH C- WITH CONCURRENCY IN TESTING FOR EMBEDDED MEMORY APPLICATIONSVLSICS Design
March algorithms are known for memory testing because March-based tests are all simple and possess good fault coverage hence they are the dominant test algorithms implemented in most modern memory BIST. As March algorithms are well known algorithms for testing embedded RAMS, out of which March Cis known for finding all SAF, SOF, CF. This March C- is used frequently in the industry also. The proposed march algorithm is modified march c- algorithm which uses concurrent technique. Using this modified march c- algorithm the complexity is reduced to 8n as well as the test time is reduced greatly. Because of concurrency in testing the sequences the test results were observed in less time than the traditional March tests. This technique is applied for a memory of size 256x8 and can be extended to any memory size.
IMPLEMENTATION AND VALIDATION OF MEMORY BUILT IN SELF TEST (MBIST) - SURVEYIAEME Publication
This paper provides a survey of Implementation and Validation involved in Memory Built in Self-Test (MBIST). This paper comprises of the various strategies involved in the implementation and Validation of the Memory Built in Self-Test (MBIST). MBIST (Memory built-in self-test) provides an effective solution for testing of such large memories. Verification of functioning MBIST is an essential part in any SoC design cycle, as it enables the designer to detect beforehand any issues related to MBIST [11] . The advantages of MBIST are simplicity of test program, Possibility to run different algorithm, Reduction in test cost, Possibility to run user defined algorithm on memories.
Complex Test Pattern Generation for high speed fault diagnosis in FPGA based ...IJMERJOURNAL
ABSTRACT: The memory blocks testing is a separate testing procedure followed in VLSI testing. The memory block testing involves writing a specific bit sequences in the memory locations and reading them again. This type of test is called March test. A particular March test consists of a sequence of writes followed by reads with increasing or decreasing address. For example the March C- test has the following test pattern. There are several test circuits available for testing the memory chips. However no test setup is developed so far for testing the memory blocks inside the FPGA. The BRAM blocks of FPGA are designed to work at much higher frequency than the FPGA core logic. Hence testing the BRAMs at higher speed is essential. The conventional memory test circuits cannot be used for this purpose. Hence the proposed work develops a memory testing tool based on March tests for FPGA based BRAM (block RAM testing). The code modules for March test generator shall be developed in VHDL and shall be synthesized for Xilinx Spartan 3 Family device. A PC based GUI tool shall send command to FPGA using serial port for selecting the type of test. The FPGA core gets the command through UART and performs the appropriate and sends the test report back to PC. The results shall be verified in simulation with Xilinx ISE simulator and also in hardware by using Chip scope. Xilinx Spartan 3 family FPGA board shall be used for hardware verification of the developed March test generator
Memory built-in self-repair and correction for improving yield: a reviewIJECEIAES
Nanometer memories are highly prone to defects due to dense structure, necessitating memory built-in self-repair as a must-have feature to improve yield. Today’s system-on-chips contain memories occupying an area as high as 90% of the chip area. Shrinking technology uses stricter design rules for memories, making them more prone to manufacturing defects. Further, using 3D-stacked memories makes the system vulnerable to newer defects such as those coming from through-silicon-vias (TSV) and micro bumps. The increased memory size is also resulting in an increase in soft errors during system operation. Multiple memory repair techniques based on redundancy and correction codes have been presented to recover from such defects and prevent system failures. This paper reviews recently published memory repair methodologies, including various built-in self-repair (BISR) architectures, repair analysis algorithms, in-system repair, and soft repair handling using error correcting codes (ECC). It provides a classification of these techniques based on method and usage. Finally, it reviews evaluation methods used to determine the effectiveness of the repair algorithms. The paper aims to present a survey of these methodologies and prepare a platform for developing repair methods for upcoming-generation memories.
Designing of telecommand system using system on chip soc for spacecraft contr...IAEME Publication
The emerging developments in semiconductor technology have made possible to design
entire system onto a single chip, commonly known as System-On-Chip (SoC). The increase in Space
System‘s capabilities by the On-board data processing capabilities can be overcome by optimizing
the SoCs to provide cost effective, high performance, and reliable data. This is achieved by
embedding pre-designed functions into a single SoC, which utilizes specialized reusable core (IP
cores) architecture into complex chip. This paper is concerned with the design of Telecommand
system for transfer of signals from ground station to space station by the integration of SRAM (Static
Random Access Memory), ARM (Advanced RISC Machine) Processor, EDAC unit (Error Detection
and Correction) and CCSDS (Consultative Committee for Space Data System) decoder system. In
this paper we designed the Telecommand SoC by using Verilog code. The implementations have
been done using XILINX FPGA platform and the functionality of the system is verified using
Modelsim simulation. The results are analyzed for SPARTAN 3E device and ARM board and two
devices are being controlled by the signal transfer.
A Built In Self-Test and Repair Analyser for Embedded MemoriesIJSRD
This paper presents a survey of different algorithms to test and repair a memory. This paper explains about different built in self-test and built in self repair analysis of embedded memories. The improvement in the yield of memories plays an important role in SOC. The use of spare rows and spare columns with redundancy allocation is proven to be more promising since it gives an optimal repair rate in a single test.
Dominant block guided optimal cache size estimation to maximize ipc of embedd...ijesajournal
Embedded system software is highly constrained from performance, memory footprint, energy consumption and implementing cost view point. It is always desirable to obtain better Instructions per Cycle (IPC). Instruction cache has major contribution in improving IPC. Cache memories are realized on the same chip where the processor is running. This considerably increases the system cost as well. Hence, it is required to maintain a trade-off between cache sizes and performance improvement offered. Determining the number of cache lines and size of cache line are important parameters for cache designing. The design space for cache is quite large. It is time taking to execute the given application with different cache sizes on an instruction set simulator (ISS) to figure out the optimal cache size. In this paper, a technique is proposed to identify a number of cache lines and cache line size for the L1 instruction cache that will offer best or nearly best IPC. Cache size is derived, at a higher abstraction level, from basic block analysis in the Low Level Virtual Machine (LLVM) environment. The cache size estimated from the LLVM environment is cross validated by simulating the set of benchmark applications with different cache sizes in SimpleScalar’s out-of-order simulator. The proposed method seems to be superior in terms of estimation accuracy and/or estimation time as compared to the existing methods for estimation of optimal cache size parameters (cache line size, number of cache lines).
