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The Effect of Coating and Potting on the Reliability of QFN Devices 
Cheryl Tulkoff and Dr. Nathan Blattau
© 2004 - 2007 
2010 
2 
QFN: What is it? 
oQuad Flat Pack No Lead or Quad Flat Non-Leaded 
o‘The poor man’s ball grid array’ 
oAlso known as 
oLeadframe Chip Scale Package (LF-CSP) 
oMicroLeadFrame (MLF) 
oOthers (MLP, LPCC, QLP, HVQFN, etc.) 
oOvermolded leadframe with bond pads exposed on the bottom and arranged along the periphery of the package 
oDeveloped in the early to mid-1990’s by Motorola, Toshiba, Amkor, etc. 
oStandardized by JEDEC/EIAJ in late-1990’s 
oFastest growing package type
© 2004 - 2007 
2010 
3 
Quad Flat No-Leads (QFN) 
oElimination of leads 
oProvides lower resistance 
oLower inductance 
oHigher performance 
oHigher package densities 
oTradeoffs 
oIncreased power density 
oManufacturability 
oMore susceptible to thermal mechanical fatigue 
Cycles to failure 
-40 to 125C 
QFP: >10,000 
BGA: 3,000 to 8,000 
QFN: 1,000 to 3,000
© 2004 - 2007 
2010 
4 
Advantages: Thermal Performance 
oMore direct thermal path with larger area 
oDie  Die Attach  Thermal Pad  Solder  Board Bond Pad 
oqJa for the QFN is about half of a leaded counterpart (as per JESD-51) 
oAllows for 2X increase in power dissipation
© 2004 - 2007 
2010 
5 
Advantages: Inductance 
oAt higher operating frequencies, inductance of the gold wire and long lead-frame traces will affect performance 
oInductance of QFN is half its leaded counterpart because it eliminates gullwing leads and shortens wire lengths 
http://ap.pennnet.com/display_article/153955/36/ARTCL/none/none/1/The-back-end-process:-Step-9-QFN-Singulation/ 
Popular for RF Designs
6© 2004 - 200107 
Disadvantage: Thermal Mechanical Fatigue (Solder) 
o Design change: More silicon, less plastic 
o Increases mismatch in coefficient of thermal expansion (CTE) 
BOARD LEVEL ASSEMBLY AND RELIABILITY 
CONSIDERATIONS FOR QFN TYPE PACKAGES, 
Ahmer Syed and WonJoon Kang, Amkor Technology. 
Does the increased 
susceptibility of QFN 
devices make them 
more sensitive to 
conformal coating and 
potting effects?
© 2004 - 2007 
2010 
oThe use of underfills, potting compounds and thick conformal coatings can greatly influence the failure behavior under thermal cycling 
oAny time a material goes through its glass transition temperature problems tend to occur 
oConformal coating should not bridge between the PCB and the component 
oUnderfills designed for enhancing shock robustness do not tend to enhance thermal cycling robustness 
oPotting materials can cause PCB warpage and tensile stresses on electronic packages that greatly reduce time to failure 
Rules of Thumb
9© 2004 - 200107 
Thermal Cycling: Conformal Coating 
o Care must be taken when using conformal coating over QFN 
o Coating can infiltrate under the QFN 
o Small standoff height allows coating to cause lift 
o Hamilton Sundstrand found a significant reduction in time to failure 
(-55 / 125C) 
o Uncoated: 2000 to 2500 cycles 
o Coated: 300 to 700 cycles 
o Also driven by solder joint 
sensitivity to tensile stresses 
o Damage evolution is far 
higher than for shear stresses 
Wrightson, SMTA Pan Pac 2007
© 2004 - 2007 
2010 
10 
oWhy did conformal coating effect thermal cycling performance? 
