Electron microscopy is a technique that uses beams of electrons instead of light to view objects. There are two main types: transmission electron microscopy (TEM) and scanning electron microscopy (SEM). TEM uses electrons transmitted through an ultra-thin sample to form magnified images, allowing visualization of structures as small as single atoms. SEM scans a focused beam of electrons across a sample to produce high-resolution 3D images of surface topology and composition. Newer techniques like scanning tunneling microscopy can achieve even higher resolution down to fractions of a nanometer. Electron microscopy has enabled significant advances in fields like materials science, biology, and nanotechnology.
1) CONTENTS:
Introduction
Construction
Working Principle
The Electron Gun And Condenser System
Image Producing & Recording System
TEM Applications
Advantages
Disadvantages
2) INTRODUCTION:
A Transmission Electron Microscope (TEM) utilizes energetic electron beam to provide morphologic, compositional and crystallographic information on samples.TEM produce High-Resolution, 2D images. The first transmission electron microscope was invented in 1933 by Max Knoll and E. Ruska at the Technical College in Berlin.
3) CONSTRUCTION:
Electron Gun – to produce electrons.
Magnetic condensing lens - to condense the electrons and to adjust the spot size of the electron.The specimen is placed in between the condensing lens and the objective lens.
The magnetic objective lens - to block the high angle diffracted
beam.
Aperture - eliminate the diffracted beam (if any) and in turn
increases the contrast of the image.The magnetic projector lens - to achieve higher magnification.
Fluorescent (Phosphor) screen – To record the image.
4)Working Principle: High voltage electron beam is transmitted through a specimen to form an image. Stream of electrons are produced by the electron gun and is made to fall over the specimen using the magnetic condensing lens.Electrons are made to pass through the specimen and the image is formed on the fluorescent screen.
5) The Electron Gun And Condenser System: The image can be manipulated by adjusting the voltage of the gun to accelerate or decrease the speed of electrons as well as changing the electromagnetic wavelength via the solenoids.
6) Image Producing & Recording System:
Air needs to be pumped out of the vacuum chamber, creating a
space where electrons are able to move.The objective lens is used to produces a image and then further magnified by the projector lens. The lighter areas of the image represent the places where a greater number of electrons were able to pass through the sample and the darker areas reflect the dense areas of the object. Monochromatic image is recorded in fluorescent screen or by capturing the image digitally to display on a computer monitor,basically stored in a TIFF or JPEG format.
7)TEM Applications:
It analyze structure, topographical, morphological, compositional and crystalline information. Can be used in semiconductor analysis and production and the manufacturing of computer and silicon chips. To identify fractures and damages.
8)Advantages:
Powerful magnification . It can produce magnification as high as 1,00,000 times as that of the size of the object.
Images are high-quality and detailed.They are easy to operate with proper training.
9)Disadvantages:
Large and very expensive.
Laborious sample preparation.
TEM require special housing and maintenance.
Samples are limited to those that are electron transparent.
10) Thank You
5. Electron spectroscopy for surface analysis.
Applications of scanning electron microscope Applications of Transmission electron Microscope Brief history of electron microscopy Coherency and stability on the electron beam Different kinds of electron microscopes Different parts of electron microscope Effect of Brightness Electron Microscopy Electron Sources Field emission Interaction of electrons with Matter Limitations of Transmission electron Microscope Magnification contrast etc Material Characterization techniques Resolution Scanning electron microscope Scattering of electrons Specimen preparation of Transmission electron Microscope Thermionic Emission Various sources of electron beams and Detectors
1) CONTENTS:
Introduction
Construction
Working Principle
The Electron Gun And Condenser System
Image Producing & Recording System
TEM Applications
Advantages
Disadvantages
2) INTRODUCTION:
A Transmission Electron Microscope (TEM) utilizes energetic electron beam to provide morphologic, compositional and crystallographic information on samples.TEM produce High-Resolution, 2D images. The first transmission electron microscope was invented in 1933 by Max Knoll and E. Ruska at the Technical College in Berlin.
