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© 2016 KEMET Corporation. All Rights Reserved
C0G MLCC DC Link
Capacitors in
3D Power Electronics
© 2016 KEMET Corporation.
All Rights Reserved
© 2016 KEMET Corporation. All Rights Reserved
An Evaluation of BME C0G Multilayer
Ceramic Capacitors as Building Blocks
for DC Link Capacitors in 3-D Power
Electronics
John Bultitude, Lonnie Jones, Buli Xu,
Jim Magee and Reggie Phillips
KEMET Electronics Corporation
2835 KEMET Way, Simpsonville,
SC 29681, USA
johnbultitude@kemet.com
© 2016 KEMET Corporation. All Rights Reserved
Presentation Outline
• Introduction
• Background
• Capacitor Designs & Basic Electric Properties
• Reliability & DC Link Performance
• Assembly Considerations
• Conclusions
• Future Work
© 2016 KEMET Corporation. All Rights Reserved
Introduction
• There is a need for DC Link capacitors that can be
embedded in 3-D electronic packages close to wide band
gap semiconductors to reduce inductance and improve
efficiency at
– Higher Frequencies
– Higher Voltages
– Higher Temperatures
• Traditional film capacitors are limited to lower operational
temperatures and they do not lend themselves easily to
high density 3-D assembly
• The availability of suitable multilayer ceramic capacitors
(MLCC) with the necessary voltage and temperature
capability as well as reliability is limited
© 2016 KEMET Corporation. All Rights Reserved
Background
• KEMET developed 200°C MLCC solutions over 5 years ago
using Ni BME C0G Dielectrics
• Since this time extensions have be made to high voltages
ratings, 2000V, in large case sizes to 4540 rated for 200°C
• For immediate DC Link needs we targeted higher capacitance
MLCC for rating 500VDC at 150°C
• The purpose of this work is to evaluate different 3640 MLCC of Ni
C0G made with thinner active layers
• Comparisons are made to a commercial surface mountable
leaded ceramic DC Link capacitor that has been extensively
reviewed in the literature
© 2016 KEMET Corporation. All Rights Reserved
MLCC Evaluation
Commercial
DC Link
KEMET BME
C0G 3640
Case Size
Description C0G BME MLCC
Prototypes
Commercial DC Link
MLCC
Part Types 3640 Case Sizes (EIA) 4231 (2731 no leads)
Average. Dimensions
(without leads)
Length, mm 9.14 10.78 (6.88)
Width, mm 10.16 7.94 (7.80)
Thickness, mm 2.49 4.05 (2.67)
Volume (cm3) 0.231 0.347 (0.143)
© 2016 KEMET Corporation. All Rights Reserved
Capacitor Materials
Description C0G BME MLCC
Prototypes
Commercial DC-Link
Capacitor
Dielectric CaZrO3 Pb0.87La0.07(Na,K)0.05
Zr0.86Ti0.14O3 [4] PLZT
Dielectric Type Paraelectric Anti-Ferroelectric
Dielectric Constant (K) 32 2274
Inner Electrode Nickel Copper
Termination Tin Plating Over Nickel
Plating
Silver Plated Lead
[4] G. F. Engel, “Material Requirements for Power and High Temperature Multilayer Ceramic Capacitors (MLCC)”,
Proceedings: IMAPS/ACerS 11th International CICMT, Conference & Exhibition, Dresden, Germany, April 20-23, 2015,
pp. 21-28.
