SlideShare a Scribd company logo
The Effect of Coating and 
Potting on the Reliability of 
QFN Devices 
Greg Caswell, Cheryl Tulkoff and Dr. Nathan Blattau
QFN: What is it? 
o Quad Flat Pack No Lead or Quad Flat Non-Leaded 
o ‘The poor man’s ball grid array’ 
o Also known as 
2© 2004 - 200107 
o Leadframe Chip Scale Package (LF-CSP) 
o MicroLeadFrame (MLF) 
o Others (MLP, LPCC, QLP, HVQFN, etc.) 
o Overmolded leadframe with bond pads exposed on the bottom and 
arranged along 
the periphery of the package 
o Developed in the early to 
mid-1990’s by Motorola, 
Toshiba, Amkor, etc. 
o Standardized by JEDEC/EIAJ in 
late-1990’s 
o Fastest growing package type
Quad Flat No-Leads (QFN) 
o Elimination of leads 
o Provides lower resistance 
o Lower inductance 
o Higher performance 
o Higher package densities 
o Tradeoffs 
o Increased power density 
o Manufacturability 
o More susceptible to 
QFP: >10,000 
thermal mechanical 
fatigue Cycles to failure 
-40 to 125C 
BGA: 3,000 to 8,000 
QFN: 1,000 to 3,000 
© 2004 - 200107 3
Advantages: Thermal Performance 
o More direct thermal path with larger area 
o Die ® Die Attach ® Thermal Pad ® 
Solder ® Board Bond Pad 
o qJa for the QFN is about half of a 
leaded counterpart (as per JESD-51) 
o Allows for 2X increase in power dissipation 
4© 2004 - 200107
Advantages: Inductance 
o At higher operating frequencies, inductance of the gold 
wire and long lead-frame traces will affect performance 
o Inductance of QFN is half its leaded counterpart because it 
eliminates gullwing leads and shortens wire lengths 
5© 2004 - 200107 
http://ap.pennnet.com/display_article/153955/36/ARTCL/none/none/1/The-back-end-process:-Step-9-QFN-Singulation/ 
Popular for 
RF Designs
Disadvantage: Thermal Mechanical Fatigue (Solder) 
o Design change: More silicon, less plastic 
o Increases mismatch in coefficient of thermal expansion (CTE) 
Does the increased 
susceptibility of QFN 
devices make them 
more sensitive to 
conformal coating and 
potting effects? 
BOARD LEVEL ASSEMBLY AND RELIABILITY 
CONSIDERATIONS FOR QFN TYPE PACKAGES, 
Ahmer Syed and WonJoon Kang, Amkor Technology. 
6© 2004 - 200107
CTE Mismatch 
© 2004 - 200107 
Crack 
Laminate CTE : 12~15PPM 
Laminate typical z-axis CTE: 
Before Tg: 40~60PPM 
After Tg: 280~350PPM 
Shear stress 
Shear stress 
Component typical CTE: 8~12PPM 
Copper CTE : 17~18PPM/
Rules of Thumb 
o The use of underfills, potting compounds and thick 
conformal coatings can greatly influence the failure 
behavior under thermal cycling 
o Any time a material goes through its glass transition temperature 
problems tend to occur 
o Conformal coating should not bridge between the PCB and the 
component 
o Underfills designed for enhancing shock robustness do not tend to 
enhance thermal cycling robustness 
o Potting materials can cause PCB warpage and tensile stresses on 
electronic packages that greatly reduce time to failure 
© 2004 - 200107
Thermal Cycling: Conformal Coating 
o Care must be taken when using conformal coating over QFN 
o Coating can infiltrate under the QFN 
o Small standoff height allows coating to cause lift 
o Hamilton Sundstrand found a significant reduction in time to failure 
(-55 / 125C) 
o Uncoated: 2000 to 2500 cycles 
o Coated: 300 to 700 cycles 
o Also driven by solder joint 
sensitivity to tensile stresses 
o Damage evolution is far 
higher than for shear stresses 
9© 2004 - 200107 
Wrightson, SMTA Pan Pac 2007
Conformal Coating Properties (Glass Transition Temperature) 
o Why did conformal 
coating effect thermal 
cycling performance? 
o Verification and 
determination of 
mechanical properties 
o Elastic Modulus as a 
function of temperature 
o Glass Transition 
Temperature 
o Coefficient of Thermal 
Expansion Young’s Modulus 
Datasheet 1260 psi (8.7 MPa) 
Coefficient of thermal Expansion 
Datasheet 55 ppm/°C 
© 2004 - 200107 10
Elastic Modulus – DMA - Tensile 
Acrylic 
conformal 
coating 
Datasheet - Specification (8.7 MPa, 1260 psi), Tg = 15°C 
1©1 2004 - 200107
Coefficient of Thermal Expansion - TMA 
Acrylic conformal coating 
1©2 2004 - 200107 
Glass Transition Temperature 
Tg  5 to 15°C 
Below Tg CTE – 170 ppm/°C 
Above Tg : CTE – 340 ppm/°C
Potting 
o Ideally the CTE of the potting should be as close to the CCA as possible 
o Usually in the 20 to 30 ppm/°C 
o The larger the CTE, the more compliant the potting must be to limit the stresses imparted to the 
© 2004 - 200107 
CCA 
o Potting should the generate hydrostatic pressure (equal on all sides) of the circuit card 
o This prevents warping of the CCA as the potting expands 
o Excessive warping will greatly reduce time to failure 
o May cause overstress failures. 
o This may require modification to the housing 
o Housing may need to be relatively stiff
Rigid Housing with Free Surface 
o QFN failures occurring very rapidly during temperature 
cycling with urethane based potting material 
o All units were failed at the 100 cycle inspection 
(-40 to 105C) 
o Good quality joints with sufficient solder thickness 
© 2004 - 200107
Material Properties 
Potting Compound 
Isotropic Material 
CTEx,y = 120 ppm 
Significant increase in modulus or 
stiffness below with high CTE 
© 2004 - 200107
PCB Warpage due to Potting Shrinkage 
© 2004 - 200107
QFN Warpage 
© 2004 - 200107 
Unpotted 
Potted 
Order of magnitude higher 
deformation and deformation 
concentrated over corner solder 
joints
Solder Stresses 
o Very high stresses during 
cold dwell of thermal cycle 
© 2004 - 200107 
HOT 
COLD
Creep Strains 
o The higher the 
creep strains 
the shorter the 
time to failure 
© 2004 - 200107 
Unpotted 
Potted o Excessive creep 
occurring at cold 
temperature 
o More energy required 
to cause cold 
temperature creep 
(more damaging)
Conclusions 
o The lack of a compliant lead structure makes QFN devices 
more susceptible to PCB warpage related failures 
o Mechanical properties of the potting material 
o Glass transition temperature (Tg) 
o Modulus should be specified above and below the Tg 
o CTE should be specified above and below the Tg 
o The design of the housing 
o May provide a surface to which the potting material can pull 
© 2004 - 200107 
against when shrinking causing PCB warpage 
o Should be designed to provide as close to a hydrostatic pressure 
as possible (equal pressure on all sides)

