Scanning electron microscopy
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Dr. S. H. Burungale's document discusses scanning electron microscopy. It notes that Ernst Ruska won the Nobel Prize in Physics in 1986 for his work developing the first electron microscope. The document compares light microscopes and electron microscopes, noting that electron microscopes have much higher magnifications and resolving power but are more expensive. It explains that electron microscopes work by generating a beam of electrons that is accelerated, focused by electromagnetic lenses, and scanned across a specimen, with secondary electrons from the specimen detected to form an image.
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Atomic Force Microscopy is an instrument that gives a complete informatition about topology of specimen.
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Scanning electron microscopy
- 1. Scanning Electron microscopy Dr. S. H. Burungale Department of chemistry Yashwantrao Chavan College of Science, Karad
- 2. Ernst August Friedrich Ruska (25 December 1906 – 27 May 1988) was a German physicist who won Nobel prize in Physics in 1986 for his work in electron optics, including the design of the first electron microscope
- 3. Difference Between Light Microscope and electron Microscope Light Microscope Electron Microscope Source Light electron Magnificati on magnification of around 1000X with resolving power of 0.2um magnification of 10,00,000X and resolving power up to 0.5nm. Lenses In Light Microscope projection screen and glass lenses are used fluorescent screen and an Electromagnetic screen is used. Samples Living and natural color of the specimen is obtained dead(fixed), black and white but 3D images are obtained. Cost less expensive and easily available expensive and not easy to handle. Voltage there is no such requirement. high voltage which is around 50,000
- 5. Principle: A Beam of electrons is generated by suitable source like Tungsten filament gun and field emission gun . The electron beam is accelerated through a high voltage 20kv and pass through a system of objective aperture, electromagnetic lenses to produce a thin beam of electrons. The thin beam of electrons scan the surface of the specimen , the emitted electrons is detected by suitable detector.
- 8. Electron Source Anode Magnetic Lens Scan Coils Objective Lens specimen Secondary electron
- 23. Thank you