A.Solairajan,
1st year,
M.pharm(analysis).
Introduction
What is X-Ray?
 Basic principle
Instrumentation
 X Ray diffraction methods
 Applications.
 X-Rays are electromagnetic radiation with
wavelengths in the range 0.1 - 100 Å (0.01-10nm)
 X Rays used in diffraction experiments have
typical wavelengths of 0.5 - 1.8 Å
 X-rays were discovered by Wilhelm Roentgen
who called them X-rays and it also called as
Roentgen rays.
 X-ray diffraction was discovered by Max von
Laue in 1912.
 In an atom, the electrons
are arranged in layers or
shells, like
• K-shell
• L-shell
• M-shell
• N-shell
 When the atom is bombarded with an electron,
eject one of the electron from the inner shell.
 The electrons migrate from the outer shell to the
inner shell to fill the gap with higher energy.
 A quantum of radiation (X-rays)is emitted
corresponding to this transition , time scale is
approximately 10-12
-10-4
sec.
 Emitted radiation is called X-rays.
Inner orbit
Outer orbit
Emitted
radiation as
X-rays
X-rays are obtained in three ways.
 By bombardment of metal target with a
beam of high energy electrons.
 By exposure of a substance to a primary
beam of X-rays in order to generate a
secondary beam of X-ray fluorescence.
 By use of radioactive source decay process
results in X-ray emission.
There are four methods available.
 X-ray absorption methods
 X-ray Emission methods
 X-ray fluorescence methods
 X-ray diffraction methods.
 X-Ray absorption methods:-
A beam of X-rays is allowed to pass through
the sample and fraction of X-ray photons absorbed
is considered to be a measure of the concentration
of the absorbing substance.
 X-Ray emission methods:-
X-ray are obtained by employment of
radioactive source whose decay process results in
emission.
 X-ray fluorescence:-
In these methods, X-rays are generated within
the sample and by measuring the wavelength and
intensity of the generated X-rays, one can perform
qualitative and quantitative analysis.
 X-ray diffraction:-
These methods are based on the scattering of
x-ray by crystals. This method is used to identify
the crystal structures of various solid compounds.
A beam of X-ray is passed to the sample
X-ray photons absorbed by the substance.
Measuring the concentration of absorbing substance.
Applications:-
Elemental analysis such as barium and iodine in
the body
Beam of X-ray fall on sample
Emits secondary X-ray
Fluorescent X-ray
Intensity of X-ray provides
how much is present
Applications:-
Elemental analysis.
X-ray tube
Collimator
Monochromator
• Filter
• Crystal monochromator
Detectors
X-ray tube:-
High velocity of electrons bombarded on metal
target, X-rays are produced.
Collimator:-
Close metal plates separated by small gap.
Use is to produce narrow beam.
Monochromator:-
Absorbs the undesirable radiations and allows
required wavelength to pass.
Filter -E.g. Zirconium
Crystal -E.g. Sodium chloride, Lithium fluoride
Detectors:-
Photographic methods
Counter methods
Types:-
• Geiger-muller counter
• proportional counter
• Scintillation counter
• Solid state semiconductor counter
• Semiconductor
When X-rays interact with a solid material, the
scattered beams can add together in a few
directions and yield diffraction.
 X-ray diffraction is based on constructive
interference of monochromatic x-rays and a
crystalline sample.
 These x-rays are generated by a cathode ray tube,
filtered to produce monochromatic radiation
,collimated to concentrate and directed towards
the sample.
 The interaction of incident rays with the sample
produces constructive interference when
conditions satisfy Bragg’s law.
The relationship describing the angle at which a
beam of X-rays of a particular wavelength diffracts
from a crystalline surface was discovered by
William Bragg and Lawrence Bragg and is known
as Bragg’s law.
Bragg diffraction
For constructive
interference,
2(d sin ) = n 
}d

 
d
d sin d sin 
}
}
X-ray diffraction method is generally used for
investigation on the internal structure.
 Laue photographic method
 Bragg X-ray spectrometer method
 Rotating crystal method
 Powder method
This method is divided into two types.
 Transmission method
 Back Reflection method.
Transmission method:-
A beam of X-ray is passed through the crystal,
after passing through the crystal, X-rays are
diffracted and recorded on a photographic plate.
Back reflection method:-
This method provides similar
information as the transmission method.
 Using the Laue's photograph, Bragg analysed the
structures of crystals of sodium chloride, Kcl.
 Bragg devised a spectrometer to measure the
intensity of X-ray beam.
 The spectra obtained in this way can be employed
for crystallographic analyses.
 This is based on the Bragg’s equation:
nλ = 2dsinϴ
 A beam of X-ray beam is fall on to the powedered
specimen through slits.
 The sharp lines to be obtained on the photographic
film which is surrounding the powder crystal in the
form of circular arc.
 Powder diffraction patterns are typically plotted as
the intensity of the diffracted X-rays vs. the angle 2θ.
 Peaks will appear in the diffraction pattern at 2θ
values when constructive interference is at a
maximum, when Bragg’s Law is satisfied.
n λ = 2 d sin θ
 Identification of single phase materials-Minerals, chemical
compounds,ceramics.
 Identification of multiple phases in microcrystalline
mixtures(rocks).
 Determination of crystallite size and shape.
 Crystallographic structural analysis and unit cell calculation for
crystalline materials.
 Particle size determination-Spot counting methods,
-Broadening of diffraction lines
Instrumental methods of chemical analysis
by Gurudeep R. Chatwal.
 Wikipedia.org.
X ray powder diffraction