Dominant block guided optimal cache size estimation to maximize ipc of embedd...ijesajournal
Embedded system software is highly constrained from performance, memory footprint, energy consumption
and implementing cost view point. It is always desirable to obtain better Instructions per Cycle (IPC).
Instruction cache has major contribu
tion in improving IPC. Cache memories are realized on the same chip
where the processor is running. This considerably increases the system cost as well. Hence, it is required to
maintain a trade
-
off between cache sizes and performance improvement offered.
Determining the number
of cache lines and size of cache line are important parameters for cache designing. The design space for
cache is quite large. It is time taking to execute the given application with different cache sizes on an
instruction set simula
tor (ISS) to figure out the optimal cache size. In this paper, a technique is proposed to
identify a number of cache lines and cache line size for the L1 instruction cache that will offer best or
nearly best IPC. Cache size is derived, at a higher abstract
ion level, from basic block analysis in the Low
Level Virtual Machine (LLVM) environment. The cache size estimated from the LLVM environment is cross
validated by simulating the set of benchmark applications with different cache sizes in SimpleScalar’s out
-
of
-
order simulator. The proposed method seems to be superior in terms of estimation accuracy and/or
estimation time as compared to the existing methods for estimation of optimal cache size parameters (cache
line size, number of cache lines).
Improved Reliability Memory’s Module Structure for Critical Application Systems IJERA Editor
For critical application systems, which control nuclear power plants and other energy facilities, air, sea and
ground vehicles, the needs to ensure their operability are increased. To fulfill this requirement, it is necessary to
increase the technical readiness coefficient, the value of which increases with decreasing recovery time control
system in case of fault of its constituent units. The main control system components critical applications are
memory devices, which store programs and used for performing algorithms control. Semiconductor memory
modules with automatic recovery functionality at multiple faults can be used in systems of critical applications
protection and management where the use of fault-tolerant digital devices is a necessity due to the inability of
traditional methods of repair by replacing the failed elements.
Similar to International Journal of Engineering Research and Development (20)
A Novel Method for Prevention of Bandwidth Distributed Denial of Service AttacksIJERD Editor
Distributed Denial of Service (DDoS) Attacks became a massive threat to the Internet. Traditional
Architecture of internet is vulnerable to the attacks like DDoS. Attacker primarily acquire his army of Zombies,
then that army will be instructed by the Attacker that when to start an attack and on whom the attack should be
done. In this paper, different techniques which are used to perform DDoS Attacks, Tools that were used to
perform Attacks and Countermeasures in order to detect the attackers and eliminate the Bandwidth Distributed
Denial of Service attacks (B-DDoS) are reviewed. DDoS Attacks were done by using various Flooding
techniques which are used in DDoS attack.
The main purpose of this paper is to design an architecture which can reduce the Bandwidth
Distributed Denial of service Attack and make the victim site or server available for the normal users by
eliminating the zombie machines. Our Primary focus of this paper is to dispute how normal machines are
turning into zombies (Bots), how attack is been initiated, DDoS attack procedure and how an organization can
save their server from being a DDoS victim. In order to present this we implemented a simulated environment
with Cisco switches, Routers, Firewall, some virtual machines and some Attack tools to display a real DDoS
attack. By using Time scheduling, Resource Limiting, System log, Access Control List and some Modular
policy Framework we stopped the attack and identified the Attacker (Bot) machines
Hearing loss is one of the most common human impairments. It is estimated that by year 2015 more
than 700 million people will suffer mild deafness. Most can be helped by hearing aid devices depending on the
severity of their hearing loss. This paper describes the implementation and characterization details of a dual
channel transmitter front end (TFE) for digital hearing aid (DHA) applications that use novel micro
electromechanical- systems (MEMS) audio transducers and ultra-low power-scalable analog-to-digital
converters (ADCs), which enable a very-low form factor, energy-efficient implementation for next-generation
DHA. The contribution of the design is the implementation of the dual channel MEMS microphones and powerscalable
ADC system.
Influence of tensile behaviour of slab on the structural Behaviour of shear c...IJERD Editor
-A composite beam is composed of a steel beam and a slab connected by means of shear connectors
like studs installed on the top flange of the steel beam to form a structure behaving monolithically. This study
analyzes the effects of the tensile behavior of the slab on the structural behavior of the shear connection like slip
stiffness and maximum shear force in composite beams subjected to hogging moment. The results show that the
shear studs located in the crack-concentration zones due to large hogging moments sustain significantly smaller
shear force and slip stiffness than the other zones. Moreover, the reduction of the slip stiffness in the shear
connection appears also to be closely related to the change in the tensile strain of rebar according to the increase
of the load. Further experimental and analytical studies shall be conducted considering variables such as the
reinforcement ratio and the arrangement of shear connectors to achieve efficient design of the shear connection
in composite beams subjected to hogging moment.
Gold prospecting using Remote Sensing ‘A case study of Sudan’IJERD Editor
Gold has been extracted from northeast Africa for more than 5000 years, and this may be the first
place where the metal was extracted. The Arabian-Nubian Shield (ANS) is an exposure of Precambrian
crystalline rocks on the flanks of the Red Sea. The crystalline rocks are mostly Neoproterozoic in age. ANS
includes the nations of Israel, Jordan. Egypt, Saudi Arabia, Sudan, Eritrea, Ethiopia, Yemen, and Somalia.
Arabian Nubian Shield Consists of juvenile continental crest that formed between 900 550 Ma, when intra
oceanic arc welded together along ophiolite decorated arc. Primary Au mineralization probably developed in
association with the growth of intra oceanic arc and evolution of back arc. Multiple episodes of deformation
have obscured the primary metallogenic setting, but at least some of the deposits preserve evidence that they
originate as sea floor massive sulphide deposits.
The Red Sea Hills Region is a vast span of rugged, harsh and inhospitable sector of the Earth with
inimical moon-like terrain, nevertheless since ancient times it is famed to be an abode of gold and was a major
source of wealth for the Pharaohs of ancient Egypt. The Pharaohs old workings have been periodically
rediscovered through time. Recent endeavours by the Geological Research Authority of Sudan led to the
discovery of a score of occurrences with gold and massive sulphide mineralizations. In the nineties of the
previous century the Geological Research Authority of Sudan (GRAS) in cooperation with BRGM utilized
satellite data of Landsat TM using spectral ratio technique to map possible mineralized zones in the Red Sea
Hills of Sudan. The outcome of the study mapped a gossan type gold mineralization. Band ratio technique was
applied to Arbaat area and a signature of alteration zone was detected. The alteration zones are commonly
associated with mineralization. The alteration zones are commonly associated with mineralization. A filed check
confirmed the existence of stock work of gold bearing quartz in the alteration zone. Another type of gold
mineralization that was discovered using remote sensing is the gold associated with metachert in the Atmur
Desert.
