Atomic Force Microscope and its potential use in biology
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- The atomic force microscope (AFM) is a type of scanning probe microscope used to image surfaces at the nanoscale. It measures forces between a sharp probe and the sample surface. - In contact mode, the AFM tip is in contact with the sample surface and repulsive forces are measured. In tapping mode, the tip lightly taps the surface to reduce lateral forces and damage. - The AFM has many applications in biology like imaging living cells, studying protein unfolding, measuring molecular interactions like DNA binding, and more. It can be used to map molecular recognition with single molecule resolution.
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Atomic force microscopy
The document summarizes atomic force microscopy (AFM). AFM was invented in 1985 and works by scanning a probe tip across a sample surface while monitoring interatomic forces. AFM can be used to create high-resolution topographic images of samples without extensive preparation. It has advantages over other techniques as it can image samples in liquid, at varying temperatures, and allow repeated studies without damage. AFM is commonly used to image biological samples like DNA, proteins, and cells.
Atomic force microscopy
The document discusses atomic force microscopy (AFM) and its use to characterize crystalline cellulose distributions on natural and pretreated plant cell wall surfaces. AFM uses a sharp tip to scan surfaces with nanoscale resolution. The document finds that dilute acid pretreatment increases the percentage of plant cell wall surfaces covered by crystalline cellulose from 17-20% naturally to 23-38% after pretreatment. Optimized pretreatment with 0.5% sulfuric acid at 135°C resulted in 23% coverage on poplar, 28% on switchgrass, and 38% on corn stover. AFM provides detailed surface information that can improve understanding of pretreatment effects and lead to biomass processing enhancements.
Atomic Force Microscopy
Atomic force microscopy (AFM) is a type of scanning probe microscopy used to image surfaces at the nanoscale. It was developed in the 1980s by modifying the scanning tunneling microscope to be able to image non-conducting samples in various environments including air, liquid, and vacuum. An AFM works by scanning a probe with a very sharp tip over a sample surface, measuring the force between the tip and sample. This force is measured by reflecting a laser off the back of the flexible cantilever the tip is attached to. AFM can image surfaces with sub-nanometer resolution and is used in various applications including biology to image things like proteins and DNA.
Atomic Force Microscopy (AFM)
Atomic force microscopy (AFM) is a scanning probe microscopy technique capable of producing high-resolution topographical images of a sample surface. AFM works by scanning a sharp tip over a surface and measuring the force between the tip and sample using a laser beam and photodetector. This force is characterized by Hooke's law and depends on the tip deflection and spring constant. AFM can operate in contact, non-contact, or tapping mode and is used across many fields due to its ability to image both hard and soft materials with nanoscale resolution.
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The document summarizes the fundamentals of atomic force microscopy (AFM). It describes that AFM has very high resolution on the order of fractions of nanometers. It operates by measuring the force between a probe tip and the sample surface. The document outlines the basic theory of AFM, including that it consists of a cantilever with a sharp tip used to scan the sample surface. Forces between the tip and sample lead to deflection of the cantilever. It also describes the different operating modes of AFM including contact, non-contact, and tapping modes.
Atomic Force Microscopy
This document is a PowerPoint presentation about atomic force microscopy (AFM). AFM was invented in 1981 and provides very high-resolution imaging, with the ability to resolve features on the order of fractions of a nanometer. It works by scanning a sharp probe across a surface to detect interatomic forces. In contact mode, the probe is less than 0.5 nm from the surface, while in tapping mode it oscillates 0.5-2 nm above. Noncontact mode uses an oscillating probe without touching. AFM finds wide application from materials science to biology due to its ability to image nonconductive samples without coating in liquid or air.