More Related Content

What's hot

Manufacturability & reliability challenges with qfn
Manufacturability & reliability challenges with qfn Manufacturability & reliability challenges with qfn
Manufacturability & reliability challenges with qfn
ASQ Reliability Division
 
Fabrication of through silicon-via (tsv) by copper
Fabrication of through silicon-via (tsv) by copperFabrication of through silicon-via (tsv) by copper
Fabrication of through silicon-via (tsv) by copper
Mirza Baig
 
Growth of advanced packaging - What make it so special? Presentation by Rozal...
Growth of advanced packaging - What make it so special? Presentation by Rozal...Growth of advanced packaging - What make it so special? Presentation by Rozal...
Growth of advanced packaging - What make it so special? Presentation by Rozal...
Yole Developpement
 
Soi aalam
Soi aalamSoi aalam
Soi aalam
aalamkhan
 
OVERVIEW OF IC PACKAGING
OVERVIEW OF IC PACKAGINGOVERVIEW OF IC PACKAGING
OVERVIEW OF IC PACKAGING
Basavaraj Gangur
 
2.5D/3D IC Market Challenges & Opportunities
2.5D/3D IC MarketChallenges & Opportunities2.5D/3D IC MarketChallenges & Opportunities
2.5D/3D IC Market Challenges & Opportunities
Rohan Hubli
 
WPE
WPEWPE
Nmi Presentation Sept 2007
Nmi Presentation Sept 2007Nmi Presentation Sept 2007
Nmi Presentation Sept 2007
AdrianOShaughnessy
 
Optimized Local I/O ESD Protection for SerDes In Advanced SOI, BiCMOS and Fin...
Optimized Local I/O ESD Protection for SerDes In Advanced SOI, BiCMOS and Fin...Optimized Local I/O ESD Protection for SerDes In Advanced SOI, BiCMOS and Fin...
Optimized Local I/O ESD Protection for SerDes In Advanced SOI, BiCMOS and Fin...
Sofics
 
High-end Performance Packaging 2020
High-end Performance Packaging 2020High-end Performance Packaging 2020
High-end Performance Packaging 2020
Yole Developpement
 
2012 Introduction wire bonding
2012 Introduction wire bonding2012 Introduction wire bonding
2012 Introduction wire bonding
Jan Eite Bullema
 
State of Supply Chain Semiconductor Industry Performance
State of Supply Chain Semiconductor Industry PerformanceState of Supply Chain Semiconductor Industry Performance
State of Supply Chain Semiconductor Industry Performance
iCognitive Supply Chain Management
 
Advanced Packaging Role after Moore’s Law: Transition from Technology Node Er...
Advanced Packaging Role after Moore’s Law: Transition from Technology Node Er...Advanced Packaging Role after Moore’s Law: Transition from Technology Node Er...
Advanced Packaging Role after Moore’s Law: Transition from Technology Node Er...
Yole Developpement
 
【Junior新趨勢_先進封裝】
【Junior新趨勢_先進封裝】【Junior新趨勢_先進封裝】
【Junior新趨勢_先進封裝】
Collaborator
 
Pcb design best practices for more reliable manufacturing
Pcb design best practices for more reliable manufacturingPcb design best practices for more reliable manufacturing
Pcb design best practices for more reliable manufacturing
Screaming Circuits
 
新趨勢:Micro LED
新趨勢:Micro LED新趨勢:Micro LED
新趨勢:Micro LED
Collaborator
 
3DIC & 2,5D TSV Interconnect trends 2014 Kinsale Presentation Yole Developpement
3DIC & 2,5D TSV Interconnect trends 2014 Kinsale Presentation Yole Developpement3DIC & 2,5D TSV Interconnect trends 2014 Kinsale Presentation Yole Developpement
3DIC & 2,5D TSV Interconnect trends 2014 Kinsale Presentation Yole Developpement
Yole Developpement
 
GaN and SiC for power electronics applications 2015 Report by Yole Developpement
GaN and SiC for power electronics applications 2015 Report by Yole DeveloppementGaN and SiC for power electronics applications 2015 Report by Yole Developpement
GaN and SiC for power electronics applications 2015 Report by Yole Developpement
Yole Developpement
 
The Effect of Mixing BGA and Solder Paste Alloys on the Formation of Voids
The Effect of Mixing BGA and Solder Paste Alloys on the Formation of VoidsThe Effect of Mixing BGA and Solder Paste Alloys on the Formation of Voids
The Effect of Mixing BGA and Solder Paste Alloys on the Formation of Voids
Alpha
 

What's hot (20)

Manufacturability & reliability challenges with qfn
Manufacturability & reliability challenges with qfn Manufacturability & reliability challenges with qfn
Manufacturability & reliability challenges with qfn
 
Fabrication of through silicon-via (tsv) by copper
Fabrication of through silicon-via (tsv) by copperFabrication of through silicon-via (tsv) by copper
Fabrication of through silicon-via (tsv) by copper
 
Growth of advanced packaging - What make it so special? Presentation by Rozal...
Growth of advanced packaging - What make it so special? Presentation by Rozal...Growth of advanced packaging - What make it so special? Presentation by Rozal...
Growth of advanced packaging - What make it so special? Presentation by Rozal...
 