Reducing Corrosion Rate by Welding DesignIJERD Editor
The paper addresses the importance of welding design to prevent corrosion at steel. Welding is
used to join pipe, profiles at bridges, spindle, and a lot more part of engineering construction. The
problems happened associated with welding are common issues in these fields, especially corrosion.
Corrosion can be reduced with many methods, they are painting, controlling humidity, and also good
welding design. In the research, it can be found that reducing residual stress on the welding can be
solved in corrosion rate reduction problem.
Preheating on 500oC and 600oC give better condition to reduce corosion rate than condition after
preheating 400oC. For all welding groove type, material with 500oC and 600oC preheating after 14 days
corrosion test is 0,5%-0,69% lost. Material with 400oC preheating after 14 days corrosion test is 0,57%-0,76%
lost.
Welding groove also influence corrosion rate. X and V type welding groove give better condition to reduce
corrosion rate than use 1/2V and 1/2 X welding groove. After 14 days corrosion test, the samples with
X welding groove type is 0,5%-0,57% lost. The samples with V welding groove after 14 days corrosion test is
0,51%-0,59% lost. The samples with 1/2V and 1/2X welding groove after 14 days corrosion test is 0,58%-
0,71% lost.
Router 1X3 – RTL Design and VerificationIJERD Editor
Routing is the process of moving a packet of data from source to destination and enables messages
to pass from one computer to another and eventually reach the target machine. A router is a networking device
that forwards data packets between computer networks. It is connected to two or more data lines from different
networks (as opposed to a network switch, which connects data lines from one single network). This paper,
mainly emphasizes upon the study of router device, it‟s top level architecture, and how various sub-modules of
router i.e. Register, FIFO, FSM and Synchronizer are synthesized, and simulated and finally connected to its top
module.
Active Power Exchange in Distributed Power-Flow Controller (DPFC) At Third Ha...IJERD Editor
This paper presents a component within the flexible ac-transmission system (FACTS) family, called
distributed power-flow controller (DPFC). The DPFC is derived from the unified power-flow controller (UPFC)
with an eliminated common dc link. The DPFC has the same control capabilities as the UPFC, which comprise
the adjustment of the line impedance, the transmission angle, and the bus voltage. The active power exchange
between the shunt and series converters, which is through the common dc link in the UPFC, is now through the
transmission lines at the third-harmonic frequency. DPFC multiple small-size single-phase converters which
reduces the cost of equipment, no voltage isolation between phases, increases redundancy and there by
reliability increases. The principle and analysis of the DPFC are presented in this paper and the corresponding
simulation results that are carried out on a scaled prototype are also shown.
Mitigation of Voltage Sag/Swell with Fuzzy Control Reduced Rating DVRIJERD Editor
Power quality has been an issue that is becoming increasingly pivotal in industrial electricity
consumers point of view in recent times. Modern industries employ Sensitive power electronic equipments,
control devices and non-linear loads as part of automated processes to increase energy efficiency and
productivity. Voltage disturbances are the most common power quality problem due to this the use of a large
numbers of sophisticated and sensitive electronic equipment in industrial systems is increased. This paper
discusses the design and simulation of dynamic voltage restorer for improvement of power quality and
reduce the harmonics distortion of sensitive loads. Power quality problem is occurring at non-standard
voltage, current and frequency. Electronic devices are very sensitive loads. In power system voltage sag,
swell, flicker and harmonics are some of the problem to the sensitive load. The compensation capability
of a DVR depends primarily on the maximum voltage injection ability and the amount of stored
energy available within the restorer. This device is connected in series with the distribution feeder at
medium voltage. A fuzzy logic control is used to produce the gate pulses for control circuit of DVR and the
circuit is simulated by using MATLAB/SIMULINK software.
Study on the Fused Deposition Modelling In Additive ManufacturingIJERD Editor
Additive manufacturing process, also popularly known as 3-D printing, is a process where a product
is created in a succession of layers. It is based on a novel materials incremental manufacturing philosophy.
Unlike conventional manufacturing processes where material is removed from a given work price to derive the
final shape of a product, 3-D printing develops the product from scratch thus obviating the necessity to cut away
materials. This prevents wastage of raw materials. Commonly used raw materials for the process are ABS
plastic, PLA and nylon. Recently the use of gold, bronze and wood has also been implemented. The complexity
factor of this process is 0% as in any object of any shape and size can be manufactured.
Spyware triggering system by particular string valueIJERD Editor
This computer programme can be used for good and bad purpose in hacking or in any general
purpose. We can say it is next step for hacking techniques such as keylogger and spyware. Once in this system if
user or hacker store particular string as a input after that software continually compare typing activity of user
with that stored string and if it is match then launch spyware programme.
A Blind Steganalysis on JPEG Gray Level Image Based on Statistical Features a...IJERD Editor
This paper presents a blind steganalysis technique to effectively attack the JPEG steganographic
schemes i.e. Jsteg, F5, Outguess and DWT Based. The proposed method exploits the correlations between
block-DCTcoefficients from intra-block and inter-block relation and the statistical moments of characteristic
functions of the test image is selected as features. The features are extracted from the BDCT JPEG 2-array.
Support Vector Machine with cross-validation is implemented for the classification.The proposed scheme gives
improved outcome in attacking.
Secure Image Transmission for Cloud Storage System Using Hybrid SchemeIJERD Editor
- Data over the cloud is transferred or transmitted between servers and users. Privacy of that
data is very important as it belongs to personal information. If data get hacked by the hacker, can be
used to defame a person’s social data. Sometimes delay are held during data transmission. i.e. Mobile
communication, bandwidth is low. Hence compression algorithms are proposed for fast and efficient
transmission, encryption is used for security purposes and blurring is used by providing additional
layers of security. These algorithms are hybridized for having a robust and efficient security and
transmission over cloud storage system.