3) CONSTRUCTION:
Electron Gun – to produce electrons.
Magnetic condensing lens - to condense the electrons and to adjust the spot size of the electron.The specimen is placed in between the condensing lens and the objective lens.
The magnetic objective lens - to block the high angle diffracted
beam.
Aperture - eliminate the diffracted beam (if any) and in turn
increases the contrast of the image.The magnetic projector lens - to achieve higher magnification.
Fluorescent (Phosphor) screen – To record the image.
4)Working Principle: High voltage electron beam is transmitted through a specimen to form an image. Stream of electrons are produced by the electron gun and is made to fall over the specimen using the magnetic condensing lens.Electrons are made to pass through the specimen and the image is formed on the fluorescent screen.
5) The Electron Gun And Condenser System: The image can be manipulated by adjusting the voltage of the gun to accelerate or decrease the speed of electrons as well as changing the electromagnetic wavelength via the solenoids.
6) Image Producing & Recording System:
Air needs to be pumped out of the vacuum chamber, creating a
space where electrons are able to move.The objective lens is used to produces a image and then further magnified by the projector lens. The lighter areas of the image represent the places where a greater number of electrons were able to pass through the sample and the darker areas reflect the dense areas of the object. Monochromatic image is recorded in fluorescent screen or by capturing the image digitally to display on a computer monitor,basically stored in a TIFF or JPEG format.
7)TEM Applications:
It analyze structure, topographical, morphological, compositional and crystalline information. Can be used in semiconductor analysis and production and the manufacturing of computer and silicon chips. To identify fractures and damages.
8)Advantages:
Powerful magnification . It can produce magnification as high as 1,00,000 times as that of the size of the object.
Images are high-quality and detailed.They are easy to operate with proper training.
9)Disadvantages:
Large and very expensive.
Laborious sample preparation.
TEM require special housing and maintenance.
Samples are limited to those that are electron transparent.
10) Thank You
5. Electron spectroscopy for surface analysis.
Applications of scanning electron microscope Applications of Transmission electron Microscope Brief history of electron microscopy Coherency and stability on the electron beam Different kinds of electron microscopes Different parts of electron microscope Effect of Brightness Electron Microscopy Electron Sources Field emission Interaction of electrons with Matter Limitations of Transmission electron Microscope Magnification contrast etc Material Characterization techniques Resolution Scanning electron microscope Scattering of electrons Specimen preparation of Transmission electron Microscope Thermionic Emission Various sources of electron beams and Detectors
Presentation on SEM (Scanning Electron Microscope) Farshina Nazrul
Electron microscopes are scientific instruments that use a beam of energetic electrons to examine objects on a very fine scale. They were developed due to the limitations of Light Microscopes
which are limited by the physics of light. There are different types of electron microscope. One of them is Scanning Electron Microscope or SEM. A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography, composition and other properties. The electron beam is scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image. SEM can achieve resolution better than 1 nanometer. Specimens can be observed in high vacuum in conventional SEM, or in low vacuum or wet conditions in variable pressure or environmental SEM, and at a wide range of cryogenic or elevated temperatures with specialized instruments.
The chapter explains the diffraction of electrons and demonstrates what it can reveal. From "Electron Microscopy and Analysis" textbook by Peter J. Goodhew, John Humphreys and Richard Beanland. Courtesy of Taylor and Francis Books UK.
Characterization methods - Nanoscience and nanotechnologiesNANOYOU
An introduction to characterization methods.
This chapter is part of the NANOYOU training kit for teachers.