© 2016 KEMET Corporation. All Rights Reserved
Cross-Section Analysis
KEMET 3640 C0G Ni Prototype #1
• Single Monolith
• Single Overlap Area
C = K K0 A n / t
C = capacitance
K = dielectric constant
K0 = permittivity of free space
(8.854 x 10-12 F/m)
A = Overlap Area
n = Number of active layers
t = Thickness of active layers
Commercial DC Link
• 2 Bonded Monoliths
• 2 Capacitors in Series
1/C = 1/C1 + 1/C2
C1 = capacitance of 1st cap.in series
C2 = capacitance of 2nd cap.in series
Voltage is divided between the
capacitors but at the expense of
lowering effective capacitance
© 2016 KEMET Corporation. All Rights Reserved
Dielectric Strength
Ni BME C0G 3640 Prototypes Commercial Cu
PLZT
#1 #2 #3
Dielectric Strength
(V/μm)
100 110 120 27
• Ni BME C0G has higher dielectric strength even in thin
active layers
• Use more active layers for high capacitance
© 2016 KEMET Corporation. All Rights Reserved
Electrical Properties
Ni BME C0G 3640 Prototypes Commercial Cu
PLZT
#1 #2 #3
Capacitance (nF) 227 343 487 310
DF (%) 0.0080 0.0117 0.0110 0.618
IR @ 25oC (GΩ) 458 277 242 16.5
IR @ 125oC (GΩ) 7.42 6.47 6.24 5.10
• The Commercial Cu PLZT
capacitor is labeled as 1μF part
but is only 310nF at 1VRMS at 1kHz
[2] X. Xu, A. S. Gurav, P. M. Lessner and C.A. Randall, “Robust BME Class-1 MLCC for Harsh Environment Applications”,
IEEE Transactions on Industrial Electronics, Vol. 50, No. 7, July 2011, pp. 2636-43.
• Ni BME C0G has far lower DF and
IR does not decrease further on
increasing temperature > 125oC [2]:
© 2016 KEMET Corporation. All Rights Reserved
Capacitance at 500VDC from 25oC to 200oC
• Capacitance increases with
applied DC voltage in anti-
ferroelectric (AFE) type dielectrics
like PLZT
• 500VDC is more representative of
the operational conditions in DC-
Link applications
• Capacitance varies significantly
with temperature for the PLZT
capacitor increasing to a peak
value of 447nF
• There is hardly any change in
capacitance over this temperature
range for the C0G MLCC - in this
respect they behave similar to film
capacitors
© 2016 KEMET Corporation. All Rights Reserved
Reliability, Accelerated Life Testing 600VDC
& 200oC
• The failure rate at 750hours of
the commercial capacitor is
higher than reported in the
literature [1] but no failures
after 250hours is consistent
with this data
• The C0G 3640 prototypes #2
& #3 only had early failures at
250hours.
• No failures were detected in
the 3640 Prototype #1 through
1000hours of testing
• Further testing multiple
batches underway to rate for
500VDC & 150oC
© 2016 KEMET Corporation. All Rights Reserved
Reliability, Accelerated Life Testing 600VDC
& 200oC, IR Weibull
© 2016 KEMET Corporation. All Rights Reserved
Current Handling Capability
Temperature Rise from Ambient @ 100kHz
• Temperature of the Cu PLZT
capacitor increases relatively
rapidly compared to the C0G Ni
BME capacitors.
• Lower dissipation factors of the
C0G results in a lower
temperature rise. This is not
unexpected since the power
dissipated is related by:
P = i2d/2πfC
P = power dissipated
i = current
d = dissipation factor
f = frequency
C = capacitance
• Also; P = i2ESR so this too should be lower
© 2016 KEMET Corporation. All Rights Reserved
ESR, Impedance and ESL Comparisons
• < 3MHz ESR is lower for
Ni BME C0G prototype #1
MLCC and self-resonant
frequency is lower
consistent with the lower
capacitance
• ESL remains low for C0G
3640, around 0.5nH
compared to 1.3nH for the
PLZT commercial DC link
capacitor because there
are no leads in the C0G
MLCC to add to the
inductive loop
© 2016 KEMET Corporation. All Rights Reserved
Power Density Figure of Merit (FOM)
• For DC Link capacitors Power Density (PD) can be calculated as follows [5]:
PD = [C x Un x IRMS] / Vol
C = max. capacitance in μF at 500VDC up to 150oC
Un = DC voltage rating (500VDC)
IRMS = max. current handling at 100kHz
Vol = Volume in cm3
Capacitor Volume
(cm3)
C
(μF)
IRMS
(A)
Power
Density
3640 Prototype #1 0.231 0.227 15 7370
Commercial DC
Link
0.347 0.447 4 2580
Commercial DC
Link - no Leads
0.143 0.447 4 6250
Film Capacitor
- Rated 105oC
45 200 50 110,000
[5] P. Bettacchi, D. Montanari, D. Zanarini, D. Orioli, G. Rondelli and A. Sanua, “Power Film Capacitors for Industrial
Applications”, Proceedings CARTS Europe 2010, Symposium for Passive Components, Munich, Germany, pp. 1-10.