Application of Buckley-Leverett Equation in Modeling the Radius of Invasion i...IJERD Editor
A thorough review of existing literature indicates that the Buckley-Leverett equation only analyzes
waterflood practices directly without any adjustments on real reservoir scenarios. By doing so, quite a number
of errors are introduced into these analyses. Also, for most waterflood scenarios, a radial investigation is more
appropriate than a simplified linear system. This study investigates the adoption of the Buckley-Leverett
equation to estimate the radius invasion of the displacing fluid during waterflooding. The model is also adopted
for a Microbial flood and a comparative analysis is conducted for both waterflooding and microbial flooding.
Results shown from the analysis doesn’t only records a success in determining the radial distance of the leading
edge of water during the flooding process, but also gives a clearer understanding of the applicability of
microbes to enhance oil production through in-situ production of bio-products like bio surfactans, biogenic
gases, bio acids etc.
Gesture Gaming on the World Wide Web Using an Ordinary Web CameraIJERD Editor
- Gesture gaming is a method by which users having a laptop/pc/x-box play games using natural or
bodily gestures. This paper presents a way of playing free flash games on the internet using an ordinary webcam
with the help of open source technologies. Emphasis in human activity recognition is given on the pose
estimation and the consistency in the pose of the player. These are estimated with the help of an ordinary web
camera having different resolutions from VGA to 20mps. Our work involved giving a 10 second documentary to
the user on how to play a particular game using gestures and what are the various kinds of gestures that can be
performed in front of the system. The initial inputs of the RGB values for the gesture component is obtained by
instructing the user to place his component in a red box in about 10 seconds after the short documentary before
the game is finished. Later the system opens the concerned game on the internet on popular flash game sites like
miniclip, games arcade, GameStop etc and loads the game clicking at various places and brings the state to a
place where the user is to perform only gestures to start playing the game. At any point of time the user can call
off the game by hitting the esc key and the program will release all of the controls and return to the desktop. It
was noted that the results obtained using an ordinary webcam matched that of the Kinect and the users could
relive the gaming experience of the free flash games on the net. Therefore effective in game advertising could
also be achieved thus resulting in a disruptive growth to the advertising firms.
Hardware Analysis of Resonant Frequency Converter Using Isolated Circuits And...IJERD Editor
-LLC resonant frequency converter is basically a combo of series as well as parallel resonant ckt. For
LCC resonant converter it is associated with a disadvantage that, though it has two resonant frequencies, the
lower resonant frequency is in ZCS region[5]. For this application, we are not able to design the converter
working at this resonant frequency. LLC resonant converter existed for a very long time but because of
unknown characteristic of this converter it was used as a series resonant converter with basically a passive
(resistive) load. . Here, it was designed to operate in switching frequency higher than resonant frequency of the
series resonant tank of Lr and Cr converter acts very similar to Series Resonant Converter. The benefit of LLC
resonant converter is narrow switching frequency range with light load[6] . Basically, the control ckt plays a
very imp. role and hence 555 Timer used here provides a perfect square wave as the control ckt provides no
slew rate which makes the square wave really strong and impenetrable. The dead band circuit provides the
exclusive dead band in micro seconds so as to avoid the simultaneous firing of two pairs of IGBT’s where one
pair switches off and the other on for a slightest period of time. Hence, the isolator ckt here is associated with
each and every ckt used because it acts as a driver and an isolation to each of the IGBT is provided with one
exclusive transformer supply[3]. The IGBT’s are fired using the appropriate signal using the previous boards
and hence at last a high frequency rectifier ckt with a filtering capacitor is used to get an exact dc
waveform .The basic goal of this particular analysis is to observe the wave forms and characteristics of
converters with differently positioned passive elements in the form of tank circuits.
Simulated Analysis of Resonant Frequency Converter Using Different Tank Circu...IJERD Editor
LLC resonant frequency converter is basically a combo of series as well as parallel resonant ckt. For
LCC resonant converter it is associated with a disadvantage that, though it has two resonant frequencies, the
lower resonant frequency is in ZCS region [5]. For this application, we are not able to design the converter
working at this resonant frequency. LLC resonant converter existed for a very long time but because of
unknown characteristic of this converter it was used as a series resonant converter with basically a passive
(resistive) load. . Here, it was designed to operate in switching frequency higher than resonant frequency of the
series resonant tank of Lr and Cr converter acts very similar to Series Resonant Converter. The benefit of LLC
resonant converter is narrow switching frequency range with light load[6] . Basically, the control ckt plays a
very imp. role and hence 555 Timer used here provides a perfect square wave as the control ckt provides no
slew rate which makes the square wave really strong and impenetrable. The dead band circuit provides the
exclusive dead band in micro seconds so as to avoid the simultaneous firing of two pairs of IGBT’s where one
pair switches off and the other on for a slightest period of time. Hence, the isolator ckt here is associated with
each and every ckt used because it acts as a driver and an isolation to each of the IGBT is provided with one
exclusive transformer supply[3]. The IGBT’s are fired using the appropriate signal using the previous boards
and hence at last a high frequency rectifier ckt with a filtering capacitor is used to get an exact dc
waveform .The basic goal of this particular analysis is to observe the wave forms and characteristics of
converters with differently positioned passive elements in the form of tank circuits. The supported simulation
is done through PSIM 6.0 software tool
Amateurs Radio operator, also known as HAM communicates with other HAMs through Radio
waves. Wireless communication in which Moon is used as natural satellite is called Moon-bounce or EME
(Earth -Moon-Earth) technique. Long distance communication (DXing) using Very High Frequency (VHF)
operated amateur HAM radio was difficult. Even with the modest setup having good transceiver, power
amplifier and high gain antenna with high directivity, VHF DXing is possible. Generally 2X11 YAGI antenna
along with rotor to set horizontal and vertical angle is used. Moon tracking software gives exact location,
visibility of Moon at both the stations and other vital data to acquire real time position of moon.
“MS-Extractor: An Innovative Approach to Extract Microsatellites on „Y‟ Chrom...IJERD Editor
Simple Sequence Repeats (SSR), also known as Microsatellites, have been extensively used as
molecular markers due to their abundance and high degree of polymorphism. The nucleotide sequences of
polymorphic forms of the same gene should be 99.9% identical. So, Microsatellites extraction from the Gene is
crucial. However, Microsatellites repeat count is compared, if they differ largely, he has some disorder. The Y
chromosome likely contains 50 to 60 genes that provide instructions for making proteins. Because only males
have the Y chromosome, the genes on this chromosome tend to be involved in male sex determination and
development. Several Microsatellite Extractors exist and they fail to extract microsatellites on large data sets of
giga bytes and tera bytes in size. The proposed tool “MS-Extractor: An Innovative Approach to extract
Microsatellites on „Y‟ Chromosome” can extract both Perfect as well as Imperfect Microsatellites from large
data sets of human genome „Y‟. The proposed system uses string matching with sliding window approach to
locate Microsatellites and extracts them.