For more resources on nanotechnologies visit: www.nanoyou.eu
more chemistry contents are available
1. pdf file on Termmate: https://www.termmate.com/rabia.aziz
2. YouTube: https://www.youtube.com/channel/UCKxWnNdskGHnZFS0h1QRTEA
3. Facebook: https://web.facebook.com/Chemist.Rabia.Aziz/
4. Blogger: https://chemistry-academy.blogspot.com/
BS-III
Presentation on SEM (Scanning Electron Microscope) Farshina Nazrul
Electron microscopes are scientific instruments that use a beam of energetic electrons to examine objects on a very fine scale. They were developed due to the limitations of Light Microscopes
which are limited by the physics of light. There are different types of electron microscope. One of them is Scanning Electron Microscope or SEM. A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography, composition and other properties. The electron beam is scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image. SEM can achieve resolution better than 1 nanometer. Specimens can be observed in high vacuum in conventional SEM, or in low vacuum or wet conditions in variable pressure or environmental SEM, and at a wide range of cryogenic or elevated temperatures with specialized instruments.
The chapter explains the diffraction of electrons and demonstrates what it can reveal. From "Electron Microscopy and Analysis" textbook by Peter J. Goodhew, John Humphreys and Richard Beanland. Courtesy of Taylor and Francis Books UK.
Characterization methods - Nanoscience and nanotechnologiesNANOYOU
An introduction to characterization methods.
This chapter is part of the NANOYOU training kit for teachers.
For more resources on nanotechnologies visit: www.nanoyou.eu
more chemistry contents are available
1. pdf file on Termmate: https://www.termmate.com/rabia.aziz
2. YouTube: https://www.youtube.com/channel/UCKxWnNdskGHnZFS0h1QRTEA
3. Facebook: https://web.facebook.com/Chemist.Rabia.Aziz/
4. Blogger: https://chemistry-academy.blogspot.com/
BS-III
Beam of electrons is transmitted through an ultra thin specimen,
An image is formed from the interaction of the electrons transmitted through the specimen,
The image is magnified and focused onto an imaging device, such as a fluorescent screen, on a layer of photographic film, or to be detected by a sensor such as a CCD camera
Electron Microscopy - Scanning electron microscope, Transmission Electron Mic...Sumer Pankaj
An electron microscope is a microscope that uses a beam of accelerated electrons as a source of illumination. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light photons, electron microscopes have a higher resolving power than light microscopes and can reveal the structure of smaller objects. A transmission electron microscope can achieve better than 50 pm resolution and magnifications of up to about 10,000,000x whereas most light microscopes are limited by diffraction to about 200 nm resolution and useful magnifications below 2000x.
Electron microscopes are used to investigate the ultrastructure of a wide range of biological and inorganic specimens including microorganisms, cells, large molecules, biopsy samples, metals, and crystals. Industrially, electron microscopes are often used for quality control and failure analysis. Modern electron microscopes produce electron micrographs using specialized digital cameras and frame grabbers to capture the image.
It is technique used to identify more clear picture of small organelles which are not able to distinguished by normal microscopy techniques. Its too expensive to perform that's why not used commonly.
Electron microscope, principle and applicationKAUSHAL SAHU
Introduction
History
Resolution &Magnification of
Electron microscope
Types of electron microscope
1) Transmission electron microscope (TEM)
- Structural parts of TEM
- Principle & Working of TEM
- Sample preparation for TEM
- Advantages & disadvantages of TEM
Scanning electron microscope (SEM)
- Structural parts of SEM
- Principle & Working of SEM
- Sample preparation for SEM
- Advantages & disadvantages of SEM
3) Scanning transmission electron microscope (STEM)
Applications of electron microscope
Conclusion
References
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2. The Central player - (e)
• The electron “e” is an elementary particle
• Also called corpuscle
• carries a negative charge.
• the electron was discovered by J. J.
Thompson in 1897
• e is a constituent of the atom
• 1000 times smaller than a hydrogen atom.
• the mass of the electron 1/1836 of that of a
proton.
4. The Wave Properties
• In 1924, the wave-particle dualism was
postulated by de Broglie (Nobel Prize 1929).
