This document provides an overview of scanning electron microscopy (SEM). It discusses how SEM works by using a beam of electrons to examine objects at a very fine scale, with greater resolving power than light microscopes. The first SEM debuted in 1938. SEM can provide information about a sample's topography, morphology, composition, and crystal structure. Diagrams show the major components of an SEM, including the electron gun and various detectors. Imaging modes like secondary electron and backscattered electron are described. Applications and limitations of SEM are also summarized.
Transmission electron microscope, high resolution tem and selected area elect...Nano Encryption
The transmission electron microscope is a very powerful tool for material science. A high energy beam of electrons is shone through a very thin sample, and the interactions between the electrons and the atoms can be used to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. Chemical analysis can also be performed. TEM can be used to study the growth of layers, their composition and defects in semiconductors. High resolution can be used to analyze the quality, shape, size and density of quantum wells, wires and dots.
Transmission electron microscope, high resolution tem and selected area elect...Nano Encryption
The transmission electron microscope is a very powerful tool for material science. A high energy beam of electrons is shone through a very thin sample, and the interactions between the electrons and the atoms can be used to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. Chemical analysis can also be performed. TEM can be used to study the growth of layers, their composition and defects in semiconductors. High resolution can be used to analyze the quality, shape, size and density of quantum wells, wires and dots.
The transmission electron microscope is a very powerful tool for material science. A high energy beam of electrons is shone through a very thin sample, and the interactions between the electrons and the atoms can be used to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. Chemical analysis can also be performed. TEM can be used to study the growth of layers, their composition and defects in semiconductors. High resolution can be used to analyze the quality, shape, size and density of quantum wells, wires and dots.
The transmission electron microscope is a very powerful tool for material science. A high energy beam of electrons is shone through a very thin sample, and the interactions between the electrons and the atoms can be used to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. Chemical analysis can also be performed. TEM can be used to study the growth of layers, their composition and defects in semiconductors. High resolution can be used to analyze the quality, shape, size and density of quantum wells, wires and dots.
Electron Microscopy - Scanning electron microscope, Transmission Electron Mic...Sumer Pankaj
An electron microscope is a microscope that uses a beam of accelerated electrons as a source of illumination. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light photons, electron microscopes have a higher resolving power than light microscopes and can reveal the structure of smaller objects. A transmission electron microscope can achieve better than 50 pm resolution and magnifications of up to about 10,000,000x whereas most light microscopes are limited by diffraction to about 200 nm resolution and useful magnifications below 2000x.
Electron microscopes are used to investigate the ultrastructure of a wide range of biological and inorganic specimens including microorganisms, cells, large molecules, biopsy samples, metals, and crystals. Industrially, electron microscopes are often used for quality control and failure analysis. Modern electron microscopes produce electron micrographs using specialized digital cameras and frame grabbers to capture the image.
THIS IS A PRESENTATION ON TRANSMISSION ELECTRON MICROSCOPY .(APART FROM DIFFERENT BOOKS,I HAVE ALSO TAKEN INFORMATION FROM DIFFERENT WEBSITES & PRESENTATIONS AVAILABLE IN NET ..
The microscope has evolved a lot from the time of Leeuwenhoek. This presentation gives a brief overview about the types of microscope their principle of function and application.
Electron microscopy (EM) is a technique for obtaining high resolution images of biological and non-biological specimens. It is used in biomedical research to investigate the detailed structure of tissues, cells, organelles and macromolecular complexes
A scanning electron microscope is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition.
SEMs can magnify an object from about 10 times up to 300,000 times. A scale bar is often provided on an SEM image. From this the actual size of structures in the image can be calculated.
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.
Transmission Electron Microscope (TEM), RESOLVING POWER, Scanning Electron Microscope, PRINCIPLE AND WORKING OF SEM, SEM SAMPLE PREPARATION, Limitations of Scanning Electron Microscopy (SEM), ADVANTAGES & DISADVANTAGES OF SEM, APPLICATIONS OF SEM, PRINCIPLE, AND WORKING OF TEM, SAMPLE PREPARATION FOR TEM, ADVANTAGES & DISADVANTAGES OF TEM, APPLICATIONS OF TEM, Differences between SEM and TEM.
Slack (or Teams) Automation for Bonterra Impact Management (fka Social Soluti...Jeffrey Haguewood
Sidekick Solutions uses Bonterra Impact Management (fka Social Solutions Apricot) and automation solutions to integrate data for business workflows.
We believe integration and automation are essential to user experience and the promise of efficient work through technology. Automation is the critical ingredient to realizing that full vision. We develop integration products and services for Bonterra Case Management software to support the deployment of automations for a variety of use cases.
