This document provides an overview of fiber characterization using scanning electron microscopy (SEM). It outlines the components and working principles of SEM, including the electron gun, electromagnetic lenses, scanning coils, sample chamber, detectors, and vacuum chamber. It describes the signals generated from samples, including secondary electrons, backscattered electrons, and X-rays. The document discusses SEM resolution and sample preparation. It highlights salient features of SEM such as high resolution, 3D imaging capability, and compatibility with digital technologies. Finally, it demonstrates SEM characterization of wool, cotton, and polyester fibers through longitudinal and cross-sectional views.
The transmission electron microscope is a very powerful tool for material science. A high energy beam of electrons is shone through a very thin sample, and the interactions between the electrons and the atoms can be used to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. Chemical analysis can also be performed. TEM can be used to study the growth of layers, their composition and defects in semiconductors. High resolution can be used to analyze the quality, shape, size and density of quantum wells, wires and dots.
The transmission electron microscope is a very powerful tool for material science. A high energy beam of electrons is shone through a very thin sample, and the interactions between the electrons and the atoms can be used to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. Chemical analysis can also be performed. TEM can be used to study the growth of layers, their composition and defects in semiconductors. High resolution can be used to analyze the quality, shape, size and density of quantum wells, wires and dots.
The transmission electron microscope is a very powerful tool for material science. A high energy beam of electrons is shone through a very thin sample, and the interactions between the electrons and the atoms can be used to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. Chemical analysis can also be performed. TEM can be used to study the growth of layers, their composition and defects in semiconductors. High resolution can be used to analyze the quality, shape, size and density of quantum wells, wires and dots.
Scanning Tunneling Microscopy and UHV Scanning Tunneling MicroscopyRamkumar Niluroutu
This presentation gives the details of STM's history, working process, modes of operations and explanation of various components. UHV STM details also included in this presentation of its working process.
Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is guided through an ultra thin specimen, interacting with the specimen as it passes through.An image is formed from the fundamental interaction of the electrons transmitted through the specimen; the image is magnified and focused onto an imaging device, such as a fluorescent screen, on a layer of photographic film, or to be observed by a sensor such as a CCD camera.
Transmission electron microscope, high resolution tem and selected area elect...Nano Encryption
The transmission electron microscope is a very powerful tool for material science. A high energy beam of electrons is shone through a very thin sample, and the interactions between the electrons and the atoms can be used to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. Chemical analysis can also be performed. TEM can be used to study the growth of layers, their composition and defects in semiconductors. High resolution can be used to analyze the quality, shape, size and density of quantum wells, wires and dots.
The transmission electron microscope is a very powerful tool for material science. A high energy beam of electrons is shone through a very thin sample, and the interactions between the electrons and the atoms can be used to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. Chemical analysis can also be performed. TEM can be used to study the growth of layers, their composition and defects in semiconductors. High resolution can be used to analyze the quality, shape, size and density of quantum wells, wires and dots.
Scanning Tunneling Microscopy and UHV Scanning Tunneling MicroscopyRamkumar Niluroutu
This presentation gives the details of STM's history, working process, modes of operations and explanation of various components. UHV STM details also included in this presentation of its working process.
Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is guided through an ultra thin specimen, interacting with the specimen as it passes through.An image is formed from the fundamental interaction of the electrons transmitted through the specimen; the image is magnified and focused onto an imaging device, such as a fluorescent screen, on a layer of photographic film, or to be observed by a sensor such as a CCD camera.
Transmission electron microscope, high resolution tem and selected area elect...Nano Encryption
The transmission electron microscope is a very powerful tool for material science. A high energy beam of electrons is shone through a very thin sample, and the interactions between the electrons and the atoms can be used to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. Chemical analysis can also be performed. TEM can be used to study the growth of layers, their composition and defects in semiconductors. High resolution can be used to analyze the quality, shape, size and density of quantum wells, wires and dots.