No Failures (0/10) after
1000 hours @ 10ARMS
/150oC/100kHz
© 2016 KEMET Corporation. All Rights Reserved
Assembly Considerations
For robust performance it is
desirable to have MLCC with
• High Modulus of Rupture
• High Board Flexure
Capability
• No Failures during
Thermal Cycling
– Also dependent on CTE
mismatch
– C0G 8-10 PPM /oC
– FR4 14-18 PPM/oC
– Polyimide 15-19 PPM/oC
– Cu 17 PPM/oC
MLCC Surface Mounted
on Circuit Board
Mounting
Solder
Circuit Board
Thermal Cycling - CTE
Mismatch Causes Failure
Board Flexure Causes
Failure
© 2016 KEMET Corporation. All Rights Reserved
Modulus of Rupture (MOR)
© 2016 KEMET Corporation. All Rights Reserved
Board Flexure of 3640 Ni BME C0G
• Method JIS-C-6429
• 3640 flexure remains well above the 3mm limit (μStrain = 3555)
• Minimum failure recorded at 3.97mm (μStrain = 4704)
© 2016 KEMET Corporation. All Rights Reserved
Temperature Cycling, Large Case Size
Ni BME C0G, > 500VDC & 200oC
Case
Size
Nominal
Cap. (nF)
Rated Voltage
(VDC)
1000 Cycles
-55oC to +125oC
50 Cycles
-55oC to +200oC
4540 27 1500 0/231 0/50
3640 15 2000 0/154 0/100
3040 39 1000 0/154 0/100
2824 33 630 0/154 0/100
• All tests use SAC solder, FR4 board for 125oC, Polyimide for 200oC
• Cycling to 125oC by JESD22, Method JA-104
• -55oC to 200oC cycling with a 30oC/min ramp rate and 1 hour soak at
each temperature
© 2016 KEMET Corporation. All Rights Reserved
3D-Packaging Interconnects
• Transient Liquid Phase Sintering (TLPS) Materials &
Processes were investigated to replace Pb-based solders [10]
• Leaded MLCC with TLPS interconnects of Cu-Sn & In-Ag had:
– High shear capability at 300oC (useful to at least 350oC)
– TLPS Cu-Sn leaded MLCC passed 2000 hours storage life @ 175oC,
85oC/85% humidity testing 2000 hours & 2000 cycles -40 to +175oC
• TLPS materials may be more desirable for packaging because
they have low forming temperatures and higher melting
temperatures but unlike solders the bonding is surface finish
specific:
– Component terminations must be compatible with the TLPS and
package bonding surface
– Temperature cycling must be evaluated
[10] J. Bultitude, J. McConnell and C. Shearer, “High temperature capacitors and transient liquid phase interconnects for Pb-
solder replacement”, Journal of Materials Science: Materials in Electronics, December 2015, Volume 26, Issue 12, pp. 9236-
9242
© 2016 KEMET Corporation. All Rights Reserved
Conclusions
• 3640 C0G Ni MLCC prototype # 1 had no failures (0/60) in
accelerated testing at 200oC, 600VDC through 1000 hours
• These C0G MLCC have low DF, very stable capacitance with
temperature under bias, and higher current handling capability
leading to high power density
• Larger case size C0G MLCC also have high MOR with good
board flexure performance and thermal cycling capability
• C0G Ni MLCC are Pb-free and can be considered a good
building block for DC Link capacitors
• TLPS materials may be considered as packaging interconnects
to overcome solder limitations but are surface finish specific
© 2016 KEMET Corporation. All Rights Reserved
Future Work
• C0G Ni MLCC are being manufactured based on the 3640
prototype #1 for qualification at 500VDC and 150°C
• Thermal cycling performance in the assembled package
should be assessed to confirm interconnect integrity
• Power cycling will also need to be assessed in the final
package.
© 2016 KEMET Corporation. All Rights Reserved
Thank You!