Importance of Measurements in Smart GridIJERD Editor
- The need to get reliable supply, independence from fossil fuels, and capability to provide clean
energy at a fixed and lower cost, the existing power grid structure is transforming into Smart Grid. The
development of a smart energy distribution grid is a current goal of many nations. A Smart Grid should have
new capabilities such as self-healing, high reliability, energy management, and real-time pricing. This new era
of smart future grid will lead to major changes in existing technologies at generation, transmission and
distribution levels. The incorporation of renewable energy resources and distribution generators in the existing
grid will increase the complexity, optimization problems and instability of the system. This will lead to a
paradigm shift in the instrumentation and control requirements for Smart Grids for high quality, stable and
reliable electricity supply of power. The monitoring of the grid system state and stability relies on the
availability of reliable measurement of data. In this paper the measurement areas that highlight new
measurement challenges, development of the Smart Meters and the critical parameters of electric energy to be
monitored for improving the reliability of power systems has been discussed.
Study of Macro level Properties of SCC using GGBS and Lime stone powderIJERD Editor
One of the major environmental concerns is the disposal of the waste materials and utilization of
industrial by products. Lime stone quarries will produce millions of tons waste dust powder every year. Having
considerable high degree of fineness in comparision to cement this material may be utilized as a partial
replacement to cement. For this purpose an experiment is conducted to investigate the possibility of using lime
stone powder in the production of SCC with combined use GGBS and how it affects the fresh and mechanical
properties of SCC. First SCC is made by replacing cement with GGBS in percentages like 10, 20, 30, 40, 50 and
by taking the optimum mix with GGBS lime stone powder is blended to mix in percentages like 5, 10, 15, 20 as
a partial replacement to cement. Test results shows that the SCC mix with combination of 30% GGBS and 15%
limestone powder gives maximum compressive strength and fresh properties are also in the limits prescribed by
the EFNARC.
Epistemic Interaction - tuning interfaces to provide information for AI supportAlan Dix
Paper presented at SYNERGY workshop at AVI 2024, Genoa, Italy. 3rd June 2024
https://alandix.com/academic/papers/synergy2024-epistemic/
As machine learning integrates deeper into human-computer interactions, the concept of epistemic interaction emerges, aiming to refine these interactions to enhance system adaptability. This approach encourages minor, intentional adjustments in user behaviour to enrich the data available for system learning. This paper introduces epistemic interaction within the context of human-system communication, illustrating how deliberate interaction design can improve system understanding and adaptation. Through concrete examples, we demonstrate the potential of epistemic interaction to significantly advance human-computer interaction by leveraging intuitive human communication strategies to inform system design and functionality, offering a novel pathway for enriching user-system engagements.
PHP Frameworks: I want to break free (IPC Berlin 2024)Ralf Eggert
In this presentation, we examine the challenges and limitations of relying too heavily on PHP frameworks in web development. We discuss the history of PHP and its frameworks to understand how this dependence has evolved. The focus will be on providing concrete tips and strategies to reduce reliance on these frameworks, based on real-world examples and practical considerations. The goal is to equip developers with the skills and knowledge to create more flexible and future-proof web applications. We'll explore the importance of maintaining autonomy in a rapidly changing tech landscape and how to make informed decisions in PHP development.
This talk is aimed at encouraging a more independent approach to using PHP frameworks, moving towards a more flexible and future-proof approach to PHP development.
Slack (or Teams) Automation for Bonterra Impact Management (fka Social Soluti...Jeffrey Haguewood
Sidekick Solutions uses Bonterra Impact Management (fka Social Solutions Apricot) and automation solutions to integrate data for business workflows.
We believe integration and automation are essential to user experience and the promise of efficient work through technology. Automation is the critical ingredient to realizing that full vision. We develop integration products and services for Bonterra Case Management software to support the deployment of automations for a variety of use cases.
This video focuses on the notifications, alerts, and approval requests using Slack for Bonterra Impact Management. The solutions covered in this webinar can also be deployed for Microsoft Teams.
Interested in deploying notification automations for Bonterra Impact Management? Contact us at sales@sidekicksolutionsllc.com to discuss next steps.
Smart TV Buyer Insights Survey 2024 by 91mobiles.pdf91mobiles
91mobiles recently conducted a Smart TV Buyer Insights Survey in which we asked over 3,000 respondents about the TV they own, aspects they look at on a new TV, and their TV buying preferences.
Connector Corner: Automate dynamic content and events by pushing a buttonDianaGray10
Here is something new! In our next Connector Corner webinar, we will demonstrate how you can use a single workflow to:
Create a campaign using Mailchimp with merge tags/fields
Send an interactive Slack channel message (using buttons)
Have the message received by managers and peers along with a test email for review
But there’s more:
In a second workflow supporting the same use case, you’ll see:
Your campaign sent to target colleagues for approval
If the “Approve” button is clicked, a Jira/Zendesk ticket is created for the marketing design team
But—if the “Reject” button is pushed, colleagues will be alerted via Slack message
Join us to learn more about this new, human-in-the-loop capability, brought to you by Integration Service connectors.
And...
Speakers:
Akshay Agnihotri, Product Manager
Charlie Greenberg, Host
UiPath Test Automation using UiPath Test Suite series, part 4DianaGray10
Welcome to UiPath Test Automation using UiPath Test Suite series part 4. In this session, we will cover Test Manager overview along with SAP heatmap.
The UiPath Test Manager overview with SAP heatmap webinar offers a concise yet comprehensive exploration of the role of a Test Manager within SAP environments, coupled with the utilization of heatmaps for effective testing strategies.
Participants will gain insights into the responsibilities, challenges, and best practices associated with test management in SAP projects. Additionally, the webinar delves into the significance of heatmaps as a visual aid for identifying testing priorities, areas of risk, and resource allocation within SAP landscapes. Through this session, attendees can expect to enhance their understanding of test management principles while learning practical approaches to optimize testing processes in SAP environments using heatmap visualization techniques
What will you get from this session?
