Transmission Electron Microscopy (TEM) utilizes a high-energy electron beam to produce detailed images of specimen morphology, composition, and crystallography with resolutions down to 0.2 nm. It operates mainly in two modes: diffraction mode, which helps identify crystalline structures, and image mode, which focuses on producing images. While TEM offers high resolution and detailed information, it requires less sample material, operates under high vacuum, is costly, and demands meticulous sample preparation.