KEMET Electronics Corporation
2835 KEMET Way,
Simpsonville,
SC 29681, USA
More Information:
https://ec.kemet.com/ceramic-dc-link

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C0G MLCCs as High-Temperature, High-Power Density DC Link Capacitors for 3D Power Electronics

  • 1. © 2016 KEMET Corporation. All Rights Reserved C0G MLCC DC Link Capacitors in 3D Power Electronics © 2016 KEMET Corporation. All Rights Reserved
  • 2. © 2016 KEMET Corporation. All Rights Reserved An Evaluation of BME C0G Multilayer Ceramic Capacitors as Building Blocks for DC Link Capacitors in 3-D Power Electronics John Bultitude, Lonnie Jones, Buli Xu, Jim Magee and Reggie Phillips KEMET Electronics Corporation 2835 KEMET Way, Simpsonville, SC 29681, USA johnbultitude@kemet.com
  • 3. © 2016 KEMET Corporation. All Rights Reserved Presentation Outline • Introduction • Background • Capacitor Designs & Basic Electric Properties • Reliability & DC Link Performance • Assembly Considerations • Conclusions • Future Work
  • 4. © 2016 KEMET Corporation. All Rights Reserved Introduction • There is a need for DC Link capacitors that can be embedded in 3-D electronic packages close to wide band gap semiconductors to reduce inductance and improve efficiency at – Higher Frequencies – Higher Voltages – Higher Temperatures • Traditional film capacitors are limited to lower operational temperatures and they do not lend themselves easily to high density 3-D assembly • The availability of suitable multilayer ceramic capacitors (MLCC) with the necessary voltage and temperature capability as well as reliability is limited
  • 5. © 2016 KEMET Corporation. All Rights Reserved Background • KEMET developed 200°C MLCC solutions over 5 years ago using Ni BME C0G Dielectrics • Since this time extensions have be made to high voltages ratings, 2000V, in large case sizes to 4540 rated for 200°C • For immediate DC Link needs we targeted higher capacitance MLCC for rating 500VDC at 150°C • The purpose of this work is to evaluate different 3640 MLCC of Ni C0G made with thinner active layers • Comparisons are made to a commercial surface mountable leaded ceramic DC Link capacitor that has been extensively reviewed in the literature
  • 6. © 2016 KEMET Corporation. All Rights Reserved MLCC Evaluation Commercial DC Link KEMET BME C0G 3640 Case Size Description C0G BME MLCC Prototypes Commercial DC Link MLCC Part Types 3640 Case Sizes (EIA) 4231 (2731 no leads) Average. Dimensions (without leads) Length, mm 9.14 10.78 (6.88) Width, mm 10.16 7.94 (7.80) Thickness, mm 2.49 4.05 (2.67) Volume (cm3) 0.231 0.347 (0.143)
  • 7. © 2016 KEMET Corporation. All Rights Reserved Capacitor Materials Description C0G BME MLCC Prototypes Commercial DC-Link Capacitor Dielectric CaZrO3 Pb0.87La0.07(Na,K)0.05 Zr0.86Ti0.14O3 [4] PLZT Dielectric Type Paraelectric Anti-Ferroelectric Dielectric Constant (K) 32 2274 Inner Electrode Nickel Copper Termination Tin Plating Over Nickel Plating Silver Plated Lead [4] G. F. Engel, “Material Requirements for Power and High Temperature Multilayer Ceramic Capacitors (MLCC)”, Proceedings: IMAPS/ACerS 11th International CICMT, Conference & Exhibition, Dresden, Germany, April 20-23, 2015, pp. 21-28.