• All moving matter has wave properties with
the wavelength λ being inversely related to
the momentum p by
λ = h / p = h / mv
(h : Planck constant; m : mass; v : velocity)
5. The Wavelength
• Resolving power of EM is from Wave properties of
electrons
• Limit of resolution is indirectly proportional to the
wavelength of the illuminating light
• ie, longer the wavelength, lesser is the resolution
• λ = √150 / V, where
• λ – wavelength in Angstroms, V – accelerating
voltage in volts
6. The electron wave
• The generation of a monochromatic and
coherent electron beam is important
• Design of modern electron microscopes is
based on this concept
7. Scheme of electron-matter
interactions arising
from the impact of an electron beam
onto a specimen.
A signal below the specimen is
observable if the
thickness is small enough to allow
some electrons to
pass through
8. Elastic Electron Interactions
• no energy is transferred from the electron to
the sample.
• These signals are mainly exploited in
- Transmission Electron Microscopy and
- Electron diffraction methods.
9. Inelastic Electron Interactions
- Energy is transferred from the electrons to the
specimen
- The energy transferred can cause different
signals such as
- X-rays,
- Auger electrons
- secondary electrons,
- plasmons,
- phonons,
- UV quanta or cathodoluminescence.
• Used in Analytical Electron Microscopy … SEM
10. What is Electron Microscopy?
• Electron microscopy is a diagnostic tool with
diversified combination of techniques ……
• that offer unique possibilities to gain insights
into
- structure,
- topology,
- morphology, and
- composition of a material.
11. What is an Electron Microscope ?
• A special type of microscope having a high
resolution of images, able to magnify
objects in nanometers, which are formed
by controlled use of electrons in vacuum
captured on a phosphorescent screen
12. Why were the EMs ad vented?
• To study objects of < 0.2 micrometer
• For analysis of sub cellular structures
• Intra cellular pathogens - viruses
• Cell metabolism
• Study of minute structures in the
nature
Greater resolving power of the EMs than
light microscope
• An EM can magnify structures from
100 – 250000 times than light
microscopy
13.
14. The novelty of EMs from others
• Beam of Electrons …… instead of a beam of light
• Electro-magnetic lens ………..instead of Ground glass
lenses
• Cylindrical Vacuum column - Electrons should travel
in vacuum to avoid collisions with air molecules that
cause scattering of electrons distorting the image
16. Commonly used EMs in biology
• Transmission Electron Microscope
• Scanning Electron Microscope
“ mainly for various life forms and microbes”
• Scanning tunneling microscope
• Atomic Force Microscope
“ Actual visualization of molecules and
individual atoms, also in motion”
17. Transmission Electron
Microscopy
The first TEM was built by Max Knoll and Ernst Ruska in 1931, with
this group developing the first TEM with resolving power greater
than that of light in 1933 and the first commercial TEM in 1939.
18. TEM - Definition
TEM is a microscopy technique whereby a beam of electrons is
transmitted through an ultra thin specimen, interacting with
the specimen as it passes through.
An image is formed from the interaction of the electrons
transmitted through the specimen; the image is magnified
and focused onto an imaging device, such as a fluorescent
screen, on a layer of photographic film, or to be detected by
a sensor such as a CCD camera.
19. Applications
• TEMs are capable of imaging at a significantly higher
resolution than light microscopes, owing to the small de
Broglie wavelength of electrons.
• To examine fine detail—even as small as a single column
of atoms, which is tens of thousands times smaller than
the smallest resolvable object in a light microscope.
• Application in Biological sciences like cancer research,
virology, materials science as well as pollution,
nanotechnology, and semiconductor research.
• Application in chemical & physical sciences like in
chemical identity, crystal orientation, electronic structure
and sample induced electron phase shift as well as the
regular absorption based imaging.
20. High resolution TEM - HRTEM
• Crystal structure can also be investigated by high-
resolution transmission electron microscopy (HRTEM),
• HRTEM is also known as phase contrast.