Atomic force microscope
Atomic force microscopy (AFM) uses a sharp tip attached to a flexible cantilever to scan the surface of a sample and map its topography with nanoscale resolution. As the tip is scanned across the surface, interactions between the tip and sample cause the cantilever to deflect, and these deflections are used to construct a 3D image of the surface. AFM can operate in contact, non-contact, or tapping mode and is capable of measuring properties like roughness, elasticity, and adhesion in addition to topography. It provides magnification from 100X to over 100 million X with nanometer scale resolution and does not require complex sample preparation, making AFM a versatile high-resolution imaging tool.
Atomic force microscopy(afm)
- Atomic force microscopy (AFM) uses a cantilever with a sharp tip to scan over a sample surface and produce images of its topography. The tip is moved in the x, y, and z directions using a piezoelectric scanner. Interactions between the tip and sample are measured to create images with sub-nanometer resolution.
- AFM can operate in different modes depending on whether the tip is in contact with the surface or oscillating above it. Force-distance curves can also be collected to measure interaction forces. AFM has various applications in biology, materials science, and nanotechnology.
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Atomic Force Microscopy
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Atomic force microscopy (AFM) is a scanning probe microscopy technique capable of producing high-resolution topographical images of a sample surface. AFM works by scanning a sharp tip over a surface and measuring the force between the tip and sample using a laser beam and photodetector. This force is characterized by Hooke's law and depends on the tip deflection and spring constant. AFM can operate in contact, non-contact, or tapping mode and is used across many fields due to its ability to image both hard and soft materials with nanoscale resolution.
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The document summarizes the fundamentals of atomic force microscopy (AFM). It describes that AFM has very high resolution on the order of fractions of nanometers. It operates by measuring the force between a probe tip and the sample surface. The document outlines the basic theory of AFM, including that it consists of a cantilever with a sharp tip used to scan the sample surface. Forces between the tip and sample lead to deflection of the cantilever. It also describes the different operating modes of AFM including contact, non-contact, and tapping modes.
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Atomic force microscope
Atomic force microscopy (AFM) uses a sharp tip attached to a flexible cantilever to scan the surface of a sample and map its topography with nanoscale resolution. As the tip is scanned across the surface, interactions between the tip and sample cause the cantilever to deflect, and these deflections are used to construct a 3D image of the surface. AFM can operate in contact, non-contact, or tapping mode and is capable of measuring properties like roughness, elasticity, and adhesion in addition to topography. It provides magnification from 100X to over 100 million X with nanometer scale resolution and does not require complex sample preparation, making AFM a versatile high-resolution imaging tool.
Atomic force microscopy(afm)
- Atomic force microscopy (AFM) uses a cantilever with a sharp tip to scan over a sample surface and produce images of its topography. The tip is moved in the x, y, and z directions using a piezoelectric scanner. Interactions between the tip and sample are measured to create images with sub-nanometer resolution.
- AFM can operate in different modes depending on whether the tip is in contact with the surface or oscillating above it. Force-distance curves can also be collected to measure interaction forces. AFM has various applications in biology, materials science, and nanotechnology.
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AFM and STM (Scanning probe microscopy)
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Atomic force microscopy
Atomic force microscopy (AFM) works by scanning a probe over a sample surface to build up a topographic map with single-atom level resolution without the need for sample preparation. It was invented in 1986 by Binning and first used a cantilever with a diamond tip. The main components are a microscope stage to move the tip and sample, control electronics, and a computer. A piezoelectric transducer moves the tip while a force transducer senses the force and feedback control maintains a set force. There are different imaging modes including contact, non-contact, and tapping modes that use repulsive or attractive forces between the probe and sample. AFM can image a variety of biological and material science samples with limitations
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Atomic force microscopy (AFM) was developed in 1986 as an extension of scanning tunneling microscopy to image non-conductive surfaces. AFM uses a sharp probe at the end of a flexible cantilever to measure the tiny forces between the probe and sample surface. As the probe scans the surface, these interatomic forces cause the cantilever to deflect, and a laser detects these deflections to create a 3D topographic image of the surface with angstrom-scale resolution. AFM provides topographic and force measurements and can image surfaces in open air or liquid with minimal sample preparation. It has applications in fields including solid state physics, molecular biology, and materials science.
