The electron microscope was invented in 1931 and allows viewing objects at much higher magnifications than a light microscope. There are two main types: transmission electron microscopes (TEM), which use a beam of electrons to view thin samples, and scanning electron microscopes (SEM), which scan a sample's surface with a focused beam. TEMs can achieve resolutions of less than 1 nanometer but require complex sample preparation while SEMs provide three-dimensional views of surfaces but have lower resolution. Both have contributed greatly to scientific fields like biology, medicine, and materials science by revealing ultrastructures invisible to light microscopes.