• In a specimen of uniform thickness, the images are
formed due to differences in phase of electron waves,
which is caused by specimen interaction.
• Image formation is given by the complex modulus of
the incoming electron beams.
• The image is dependent on the number of electrons
hitting the screen,
• it can be manipulated to provide more information
about the sample as in complex phase retrieval
techniques.
21. • By taking multiple images of a
single TEM sample at differing
angles,
• typically in 1° increments,
• a set of images known as a "tilt
series" can be collected.
• This methodology was proposed
in the 1970s by Walter Hoppe.
• Under absorption contrast
conditions, this set of images
can be used to construct a
three-dimensional
representation of the sample.
Gold particles on E. coli appear
as bright white dots due to the
higher percentage of
backscattered electrons
compared to the low atomic
weight elements in the
specimen
22. Scanning TEM (STEM)
• Modified type of TEM
• by the addition of a system that raster the beam
across the sample to form the image, combined with
suitable detectors.
• The STEM uses magnetic lenses to focus a beam of
electrons
• The image is formed not by secondary electrons as in
SEM but by primary electrons coming through the
specimen
23. Limitations of TEM
• Many materials require extensive sample preparation
• Difficult to produce a very thin sample
• relatively time consuming process with a low throughput of
samples.
• The structure of the sample may change during the
preparation process.
• Small field of view may not give conclusive result of the
whole sample.
24. Definition of SEM
• An electron microscope that produces images
of a sample by scanning over it with a focused
beam of electrons.
• The incident electrons interact with electrons
in the sample, producing various signals that
can be detected and
• contain information about the sample's
surface topography and composition.
25. The electron beams
• The types of signals produced by a SEM
include
- secondary electrons,
- back-scattered electrons (BSE),
- X-rays,
- light rays (cathodoluminescence),
- A standard SEM uses Secondary electrons &
Back scattered electrons
26. Salient features
• Electrons are used to create images of the surface of
specimen - topology
• Resolution of objects of nearly 1 nm
• Magnification up to 500000 x (250 times > light
microscopes)
• secondary electrons (SE), backscattered electrons
(BSE) are utilized for imaging
• specimens can be observed in high vacuum, low
vacuum and
• In Environmental SEM specimens can be observed in
wet condition.
• Gives 3D views of the exteriors of the objects like
cells, microbes or surfaces
27. Scanning tunneling microscopy
• 1980 – Gerd Bennig and Heinrich Rohrer invented STM
• Also called Scanning Probe microscopes
• Object resolution 0.1-0.01 nm
• Thin wire probe made of platinum - iridium is used to trace the
surface of the object
• Electrons from the probe overlap with electron from the surface
- tunnel into one another’s clouds
- tunnels create a current as the probe moves on the uneven
surface of the specimen
28. The applications
• The STM can be used in ultra high vacuum, air, water, and
various other liquid or gaseous environments
• and at temperatures ranging from near zero to a few
hundred degrees Celsius
• First movie made using STM – “individual fibrin molecule
forming a clot”
• Live specimen examination – as in “Virus infected cells
exploding and releasing new viruses”
• Visualization of intra cellular changes
29. Recent advances
The effect of metallic nanoparticles on cells was
probed by treating two cell lines with C-coated Cu
nanoparticles. The up-take of these nanoparticles
was shown by HAADF-STEM that reveal them as
bright patches inside the cells (s. image).
Nanoparticle Cytotoxicity Depends on Intracellular
Solubility: Comparison of Stabilized Copper Metal
and Degradable Copper Oxide Nanoparticles
30. References:-
• A. M. Studer, L. K. Limbach, L. Van Duc, F. Krumeich, E. K. Athanassiou, L. C. Gerber,
H. Moch, and W. J. Stark
Toxicology Lett. 197 (2010) 169-174 DOI
• www.Wikipedia.en.us/electron microscopy
• www.slideshare.com