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Atomic force microscopy (AFM) is a type of scanning probe microscopy that uses a sharp probe to scan over a sample surface. It operates by measuring the forces between the probe and sample using a laser beam and photodetector to measure the probe's deflection. There are three main imaging modes: contact mode, non-contact mode, and tapping mode. AFM provides topographic, mechanical, and other property information with nanoscale resolution and is widely used in materials science and biology.
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- Atomic force microscopy (AFM) uses a sharp tip to scan over a sample surface and measure forces between the tip and sample. Gerd Binning invented the AFM in 1986.
- There are three main imaging modes: contact mode, tapping mode, and non-contact mode. Non-contact mode operates with the tip oscillating above the surface without touching.
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ATOMIC FORCE MICROSCOPE MITHILESH CHOUDHARY
Atomic Force Microscopy is an instrument that gives a complete informatition about topology of specimen.
AFM and STM (Scanning probe microscopy)
Scanning Probe microscopy (AFM and STM) head point
AFM: Configuration of AFM
Parts of AFM system and Principle of AFM
Three Modes of AFM
AFM Instrument
Advantage and disadvantage
STM
Schematic Diagram
AFM and STM
https://www.linkedin.com/in/preeti-choudhary-266414182/
https://www.instagram.com/chaudharypreeti1997/
https://www.facebook.com/profile.php?id=100013419194533
https://twitter.com/preetic27018281
Please like, share, comment and follow.
stay connected
If any query then contact:
chaudharypreeti1997@gmail.com
Thanking-You
Preeti Choudhary
Atomic force microscopy
Atomic force microscopy (AFM) works by scanning a probe over a sample surface to build up a topographic map with single-atom level resolution without the need for sample preparation. It was invented in 1986 by Binning and first used a cantilever with a diamond tip. The main components are a microscope stage to move the tip and sample, control electronics, and a computer. A piezoelectric transducer moves the tip while a force transducer senses the force and feedback control maintains a set force. There are different imaging modes including contact, non-contact, and tapping modes that use repulsive or attractive forces between the probe and sample. AFM can image a variety of biological and material science samples with limitations
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Atomic force microscopy (AFM) is a technique used to image surfaces at the nanoscale. The document outlines the history, components, operating modes, applications, and limitations of AFM. It discusses how AFM works by scanning a sample with a sharp tip attached to a flexible cantilever, measuring deflections to construct 3D surface images. Three common modes are contact, non-contact, and tapping mode. AFM can image a variety of materials and is useful for measuring surface roughness, adhesion, and other nanoscale properties. While resolution is limited by tip size, continued improvements aim to develop sharper tips and less damaging probes.
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AFM (Atomic Force Microscopy)
Atomic force microscopy (AFM) was developed in 1986 as an extension of scanning tunneling microscopy to image non-conductive surfaces. AFM uses a sharp probe at the end of a flexible cantilever to measure the tiny forces between the probe and sample surface. As the probe scans the surface, these interatomic forces cause the cantilever to deflect, and a laser detects these deflections to create a 3D topographic image of the surface with angstrom-scale resolution. AFM provides topographic and force measurements and can image surfaces in open air or liquid with minimal sample preparation. It has applications in fields including solid state physics, molecular biology, and materials science.
Atomic force microscopy
Atomic force microscopy (AFM) is a type of scanning probe microscopy that uses a sharp probe to scan over a sample surface. It operates by measuring the forces between the probe and sample using a laser beam and photodetector to measure the probe's deflection. There are three main imaging modes: contact mode, non-contact mode, and tapping mode. AFM provides topographic, mechanical, and other property information with nanoscale resolution and is widely used in materials science and biology.
Non contact mode (AFM)
- Atomic force microscopy (AFM) uses a sharp tip to scan over a sample surface and measure forces between the tip and sample. Gerd Binning invented the AFM in 1986.
