- Atomic force microscopy (AFM) uses a cantilever with a sharp tip to scan over a sample surface and produce images of its topography. The tip is moved in the x, y, and z directions using a piezoelectric scanner. Interactions between the tip and sample are measured to create images with sub-nanometer resolution.
- AFM can operate in different modes depending on whether the tip is in contact with the surface or oscillating above it. Force-distance curves can also be collected to measure interaction forces. AFM has various applications in biology, materials science, and nanotechnology.
Transmission electron microscope, high resolution tem and selected area elect...Nano Encryption
The transmission electron microscope is a very powerful tool for material science. A high energy beam of electrons is shone through a very thin sample, and the interactions between the electrons and the atoms can be used to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. Chemical analysis can also be performed. TEM can be used to study the growth of layers, their composition and defects in semiconductors. High resolution can be used to analyze the quality, shape, size and density of quantum wells, wires and dots.
Scanning Probe microscopy (AFM and STM) head point
AFM: Configuration of AFM
Parts of AFM system and Principle of AFM
Three Modes of AFM
AFM Instrument
Advantage and disadvantage
STM
Schematic Diagram
AFM and STM
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Transmission electron microscope, high resolution tem and selected area elect...Nano Encryption
The transmission electron microscope is a very powerful tool for material science. A high energy beam of electrons is shone through a very thin sample, and the interactions between the electrons and the atoms can be used to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. Chemical analysis can also be performed. TEM can be used to study the growth of layers, their composition and defects in semiconductors. High resolution can be used to analyze the quality, shape, size and density of quantum wells, wires and dots.
Scanning Probe microscopy (AFM and STM) head point
AFM: Configuration of AFM
Parts of AFM system and Principle of AFM
Three Modes of AFM
AFM Instrument
Advantage and disadvantage
STM
Schematic Diagram
AFM and STM
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Different types of Nanolithography technique.
Types: Electron beam lithography, Photolithography, electron-beam writing, ion- lithography, X-ray lithography, and related images, concepts and graphical views.
I hope this presentation helpful for you.
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Microscopic examination using Atomic force microscopy and Confocal scanning ...rasha mohamed
ATOMIC FORCE MICROSCOPE
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning force microscopy, invented in 1986 by Binning, quate and Gerber.
AFMs can be operated in air, vacuum, and in liquids. Biological measurements in particular, are often carried out in vitro in biological fluids, friction and chemical functionality.
Ability of an AFM to achieve near atomic level resolution depends on three essential components:
1). Cantilever with sharp tip
2). Scanner that controls the x-y-z position
3). Feedback control and loop
Confocal Scanning Laser Microscopy (SLCM)is a valuable tool for obtaining high resolution images and 3-D
reconstructions.
Scanning probe microscopy
Scanning probe microscopy is a part of microscopy. That structures pictures of surfaces utilizing an actual test that filters the example. SPM was established in 1981. With the innovation of the checking burrowing magnifying lens. An instrument for imaging surfaces at the nuclear level.
Scanning probe microscopy
The primary fruitful examining burrowing magnifying instrument explore was finished. By Gerd Binnig and Heinrich Rohrer. The way to their prosperity was by utilizing. A criticism circle to direct the hole distance between the example and the probe. Many checking test magnifying instruments can picture a few corporations all the while.
Scanning probe microscopy
The way of utilizing these communications. To get a picture is for the most part called a mode. The goal changes to some degree from one procedure to another. However, a few test strategies arrive at a fairly noteworthy nuclear resolution. This is expected to a great extent. Because piezoelectric actuators can execute movements. With accuracy and precision at the nuclear level or better on electronic order.
This group of methods can be designated "piezoelectric strategies". The other shared factor is that the information. Is commonly acquired as a two-layered framework of main items. Imagined in bogus shading as a PC picture.
Types of Scanning Probe Microscopy
AFM, atomic force microscopy
Contact AFM
Non-contact AFM
Dynamic contact AFM
Taping AFM AFM-IR
CFM, chemical force microscopy
C-AFM, conductive atomic force microscopy
EFM, electrostatic force microscopy
KPFM, kelvin probe force microscopy
MFM, magnetic force microscope
PFM, piezoresponse force microscopy
PTMS, photothermal microspectroscopy / microscopy
SCM, scanning capacitance microscopy
SGM, scanner gate microscopy
SQDM, scanner quantum dot microscopy
SVM, scanner voltage microscopy
FMM, force modulation microscopy
STM, scanning tunneling microscope
BEEM, ballistic electron emission microscopy
ASTM, electrochemical scanning tunnel microscope
SHPM, scanner Hall probe microscopy
SPSM, Spin-polarized scanning microscopy,
PSTM, photon scanning tunneling microscopy
STP, scanning tunneling potentiometry
SXSTM, synchrotron x-ray scanning tunneling microscopy
SPE, Scanning Probe Electrochemistry
The way of utilizing these communications. To get a picture is for the most part called a mode. The goal changes to some degree from one procedure to another. But, a few test strategies arrive at a noteworthy nuclear resolution. This is expected to a great extent.