  • 8. © 2016 KEMET Corporation. All Rights Reserved Cross-Section Analysis KEMET 3640 C0G Ni Prototype #1 • Single Monolith • Single Overlap Area C = K K0 A n / t C = capacitance K = dielectric constant K0 = permittivity of free space (8.854 x 10-12 F/m) A = Overlap Area n = Number of active layers t = Thickness of active layers Commercial DC Link • 2 Bonded Monoliths • 2 Capacitors in Series 1/C = 1/C1 + 1/C2 C1 = capacitance of 1st cap.in series C2 = capacitance of 2nd cap.in series Voltage is divided between the capacitors but at the expense of lowering effective capacitance
  • 9. © 2016 KEMET Corporation. All Rights Reserved Dielectric Strength Ni BME C0G 3640 Prototypes Commercial Cu PLZT #1 #2 #3 Dielectric Strength (V/μm) 100 110 120 27 • Ni BME C0G has higher dielectric strength even in thin active layers • Use more active layers for high capacitance
  • 10. © 2016 KEMET Corporation. All Rights Reserved Electrical Properties Ni BME C0G 3640 Prototypes Commercial Cu PLZT #1 #2 #3 Capacitance (nF) 227 343 487 310 DF (%) 0.0080 0.0117 0.0110 0.618 IR @ 25oC (GΩ) 458 277 242 16.5 IR @ 125oC (GΩ) 7.42 6.47 6.24 5.10 • The Commercial Cu PLZT capacitor is labeled as 1μF part but is only 310nF at 1VRMS at 1kHz [2] X. Xu, A. S. Gurav, P. M. Lessner and C.A. Randall, “Robust BME Class-1 MLCC for Harsh Environment Applications”, IEEE Transactions on Industrial Electronics, Vol. 50, No. 7, July 2011, pp. 2636-43. • Ni BME C0G has far lower DF and IR does not decrease further on increasing temperature > 125oC [2]:
  • 11. © 2016 KEMET Corporation. All Rights Reserved Capacitance at 500VDC from 25oC to 200oC • Capacitance increases with applied DC voltage in anti- ferroelectric (AFE) type dielectrics like PLZT • 500VDC is more representative of the operational conditions in DC- Link applications • Capacitance varies significantly with temperature for the PLZT capacitor increasing to a peak value of 447nF • There is hardly any change in capacitance over this temperature range for the C0G MLCC - in this respect they behave similar to film capacitors
  • 12. © 2016 KEMET Corporation. All Rights Reserved Reliability, Accelerated Life Testing 600VDC & 200oC • The failure rate at 750hours of the commercial capacitor is higher than reported in the literature [1] but no failures after 250hours is consistent with this data • The C0G 3640 prototypes #2 & #3 only had early failures at 250hours. • No failures were detected in the 3640 Prototype #1 through 1000hours of testing • Further testing multiple batches underway to rate for 500VDC & 150oC
  • 13. © 2016 KEMET Corporation. All Rights Reserved Reliability, Accelerated Life Testing 600VDC & 200oC, IR Weibull
  • 14. © 2016 KEMET Corporation. All Rights Reserved Current Handling Capability Temperature Rise from Ambient @ 100kHz • Temperature of the Cu PLZT capacitor increases relatively rapidly compared to the C0G Ni BME capacitors. • Lower dissipation factors of the C0G results in a lower temperature rise. This is not unexpected since the power dissipated is related by: P = i2d/2πfC P = power dissipated i = current d = dissipation factor f = frequency C = capacitance • Also; P = i2ESR so this too should be lower
  • 15. © 2016 KEMET Corporation. All Rights Reserved ESR, Impedance and ESL Comparisons • < 3MHz ESR is lower for Ni BME C0G prototype #1 MLCC and self-resonant frequency is lower consistent with the lower capacitance • ESL remains low for C0G 3640, around 0.5nH compared to 1.3nH for the PLZT commercial DC link capacitor because there are no leads in the C0G MLCC to add to the inductive loop