Soi aalam
Soi aalamSoi aalam
Soi aalam
 
OVERVIEW OF IC PACKAGING
OVERVIEW OF IC PACKAGINGOVERVIEW OF IC PACKAGING
OVERVIEW OF IC PACKAGING
 
2.5D/3D IC Market Challenges & Opportunities
2.5D/3D IC MarketChallenges & Opportunities2.5D/3D IC MarketChallenges & Opportunities
2.5D/3D IC Market Challenges & Opportunities
 
WPE
WPEWPE
WPE
 
Nmi Presentation Sept 2007
Nmi Presentation Sept 2007Nmi Presentation Sept 2007
Nmi Presentation Sept 2007
 
Optimized Local I/O ESD Protection for SerDes In Advanced SOI, BiCMOS and Fin...
Optimized Local I/O ESD Protection for SerDes In Advanced SOI, BiCMOS and Fin...Optimized Local I/O ESD Protection for SerDes In Advanced SOI, BiCMOS and Fin...
Optimized Local I/O ESD Protection for SerDes In Advanced SOI, BiCMOS and Fin...
 
High-end Performance Packaging 2020
High-end Performance Packaging 2020High-end Performance Packaging 2020
High-end Performance Packaging 2020
 
2012 Introduction wire bonding
2012 Introduction wire bonding2012 Introduction wire bonding
2012 Introduction wire bonding
 
State of Supply Chain Semiconductor Industry Performance
State of Supply Chain Semiconductor Industry PerformanceState of Supply Chain Semiconductor Industry Performance
State of Supply Chain Semiconductor Industry Performance
 
Advanced Packaging Role after Moore’s Law: Transition from Technology Node Er...
Advanced Packaging Role after Moore’s Law: Transition from Technology Node Er...Advanced Packaging Role after Moore’s Law: Transition from Technology Node Er...
Advanced Packaging Role after Moore’s Law: Transition from Technology Node Er...
 
【Junior新趨勢_先進封裝】
【Junior新趨勢_先進封裝】【Junior新趨勢_先進封裝】
【Junior新趨勢_先進封裝】
 
Pcb design best practices for more reliable manufacturing
Pcb design best practices for more reliable manufacturingPcb design best practices for more reliable manufacturing
Pcb design best practices for more reliable manufacturing
 
新趨勢:Micro LED
新趨勢:Micro LED新趨勢:Micro LED
新趨勢:Micro LED
 
3DIC & 2,5D TSV Interconnect trends 2014 Kinsale Presentation Yole Developpement
3DIC & 2,5D TSV Interconnect trends 2014 Kinsale Presentation Yole Developpement3DIC & 2,5D TSV Interconnect trends 2014 Kinsale Presentation Yole Developpement
3DIC & 2,5D TSV Interconnect trends 2014 Kinsale Presentation Yole Developpement
 
GaN and SiC for power electronics applications 2015 Report by Yole Developpement
GaN and SiC for power electronics applications 2015 Report by Yole DeveloppementGaN and SiC for power electronics applications 2015 Report by Yole Developpement
GaN and SiC for power electronics applications 2015 Report by Yole Developpement
 
The Effect of Mixing BGA and Solder Paste Alloys on the Formation of Voids
The Effect of Mixing BGA and Solder Paste Alloys on the Formation of VoidsThe Effect of Mixing BGA and Solder Paste Alloys on the Formation of Voids
The Effect of Mixing BGA and Solder Paste Alloys on the Formation of Voids
 
SOI
SOISOI
SOI
 

Similar to The Effect of Coating and Potting on the Reliability of QFN devices

The Effect of Coating and Potting on the Reliability of QFN Devices
The Effect of Coating and Potting on the Reliability of QFN DevicesThe Effect of Coating and Potting on the Reliability of QFN Devices
The Effect of Coating and Potting on the Reliability of QFN Devices
Cheryl Tulkoff
 
Temperature Cycling and Fatigue in Electronics
Temperature Cycling and Fatigue in ElectronicsTemperature Cycling and Fatigue in Electronics
Temperature Cycling and Fatigue in Electronics
Cheryl Tulkoff
 
Automating lifetime simulation of power PCBs
Automating lifetime simulation of power PCBsAutomating lifetime simulation of power PCBs
Automating lifetime simulation of power PCBs
Greg Caswell
 
Solving Problems with Reliability in the Lead-Free Era
Solving Problems with Reliability in the Lead-Free EraSolving Problems with Reliability in the Lead-Free Era
Solving Problems with Reliability in the Lead-Free Era
Cheryl Tulkoff
 
Comparison Between Solders & Transient Liquid Phase Sintered Interconnects in...
Comparison Between Solders & Transient Liquid Phase Sintered Interconnects in...Comparison Between Solders & Transient Liquid Phase Sintered Interconnects in...
Comparison Between Solders & Transient Liquid Phase Sintered Interconnects in...
KEMET Electronics Corporation
 
KEMET Webinar - Tantalum Polymer Surface Mount Capacitors New Industrial Appl...
KEMET Webinar - Tantalum Polymer Surface Mount Capacitors New Industrial Appl...KEMET Webinar - Tantalum Polymer Surface Mount Capacitors New Industrial Appl...
KEMET Webinar - Tantalum Polymer Surface Mount Capacitors New Industrial Appl...
Ivana Ivanovska
 
Overview of Advanced Thermal Materials
Overview of Advanced Thermal MaterialsOverview of Advanced Thermal Materials
Overview of Advanced Thermal MaterialsDr Carl Zweben
 
FINAL REPORT-5
FINAL REPORT-5FINAL REPORT-5
FINAL REPORT-5Neel Patel
 
Solid Electrolytic Capacitor Design for High Temp Applications
Solid Electrolytic Capacitor Design for High Temp ApplicationsSolid Electrolytic Capacitor Design for High Temp Applications
Solid Electrolytic Capacitor Design for High Temp Applications
KEMET Electronics Corporation
 