Because piezoelectric actuators can execute movements. With accuracy and precision at the nuclear level or better on electronic order. This group of methods can be designated "piezoelectric strategies". The other shared factor is the information. Is acquired as a two-layered framework of main items. Imagined in bogus shading as a PC picture.
Types of Scanning Probe Microscopy
AFM, atomic force microscopy Contact AFM N
The French Revolution, which began in 1789, was a period of radical social and political upheaval in France. It marked the decline of absolute monarchies, the rise of secular and democratic republics, and the eventual rise of Napoleon Bonaparte. This revolutionary period is crucial in understanding the transition from feudalism to modernity in Europe.
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Embracing GenAI - A Strategic ImperativePeter Windle
Artificial Intelligence (AI) technologies such as Generative AI, Image Generators and Large Language Models have had a dramatic impact on teaching, learning and assessment over the past 18 months. The most immediate threat AI posed was to Academic Integrity with Higher Education Institutes (HEIs) focusing their efforts on combating the use of GenAI in assessment. Guidelines were developed for staff and students, policies put in place too. Innovative educators have forged paths in the use of Generative AI for teaching, learning and assessments leading to pockets of transformation springing up across HEIs, often with little or no top-down guidance, support or direction.
This Gasta posits a strategic approach to integrating AI into HEIs to prepare staff, students and the curriculum for an evolving world and workplace. We will highlight the advantages of working with these technologies beyond the realm of teaching, learning and assessment by considering prompt engineering skills, industry impact, curriculum changes, and the need for staff upskilling. In contrast, not engaging strategically with Generative AI poses risks, including falling behind peers, missed opportunities and failing to ensure our graduates remain employable. The rapid evolution of AI technologies necessitates a proactive and strategic approach if we are to remain relevant.
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Atomic force microscopy(afm)
1. Atomic Force Microscopy
-
Basics and Applications
Summer School June 2006
„Complex Materials: Cooperative Projects of the
Natural, Engineering and Biosciences“
Astrid Kronenberger
School of Engineering and Science
2. Outline
• Scanning Probe Microscopy
• Atomic Force Microscopy
– General set-up & operation modes
– Sample preparation
• Applications in life science
– Imaging mode
– Force-distance mode
• Conclusion
3. Scanning Probe Microscopy
(SPM)
~1600 Light Microscope
1938: Transmission Electron Microscope
1964: Scanning Electron Microscope
1982: Scanning Tunneling Microscope
1984: Scanning Near-field
Optical Microscope
1986: Atomic Force Microscope
- magnetic force, lateral force, chemical force...
4. Scanning Probe Microscopy
• Creates images of surfaces using a probe.
• Probe is moved (scanned) over the sample.
• Sample-probe interaction is monitored as function
of location.
+ Image resolution limited by probe-sample
interaction volume - not by diffraction .
+ Interaction can modify surface - nanolithography
possible.
- Scanning technique quite slow.
- Limited maximum image size.
sample
tip
8. • Contact mode:
– tip in continuous contact with sample
– preferably used for hard samples
– imaging in air and liquid
– high resolution
detect: deflection
• Force spectroscopy mode:
– consecutive cycles of tip approach and
retract
– interaction forces between tip and sample
are recorded
F = - kspring
. Δx
Static AFM modi
http://www.jpk.com/tutorial/tutorial1.htm
9. Dynamic AFM modi
• Intermittent/tapping mode:
– oscillating cantilever, tip touching surface
gently and frequently
– often used for biological samples
– imaging in air and liquid
– good resolution
• Non contact mode:
– oscillating cantilever, tip not in contact with
sample
– used for soft samples
– imaging in vacuum
– distance range 50Å - 150Å
detect: amplitude
phase
deflection
http://www.jpk.com/tutorial/tutorial1.htm
effm
k
ω =
10. Microfabricated AFM cantilevers
standard tip
diamond tip
nanotube tip
sharpened tip
silicon nitride
cantilevers
silicon
cantilevers
spring constant:
force resolution
resonance frequency
tip radius:
lateral resolution
tip aspect ratio:
“depth" resolution
Typical cantilevers:
1µm thick, 100s µm long
kspring ~ 0.01 ... 20N/m