- There are three main imaging modes: contact mode, tapping mode, and non-contact mode. Non-contact mode operates with the tip oscillating above the surface without touching.
- Advantages of non-contact AFM include that it exerts low forces and avoids damaging soft samples or contaminating the tip. Disadvantages include lower resolution and slower scanning speeds. Applications include analyzing surface roughness, thin film growth, and material properties like stiffness.
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Scanning tunneling microscopy (STM) is a technique used to image surfaces at the atomic level. It was developed in 1981 by Gerd Binnig and Heinrich Rohrer at IBM, based on the concept of quantum tunneling. The STM works by using a scanning tip, typically made of tungsten, which is brought very close to the sample surface. A bias is applied between the tip and sample, allowing electrons to tunnel through the vacuum gap. The tunneling current depends on factors like the voltage and position of the tip relative to the sample, enabling atomic resolution images to be produced. Piezoelectric materials are crucial for providing precise movement of the tip in the angstrom scale needed. STM opened
Stm
This document discusses the scanning tunneling microscope (STM). It begins by introducing STM and its ability to image surfaces with atomic resolution. It then explains the principle of STM, which uses a voltage applied between a metal tip and sample surface to create a tunneling current that is exponentially dependent on tip-sample separation. The document outlines the tip positioning system, describes the constant current and variable current imaging modes, and notes STM's advantages of high resolution and ability to study various environments and its disadvantage of requiring precise tip positioning and stable/clean surfaces.
Scanning electron microscopy
The document discusses the scanning electron microscope (SEM). The SEM uses a focused beam of electrons to scan the surface of a sample and produce images with high magnification and resolution. It has several advantages over optical microscopes, including higher magnification, greater depth of field, and the ability to provide 3D images and determine sample composition. The SEM has many applications in science and industry such as structural analysis, measurements, and failure inspection. It provides valuable but has some limitations like requiring solid samples and being costly.
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This document provides information about a scanning tunneling microscope (STM) including its basic operating principles, design, modes of operation, applications, and related imaging techniques. The STM works by using the quantum tunneling effect to measure electric currents between a sharp tip and conductive sample surface. This allows it to image surfaces at the atomic level with high resolution. The document outlines the key components of an STM including the sample, scanning tip, piezoelectric scanner, and control electronics. It also describes the two main imaging modes of constant current and constant height. Common applications and examples of STM images showing atomic structures are also presented. Finally, related microscopy techniques developed from STM principles are briefly discussed.
AFM.ppt
Atomic force microscopy (AFM) is a very high-resolution type of scanning probe microscopy that can image surfaces at the atomic scale. An AFM works by scanning a probe with a very sharp tip over a sample surface, measuring the forces between the tip and surface. There are three main imaging modes: contact mode, non-contact mode, and tapping mode. AFMs can be used to image topography, measure forces, and manipulate samples at the nanoscale. While providing atomic resolution, AFM also has limitations such as limited range and data dependence on the tip. Future improvements may enable even sharper tips and atomic resolution of living systems.
SCANNING PROBE MICROSCOPY .
Scanning probe microscopy (SPM) uses a probe that interacts with the sample surface without lenses to resolve images. The first SPM was invented in 1981 by Binning and Roher, winning them the Nobel Prize. For SPM techniques like STM and AFM to provide atomic-level surface structure information, the tip-sample position must be controlled within 0.1 Angstroms and the tip must be very sharp. STM uses tunneling current between a biased tip and conducting sample, while AFM measures cantilever deflection from tip-surface interactions to map topography. SPM provides higher resolution than diffraction-limited techniques and can image insulators and conductors.
Transmission electron microscope
Transmission electron microscopy provides high resolution images of ultrastructures down to the nanometer scale. Specimen preparation for TEM involves fixation, dehydration, embedding, sectioning, and staining. The document outlines the principles and instrumentation of TEM, including the electron source, lenses, detectors, vacuum system, and electrical system. TEM is useful for medical and biological research applications such as virus identification, vaccine development, and disease surveillance.