X ray powder diffraction

  • 1.
  • 2.
    Introduction What is X-Ray? Basic principle Instrumentation  X Ray diffraction methods  Applications.
  • 3.
     X-Rays areelectromagnetic radiation with wavelengths in the range 0.1 - 100 Å (0.01-10nm)  X Rays used in diffraction experiments have typical wavelengths of 0.5 - 1.8 Å  X-rays were discovered by Wilhelm Roentgen who called them X-rays and it also called as Roentgen rays.  X-ray diffraction was discovered by Max von Laue in 1912.
  • 5.
     In anatom, the electrons are arranged in layers or shells, like • K-shell • L-shell • M-shell • N-shell
  • 6.
     When theatom is bombarded with an electron, eject one of the electron from the inner shell.  The electrons migrate from the outer shell to the inner shell to fill the gap with higher energy.  A quantum of radiation (X-rays)is emitted corresponding to this transition , time scale is approximately 10-12 -10-4 sec.  Emitted radiation is called X-rays.
  • 7.
  • 10.
    X-rays are obtainedin three ways.  By bombardment of metal target with a beam of high energy electrons.  By exposure of a substance to a primary beam of X-rays in order to generate a secondary beam of X-ray fluorescence.  By use of radioactive source decay process results in X-ray emission.
  • 13.
    There are fourmethods available.  X-ray absorption methods  X-ray Emission methods  X-ray fluorescence methods  X-ray diffraction methods.
  • 14.
     X-Ray absorptionmethods:- A beam of X-rays is allowed to pass through the sample and fraction of X-ray photons absorbed is considered to be a measure of the concentration of the absorbing substance.  X-Ray emission methods:- X-ray are obtained by employment of radioactive source whose decay process results in emission.
  • 15.
     X-ray fluorescence:- Inthese methods, X-rays are generated within the sample and by measuring the wavelength and intensity of the generated X-rays, one can perform qualitative and quantitative analysis.  X-ray diffraction:- These methods are based on the scattering of x-ray by crystals. This method is used to identify the crystal structures of various solid compounds.
  • 16.
    A beam ofX-ray is passed to the sample X-ray photons absorbed by the substance. Measuring the concentration of absorbing substance. Applications:- Elemental analysis such as barium and iodine in the body
  • 17.
    Beam of X-rayfall on sample Emits secondary X-ray Fluorescent X-ray Intensity of X-ray provides how much is present Applications:- Elemental analysis.
  • 18.
  • 19.
    X-ray tube:- High velocityof electrons bombarded on metal target, X-rays are produced. Collimator:- Close metal plates separated by small gap. Use is to produce narrow beam. Monochromator:- Absorbs the undesirable radiations and allows required wavelength to pass. Filter -E.g. Zirconium Crystal -E.g. Sodium chloride, Lithium fluoride
  • 20.
    Detectors:- Photographic methods Counter methods Types:- •Geiger-muller counter • proportional counter • Scintillation counter • Solid state semiconductor counter • Semiconductor
  • 21.
    When X-rays interactwith a solid material, the scattered beams can add together in a few directions and yield diffraction.
  • 24.
     X-ray diffractionis based on constructive interference of monochromatic x-rays and a crystalline sample.  These x-rays are generated by a cathode ray tube, filtered to produce monochromatic radiation ,collimated to concentrate and directed towards the sample.  The interaction of incident rays with the sample produces constructive interference when conditions satisfy Bragg’s law.
  • 25.
    The relationship describingthe angle at which a beam of X-rays of a particular wavelength diffracts from a crystalline surface was discovered by William Bragg and Lawrence Bragg and is known as Bragg’s law.
  • 26.
    Bragg diffraction For constructive interference, 2(dsin ) = n  }d    d d sin d sin  } }
  • 27.
    X-ray diffraction methodis generally used for investigation on the internal structure.  Laue photographic method  Bragg X-ray spectrometer method  Rotating crystal method  Powder method
  • 28.
    This method isdivided into two types.  Transmission method  Back Reflection method.
  • 29.
    Transmission method:- A beamof X-ray is passed through the crystal, after passing through the crystal, X-rays are diffracted and recorded on a photographic plate.
  • 30.
    Back reflection method:- Thismethod provides similar information as the transmission method.
  • 31.
     Using theLaue's photograph, Bragg analysed the structures of crystals of sodium chloride, Kcl.  Bragg devised a spectrometer to measure the intensity of X-ray beam.  The spectra obtained in this way can be employed for crystallographic analyses.  This is based on the Bragg’s equation: nλ = 2dsinϴ
  • 35.
     A beamof X-ray beam is fall on to the powedered specimen through slits.  The sharp lines to be obtained on the photographic film which is surrounding the powder crystal in the form of circular arc.  Powder diffraction patterns are typically plotted as the intensity of the diffracted X-rays vs. the angle 2θ.  Peaks will appear in the diffraction pattern at 2θ values when constructive interference is at a maximum, when Bragg’s Law is satisfied. n λ = 2 d sin θ
  • 38.
     Identification ofsingle phase materials-Minerals, chemical compounds,ceramics.  Identification of multiple phases in microcrystalline mixtures(rocks).  Determination of crystallite size and shape.  Crystallographic structural analysis and unit cell calculation for crystalline materials.  Particle size determination-Spot counting methods, -Broadening of diffraction lines
  • 39.
    Instrumental methods ofchemical analysis by Gurudeep R. Chatwal.  Wikipedia.org.