This document summarizes an analysis of von-Mises stress for interference fit and pull-out states using the finite element method. It first defines von-Mises stress as the stress at the yield point of a material. It then discusses interference fits, their applications, and how they are typically modeled using finite element analysis software. Key steps in modeling interference fits with FEA include defining the geometry, material properties, loads, and using appropriate contact elements. The results can provide insight into high stress regions that may lead to failures.