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This document provides information about transmission electron microscopy (TEM). It describes the principle, parts, and working of the TEM. The TEM uses electron beams rather than light to image specimens. It has greater magnification than light microscopes. The key parts are the electron gun, image producing system, and image recording system. The electron gun produces electrons, the image system focuses electrons through the specimen, and the recording system views and captures the image. TEM allows study of structures down to the nanoscale and is used across many fields including biology, nanotechnology, and materials science.
















