This document provides an introduction to various types of microscopy used in nanotechnology. It explains that light microscopes have resolution limitations and then describes scanning electron microscopes which use electron beams rather than light to achieve higher resolution down to 1nm. Atomic force microscopes are also discussed, which use a physical probe to scan samples with nanoscale resolution. Finally, 3D optical profilers are introduced, which use light waves to generate 3D renderings of micrometer-scale surface topography. Overall, the document outlines different microscopy techniques and their applications from the micrometer to nanometer scale.