This video focuses on the notifications, alerts, and approval requests using Slack for Bonterra Impact Management. The solutions covered in this webinar can also be deployed for Microsoft Teams.
Interested in deploying notification automations for Bonterra Impact Management? Contact us at sales@sidekicksolutionsllc.com to discuss next steps.
GDG Cloud Southlake #33: Boule & Rebala: Effective AppSec in SDLC using Deplo...James Anderson
Effective Application Security in Software Delivery lifecycle using Deployment Firewall and DBOM
The modern software delivery process (or the CI/CD process) includes many tools, distributed teams, open-source code, and cloud platforms. Constant focus on speed to release software to market, along with the traditional slow and manual security checks has caused gaps in continuous security as an important piece in the software supply chain. Today organizations feel more susceptible to external and internal cyber threats due to the vast attack surface in their applications supply chain and the lack of end-to-end governance and risk management.
The software team must secure its software delivery process to avoid vulnerability and security breaches. This needs to be achieved with existing tool chains and without extensive rework of the delivery processes. This talk will present strategies and techniques for providing visibility into the true risk of the existing vulnerabilities, preventing the introduction of security issues in the software, resolving vulnerabilities in production environments quickly, and capturing the deployment bill of materials (DBOM).
Speakers:
Bob Boule
Robert Boule is a technology enthusiast with PASSION for technology and making things work along with a knack for helping others understand how things work. He comes with around 20 years of solution engineering experience in application security, software continuous delivery, and SaaS platforms. He is known for his dynamic presentations in CI/CD and application security integrated in software delivery lifecycle.
Gopinath Rebala
Gopinath Rebala is the CTO of OpsMx, where he has overall responsibility for the machine learning and data processing architectures for Secure Software Delivery. Gopi also has a strong connection with our customers, leading design and architecture for strategic implementations. Gopi is a frequent speaker and well-known leader in continuous delivery and integrating security into software delivery.
Transcript: Selling digital books in 2024: Insights from industry leaders - T...BookNet Canada
The publishing industry has been selling digital audiobooks and ebooks for over a decade and has found its groove. What’s changed? What has stayed the same? Where do we go from here? Join a group of leading sales peers from across the industry for a conversation about the lessons learned since the popularization of digital books, best practices, digital book supply chain management, and more.
Link to video recording: https://bnctechforum.ca/sessions/selling-digital-books-in-2024-insights-from-industry-leaders/
Presented by BookNet Canada on May 28, 2024, with support from the Department of Canadian Heritage.
Kubernetes & AI - Beauty and the Beast !?! @KCD Istanbul 2024Tobias Schneck
As AI technology is pushing into IT I was wondering myself, as an “infrastructure container kubernetes guy”, how get this fancy AI technology get managed from an infrastructure operational view? Is it possible to apply our lovely cloud native principals as well? What benefit’s both technologies could bring to each other?
Let me take this questions and provide you a short journey through existing deployment models and use cases for AI software. On practical examples, we discuss what cloud/on-premise strategy we may need for applying it to our own infrastructure to get it to work from an enterprise perspective. I want to give an overview about infrastructure requirements and technologies, what could be beneficial or limiting your AI use cases in an enterprise environment. An interactive Demo will give you some insides, what approaches I got already working for real.
State of ICS and IoT Cyber Threat Landscape Report 2024 previewPrayukth K V
The IoT and OT threat landscape report has been prepared by the Threat Research Team at Sectrio using data from Sectrio, cyber threat intelligence farming facilities spread across over 85 cities around the world. In addition, Sectrio also runs AI-based advanced threat and payload engagement facilities that serve as sinks to attract and engage sophisticated threat actors, and newer malware including new variants and latent threats that are at an earlier stage of development.
The latest edition of the OT/ICS and IoT security Threat Landscape Report 2024 also covers:
State of global ICS asset and network exposure
Sectoral targets and attacks as well as the cost of ransom
Global APT activity, AI usage, actor and tactic profiles, and implications
Rise in volumes of AI-powered cyberattacks
Major cyber events in 2024
Malware and malicious payload trends
Cyberattack types and targets
Vulnerability exploit attempts on CVEs
Attacks on counties – USA
Expansion of bot farms – how, where, and why
In-depth analysis of the cyber threat landscape across North America, South America, Europe, APAC, and the Middle East
Why are attacks on smart factories rising?