.3mm CSP and LFCSP Reliability
.3mm CSP and LFCSP Reliability.3mm CSP and LFCSP Reliability
.3mm CSP and LFCSP Reliability
Greg Caswell
 
Ensuring and predicting the reliability of cpv
Ensuring and predicting the reliability of cpvEnsuring and predicting the reliability of cpv
Ensuring and predicting the reliability of cpv
Greg Caswell
 
BME C0G Ceramic DC Link Evaluation
BME C0G Ceramic DC Link EvaluationBME C0G Ceramic DC Link Evaluation
BME C0G Ceramic DC Link Evaluation
KEMET Electronics Corporation
 
KO-CAP for High-Reliability Applications (Space Tech Expo 2017)
KO-CAP for High-Reliability Applications (Space Tech Expo 2017)KO-CAP for High-Reliability Applications (Space Tech Expo 2017)
KO-CAP for High-Reliability Applications (Space Tech Expo 2017)
KEMET Electronics Corporation
 
Polymer Capacitors for Automotive DC to DC Converters
Polymer Capacitors for Automotive DC to DC ConvertersPolymer Capacitors for Automotive DC to DC Converters
Polymer Capacitors for Automotive DC to DC Converters
KEMET Electronics Corporation
 
KEMET Webinar - Update on ESA and military standard portfolio
KEMET Webinar - Update on ESA and military standard portfolioKEMET Webinar - Update on ESA and military standard portfolio
KEMET Webinar - Update on ESA and military standard portfolio
Ivana Ivanovska
 
Development of Transient Liquid Phase Sintering (TLPS) for MLCCs
Development of Transient Liquid Phase Sintering (TLPS) for MLCCsDevelopment of Transient Liquid Phase Sintering (TLPS) for MLCCs
Development of Transient Liquid Phase Sintering (TLPS) for MLCCs
KEMET Electronics Corporation
 
Hpc new
Hpc newHpc new
KEMET Webinar - Film capacitors in SMD
KEMET Webinar - Film capacitors in SMDKEMET Webinar - Film capacitors in SMD
KEMET Webinar - Film capacitors in SMD
Ivana Ivanovska
 
KEMET Webinar - 0805 and 1206 footprints now available with higher rated volt...
KEMET Webinar - 0805 and 1206 footprints now available with higher rated volt...KEMET Webinar - 0805 and 1206 footprints now available with higher rated volt...
KEMET Webinar - 0805 and 1206 footprints now available with higher rated volt...
Markus Trautz
 
transformer Sales, after sales & service presentation
transformer Sales, after sales & service presentationtransformer Sales, after sales & service presentation
transformer Sales, after sales & service presentationFawaz Baik
 

Similar to The Effect of Coating and Potting on the Reliability of QFN devices (20)

The Effect of Coating and Potting on the Reliability of QFN Devices
The Effect of Coating and Potting on the Reliability of QFN DevicesThe Effect of Coating and Potting on the Reliability of QFN Devices
The Effect of Coating and Potting on the Reliability of QFN Devices
 
Temperature Cycling and Fatigue in Electronics
Temperature Cycling and Fatigue in ElectronicsTemperature Cycling and Fatigue in Electronics
Temperature Cycling and Fatigue in Electronics
 
Automating lifetime simulation of power PCBs
Automating lifetime simulation of power PCBsAutomating lifetime simulation of power PCBs
Automating lifetime simulation of power PCBs
 
Solving Problems with Reliability in the Lead-Free Era
Solving Problems with Reliability in the Lead-Free EraSolving Problems with Reliability in the Lead-Free Era
Solving Problems with Reliability in the Lead-Free Era
 
Comparison Between Solders & Transient Liquid Phase Sintered Interconnects in...
Comparison Between Solders & Transient Liquid Phase Sintered Interconnects in...Comparison Between Solders & Transient Liquid Phase Sintered Interconnects in...
Comparison Between Solders & Transient Liquid Phase Sintered Interconnects in...
 
KEMET Webinar - Tantalum Polymer Surface Mount Capacitors New Industrial Appl...
KEMET Webinar - Tantalum Polymer Surface Mount Capacitors New Industrial Appl...KEMET Webinar - Tantalum Polymer Surface Mount Capacitors New Industrial Appl...
KEMET Webinar - Tantalum Polymer Surface Mount Capacitors New Industrial Appl...
 
Overview of Advanced Thermal Materials
Overview of Advanced Thermal MaterialsOverview of Advanced Thermal Materials
Overview of Advanced Thermal Materials
 
FINAL REPORT-5
FINAL REPORT-5FINAL REPORT-5
FINAL REPORT-5
 
Solid Electrolytic Capacitor Design for High Temp Applications
Solid Electrolytic Capacitor Design for High Temp ApplicationsSolid Electrolytic Capacitor Design for High Temp Applications
Solid Electrolytic Capacitor Design for High Temp Applications
 
.3mm CSP and LFCSP Reliability
.3mm CSP and LFCSP Reliability.3mm CSP and LFCSP Reliability
.3mm CSP and LFCSP Reliability
 
Ensuring and predicting the reliability of cpv
Ensuring and predicting the reliability of cpvEnsuring and predicting the reliability of cpv
Ensuring and predicting the reliability of cpv
 
BME C0G Ceramic DC Link Evaluation
BME C0G Ceramic DC Link EvaluationBME C0G Ceramic DC Link Evaluation
BME C0G Ceramic DC Link Evaluation
 
KO-CAP for High-Reliability Applications (Space Tech Expo 2017)
KO-CAP for High-Reliability Applications (Space Tech Expo 2017)KO-CAP for High-Reliability Applications (Space Tech Expo 2017)
KO-CAP for High-Reliability Applications (Space Tech Expo 2017)
 
Polymer Capacitors for Automotive DC to DC Converters
Polymer Capacitors for Automotive DC to DC ConvertersPolymer Capacitors for Automotive DC to DC Converters
Polymer Capacitors for Automotive DC to DC Converters
 
KEMET Webinar - Update on ESA and military standard portfolio
KEMET Webinar - Update on ESA and military standard portfolioKEMET Webinar - Update on ESA and military standard portfolio
KEMET Webinar - Update on ESA and military standard portfolio
 
