The document provides an overview of scanning electron microscopes (SEMs), including their history, key parts, working principle, applications, and sample preparation process. Some key points:
- SEMs use a beam of electrons to produce high-resolution images of sample surfaces, allowing examination of microscopic structural features. They have greater depth of field than light microscopes.
- Early development began in the 1930s. Commercial instruments became available in the 1960s. Continued improvements have increased resolution to the atomic scale.
- Key components include an electron gun, electromagnetic lenses, vacuum system, specimen stage, and detectors. Secondary electrons emitted from the sample are used to form images.
- Applications span biology, materials