We have top level insurance defense attorneys throughout Louisiana its practice has expanded to professional liability defense. For more details visit our website
Npm : 2012 4350 1163
Nama : Hamim Suyuti
Kelas : R7H
Mata Kuliah : Komputer Grafik
Dosen : Nahot Frastian, M.Kom
Program Studi : Teknik Informatika
Universitas : Universitas Indraprasta PGRI
Npm : 2012 4350 1163
Nama : Hamim Suyuti
Kelas : R7H
Mata Kuliah : Komputer Grafik
Dosen : Nahot Frastian, M.Kom
Program Studi : Teknik Informatika
Universitas : Universitas Indraprasta PGRI
A scanning electron microscope is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition.
SEMs can magnify an object from about 10 times up to 300,000 times. A scale bar is often provided on an SEM image. From this the actual size of structures in the image can be calculated.
SEM is a technique that provides information such as topography, composition and crystallographic information of an object.
Scanning electron microscopes use a beam of highly energetic electrons to examine objects on a very fine scale.
SEM produces images by detecting secondary electrons that are emitted from the surface due to excitation from a primary electron beam.
The TEM is a very powerful tool for material science.
TEM can be used to study the growth of layers, their composition and defects in semiconductors.
High resolution can be used to analyze the quality, shape, size and density of quantum wells, wires and dots.
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.
NO1 Uk best vashikaran specialist in delhi vashikaran baba near me online vas...Amil Baba Dawood bangali
Contact with Dawood Bhai Just call on +92322-6382012 and we'll help you. We'll solve all your problems within 12 to 24 hours and with 101% guarantee and with astrology systematic. If you want to take any personal or professional advice then also you can call us on +92322-6382012 , ONLINE LOVE PROBLEM & Other all types of Daily Life Problem's.Then CALL or WHATSAPP us on +92322-6382012 and Get all these problems solutions here by Amil Baba DAWOOD BANGALI
#vashikaranspecialist #astrologer #palmistry #amliyaat #taweez #manpasandshadi #horoscope #spiritual #lovelife #lovespell #marriagespell#aamilbabainpakistan #amilbabainkarachi #powerfullblackmagicspell #kalajadumantarspecialist #realamilbaba #AmilbabainPakistan #astrologerincanada #astrologerindubai #lovespellsmaster #kalajaduspecialist #lovespellsthatwork #aamilbabainlahore#blackmagicformarriage #aamilbaba #kalajadu #kalailam #taweez #wazifaexpert #jadumantar #vashikaranspecialist #astrologer #palmistry #amliyaat #taweez #manpasandshadi #horoscope #spiritual #lovelife #lovespell #marriagespell#aamilbabainpakistan #amilbabainkarachi #powerfullblackmagicspell #kalajadumantarspecialist #realamilbaba #AmilbabainPakistan #astrologerincanada #astrologerindubai #lovespellsmaster #kalajaduspecialist #lovespellsthatwork #aamilbabainlahore #blackmagicforlove #blackmagicformarriage #aamilbaba #kalajadu #kalailam #taweez #wazifaexpert #jadumantar #vashikaranspecialist #astrologer #palmistry #amliyaat #taweez #manpasandshadi #horoscope #spiritual #lovelife #lovespell #marriagespell#aamilbabainpakistan #amilbabainkarachi #powerfullblackmagicspell #kalajadumantarspecialist #realamilbaba #AmilbabainPakistan #astrologerincanada #astrologerindubai #lovespellsmaster #kalajaduspecialist #lovespellsthatwork #aamilbabainlahore #Amilbabainuk #amilbabainspain #amilbabaindubai #Amilbabainnorway #amilbabainkrachi #amilbabainlahore #amilbabaingujranwalan #amilbabainislamabad
Final project report on grocery store management system..pdfKamal Acharya
In today’s fast-changing business environment, it’s extremely important to be able to respond to client needs in the most effective and timely manner. If your customers wish to see your business online and have instant access to your products or services.
Online Grocery Store is an e-commerce website, which retails various grocery products. This project allows viewing various products available enables registered users to purchase desired products instantly using Paytm, UPI payment processor (Instant Pay) and also can place order by using Cash on Delivery (Pay Later) option. This project provides an easy access to Administrators and Managers to view orders placed using Pay Later and Instant Pay options.