Development of Transient Liquid Phase Sintering (TLPS) for MLCCs
Development of Transient Liquid Phase Sintering (TLPS) for MLCCsDevelopment of Transient Liquid Phase Sintering (TLPS) for MLCCs
Development of Transient Liquid Phase Sintering (TLPS) for MLCCs
 
Hpc new
Hpc newHpc new
Hpc new
 
KEMET Webinar - Film capacitors in SMD
KEMET Webinar - Film capacitors in SMDKEMET Webinar - Film capacitors in SMD
KEMET Webinar - Film capacitors in SMD
 
KEMET Webinar - 0805 and 1206 footprints now available with higher rated volt...
KEMET Webinar - 0805 and 1206 footprints now available with higher rated volt...KEMET Webinar - 0805 and 1206 footprints now available with higher rated volt...
KEMET Webinar - 0805 and 1206 footprints now available with higher rated volt...
 
transformer Sales, after sales & service presentation
transformer Sales, after sales & service presentationtransformer Sales, after sales & service presentation
transformer Sales, after sales & service presentation
 

More from Greg Caswell

Using Physics of Failure to Predict System Level Reliability for Avionic Systems
Using Physics of Failure to Predict System Level Reliability for Avionic SystemsUsing Physics of Failure to Predict System Level Reliability for Avionic Systems
Using Physics of Failure to Predict System Level Reliability for Avionic Systems
Greg Caswell
 
Understanding the-criticality-of-stencil-aperture-design-and-implementation-f...
Understanding the-criticality-of-stencil-aperture-design-and-implementation-f...Understanding the-criticality-of-stencil-aperture-design-and-implementation-f...
Understanding the-criticality-of-stencil-aperture-design-and-implementation-f...
Greg Caswell
 
Reliability of power modules using sherlock
Reliability of power modules using sherlockReliability of power modules using sherlock
Reliability of power modules using sherlock
Greg Caswell
 
Reliability Modeling of Electronics for Co-designed Systems
Reliability Modeling of Electronics for Co-designed SystemsReliability Modeling of Electronics for Co-designed Systems
Reliability Modeling of Electronics for Co-designed Systems
Greg Caswell
 
Counterfeit prevention & detection strategies, how to do it, when to do it.
Counterfeit prevention & detection strategies, how to do it, when to do it.Counterfeit prevention & detection strategies, how to do it, when to do it.
Counterfeit prevention & detection strategies, how to do it, when to do it.
Greg Caswell
 
Coatings and-pottings-issues-challenges-and-the-reason-for-a-consortium
Coatings and-pottings-issues-challenges-and-the-reason-for-a-consortiumCoatings and-pottings-issues-challenges-and-the-reason-for-a-consortium
Coatings and-pottings-issues-challenges-and-the-reason-for-a-consortium
Greg Caswell
 
Bga reballing from pb free to sn pb metallurgy
Bga reballing from pb free to sn pb metallurgyBga reballing from pb free to sn pb metallurgy
Bga reballing from pb free to sn pb metallurgy
Greg Caswell
 
A solder joint reliability model for the philips lumileds luxeon rebel led c...
A solder joint reliability model for the philips lumileds luxeon rebel led  c...A solder joint reliability model for the philips lumileds luxeon rebel led  c...
A solder joint reliability model for the philips lumileds luxeon rebel led c...
Greg Caswell
 
Part quality-presentation-how-to-test-when-what-it-all-means
Part quality-presentation-how-to-test-when-what-it-all-meansPart quality-presentation-how-to-test-when-what-it-all-means
Part quality-presentation-how-to-test-when-what-it-all-means
Greg Caswell
 
Overcoming 25 year life reliability challenges in solar electronics
Overcoming 25 year life reliability challenges in solar electronicsOvercoming 25 year life reliability challenges in solar electronics
Overcoming 25 year life reliability challenges in solar electronics
Greg Caswell
 
A new-method-for-testing-electrolytic-capacitors-to-compare-life-expectancy
A new-method-for-testing-electrolytic-capacitors-to-compare-life-expectancyA new-method-for-testing-electrolytic-capacitors-to-compare-life-expectancy
A new-method-for-testing-electrolytic-capacitors-to-compare-life-expectancy
Greg Caswell
 
Non functional-pads-should-they-stay-or-should-they-go
Non functional-pads-should-they-stay-or-should-they-goNon functional-pads-should-they-stay-or-should-they-go
Non functional-pads-should-they-stay-or-should-they-go
Greg Caswell
 
Reliability of-wearable-electronics
Reliability of-wearable-electronicsReliability of-wearable-electronics
Reliability of-wearable-electronics
Greg Caswell
 

More from Greg Caswell (13)

Using Physics of Failure to Predict System Level Reliability for Avionic Systems
Using Physics of Failure to Predict System Level Reliability for Avionic SystemsUsing Physics of Failure to Predict System Level Reliability for Avionic Systems
Using Physics of Failure to Predict System Level Reliability for Avionic Systems
 
Understanding the-criticality-of-stencil-aperture-design-and-implementation-f...
Understanding the-criticality-of-stencil-aperture-design-and-implementation-f...Understanding the-criticality-of-stencil-aperture-design-and-implementation-f...
Understanding the-criticality-of-stencil-aperture-design-and-implementation-f...
 
Reliability of power modules using sherlock
Reliability of power modules using sherlockReliability of power modules using sherlock
Reliability of power modules using sherlock
 
Reliability Modeling of Electronics for Co-designed Systems
Reliability Modeling of Electronics for Co-designed SystemsReliability Modeling of Electronics for Co-designed Systems
Reliability Modeling of Electronics for Co-designed Systems
 
Counterfeit prevention & detection strategies, how to do it, when to do it.
Counterfeit prevention & detection strategies, how to do it, when to do it.Counterfeit prevention & detection strategies, how to do it, when to do it.
Counterfeit prevention & detection strategies, how to do it, when to do it.
 