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Secondary ion mass spectrometry (SIMS) is an analytical technique that bombards a sample surface with a primary ion beam, causing charged secondary ions to emit. These secondary ions are then analyzed using mass spectrometry to determine their mass-to-charge ratios. SIMS has high sensitivity and can detect elements down to parts-per-million or parts-per-billion levels. It provides both elemental and molecular composition of solid surfaces with good depth resolution and lateral resolution in the 2-5 nm and 20 nm to 1 μm range, respectively. SIMS finds applications in composition analysis, depth profiling, trace detection in semiconductors, and imaging of surfaces.
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This document provides an overview of syntax and generative grammar. It defines syntax as the way words are arranged to show relationships of meaning within and between sentences. Grammar is defined as the art of writing, but is now used to study language. Generative grammar uses formal rules to generate an infinite set of grammatical sentences. It distinguishes between deep structure and surface structure. Tree diagrams are used to represent syntactic structures with symbols like S, NP, VP. Phrase structure rules, lexical rules, and movement rules are components of generative grammar. Complement phrases and recursion allow sentences to be embedded within other sentences.
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Chemistry - Chp 4 - Atomic Structure - PowerPoint
This document summarizes key concepts from Chapter 4 on atomic structure:
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2) It outlines the discovery of subatomic particles like electrons, protons, and neutrons through experiments by Thomson, Rutherford, and Chadwick.
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AFM talk ASAS 10dec2015 Jenny to publish.pptx
AFM was invented in 1986 by Binning and colleagues and belongs to the scanning probe microscopy family. It uses a sharp tip on a flexible cantilever to scan a sample surface at an atomic scale resolution and detect short-range forces between the tip and sample. AFM can operate in various modes including contact, tapping, and dynamic contact modes and is capable of imaging in air, liquid, and other environments.
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The document discusses the principles, instrumentation, and applications of atomic force microscopy (AFM). It was invented in the 1980s to overcome limitations of scanning tunneling microscopy. AFM uses a sharp tip to scan over a sample surface, detecting interatomic forces to generate topological images with atomic resolution without needing lenses or light. The key components are a cantilever with a tip, piezoelectric scanners, and a laser and photodetector that together detect tip deflection. AFM can operate in contact, non-contact, or tapping modes and is used in fields like materials science, biology, and nanotechnology due to its ability to image a wide range of surfaces.
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Microbial interaction may be positive such as mutualism, proto-cooperation, commensalism or may be negative such as parasitism, predation or competition
Types of microbial interaction
Positive interaction: mutualism, proto-cooperation, commensalism
Negative interaction: Ammensalism (antagonism), parasitism, predation, competition
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Compound A
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Compound B
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6:个人职称评审加20分
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Atomic Force Microscope and its potential use in biology
- 1. - Sudhir K Shukla Journal club presentation Atomic Force Microscope and its potential use in biology
- 2. Scanning Probe Microscopy STM: scanning tunneling microscope tunneling of electrons between probe and surface AFM: atomic force microscope measuring of the force on the probe tip OFM: Optical force microscope measuring of the force on the optically trapped particle MFM: magnetic force microscope AFM with magnetical probe y x
- 3. STM: scanning tunneling microscope nA R piezo- element e- e- e- e- e- e- e- e- e- < 1nm tunneling of electrons through air between probe and surface only conducting material probe x-y stage