1. Insights into SAP testing best practices
2. Heatmap utilization for testing
3. Optimization of testing processes
4. Demo
Topics covered:
Execution from the test manager
Orchestrator execution result
Defect reporting
SAP heatmap example with demo
Speaker:
Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP
Builder.ai Founder Sachin Dev Duggal's Strategic Approach to Create an Innova...Ramesh Iyer
In today's fast-changing business world, Companies that adapt and embrace new ideas often need help to keep up with the competition. However, fostering a culture of innovation takes much work. It takes vision, leadership and willingness to take risks in the right proportion. Sachin Dev Duggal, co-founder of Builder.ai, has perfected the art of this balance, creating a company culture where creativity and growth are nurtured at each stage.
Dev Dives: Train smarter, not harder – active learning and UiPath LLMs for do...UiPathCommunity
💥 Speed, accuracy, and scaling – discover the superpowers of GenAI in action with UiPath Document Understanding and Communications Mining™:
See how to accelerate model training and optimize model performance with active learning
Learn about the latest enhancements to out-of-the-box document processing – with little to no training required
Get an exclusive demo of the new family of UiPath LLMs – GenAI models specialized for processing different types of documents and messages
This is a hands-on session specifically designed for automation developers and AI enthusiasts seeking to enhance their knowledge in leveraging the latest intelligent document processing capabilities offered by UiPath.
Speakers:
👨🏫 Andras Palfi, Senior Product Manager, UiPath
👩🏫 Lenka Dulovicova, Product Program Manager, UiPath
GDG Cloud Southlake #33: Boule & Rebala: Effective AppSec in SDLC using Deplo...James Anderson
Effective Application Security in Software Delivery lifecycle using Deployment Firewall and DBOM
The modern software delivery process (or the CI/CD process) includes many tools, distributed teams, open-source code, and cloud platforms. Constant focus on speed to release software to market, along with the traditional slow and manual security checks has caused gaps in continuous security as an important piece in the software supply chain. Today organizations feel more susceptible to external and internal cyber threats due to the vast attack surface in their applications supply chain and the lack of end-to-end governance and risk management.
The software team must secure its software delivery process to avoid vulnerability and security breaches. This needs to be achieved with existing tool chains and without extensive rework of the delivery processes. This talk will present strategies and techniques for providing visibility into the true risk of the existing vulnerabilities, preventing the introduction of security issues in the software, resolving vulnerabilities in production environments quickly, and capturing the deployment bill of materials (DBOM).
Speakers:
Bob Boule
Robert Boule is a technology enthusiast with PASSION for technology and making things work along with a knack for helping others understand how things work. He comes with around 20 years of solution engineering experience in application security, software continuous delivery, and SaaS platforms. He is known for his dynamic presentations in CI/CD and application security integrated in software delivery lifecycle.
Gopinath Rebala
Gopinath Rebala is the CTO of OpsMx, where he has overall responsibility for the machine learning and data processing architectures for Secure Software Delivery. Gopi also has a strong connection with our customers, leading design and architecture for strategic implementations. Gopi is a frequent speaker and well-known leader in continuous delivery and integrating security into software delivery.
JMeter webinar - integration with InfluxDB and GrafanaRTTS
Watch this recorded webinar about real-time monitoring of application performance. See how to integrate Apache JMeter, the open-source leader in performance testing, with InfluxDB, the open-source time-series database, and Grafana, the open-source analytics and visualization application.
In this webinar, we will review the benefits of leveraging InfluxDB and Grafana when executing load tests and demonstrate how these tools are used to visualize performance metrics.
Length: 30 minutes
Session Overview
-------------------------------------------
During this webinar, we will cover the following topics while demonstrating the integrations of JMeter, InfluxDB and Grafana:
- What out-of-the-box solutions are available for real-time monitoring JMeter tests?
- What are the benefits of integrating InfluxDB and Grafana into the load testing stack?
- Which features are provided by Grafana?
- Demonstration of InfluxDB and Grafana using a practice web application
To view the webinar recording, go to:
https://www.rttsweb.com/jmeter-integration-webinar
GraphRAG is All You need? LLM & Knowledge GraphGuy Korland
Guy Korland, CEO and Co-founder of FalkorDB, will review two articles on the integration of language models with knowledge graphs.
1. Unifying Large Language Models and Knowledge Graphs: A Roadmap.
https://arxiv.org/abs/2306.08302
2. Microsoft Research's GraphRAG paper and a review paper on various uses of knowledge graphs:
https://www.microsoft.com/en-us/research/blog/graphrag-unlocking-llm-discovery-on-narrative-private-data/
International Journal of Engineering Research and Development
1. International Journal of Engineering Research and Development
e-ISSN: 2278-067X, p-ISSN: 2278-800X, www.ijerd.com
Volume 10, Issue 10 (October 2014), PP.70-74
Testing and Relocating of Memory with Address
Programmability
Kosuru.Maruthi1, Tadi.Venkateswara Reddy, 2 C.R.S.Hanuman3
1(M.Tech Student in VLSI & Embedded Systems, S.I.T.E, Tadepalligudem, India)
2(Assistant Professor , ECE Department, S.I.T.E, Tadepalligudem, India )
3(Associate Professor, ECE Department, S.I.T.E, Tadepalligudem, India)
Abstract:- Most of the System-on-Chip (SoC)‟s area is covered by embedded memories. As these memories
are very tightly integrated, consists majority of defects in SoC. Detection of such a complex and diverse faults
during fabrication is not possible. Hence leads to failure of soc in field. Usage of test algorithms may increase
the coverage of complex faults, but unexpected failures can‟t be covered by these algorithm. Providing
possibility of choosing testing algorithms before using in SoC is very important. Programmable BIST
approaches, allowing selecting after fabrication a large variety of memory tests, are therefore desirable, but
may lead on unacceptable area cost. BIST approaches enabling test algorithm programmability and data
background programmability at low area cost have been presented in the past. However, no proposals exist for
programming the address sequence used by the test algorithm. In this paper, we extend programmable BIST to
complete programmability. This new feature is implemented at low cost by using the memory under test itself
to store the desired address sequence and some compact circuitry that enables using this sequence for testing the
memory.
Keywords:- Built In Self Test (BIST), Memory BIST (MBIST), Memory test algorithms, System-on-Chip
(SoC).
