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Device Modeling Report



COMPONENTS: Power MOSFET (Professional)
PART NUMBER: 2SK3454
MANUFACTURER: TOSHIBA
Body Diode (Professional) / ESD Protection Diode




                  Bee Technologies Inc.




    All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
MOSFET MODEL

Pspice model
                                      Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
     RG        Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
      N        Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
   DELTA       Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Modility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
     UO        Surface Mobility




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Transconductance Characteristic

Circuit Simulation Result


         5
                     Measurement
                     Simulation


         4




         3
   gfs




         2




         1




         0
             0           1            2            3             4              5
                                   ID : Drain Curre nt A


Comparison table


         Id(A)                            gfs                           Error(%)

                       Measurement              Simulation

             0.001                  0.012                  0.013                     4.839
             0.002                  0.048                  0.050                     4.167
             0.005                  0.080                  0.083                     3.750
              0.01                  0.106                  0.111                     4.717
              0.02                  0.213                  0.222                     4.225
              0.05                  0.257                  0.263                     2.335
               0.1                  0.475                  0.455                    -4.211
               0.2                  0.634                  0.659                     3.943
               0.5                  1.002                  1.042                     3.992
                 1                  1.246                  1.300                     4.334


                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Vgs-Id Characteristic

Circuit Simulation result



         100A



          10A



         1.0A



        100mA



         10mA



        1.0mA



        100uA
             0V               4V         8V              12V            16V      20V
                  I(V3)
                                                V_V2


Evaluation circuit


                                                 V3


                                                        0Vdc


                                              U1
                                              2SK3454
                                                               Vv ariable

                      10Vdc
                                                               10Vdc


                      V2




                                          0




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Comparison Graph

Circuit Simulation Result


                           100.000
                                          Measurement
                                          Simulation


                            10.000
    ID : Drain Current A




                             1.000




                             0.100




                             0.010




                             0.001
                                  0.00        4.00           8.00        12.00          16.00   20.00
                                                       VGS : Gate to Source Voltage V



Simulation Result


                           ID(A)                               VGS(V)                           Error (%)
                                           Measurement                   Simulation

                               0.001                       3.640                        3.570           -1.923
                               0.002                       3.730                        3.593           -3.673
                               0.005                       3.760                        3.636           -3.298
                               0.010                       3.810                        3.685           -3.281
                               0.020                       3.865                        3.758           -2.768
                               0.050                       4.053                        3.894           -3.923
                               0.100                       4.213                        4.050           -3.869
                               0.200                       4.420                        4.270           -3.394
                               0.500                       4.770                        4.708           -1.300
                               1.000                       5.070                        5.213            2.821
                               2.000                       5.665                        5.929            4.660
                               5.000                       7.012                        7.345            4.749


                                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Rds(on) Characteristic

Circuit Simulation result


        7.0A


        6.0A


        5.0A


        4.0A


        3.0A


        2.0A


        1.0A


          0A
            0V                    1.0V                       2.0V            3.0V
                 I(V3)
                                              V_VDS

Evaluation circuit


                                               V3


                                                      0Vdc


                                          U1
                                          2SK3454

                                                              VDS

                  10Vdc
                                                              0Vdc


                  VGS




                                      0



Simulation Result

       ID=4A, VGS=10V             Measurement                 Simulation         Error (%)
         R DS (on) ()                          0.500                0.499          -0.200



                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Gate Charge Characteristic
Circuit Simulation result

          14V



          12V



          10V



          8V



          6V



          4V



          2V



          0V
                0                 5n               10n       15n                20n
                    V(W1:3)
                                                 Time*1mS


Evaluation circuit

                                                                    V2


                                                                             0Vdc
                                                                   U1
                                                                   2SK3454

                    PER = 1000u                                               Dbreak
                    PW = 600u               W1
                    TF = 10n                  +                                D1
                    TR = 10n                                                            I2
                                              -
                    TD = 0                                                              7Adc
                    I2 = 1m                 W
                                  I1    IOFF = 0.1mA
                    I1 = 0              ION = 0uA

                                                                                        V1
                                                                                        200Vdc



                                                       0



Simulation Result

        VDD=200V,ID=7A                 Measurement          Simulation                 Error (%)
           ,VGS=10V
                 Qgs(nc)                            3.500             3.508                     0.229
                Qgd(nc)                            13.500            13.509                     0.067
                  Qg(nc)                           11.000            10.995                    -0.045


                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Capacitance Characteristic




                                                            Measurement
                                                            Simulation