In order to develop an e-commerce website, a number of Technologies must be studied and understood. These include multi-tiered architecture, server and client-side scripting techniques, implementation technologies, programming language (such as PHP, HTML, CSS, JavaScript) and MySQL relational databases. This is a project with the objective to develop a basic website where a consumer is provided with a shopping cart website and also to know about the technologies used to develop such a website.
This document will discuss each of the underlying technologies to create and implement an e- commerce website.
Industrial Training at Shahjalal Fertilizer Company Limited (SFCL)MdTanvirMahtab2
This presentation is about the working procedure of Shahjalal Fertilizer Company Limited (SFCL). A Govt. owned Company of Bangladesh Chemical Industries Corporation under Ministry of Industries.
Hierarchical Digital Twin of a Naval Power SystemKerry Sado
A hierarchical digital twin of a Naval DC power system has been developed and experimentally verified. Similar to other state-of-the-art digital twins, this technology creates a digital replica of the physical system executed in real-time or faster, which can modify hardware controls. However, its advantage stems from distributing computational efforts by utilizing a hierarchical structure composed of lower-level digital twin blocks and a higher-level system digital twin. Each digital twin block is associated with a physical subsystem of the hardware and communicates with a singular system digital twin, which creates a system-level response. By extracting information from each level of the hierarchy, power system controls of the hardware were reconfigured autonomously. This hierarchical digital twin development offers several advantages over other digital twins, particularly in the field of naval power systems. The hierarchical structure allows for greater computational efficiency and scalability while the ability to autonomously reconfigure hardware controls offers increased flexibility and responsiveness. The hierarchical decomposition and models utilized were well aligned with the physical twin, as indicated by the maximum deviations between the developed digital twin hierarchy and the hardware.
Student information management system project report ii.pdfKamal Acharya
Our project explains about the student management. This project mainly explains the various actions related to student details. This project shows some ease in adding, editing and deleting the student details. It also provides a less time consuming process for viewing, adding, editing and deleting the marks of the students.
Overview of the fundamental roles in Hydropower generation and the components involved in wider Electrical Engineering.
This paper presents the design and construction of hydroelectric dams from the hydrologist’s survey of the valley before construction, all aspects and involved disciplines, fluid dynamics, structural engineering, generation and mains frequency regulation to the very transmission of power through the network in the United Kingdom.
Author: Robbie Edward Sayers
Collaborators and co editors: Charlie Sims and Connor Healey.
(C) 2024 Robbie E. Sayers
3. OUTLINE
Introduction
Components, and working principles of
SEM
Salient futures of SEM
Data analysis by SEM
Textile fiber characterization by SEM
Advantages and limitations of SEM?
5. A. INTRODUCTION
Type of electron microscope that images
the sample by scanning it with high energy
beam of electrons .
What can we study in a SEM?
o Topography and morphology(texture)
o Chemistry(chemical composition)
o Crystallography
o Orientation of materials
Designed by Stinzing and Knoll in Germany in the early 25s
1965.
6. Light microscope Electro microscope
The source of illumination The ambient light source is
light for the microscope
Electrons are used to “see”
light is replaced by an
electron gun built into the
column
The lens type Glass lenses Electromagnetic lenses
Magnification
method
Magnification is changed by
moving the lens
Focal length is charged by
changing the current through
the lens
Viewing the
sample
Eyepiece (ocular) Fluorescent screen or
digital camera
Use of vacuum No vacuum Entire electron path from
gun to camera must be
under vacuum
Comparing light vs electron microscope
7.
8. TEM SEM
Electron Beam Broad, static beams
Beam focused to fine point;
sample is scanned line by
line
Voltages Needed Accelerating voltage high r
Accelerating voltage much
lower; not necessary to
penetrate the specimen
Interaction of the
beam electrons
Specimen must be very thin
Wide range of specimens
allowed; simplifies
sample preparation
Imaging
Electrons must pass through
and be transmitted by the
specimen
Information needed is
collected near the surface
of the specimen
Image Rendering
Transmitted electrons are
collectively focused by the
objective lens and magnified
to create a real image
Beam is scanned along the
surface of the sample to
build up the image
Comparing TEM vs
SEM
12. 2.
