The document discusses electron microscopy. It describes how the transmission electron microscope (TEM) and scanning electron microscope (SEM) work. The TEM uses electrons to image the interior of thin samples with very high resolution. It was the first type of electron microscope developed in 1932. The SEM images sample surfaces and was developed later, in the 1930s. Both require samples to be viewed in a vacuum and use electromagnetic lenses to focus electron beams. The TEM provides higher magnification and resolution than light microscopes, allowing visualization of structures as small as atoms.