I. INTRODUCTION
Nowadays, the area occupied by embedded memories in System-on-Chip (SoC) is about 90%, and
expected to rise up to 94% by 2015. As those memories are very tightly integrated with large number of
transistors causes 90% of overall faults in system on chips Thus, they concentrate the large majority of defects.
In addition, with aggressive nanometer scaling, defect types are becoming more complex and diverse and may
escape detection during fabrication test. If they are not treated adequately, the above trends will increase defect
level, affect circuit quality dramatically and impact reliability, as undetected fabrication faults will be
manifested as field failures. To cope with, the ability to guaranty a high quality test should be integrated in
memory BIST, which is the mainstream test technology for embedded memories. Memory BIST generators can
integrate a limited set of test algorithms [1],[2],[3]. Thus, only the test algorithms selected during the design
phase can be used after fabrication. However, fixing the memory test algorithms during the design phase is not a
good strategy as unexpected failures may be discovered after production. Also, integrating pre-emotively a large
number of test algorithms in the BIST generator will result in large area cost. Thus, programmable memory
BIST enabling selecting the memory, test stimuli in silicon and testing the memory for a wide variety of faults is
becoming mandatory. This flexibility has to be achieved at low area cost, to make the approach attractive for
real products. Also, the flexibility offered by programmable BIST is highly important for thorough screening
inspection, failure analysis of customer returns, debug of a new fabrication process or a new memory design,
and production ramp-up, since the most challenging issue in these processes is to detect and/or diagnose
unexpected failures.
There are three memory test stimuli components 1) The test algorithm determining the operations
performed in each memory cell and the instances they performed .2) The data used in these operations .3) The
sequence in which the memory addresses are visited by the test algorithm. Previous work comprises
programmable BIST enabling test algorithm programmability [4],[8] data programmability [7],[9], but no
previous work exist concerning address sequence programmability. In the present paper we extend
programmable BIST to incorporated address sequence programmability in addition to test algorithm
programmability and test data programmability. Thus, all the components of memory test stimuli could be
programmed in silicon, enabling testing unexpected failures during fabrication go/no go test, as well as
comprehensive testing and diagnosis during failure analysis of customer returns; debug of new fabrication
process or new memory design; and production ramp-up. The main challenge when implementing complete
70
2. Testing and Relocating of Memory with Address Programmability
programmability of the address sequence used concerns the large amount of data that have to be programmed
(here the complete memory address space) and the associated high hardware cost. We resolve this problem by
adapting the transparent BIST scheme [10],[11] in a way enabling storing the address sequence in the memory
under test and using it for testing the memory.
II. FAULT MODELS, TEST ALGORITHMS
A fault model is a systematic and precise representation of physical faults in a form suitable for
simulation and test generation [11]. Applying the reduced functional model, SRAM faults can be classified as
follows: 1. Address Fault (AF), 2. Address Decoder Open Faults (ADOF), 3. Coupling Faults (CF), 3a. Inversion
Coupling Faults (CFin), 3b. Idempotent Coupling Faults (CFid), 3c. State Coupling Faults (CFst), 4. Bridge
Coupling Faults (BF) 5. Data Retention Faults (DRF) 6. Stuck-at Faults (SAF), 7. Stuck Open Faults (SOF), 8.
Transition Faults (TF)
An efficient memory test should provide the best fault coverage in shortest time [13].March tests have the
advantage of shortest test time with good fault coverage. There are many March tests such as March C, March C-,
March C+, March 3 and so on. Table .1 compares the test length, complexity and fault coverage of them. „n‟ stands for
the capacity of memory.
Algorithms Test length Complexity Fault coverage
March C- 10n O(n) AF, SAF, SOF,CF
March SS 22n O(n) AF, SAF, SOF, CF
M0M1 4n O(n) SAF, SOF
March LR with BDS 23n O(n) AF, SAF, SOF, CF
Table: 1 Comparison of different March tests
As shown in TABLE 1, March C- has better fault coverage than March C and shorter test time than
March C and March C+. So March C- has been chosen as BIST algorithm in this Paper.
III. BISR STRATEGY WITH REDUNDANCY ARCHITECTURE:
SRAM BISR strategy is flexible. The SRAM users can decide whether to use it by setting a signal. So the
redundancy of the SRAM is designed to be selectable. In another word, some normal words in SRAM can be
selected as redundancy if the SRAM needs to repair itself. We call these words Normal-Redundant words to
distinguish them from the real normal ones.
Figure: 1 Architecture of redundancy in SRAM
We take a 64 × 4 SRAM for example, as shown in Figure 1. There are 60 normal words and 4
Normal-Redundant words. When the BISR is used, the Normal-Redundant words are accessed as normal ones.
Otherwise, the Normal-Redundant words can only be accessed when there are faults in normal words. In this case,
the SRAM can only offer capacity of 60 words to users. This should be referred in SRAM manual in details.
This kind of selectable redundancy architecture can save area and increase efficiency. After BISR is applied,
other modules in SRAM can remain unchanged. Thus the selectable redundancy won't bring any problem to
SRAM compiler.
71
3. Testing and Relocating of Memory with Address Programmability
IV. PROGRAMMABLE MEMORY BIST
Work on most of programmable memory BIST approaches concerns the programmability of the
memory test algorithm [4],[6],[8]. The programmable memory BIST proposed in [7] has several advantages. It
enables programming both test algorithms and test data. It implements test algorithm programmability at low
cost, by extracting the different levels of hierarchy of the test algorithm and associating a hardware bloc to each
of them, resulting on low cost hardware. It enables low-cost implementation of full-data Programmability by
adapting the transparent memory test approach [10-16] in a manner that uses the memory under test for
programming the test data. As stated in the introduction, the aim of this paper is to extent the above
programmable BIST scheme to enable programming the address sequence, thus enabling programmability
of all components of memory test: test algorithm; test data; address sequence. The architecture for programming
march test algorithms proposed in [7] (and implemented and evaluated in [8]). This architecture uses an
Instruction Register specifying the current match test sequence by means of several fields indicating: the
number of operations (NO) performed by the current march sequence; the order Up or Down (U/D) in which
the address counter is used; the address mode like fast-X, fast-Y, fast-D (@mode); several operation fields (O1,
O2, Om-1), each determining one of the operations used by the march sequence (usually read and write, but other
operations like read-modify-write, no operation, etc are also supported if necessary); the value of the memory
word (DATA) to be used during the march sequence (fewer bits that the actual memory word can be used and
expended by the BIST circuitry to create the full word); one data polarity bit for each operation field (P1, P2,
Pm-1), specifying if the corresponding operation uses the data word in its direct or complemented form; a wait bit
(W) forcing all the operations of the march sequence to the non-operation (idle) mode, in order to implement a
retention test; a bit (TE) set to 1 only at the last instruction of the test algorithm to indicate that the test finishes at
the end of the current march sequence.