LENSES Condenser lens –determines the number of
electrons in the beam which hit the sample by
reducing the diameter of the electron beam.
Objective lenses -changes the position of the
point at which the electron are focused on the
sample.
13. 3. SCANNING COILS
Are used to raster/scan the e-beam across the sample
surface
The e-beam can be scanned in a rectangular raster
across the surface of the sample by means of a series
of “scan coils” situated above the objective lens.
4. SAMPLE CHAMBER
A place where the sample was mounted
on.
15. 6. VACUUM CHAMBER
Used to protect the electronic beam from
interference with air.
control the number of electrons which reach
the sample.
control the final convergence angle of the
electron beam onto the sample
7. Aperture
18. SIGNALS FROM THE SAMPLE
1. Secondary electrons (SE):
Low energy electrons, high resolution
Surface signal dependent on curvature
2. Backscattered electrons (BSE):
High energy electrons
“Bulk” signal dependent on atomic number
3. X-rays: chemistry
Longer recording times are needed
Absorbed e- tells the chemistry of the
sample
23. RESOLUTION IS DEPEND UP ON?
Size of the electron spot &wavelength of the
electrons .
size of the interaction volume (material
interacts with the electron beam)
24. SAMPLE PREPARATION
1) Remove all water, solvents, or
other materials that could vaporize
while in the vacuum.
2) Firmly mount all the samples.
3) Non-metallic samples, such as
plants,
and ceramics, should be coated with
electrically conductive materials.
25. Image disturbance and causes
Image
disturbance
Cause
Lack of
sharpness
Improper accelerating voltage setting
Instability of gun emission due to low heat energy
Improper setting of objective aperture
Improper focal length
Too large magnification
Specimen charge up and magnetization
Low image
quality
Improper accelerating voltage setting
Improper contrast and brightness
Improper specimen preparation process
Improper position relation between specimen and
detector
Noise Improper accelerating voltage setting
Change up of specimen surface
Mechanical vibration
Image distortion o Electron beam damage
26. C. SALIENT FUTURES OF SEM
High resolution 50 to 100 nm and magnification
ranging from 20X to approximately 30,000X
3-D Topographical imaging due to very narrow
e- beam & large depth of field yielding
Compatible with PC technologies and softwares
Fast Analysing
Store data in digital form
most powerful and popular for surface
characterization.
uses electrons to form image rather than light.
relatively easy to prepare sample.
27. Topography
The surface features of an object and its texture
(hardness, reflectivity… etc.)
Morphology
The shape and size of the particles making up the
object (strength, defects in IC and chips...etc.)
Composition
The elements and compounds that the object is
composed of and the relative amounts of them
(melting point, reactivity, hardness...etc.)
Crystallographic Information
How the grains are arranged in the object
Surface characterization of dry solid materials
29. CHARACTERIZATION OF WOOL FIBER
BY SEM
Wool have Cylindrical , irregular, rough surface,
scale like structure when we see its longitudinal
structure under SEM.
Nearly round or circular cross –sectional view
Longitudinal view Cross-sectional view
30. CHARACTERIZATION OF COTTON FIBER
BY SEM
Ribbon like with convolutions longitudinal structure
Have Elliptical been shaped stracture when we see its
cross-sectional view
Cross-sectionalLongitudinal view
31. CHARACTERIZATION OF POLYESTER
FIBER BY SEM
uniform diameter & rod like appearance of
longitudinal view
Circular cross-sectional view
Cross-sectional viewLongitudinal view
32. Limitations
Sample must fit into the microscope
chamber
Doesn't work with out vacuum
Sample should coat with electrically
conductive chemical.
Sample must be dry solid .
bulky and complex instruments as a result
needs special experts.
Ne----Advantage is listed
above( future)