- 4. STM: scanning tunneling microscope Icontrol piezo-element (changes length at different voltages) nA Itip ∆I R ∆I -> ∆V transfer
- 5. Challenges of the STM 1. Works primarily with conducting materials 2. Vibrational interference 3. Contamination •Physical (dust and other pollutants in the air) •Chemical (chemical reactivity)
- 6. AFM: Atomic Force Microscope • The AFM brings a probe in close proximity to the surface • The force is detected by the deflection of a spring, usually a cantilever (diving board) • Forces between the probe tip and the sample are sensed to control the distance between the the tip and the sample. van der Waals force curve
- 7. AFM probe scans over the surface e.g. living cells, chromatin fibers laser photodiode piezo-element probe AFM: how it works feedback
- 8. AFM: how it works cantilever tip laser cantilever piezo y z x photodiode
- 9. Scanning the Sample Tip brought within nanometers of the sample (van der Waals) Radius of tip limits the accuracy of analysis/ resolution Stiffer cantilevers protect against sample damage because they deflect less in response to a small force
- 10. Scanning Modes 1. Contact (Repulsive force) At short probe-sample distances, the forces are repulsive 2. non-contact (Attractive Force ) • At large probe-sample distances, the forces are attractive • The AFM cantilever can be used to measure both attractive force mode and repulsive forces. 3. Tapping mode (vibrating mode) • Better resolution • Minimal damage to sample van der Waals force curve
- 11. 1. Contact Mode Contact mode operates in the repulsive regime of the van der Waals curve Tip attached to cantilever with low spring constant (lower than effective spring constant binding the atoms of the sample together). In ambient conditions there is also a capillary force exerted by the thin water layer present (2-50 nm thick). van der Waals force curve
- 12. 2. Non-Contact Mode Uses attractive forces to interact surface with tip Operates within the van der Waal radii of the atoms Oscillates cantilever near its resonant frequency (~ 200 kHz) to improve sensitivity Advantages over contact: no lateral forces, non- destructive/no contamination to sample, etc. van der Waals force curve
- 13. 3. Tapping mode Change in amplitude measured Change in phase measured
- 14. Biological Applications 1. Study Unfolding Of Proteins 2. Imagining Of Biomolecules 3. Force Measurements In Real Solvent Environments 4. Antibody-Antigen Binding Studies 5. Ligand-Receptor Binding Studies 6. Binding Forces Of Complimentary DNA Strands 7. Study Surface Frictional Forces 8. Ion Channel Localization
- 15. path of AFM tip AFM tip superhelical DNA plasmid DNA double helix Mg2+ negatively charged mica surface Mg2+ Mg2+Mg2+ Mg2+Mg2+ movement of the AFM tip along the sample
- 16. AFM image of a 6.8 kb superhelical plasmid AFM tip
- 17. Molecular Force Probe •Functionalizing Cantilevers as a live biological substrate • Receptor binding in native environment can be observed Tkk xr x Tk f Boff fB m 0 ln Panorchan, P. et al. Journal of Cell Science, 119. 2006
- 18. Functionalization of AFM Tip
- 19. Imaging live cells: from structure to function
- 20. Single molecule imaging Molecular recognition maps demonstrating that clustering of the yeast sensor Wsc1 (green) is strongly enhanced by hypoosmotic shock Buffered solution Deionized water
- 21. Single molecule imaging Molecular recognition maps documenting the distribution of single Als5p adhesins (red) on a single yeast cell.
- 22. Unfolding studies of spectrin C-terminal Helix C N-terminal Helix B Helix A molecule that contributes to the mechanical properties, especially the elasticity of the cells measurement of its mechanical stability provides information about the physiological function
- 23. Stretching spectrin with an AFM distance force 1 2 3 surface cantilever tip 4 repeated spectrin domain 1. adhesion force between cantilever tip and surface 2. dissociation from the folded state to the intermediate unfolded state 3. dissociation from the intermediate to the total unfolding state
- 24. 0.15 100 30 40 0.05 20 50 0.10 0.20 0.00 unfolding force (pN) probability stretching spectrin with an AFMforce(pN) 0 20 40 60 80 0 40 20 60 80 100 distance (nm) -20
- 25. MFM: magnetic force microscope AFM with magnetic probe e.g. hard disc, tape magnetic tip laser photodiode piezo-element
- 26. Thanks