Cyber risk predictions
Axis of attacks – Europe
Systemic attacks in the Middle East
Download the full report from here:
https://sectrio.com/resources/ot-threat-landscape-reports/sectrio-releases-ot-ics-and-iot-security-threat-landscape-report-2024/
"Impact of front-end architecture on development cost", Viktor TurskyiFwdays
I have heard many times that architecture is not important for the front-end. Also, many times I have seen how developers implement features on the front-end just following the standard rules for a framework and think that this is enough to successfully launch the project, and then the project fails. How to prevent this and what approach to choose? I have launched dozens of complex projects and during the talk we will analyze which approaches have worked for me and which have not.
Epistemic Interaction - tuning interfaces to provide information for AI supportAlan Dix
Paper presented at SYNERGY workshop at AVI 2024, Genoa, Italy. 3rd June 2024
https://alandix.com/academic/papers/synergy2024-epistemic/
As machine learning integrates deeper into human-computer interactions, the concept of epistemic interaction emerges, aiming to refine these interactions to enhance system adaptability. This approach encourages minor, intentional adjustments in user behaviour to enrich the data available for system learning. This paper introduces epistemic interaction within the context of human-system communication, illustrating how deliberate interaction design can improve system understanding and adaptation. Through concrete examples, we demonstrate the potential of epistemic interaction to significantly advance human-computer interaction by leveraging intuitive human communication strategies to inform system design and functionality, offering a novel pathway for enriching user-system engagements.
Builder.ai Founder Sachin Dev Duggal's Strategic Approach to Create an Innova...Ramesh Iyer
In today's fast-changing business world, Companies that adapt and embrace new ideas often need help to keep up with the competition. However, fostering a culture of innovation takes much work. It takes vision, leadership and willingness to take risks in the right proportion. Sachin Dev Duggal, co-founder of Builder.ai, has perfected the art of this balance, creating a company culture where creativity and growth are nurtured at each stage.
Let's dive deeper into the world of ODC! Ricardo Alves (OutSystems) will join us to tell all about the new Data Fabric. After that, Sezen de Bruijn (OutSystems) will get into the details on how to best design a sturdy architecture within ODC.
Software Delivery At the Speed of AI: Inflectra Invests In AI-Powered QualityInflectra
In this insightful webinar, Inflectra explores how artificial intelligence (AI) is transforming software development and testing. Discover how AI-powered tools are revolutionizing every stage of the software development lifecycle (SDLC), from design and prototyping to testing, deployment, and monitoring.
Learn about:
• The Future of Testing: How AI is shifting testing towards verification, analysis, and higher-level skills, while reducing repetitive tasks.
• Test Automation: How AI-powered test case generation, optimization, and self-healing tests are making testing more efficient and effective.
• Visual Testing: Explore the emerging capabilities of AI in visual testing and how it's set to revolutionize UI verification.
• Inflectra's AI Solutions: See demonstrations of Inflectra's cutting-edge AI tools like the ChatGPT plugin and Azure Open AI platform, designed to streamline your testing process.
Whether you're a developer, tester, or QA professional, this webinar will give you valuable insights into how AI is shaping the future of software delivery.
UiPath Test Automation using UiPath Test Suite series, part 4DianaGray10
Welcome to UiPath Test Automation using UiPath Test Suite series part 4. In this session, we will cover Test Manager overview along with SAP heatmap.
The UiPath Test Manager overview with SAP heatmap webinar offers a concise yet comprehensive exploration of the role of a Test Manager within SAP environments, coupled with the utilization of heatmaps for effective testing strategies.
Participants will gain insights into the responsibilities, challenges, and best practices associated with test management in SAP projects. Additionally, the webinar delves into the significance of heatmaps as a visual aid for identifying testing priorities, areas of risk, and resource allocation within SAP landscapes. Through this session, attendees can expect to enhance their understanding of test management principles while learning practical approaches to optimize testing processes in SAP environments using heatmap visualization techniques
What will you get from this session?
1. Insights into SAP testing best practices
2. Heatmap utilization for testing
3. Optimization of testing processes
4. Demo
Topics covered:
Execution from the test manager
Orchestrator execution result
Defect reporting
SAP heatmap example with demo
Speaker:
Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP
2. Introduction
Electron microscopes are scientific instruments that use
a beam of energetic electrons to examine objects on a very
fine scale.
Electron microscopes were developed due to the
limitations of Light Microscopes which are limited by the
physics of light.
In the early 1930's this theoretical limit had been reached
and there was a scientific desire to see the fine details of
the interior structures of organic cells (nucleus,
mitochondria...etc.).
This required 10,000x plus magnification which was not
possible using optical microscopes.