  • 16. © 2016 KEMET Corporation. All Rights Reserved Power Density Figure of Merit (FOM) • For DC Link capacitors Power Density (PD) can be calculated as follows [5]: PD = [C x Un x IRMS] / Vol C = max. capacitance in μF at 500VDC up to 150oC Un = DC voltage rating (500VDC) IRMS = max. current handling at 100kHz Vol = Volume in cm3 Capacitor Volume (cm3) C (μF) IRMS (A) Power Density 3640 Prototype #1 0.231 0.227 15 7370 Commercial DC Link 0.347 0.447 4 2580 Commercial DC Link - no Leads 0.143 0.447 4 6250 Film Capacitor - Rated 105oC 45 200 50 110,000 [5] P. Bettacchi, D. Montanari, D. Zanarini, D. Orioli, G. Rondelli and A. Sanua, “Power Film Capacitors for Industrial Applications”, Proceedings CARTS Europe 2010, Symposium for Passive Components, Munich, Germany, pp. 1-10. No Failures (0/10) after 1000 hours @ 10ARMS /150oC/100kHz
  • 17. © 2016 KEMET Corporation. All Rights Reserved Assembly Considerations For robust performance it is desirable to have MLCC with • High Modulus of Rupture • High Board Flexure Capability • No Failures during Thermal Cycling – Also dependent on CTE mismatch – C0G 8-10 PPM /oC – FR4 14-18 PPM/oC – Polyimide 15-19 PPM/oC – Cu 17 PPM/oC MLCC Surface Mounted on Circuit Board Mounting Solder Circuit Board Thermal Cycling - CTE Mismatch Causes Failure Board Flexure Causes Failure
  • 18. © 2016 KEMET Corporation. All Rights Reserved Modulus of Rupture (MOR)
  • 19. © 2016 KEMET Corporation. All Rights Reserved Board Flexure of 3640 Ni BME C0G • Method JIS-C-6429 • 3640 flexure remains well above the 3mm limit (μStrain = 3555) • Minimum failure recorded at 3.97mm (μStrain = 4704)
  • 20. © 2016 KEMET Corporation. All Rights Reserved Temperature Cycling, Large Case Size Ni BME C0G, > 500VDC & 200oC Case Size Nominal Cap. (nF) Rated Voltage (VDC) 1000 Cycles -55oC to +125oC 50 Cycles -55oC to +200oC 4540 27 1500 0/231 0/50 3640 15 2000 0/154 0/100 3040 39 1000 0/154 0/100 2824 33 630 0/154 0/100 • All tests use SAC solder, FR4 board for 125oC, Polyimide for 200oC • Cycling to 125oC by JESD22, Method JA-104 • -55oC to 200oC cycling with a 30oC/min ramp rate and 1 hour soak at each temperature
  • 21. © 2016 KEMET Corporation. All Rights Reserved 3D-Packaging Interconnects • Transient Liquid Phase Sintering (TLPS) Materials & Processes were investigated to replace Pb-based solders [10] • Leaded MLCC with TLPS interconnects of Cu-Sn & In-Ag had: – High shear capability at 300oC (useful to at least 350oC) – TLPS Cu-Sn leaded MLCC passed 2000 hours storage life @ 175oC, 85oC/85% humidity testing 2000 hours & 2000 cycles -40 to +175oC • TLPS materials may be more desirable for packaging because they have low forming temperatures and higher melting temperatures but unlike solders the bonding is surface finish specific: – Component terminations must be compatible with the TLPS and package bonding surface – Temperature cycling must be evaluated [10] J. Bultitude, J. McConnell and C. Shearer, “High temperature capacitors and transient liquid phase interconnects for Pb- solder replacement”, Journal of Materials Science: Materials in Electronics, December 2015, Volume 26, Issue 12, pp. 9236- 9242
  • 22. © 2016 KEMET Corporation. All Rights Reserved Conclusions • 3640 C0G Ni MLCC prototype # 1 had no failures (0/60) in accelerated testing at 200oC, 600VDC through 1000 hours • These C0G MLCC have low DF, very stable capacitance with temperature under bias, and higher current handling capability leading to high power density • Larger case size C0G MLCC also have high MOR with good board flexure performance and thermal cycling capability • C0G Ni MLCC are Pb-free and can be considered a good building block for DC Link capacitors • TLPS materials may be considered as packaging interconnects to overcome solder limitations but are surface finish specific
  • 23. © 2016 KEMET Corporation. All Rights Reserved Future Work • C0G Ni MLCC are being manufactured based on the 3640 prototype #1 for qualification at 500VDC and 150°C • Thermal cycling performance in the assembled package should be assessed to confirm interconnect integrity • Power cycling will also need to be assessed in the final package.
  • 24. © 2016 KEMET Corporation. All Rights Reserved Thank You! KEMET Electronics Corporation 2835 KEMET Way, Simpsonville, SC 29681, USA More Information: https://ec.kemet.com/ceramic-dc-link