Figure 2: Proposed Architecture for Programming March C- Algorithm
Each field of the Instruction Register is interpreted by a specific block of the BIST architecture shown
in Fig: 2. They enable a very compact implementation resulting on low-cost programmable BIST allowing
selecting in silicon any march test algorithm at will, provided that its longest march sequence can be supported
by the number of Operation fields and Polarity bits of the Instruction Register, selected during the design phase.
As this size only impacts the size of the Instruction Register (linearly), the size of the Control MUX (linearly)
and the size of the Cycles Counter (logarithmically), selecting a large number of operations will slightly affect
the BIST area and can be done comfortably, to cover any march test algorithm of realistic length. March test
algorithms are powerful and can be designed to test a wide range of static and dynamic memory fault models.
V. SELF REPAIRING MECHANISM WITH BISR:
The architecture of the proposed BISR strategy is shown in Fig:3. It consists of three parts: PBIST module,
BIAA module and MUX module. We call the SRAM with BISR a system. The BIST module uses March C- to
test the addresses of the normal words in SRAM. It detects SRAM failures with a comparator that compares
actual memory data with expected data.
72
4. Testing and Relocating of Memory with Address Programmability
Figure: 3 Proposed BISR Architecture.
If there is a failure (compare_Q = 1), the current address is considered as a faulty address. The BIAA
module can store faulty addresses in a memory named Fault_A_Mem. There is a counter in BIAA that counts
the number of faulty addresses. When BISR is used (bisr_h = 1), the faulty addresses can be replaced with
redundant addresses to repair the SRAM. The inputs of SRAM in different operation modes are controlled by
the MUX module. In test mode (bist_h=1), the inputs of SRAM are generated in BISR while they are equal to
system inputs in access mode(bist_h= 0).
VI. TRANSPARENT BIST APPROACH
We present a scheme enabling programming the address sequence used by March test algorithms
without any limitations (i.e. any address sequence can be programmed in silicon). Enabling programming at will
the full address space would require an auxiliary memory of large capacity for storing any memory address
sequence selected after fabrication. We observe that the number of addresses of the auxiliary memory is the
same as the number of addresses of the memory under test. Based to this observation, we eliminate the auxiliary
memory and instead we use the memory under test to store the desired address sequence. We store it in a manner
that allows producing the desired address sequence during the March tests. We adopt the transparent BIST
approach in order to preserve the stored address sequence during testing.
VII. SIMULATION RESULT AND CONCLUSION:
We extend previous programmable memory BIST architecture to enable programmability of all three
components of memory test stimuli (test algorithm, data background, and address sequencing). It enables
testing unexpected failures during fabrication Go/No Go test, as well as comprehensive test and diagnosis during
failure analysis of customer returns; debug of new fabrication process or new memory design; and production
ramp-up.
Figure: 4 simulated output of proposed BIA
73
5. Testing and Relocating of Memory with Address Programmability
As these benefits are obtained at low area cost, the proposed memory BIST becomes highly attractive
not only for test chips dedicated to new memory and/or process debug but also for integrating it into final
products. The proposed BIA (built in analyzer) was simulated with ModelSim PE student version using Verilog
is shown in Fig:4.
REFERENCES
[1]. Semiconductor Industry Association, “International technology roadmap for semiconductors (ITRS),
74
2003 edition,” Hsinchu, Taiwan, Dec.2003.
[2]. C. Stapper, A. Mclaren, and M. Dreckman, “Yield model for Productivity Optimization of VLSI
Memory Chips with redundancy and Partially good Product,” IBM Journal of Research and
Development, Vol. 24, No. 3, pp. 398-409, May 1980.
[3]. W. K. Huang, Y. H. shen, and F. lombrardi, “New approaches for repairs of memories with redundancy
by row/column deletion for yield enhancement,” IEEE Transactions on Computer-Aided Design, vol.
9, No. 3, pp. 323-328, Mar. 1990.
[4]. P. Mazumder and Y. S. Jih, “A new built-in self-repair approach to VLSI memory yield enhancement
by using neuraltype circuits,” IEEE transactions on Computer Aided Design, vol. 12, No. 1, Jan, 1993.
[5]. H. C. Kim, D. S. Yi, J. Y. Park, and C. H. Cho, “A BISR (built-in self repair) circuit for embedded
memory with multiple redundancies,” VLSI and CAD 6th International Conference, pp. 602-605, Oct.
1999.
[6]. Shyue-Kung Lu, Chun-Lin Yang, and Han-Wen Lin, “Efficient BISR Techniques for Word-Oriented
Embedded Memories with Hierarchical Redundancy,” IEEE ICIS-COMSAR, pp. 355-360, 2006.
[7]. C. Stroud, A Designer‟s Guide to Built-In Self-Test, Kluwer Academic Publishers, 2002.
[8]. Karunaratne. M and Oomann. B, “Yield gain with memory BISR-a case study,” IEEE MWSCAS, pp.
699-702, 2009.
[9]. I. Kang, W. Jeong, and S. Kang, “ High-efficiency memory BISR with two serial RA stages using
spare memories,” IET Electron. Lett., vol. 44,no. 8, pp. 515-517, Apr. 2008.
[10]. Heon-cheol Kim, Dong-soon Yi, Jin-young Park, and Chang-hyun Cho, “A BISR (Built-In Self-
Repair) circuit for embedded memory with multiple redundancies,” in Proc. Int. Conf. VLSI CAD, Oct.
1999, pp. 602-605.
[11]. M. Sachdev, V. Zieren, and P. Janssen, “Defect detection with transient current testing and its potential
for deep submicron CMOS ICs,” IEEE International Test Conference, pp.204-213, Oct. 1998.
[12]. Mentor Graohics, MBIST Architect Process Guide, Software Version 8.2009_3, Aug 2009, pp. 113-
116.
[13]. Pavlov. Andrei and Sachdev. Manoj, CMOS SRAM Circuit Design and Parametric Test in Nano-
Scaled Technologies, CA: Springer, 2008, pp.85-86.