3. The first scanning electron microscope (SEM)
debuted in 1938 ( Von Ardenne) with the first
commercial instruments around 1965. Its late
development was due to the electronics involved in
"scanning" the beam of electrons across the
sample.
4. An electron microscope is a type of microscope that uses a
beam of electrons to illuminate the specimen and produce a
magnified image. Electron microscopes (EM) have a
greater resolving power than a light-powered optical
microscope, because electrons have wavelengths about
100,000
times
shorter
than
visible
light
(photons),
and magnifications of up to about
10,000,000x, whereas ordinary, light microscopes are limited
by diffraction to about 200 nm resolution and useful
magnifications below 2000x.
5. TEM
The original form of electron microscope, the transmission
electron microscope (TEM) uses a high voltage electron beam to
create an image. The electrons are emitted by an electron gun
and transmitted through the specimen that is in part transparent
to electrons and in part scatters them out of the beam.
When it emerges from the specimen, the electron beam carries
information about the structure of the specimen that is magnified
by the objective lens system of the microscope.
The spatial variation in this information (the "image") may be
viewed by projecting the magnified electron image onto a
fluorescent
viewing
screen
coated
with
a phosphor or scintillator material such as zinc sulfide.
Image can be photographically recorded by exposing
a photographic film or plate directly to the electron beam, or a
high-resolution phosphor may be coupled by means of a lens
optical system or a fibre optic light-guide to the sensor of a CCD
(charge-coupled device) camera. The image detected by the CCD
may be displayed on a monitor or computer.
6.
7. Characteristic Information:
SEM
Topography:
The surface features of an object or "how it looks", its texture;
direct relation between these features and materials properties
Morphology:
The shape and size of the particles making up the object; direct
relation between these structures and materials properties
Composition:
The elements and compounds that the object is composed of
and the relative amounts of them; direct relationship between
composition and materials properties
Crystallographic Information:
How the atoms are arranged in the object; direct relation between these
arrangements and material properties.
11. A scanning electron microscope (SEM) is a
type of electron microscope that images a sample
by scanning it with a high-energy beam
of electrons in araster scan pattern. The electrons
interact with the atoms that make up the sample
producing signals that contain information about
the sample's
surfacetopography, composition, and other
properties such as electrical conductivity.
12. Specimen and Electron Detector Geometries:
-position of detectors is a function of relative
energies of the electrons
15. SEM Imaging Modes
Secondary Electron
Generation
-SEM-SE
-sample electrons ejected by the
primary beam [green line]
-low energy
-surface detail & topography
16. X ray is produced when outer shell electron
falls in to replace inner shell electron
17.
18. WORKING OF SPUTTER COATER
Switch power on with main switch.
Flush working chamber several time with argon gas.
Set sputter time with timer digit switch.
Press start button to activate sputter process.
Adjust appropriate gas pressure with argon valve.
Set sputter current with current potentiometer.
Process stops when selected sputter time elapses.
To interrupt running sputter process press stop button.
Switch power off/working chamber will be vented.
21. What happens when the Electron Beam hits the sample
When the electron is bombarded by the electron beam on the
specimen , electrons are ejected from the atoms of the specimen
surface.
Inelastic scattering, place the atom in the excited state. The atom
“wants ” to return to a ground or unexcited state. Hence the atoms
will relax giving off the excess energy.
X-rays, Cathodoluminescence and Auger electrons are the three
ways of relaxation.
A resulting electron vacancy is filled by an electron from a higher
shell, and an X-ray is emitted to balance the energy difference
between the two electrons.
22.
23.
24. Limitations of Scanning Electron Microscopy (SEM)
Samples must be solid and they must fit into the microscope chamber.
Maximum size in horizontal dimensions is usually on the order of 10
cm, vertical dimensions should not exceed 40 mm.
For most instruments samples must be stable in vacuum . Samples likely
to outgas at low pressures (rocks saturated with hydrocarbons, "wet"
samples such as coal, organic materials or swelling clays, and samples
likely to depreciate at low pressure) are unsuitable for examination in
conventional SEM's.
SEM's cannot detect very light elements (H, He, and Li), and many
instruments cannot detect elements with atomic numbers less than 11.
An electrically conductive coating must be applied to electrically
insulating samples for study in conventional SEM's, unless the
instrument is capable of operation in a low vacuum mode.
25.
26. Advantages of Using SEM
The SEM has a large depth of field, which allows a large amount of
the sample to be in focus at one time and produces an image that is a
good representation of the three-dimensional sample.
The combination of higher magnification, larger depth of
field, greater resolution, compositional and crystallographic
information makes the SEM one of the most heavily used instruments
in academic/national lab research areas and industry.