oVerification and determination of mechanical properties 
oElastic Modulus as a function of temperature 
oGlass Transition Temperature 
oCoefficient of Thermal Expansion 
Young’s Modulus Datasheet 1260 psi (8.7 MPa) Coefficient of thermal Expansion Datasheet 55 ppm/°C 
Conformal Coating Properties (Glass Transition Temperature)
© 2004 - 2007 
2010 
11 
Elastic Modulus – DMA - Tensile 
Datasheet - Specification (8.7 MPa, 1260 psi), Tg = 15°C 
Acrylic conformal coating
© 2004 - 2007 
2010 
12 
Glass Transition Temperature Tg ≈ 5 to 15°C 
Coefficient of Thermal Expansion - TMA 
Below Tg CTE – 170 ppm/°C Above Tg : CTE – 340 ppm/°C 
Acrylic conformal coating
© 2004 - 2007 
2010 
oIdeally the CTE of the potting should be as close to the CCA as possible 
oUsually in the 20 to 30 ppm/°C 
oThe larger the CTE, the more compliant the potting must be to limit the stresses imparted to the CCA 
oPotting should the generate hydrostatic pressure (equal on all sides) of the circuit card 
oThis prevents warping of the CCA as the potting expands 
oExcessive warping will greatly reduce time to failure 
oMay cause overstress failures. 
oThis may require modification to the housing 
oHousing may need to be relatively stiff 
Potting
© 2004 - 2007 
2010 
oQFN failures occurring very rapidly during temperature cycling with urethane based potting material 
oAll units were failed at the 100 cycle inspection (-40 to 105C) 
oGood quality joints with sufficient solder thickness 
Rigid Housing with Free Surface
© 2004 - 2007 
2010 
Material Properties 
Potting Compound Isotropic Material CTEx,y = 120 ppm Significant increase in modulus or stiffness below with high CTE
© 2004 - 2007 
2010 
PCB Warpage due to Potting Shrinkage
© 2004 - 2007 
2010 
QFN Warpage 
Unpotted 
Potted 
Order of magnitude higher deformation and deformation concentrated over corner solder joints
© 2004 - 2007 
2010 
oVery high stresses during cold dwell of thermal cycle 
Solder Stresses 
HOT 
COLD
© 2004 - 2007 
2010 
oThe higher the creep strains the shorter the time to failure 
Creep Strains 
Unpotted 
Potted 
oExcessive creep occurring at cold temperature 
oMore energy required to cause cold temperature creep (more damaging)
© 2004 - 2007 
2010 
oThe lack of a compliant lead structure makes QFN devices more susceptible to PCB warpage related failures 
oMechanical properties of the potting material 
oGlass transition temperature (Tg) 
oModulus should be specified above and below the Tg 
oCTE should be specified above and below the Tg 
oThe design of the housing 
oMay provide a surface to which the potting material can pull against when shrinking causing PCB warpage 
oShould be designed to provide as close to a hydrostatic pressure as possible (equal pressure on all sides) 
Conclusions

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Effect of Coating and Potting on QFN Device Reliability

  • 1. The Effect of Coating and Potting on the Reliability of QFN Devices Cheryl Tulkoff and Dr. Nathan Blattau
  • 2. © 2004 - 2007 2010 2 QFN: What is it? oQuad Flat Pack No Lead or Quad Flat Non-Leaded o‘The poor man’s ball grid array’ oAlso known as oLeadframe Chip Scale Package (LF-CSP) oMicroLeadFrame (MLF) oOthers (MLP, LPCC, QLP, HVQFN, etc.) oOvermolded leadframe with bond pads exposed on the bottom and arranged along the periphery of the package oDeveloped in the early to mid-1990’s by Motorola, Toshiba, Amkor, etc. oStandardized by JEDEC/EIAJ in late-1990’s oFastest growing package type
  • 3. © 2004 - 2007 2010 3 Quad Flat No-Leads (QFN) oElimination of leads oProvides lower resistance oLower inductance oHigher performance oHigher package densities oTradeoffs oIncreased power density oManufacturability oMore susceptible to thermal mechanical fatigue Cycles to failure -40 to 125C QFP: >10,000 BGA: 3,000 to 8,000 QFN: 1,000 to 3,000
  • 4. © 2004 - 2007 2010 4 Advantages: Thermal Performance oMore direct thermal path with larger area oDie  Die Attach  Thermal Pad  Solder  Board Bond Pad oqJa for the QFN is about half of a leaded counterpart (as per JESD-51) oAllows for 2X increase in power dissipation
  • 5. © 2004 - 2007 2010 5 Advantages: Inductance oAt higher operating frequencies, inductance of the gold wire and long lead-frame traces will affect performance oInductance of QFN is half its leaded counterpart because it eliminates gullwing leads and shortens wire lengths http://ap.pennnet.com/display_article/153955/36/ARTCL/none/none/1/The-back-end-process:-Step-9-QFN-Singulation/ Popular for RF Designs
  • 6. 6© 2004 - 200107 Disadvantage: Thermal Mechanical Fatigue (Solder) o Design change: More silicon, less plastic o Increases mismatch in coefficient of thermal expansion (CTE) BOARD LEVEL ASSEMBLY AND RELIABILITY CONSIDERATIONS FOR QFN TYPE PACKAGES, Ahmer Syed and WonJoon Kang, Amkor Technology. Does the increased susceptibility of QFN devices make them more sensitive to conformal coating and potting effects?