Coatings and-pottings-issues-challenges-and-the-reason-for-a-consortium
Coatings and-pottings-issues-challenges-and-the-reason-for-a-consortiumCoatings and-pottings-issues-challenges-and-the-reason-for-a-consortium
Coatings and-pottings-issues-challenges-and-the-reason-for-a-consortium
 
Bga reballing from pb free to sn pb metallurgy
Bga reballing from pb free to sn pb metallurgyBga reballing from pb free to sn pb metallurgy
Bga reballing from pb free to sn pb metallurgy
 
A solder joint reliability model for the philips lumileds luxeon rebel led c...
A solder joint reliability model for the philips lumileds luxeon rebel led  c...A solder joint reliability model for the philips lumileds luxeon rebel led  c...
A solder joint reliability model for the philips lumileds luxeon rebel led c...
 
Part quality-presentation-how-to-test-when-what-it-all-means
Part quality-presentation-how-to-test-when-what-it-all-meansPart quality-presentation-how-to-test-when-what-it-all-means
Part quality-presentation-how-to-test-when-what-it-all-means
 
Overcoming 25 year life reliability challenges in solar electronics
Overcoming 25 year life reliability challenges in solar electronicsOvercoming 25 year life reliability challenges in solar electronics
Overcoming 25 year life reliability challenges in solar electronics
 
A new-method-for-testing-electrolytic-capacitors-to-compare-life-expectancy
A new-method-for-testing-electrolytic-capacitors-to-compare-life-expectancyA new-method-for-testing-electrolytic-capacitors-to-compare-life-expectancy
A new-method-for-testing-electrolytic-capacitors-to-compare-life-expectancy
 
Non functional-pads-should-they-stay-or-should-they-go
Non functional-pads-should-they-stay-or-should-they-goNon functional-pads-should-they-stay-or-should-they-go
Non functional-pads-should-they-stay-or-should-they-go
 
Reliability of-wearable-electronics
Reliability of-wearable-electronicsReliability of-wearable-electronics
Reliability of-wearable-electronics
 

Recently uploaded

Planning Of Procurement o different goods and services
Planning Of Procurement o different goods and servicesPlanning Of Procurement o different goods and services
Planning Of Procurement o different goods and services
JoytuBarua2
 
J.Yang, ICLR 2024, MLILAB, KAIST AI.pdf
J.Yang,  ICLR 2024, MLILAB, KAIST AI.pdfJ.Yang,  ICLR 2024, MLILAB, KAIST AI.pdf
J.Yang, ICLR 2024, MLILAB, KAIST AI.pdf
MLILAB
 
WATER CRISIS and its solutions-pptx 1234
WATER CRISIS and its solutions-pptx 1234WATER CRISIS and its solutions-pptx 1234
WATER CRISIS and its solutions-pptx 1234
AafreenAbuthahir2
 
ethical hacking-mobile hacking methods.ppt
ethical hacking-mobile hacking methods.pptethical hacking-mobile hacking methods.ppt
ethical hacking-mobile hacking methods.ppt
Jayaprasanna4
 
Sachpazis:Terzaghi Bearing Capacity Estimation in simple terms with Calculati...
Sachpazis:Terzaghi Bearing Capacity Estimation in simple terms with Calculati...Sachpazis:Terzaghi Bearing Capacity Estimation in simple terms with Calculati...
Sachpazis:Terzaghi Bearing Capacity Estimation in simple terms with Calculati...
Dr.Costas Sachpazis
 
addressing modes in computer architecture
addressing modes  in computer architectureaddressing modes  in computer architecture
addressing modes in computer architecture
ShahidSultan24
 
一比一原版(SFU毕业证)西蒙菲莎大学毕业证成绩单如何办理
一比一原版(SFU毕业证)西蒙菲莎大学毕业证成绩单如何办理一比一原版(SFU毕业证)西蒙菲莎大学毕业证成绩单如何办理
一比一原版(SFU毕业证)西蒙菲莎大学毕业证成绩单如何办理
bakpo1
 
The role of big data in decision making.
The role of big data in decision making.The role of big data in decision making.
The role of big data in decision making.
ankuprajapati0525
 
Cosmetic shop management system project report.pdf
Cosmetic shop management system project report.pdfCosmetic shop management system project report.pdf
Cosmetic shop management system project report.pdf
Kamal Acharya
 
Courier management system project report.pdf
Courier management system project report.pdfCourier management system project report.pdf
Courier management system project report.pdf
Kamal Acharya
 
Architectural Portfolio Sean Lockwood
Architectural Portfolio Sean LockwoodArchitectural Portfolio Sean Lockwood
Architectural Portfolio Sean Lockwood
seandesed
 
LIGA(E)11111111111111111111111111111111111111111.ppt
LIGA(E)11111111111111111111111111111111111111111.pptLIGA(E)11111111111111111111111111111111111111111.ppt
LIGA(E)11111111111111111111111111111111111111111.ppt
ssuser9bd3ba
 
COLLEGE BUS MANAGEMENT SYSTEM PROJECT REPORT.pdf
COLLEGE BUS MANAGEMENT SYSTEM PROJECT REPORT.pdfCOLLEGE BUS MANAGEMENT SYSTEM PROJECT REPORT.pdf
COLLEGE BUS MANAGEMENT SYSTEM PROJECT REPORT.pdf
Kamal Acharya
 
power quality voltage fluctuation UNIT - I.pptx
power quality voltage fluctuation UNIT - I.pptxpower quality voltage fluctuation UNIT - I.pptx
power quality voltage fluctuation UNIT - I.pptx
ViniHema
 
Halogenation process of chemical process industries
Halogenation process of chemical process industriesHalogenation process of chemical process industries
Halogenation process of chemical process industries
MuhammadTufail242431
 
在线办理(ANU毕业证书)澳洲国立大学毕业证录取通知书一模一样
在线办理(ANU毕业证书)澳洲国立大学毕业证录取通知书一模一样在线办理(ANU毕业证书)澳洲国立大学毕业证录取通知书一模一样
在线办理(ANU毕业证书)澳洲国立大学毕业证录取通知书一模一样
obonagu
 
Standard Reomte Control Interface - Neometrix
Standard Reomte Control Interface - NeometrixStandard Reomte Control Interface - Neometrix
Standard Reomte Control Interface - Neometrix
Neometrix_Engineering_Pvt_Ltd
 
