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Ira Feldman

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Ideal 3D Stacked Die Test - IEEE Semiconductor Wafer Test Workshop SWTW 2013
byIra Feldman
 
IEEE Semiconductor Wafer Test Workshop SWTW 2014 - International Technology Roadmap for Semiconductors (ITRS)
byIra Feldman
 
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman
byIra Feldman
 
IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621
byIra Feldman
 
IEEE SWTW 2012 Road to 450 mm Semiconductor Wafers - Ira Feldman li2
byIra Feldman
 
Silicon Valley Test Workshop - 2.5D-3D What - Ira Feldman 111111
byIra Feldman
 
Lessons for MEMS Test Engineers - Ira Feldman 111020
byIra Feldman
 
Wafer probe technology & application overview ira feldman 101108
byIra Feldman