  • 7. © 2004 - 2007 2010 oThe use of underfills, potting compounds and thick conformal coatings can greatly influence the failure behavior under thermal cycling oAny time a material goes through its glass transition temperature problems tend to occur oConformal coating should not bridge between the PCB and the component oUnderfills designed for enhancing shock robustness do not tend to enhance thermal cycling robustness oPotting materials can cause PCB warpage and tensile stresses on electronic packages that greatly reduce time to failure Rules of Thumb
  • 8. 9© 2004 - 200107 Thermal Cycling: Conformal Coating o Care must be taken when using conformal coating over QFN o Coating can infiltrate under the QFN o Small standoff height allows coating to cause lift o Hamilton Sundstrand found a significant reduction in time to failure (-55 / 125C) o Uncoated: 2000 to 2500 cycles o Coated: 300 to 700 cycles o Also driven by solder joint sensitivity to tensile stresses o Damage evolution is far higher than for shear stresses Wrightson, SMTA Pan Pac 2007
  • 9. © 2004 - 2007 2010 10 oWhy did conformal coating effect thermal cycling performance? oVerification and determination of mechanical properties oElastic Modulus as a function of temperature oGlass Transition Temperature oCoefficient of Thermal Expansion Young’s Modulus Datasheet 1260 psi (8.7 MPa) Coefficient of thermal Expansion Datasheet 55 ppm/°C Conformal Coating Properties (Glass Transition Temperature)
  • 10. © 2004 - 2007 2010 11 Elastic Modulus – DMA - Tensile Datasheet - Specification (8.7 MPa, 1260 psi), Tg = 15°C Acrylic conformal coating
  • 11. © 2004 - 2007 2010 12 Glass Transition Temperature Tg ≈ 5 to 15°C Coefficient of Thermal Expansion - TMA Below Tg CTE – 170 ppm/°C Above Tg : CTE – 340 ppm/°C Acrylic conformal coating
  • 12. © 2004 - 2007 2010 oIdeally the CTE of the potting should be as close to the CCA as possible oUsually in the 20 to 30 ppm/°C oThe larger the CTE, the more compliant the potting must be to limit the stresses imparted to the CCA oPotting should the generate hydrostatic pressure (equal on all sides) of the circuit card oThis prevents warping of the CCA as the potting expands oExcessive warping will greatly reduce time to failure oMay cause overstress failures. oThis may require modification to the housing oHousing may need to be relatively stiff Potting
  • 13. © 2004 - 2007 2010 oQFN failures occurring very rapidly during temperature cycling with urethane based potting material oAll units were failed at the 100 cycle inspection (-40 to 105C) oGood quality joints with sufficient solder thickness Rigid Housing with Free Surface
  • 14. © 2004 - 2007 2010 Material Properties Potting Compound Isotropic Material CTEx,y = 120 ppm Significant increase in modulus or stiffness below with high CTE
  • 15. © 2004 - 2007 2010 PCB Warpage due to Potting Shrinkage
  • 16. © 2004 - 2007 2010 QFN Warpage Unpotted Potted Order of magnitude higher deformation and deformation concentrated over corner solder joints
  • 17. © 2004 - 2007 2010 oVery high stresses during cold dwell of thermal cycle Solder Stresses HOT COLD
  • 18. © 2004 - 2007 2010 oThe higher the creep strains the shorter the time to failure Creep Strains Unpotted Potted oExcessive creep occurring at cold temperature oMore energy required to cause cold temperature creep (more damaging)
  • 19. © 2004 - 2007 2010 oThe lack of a compliant lead structure makes QFN devices more susceptible to PCB warpage related failures oMechanical properties of the potting material oGlass transition temperature (Tg) oModulus should be specified above and below the Tg oCTE should be specified above and below the Tg oThe design of the housing oMay provide a surface to which the potting material can pull against when shrinking causing PCB warpage oShould be designed to provide as close to a hydrostatic pressure as possible (equal pressure on all sides) Conclusions