fres ~ 4 ... 400kHz
rtip ~ 1 ... 20nm
reflective backside coating:
- better signal
3
3
spring
l4
twE
k
⋅
⋅⋅
=
11. • Thermal noise:
Equipartition theorem
kspring = kBT
Cantilever calibration and signal-to-noise ratio
Bustamante et al., Nature Rev. Mol. Cell Biol. 2000
• Comparison:
small – large cantilever
ksmall = klarge
- thermal noise spreads over
larger frequency range
Viani et al, APL 1999
small cantilever:
- better signal-to-noise
- faster measurements
12. Imaging artefacts
• Appearance of objects
– tip radius
– aspect-ratio
– double tip
– blunt tip
• Blurred images
– contamination
– feedback adjustment
– interference
– noise
– thermal drift
– static charging
14. • Surface modification
self assembling monolayers (SAM)
– silanes on glass- and Si-surfaces
– thioles on Au-surfaces
• Tip modification
– Adsorption of molecules from solution
e.g. proteins
– Decrease AFM tip radius with
attachment of molecules or nanotubes
– Attachment of linker molecules
e.g. PEG linker for antibodies,
crosslinker for SH-, NH-groups
Surface-/ Tip-Functionalisation
H H H H H H H
SAM formation
silanes
thioles
15. Applications
Lifescience
Materials and Surface Science
Nanolithography & Nanomanipulation
Polymer film
engraving
DNA
on mica
ProteinsActin filaments Linearised DNABacteriaErythrocytes
PolymerOrganic film Transistor Ferroelectric
domains
Triblock co-
polymer film
Anodic
oxidation http://www.jpk.com/
http://www.veeco.com/nanotheatre/
http://www.ntmdt.ru/Scan-gallery/
16. Imaging of isolated molecules in air
Biomolecular structure
Supramolecular structure of
aggregation factors of marine
sponges (Microciona prolifera)
(circular proteoglycans)
MAFp3 : self-interaction between MAF
MAFp4 : binds cell surface receptors
Imaging DNA-protein complexes on
aminoterminated mica
λ-DNA restriction
enzyme complex
(Hae III restriction
endonuclease
induces bending at
GGCC)
DNA plasmids
Anselmetti et al., Single. Mol. 2000
Jarchow et al., J. Struct. Biol. 2000
17. Imaging of 2d crystals in liquid
Conformational changes
10nm
20nm
Extracellular connexon surface.
contact mode measurements in buffer
solution
Müller et al., EMBO J. 2002
Scheuring et al., Single Mol. 2001
Extracellular aquaporin surface.
contact mode measurements in buffer
solution
Change of conformation of tetramers
c) Minimal force
d) Maximal force
Without Ca2+ open
channel 1.5nm
With Ca2+ closed
channel 1.5nm
18. Imaging of cells and long term processes
Goldsbury et al., J. Mol. Biol. 1999
Time-lapse AFM for imaging growth of
amyloid fibrils (synthetic human amylin)
Measuring the heartbeat of
single cells
(chicken cardiomyocytes)
Radmacher, Uni Bremen
19. Forces in molecular biology
motor proteins
RNA polymerase
active forces
extracting
lipids
DNA B-S transition
unfolding titin
dextran
bond flip
extracting
bacteriorhodopsin
elasticities
extracting forces
typ.at 0.1 - 5 nN/sec
10
50
1
100
500
1000
pN
selectins
biotin - avidin
covalent bond
antigen -
antibody
rupture forces
unzipping DNA
GC -
AT -
optical
tweezers
20. Interpretation of force-distance curves
long range
repulsion
approach
retract
penetration
of layer
pressing
on surface
repulsive
forces
molecular
structure;
elasticity
attractive
forces
rupture
force
0
21. Rupture forces
Gaub group, Science 1994
Grubmüller et al., Science 1996
Fritz at al., J.Str.Biol. (1997)
biotin - avidin interaction
MD simulation
experimental
data
22. Molecular elasticities
Experimental data
ss DNA
entropic elasticity
spring like
Modelling data
http://en.wikipedia.org/wiki/Anaphase
Rief et al. 1999
Janshoff et al., 2000
Fuchs et al., Angw.Chem. Int.Ed. (2000)
elasticity
Persistance lengths:
ss DNA: p ~ 1nm
dS DNA: p ~ 50nm
Polypeptide: p ~0.4nm
BS transition
F ~80 pN
Force-distance curve =
fingerprint for polymers
23. Chemical reaction: A + B AB Kd =
ΔGbind = RT ln( Kd )
Connection of rupture force to
biochemical data
Schwesinger et al., PNAS 2000
Rief et al., PRL 1998
off-rate increased by force
kon
koff
koff
kon
rupture force influenced by
pulling velocity
force decreases energy
barrier for unfolding
rupture / unfolding forces
correlate with koff
25. AFM @ IUB
• Investigation of DNA - protein interaction
S. Maurer
• Investion of proteins & liposomes
A. Kronenberger
• Investigation of thin organic films
Prof. V. Wagner
• Investigation on cantilever sensor arrays
Prof. J. Fritz
20nm
26. Conclusion
AFM is a versatile tool to investigate
- topography of surfaces
- properties of surfaces
- properties of single molecules
- forces within molecules
But: always consider experimental
conditions and artefacts on measurements!