Design and Analysis of Algorithms-DP,Backtracking,Graphs,B&B
Design and Analysis of Algorithms-DP,Backtracking,Graphs,B&BDesign and Analysis of Algorithms-DP,Backtracking,Graphs,B&B
Design and Analysis of Algorithms-DP,Backtracking,Graphs,B&B
Sreedhar Chowdam
 
Gen AI Study Jams _ For the GDSC Leads in India.pdf
Gen AI Study Jams _ For the GDSC Leads in India.pdfGen AI Study Jams _ For the GDSC Leads in India.pdf
Gen AI Study Jams _ For the GDSC Leads in India.pdf
gdsczhcet
 
ASME IX(9) 2007 Full Version .pdf
ASME IX(9)  2007 Full Version       .pdfASME IX(9)  2007 Full Version       .pdf
ASME IX(9) 2007 Full Version .pdf
AhmedHussein950959
 

Recently uploaded (20)

Planning Of Procurement o different goods and services
Planning Of Procurement o different goods and servicesPlanning Of Procurement o different goods and services
Planning Of Procurement o different goods and services
 
J.Yang, ICLR 2024, MLILAB, KAIST AI.pdf
J.Yang,  ICLR 2024, MLILAB, KAIST AI.pdfJ.Yang,  ICLR 2024, MLILAB, KAIST AI.pdf
J.Yang, ICLR 2024, MLILAB, KAIST AI.pdf
 
WATER CRISIS and its solutions-pptx 1234
WATER CRISIS and its solutions-pptx 1234WATER CRISIS and its solutions-pptx 1234
WATER CRISIS and its solutions-pptx 1234
 
ethical hacking-mobile hacking methods.ppt
ethical hacking-mobile hacking methods.pptethical hacking-mobile hacking methods.ppt
ethical hacking-mobile hacking methods.ppt
 
Sachpazis:Terzaghi Bearing Capacity Estimation in simple terms with Calculati...
Sachpazis:Terzaghi Bearing Capacity Estimation in simple terms with Calculati...Sachpazis:Terzaghi Bearing Capacity Estimation in simple terms with Calculati...
Sachpazis:Terzaghi Bearing Capacity Estimation in simple terms with Calculati...
 
addressing modes in computer architecture
addressing modes  in computer architectureaddressing modes  in computer architecture
addressing modes in computer architecture
 
一比一原版(SFU毕业证)西蒙菲莎大学毕业证成绩单如何办理
一比一原版(SFU毕业证)西蒙菲莎大学毕业证成绩单如何办理一比一原版(SFU毕业证)西蒙菲莎大学毕业证成绩单如何办理
一比一原版(SFU毕业证)西蒙菲莎大学毕业证成绩单如何办理
 
The role of big data in decision making.
The role of big data in decision making.The role of big data in decision making.
The role of big data in decision making.
 
Cosmetic shop management system project report.pdf
Cosmetic shop management system project report.pdfCosmetic shop management system project report.pdf
Cosmetic shop management system project report.pdf
 
Courier management system project report.pdf
Courier management system project report.pdfCourier management system project report.pdf
Courier management system project report.pdf
 
Architectural Portfolio Sean Lockwood
Architectural Portfolio Sean LockwoodArchitectural Portfolio Sean Lockwood
Architectural Portfolio Sean Lockwood
 
LIGA(E)11111111111111111111111111111111111111111.ppt
LIGA(E)11111111111111111111111111111111111111111.pptLIGA(E)11111111111111111111111111111111111111111.ppt
LIGA(E)11111111111111111111111111111111111111111.ppt
 
COLLEGE BUS MANAGEMENT SYSTEM PROJECT REPORT.pdf
COLLEGE BUS MANAGEMENT SYSTEM PROJECT REPORT.pdfCOLLEGE BUS MANAGEMENT SYSTEM PROJECT REPORT.pdf
COLLEGE BUS MANAGEMENT SYSTEM PROJECT REPORT.pdf
 
power quality voltage fluctuation UNIT - I.pptx
power quality voltage fluctuation UNIT - I.pptxpower quality voltage fluctuation UNIT - I.pptx
power quality voltage fluctuation UNIT - I.pptx
 
Halogenation process of chemical process industries
Halogenation process of chemical process industriesHalogenation process of chemical process industries
Halogenation process of chemical process industries
 
在线办理(ANU毕业证书)澳洲国立大学毕业证录取通知书一模一样
在线办理(ANU毕业证书)澳洲国立大学毕业证录取通知书一模一样在线办理(ANU毕业证书)澳洲国立大学毕业证录取通知书一模一样
在线办理(ANU毕业证书)澳洲国立大学毕业证录取通知书一模一样
 
Standard Reomte Control Interface - Neometrix
Standard Reomte Control Interface - NeometrixStandard Reomte Control Interface - Neometrix
Standard Reomte Control Interface - Neometrix
 
Design and Analysis of Algorithms-DP,Backtracking,Graphs,B&B
Design and Analysis of Algorithms-DP,Backtracking,Graphs,B&BDesign and Analysis of Algorithms-DP,Backtracking,Graphs,B&B
Design and Analysis of Algorithms-DP,Backtracking,Graphs,B&B
 
Gen AI Study Jams _ For the GDSC Leads in India.pdf
Gen AI Study Jams _ For the GDSC Leads in India.pdfGen AI Study Jams _ For the GDSC Leads in India.pdf
Gen AI Study Jams _ For the GDSC Leads in India.pdf
 
ASME IX(9) 2007 Full Version .pdf
ASME IX(9)  2007 Full Version       .pdfASME IX(9)  2007 Full Version       .pdf
ASME IX(9) 2007 Full Version .pdf
 

The Effect of Coating and Potting on the Reliability of QFN devices

  • 1. The Effect of Coating and Potting on the Reliability of QFN Devices Greg Caswell, Cheryl Tulkoff and Dr. Nathan Blattau
  • 2. QFN: What is it? o Quad Flat Pack No Lead or Quad Flat Non-Leaded o ‘The poor man’s ball grid array’ o Also known as 2© 2004 - 200107 o Leadframe Chip Scale Package (LF-CSP) o MicroLeadFrame (MLF) o Others (MLP, LPCC, QLP, HVQFN, etc.) o Overmolded leadframe with bond pads exposed on the bottom and arranged along the periphery of the package o Developed in the early to mid-1990’s by Motorola, Toshiba, Amkor, etc. o Standardized by JEDEC/EIAJ in late-1990’s o Fastest growing package type
  • 3. Quad Flat No-Leads (QFN) o Elimination of leads o Provides lower resistance o Lower inductance o Higher performance o Higher package densities o Tradeoffs o Increased power density o Manufacturability o More susceptible to QFP: >10,000 thermal mechanical fatigue Cycles to failure -40 to 125C BGA: 3,000 to 8,000 QFN: 1,000 to 3,000 © 2004 - 200107 3
  • 4. Advantages: Thermal Performance o More direct thermal path with larger area o Die ® Die Attach ® Thermal Pad ® Solder ® Board Bond Pad o qJa for the QFN is about half of a leaded counterpart (as per JESD-51) o Allows for 2X increase in power dissipation 4© 2004 - 200107
  • 5. Advantages: Inductance o At higher operating frequencies, inductance of the gold wire and long lead-frame traces will affect performance o Inductance of QFN is half its leaded counterpart because it eliminates gullwing leads and shortens wire lengths 5© 2004 - 200107 http://ap.pennnet.com/display_article/153955/36/ARTCL/none/none/1/The-back-end-process:-Step-9-QFN-Singulation/ Popular for RF Designs
  • 6. Disadvantage: Thermal Mechanical Fatigue (Solder) o Design change: More silicon, less plastic o Increases mismatch in coefficient of thermal expansion (CTE) Does the increased susceptibility of QFN devices make them more sensitive to conformal coating and potting effects? BOARD LEVEL ASSEMBLY AND RELIABILITY CONSIDERATIONS FOR QFN TYPE PACKAGES, Ahmer Syed and WonJoon Kang, Amkor Technology. 6© 2004 - 200107
  • 7. CTE Mismatch © 2004 - 200107 Crack Laminate CTE : 12~15PPM Laminate typical z-axis CTE: Before Tg: 40~60PPM After Tg: 280~350PPM Shear stress Shear stress Component typical CTE: 8~12PPM Copper CTE : 17~18PPM/
  • 8. Rules of Thumb o The use of underfills, potting compounds and thick conformal coatings can greatly influence the failure behavior under thermal cycling o Any time a material goes through its glass transition temperature problems tend to occur o Conformal coating should not bridge between the PCB and the component o Underfills designed for enhancing shock robustness do not tend to enhance thermal cycling robustness o Potting materials can cause PCB warpage and tensile stresses on electronic packages that greatly reduce time to failure © 2004 - 200107
  • 9. Thermal Cycling: Conformal Coating o Care must be taken when using conformal coating over QFN o Coating can infiltrate under the QFN o Small standoff height allows coating to cause lift o Hamilton Sundstrand found a significant reduction in time to failure (-55 / 125C) o Uncoated: 2000 to 2500 cycles o Coated: 300 to 700 cycles o Also driven by solder joint sensitivity to tensile stresses o Damage evolution is far higher than for shear stresses 9© 2004 - 200107 Wrightson, SMTA Pan Pac 2007
  • 10. Conformal Coating Properties (Glass Transition Temperature) o Why did conformal coating effect thermal cycling performance? o Verification and determination of mechanical properties o Elastic Modulus as a function of temperature o Glass Transition Temperature o Coefficient of Thermal Expansion Young’s Modulus Datasheet 1260 psi (8.7 MPa) Coefficient of thermal Expansion Datasheet 55 ppm/°C © 2004 - 200107 10
  • 11. Elastic Modulus – DMA - Tensile Acrylic conformal coating Datasheet - Specification (8.7 MPa, 1260 psi), Tg = 15°C 1©1 2004 - 200107
  • 12. Coefficient of Thermal Expansion - TMA Acrylic conformal coating 1©2 2004 - 200107 Glass Transition Temperature Tg 5 to 15°C Below Tg CTE – 170 ppm/°C Above Tg : CTE – 340 ppm/°C
  • 13. Potting o Ideally the CTE of the potting should be as close to the CCA as possible o Usually in the 20 to 30 ppm/°C o The larger the CTE, the more compliant the potting must be to limit the stresses imparted to the © 2004 - 200107 CCA o Potting should the generate hydrostatic pressure (equal on all sides) of the circuit card o This prevents warping of the CCA as the potting expands o Excessive warping will greatly reduce time to failure o May cause overstress failures. o This may require modification to the housing o Housing may need to be relatively stiff
  • 14. Rigid Housing with Free Surface o QFN failures occurring very rapidly during temperature cycling with urethane based potting material o All units were failed at the 100 cycle inspection (-40 to 105C) o Good quality joints with sufficient solder thickness © 2004 - 200107
  • 15. Material Properties Potting Compound Isotropic Material CTEx,y = 120 ppm Significant increase in modulus or stiffness below with high CTE © 2004 - 200107
  • 16. PCB Warpage due to Potting Shrinkage © 2004 - 200107
  • 17. QFN Warpage © 2004 - 200107 Unpotted Potted Order of magnitude higher deformation and deformation concentrated over corner solder joints
  • 18. Solder Stresses o Very high stresses during cold dwell of thermal cycle © 2004 - 200107 HOT COLD
  • 19. Creep Strains o The higher the creep strains the shorter the time to failure © 2004 - 200107 Unpotted Potted o Excessive creep occurring at cold temperature o More energy required to cause cold temperature creep (more damaging)
  • 20. Conclusions o The lack of a compliant lead structure makes QFN devices more susceptible to PCB warpage related failures o Mechanical properties of the potting material o Glass transition temperature (Tg) o Modulus should be specified above and below the Tg o CTE should be specified above and below the Tg o The design of the housing o May provide a surface to which the potting material can pull © 2004 - 200107 against when shrinking causing PCB warpage o Should be designed to provide as close to a hydrostatic pressure as possible (equal pressure on all sides)