Simulation Result


           VDS(V)                     Cbd(pF)                       Error(%)
                          Measurement          Simulation

                    0.1         179.000               179.070             0.039
                    0.2         169.200               169.180            -0.012
                    0.5         147.900               147.850            -0.034
                      1         128.500               128.498            -0.002
                      2         108.000               108.021             0.019
                      5          68.000                67.985            -0.022




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Switching Time Characteristic

Circuit Simulation result


        15.0V



        12.5V



        10.0V



         7.5V



         5.0V



         2.5V



           0V
           1.85us        1.90us     1.95us         2.00us         2.05us         2.10us     2.15us
                V(2)      V(3)/12.5
                                                       Time


Evaluation circuit


                                                                           3         L2

                                                                                     10u


                                                                               U1
                                                                               2SK3454                   RL
                                 R1               L1          2
                                                                                                         31.25
                V1 = 0
                                  10              30nH
                V2 = 20     V2                                                                       VDD
                TD = 2u                   R2                                               125Vdc
                TR = 6n
                TF = 7n                      10
                PW = 1u
                PER = 10u


                                                                                                     0



Simulation Result

        ID=4A, VDD=125V                Measurement                 Simulation                  Error(%)
            VGS=10V
            Ton(ns)                                11.000                      10.995                -0.045


                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Output Characteristic

Circuit Simulation result


        30A




        20A
                                                                        VGS=10V




        10A




         0A
           0V            10V        20V         30V          40V            50V   60V
                I(Vdsense)
                                            V_Vvariable


Evaluation circuit



                                             Vdsense


                                                    0Vdc
                                          U1
                                          2SK3454



                                                           Vv ariable
                 10Vdc

                                                           0Vdc

                 Vstep




                                      0




                   All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Forward Current Characteristic

Circuit Simulation Result


       100A




        10A




       1.0A




      100mA




       10mA
           0V           0.2V           0.4V   0.6V       0.8V       1.0V     1.2V
                I(R1)
                                              V_V1



Evaluation Circuit


                               R1


                               0.01m


                        V1
                0Vdc                                 U1
                                                     2SK3454




                        0




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Comparison Graph

Circuit Simulation Result


                                 100.00
                                                    Measurement
                                                    Simulation



                                  10.00
  Drain reverse current IDR(A)




                                   1.00




                                   0.10




                                   0.01
                                          0          0.2         0.4      0.6        0.8        1            1.2

                                                           Source: Drain voltage VSD(V)

Simulation Result


                                 IDR(A)                  VDS(V)                    VDS(V)                %Error
                                                       Measurement                Simulation
                                      0.010                     0.630                      0.626                   -0.635
                                      0.020                     0.645                      0.643                   -0.310
                                      0.050                     0.660                      0.666                    0.909
                                      0.100                     0.680                      0.686                    0.882
                                      0.200                     0.700                      0.709                    1.286
                                      0.500                     0.740                      0.748                    1.081
                                      1.000                     0.780                      0.787                    0.897
                                      2.000                     0.850                      0.836                   -1.647
                                      5.000                     0.930                      0.934                    0.430


                                              All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Reverse Recovery Characteristic

Circuit Simulation Result


       400mA




          0A




      -400mA
          18.8us        19.6us         20.4us          21.2us          22.0us   22.8us
               I(R1)
                                                Time

Evaluation Circuit


                                  R1


                                  50

               V1 = -9.4v    V1
               V2 = 10.7v                                       U1
               TD = 100n                                        D2SK3454
               TR = 10ns
               TF = 19ns
               PW = 20us
               PER = 100us




                             0



Compare Measurement vs. Simulation

                             Measurement                   Simulation             Error (%)
        Trj(ns)                         416.000                       416.536             0.129
        trb(ns)                         264.000                       263.071            -0.352
        trr(ns)                         680.000                       679.607            -0.058


                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Reverse Recovery Characteristic                                        Reference




Trj=416(ns)
Trb=264(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Zener Voltage Characteristic

Circuit Simulation Result

       10mA


        9mA


        8mA


        7mA


        6mA


        5mA


        4mA


        3mA


        2mA


        1mA


         0A
           0V       10V        20V         30V         40V      50V    60V   70V   80V   90V 100V
                I(R1)
                                                               V_V1



Evaluation Circuit


                                              R1



                                           0.01m




                          V1
                0Vdc
                                                                  U1
                                      R2                     2SK3454

                                     100MEG


                                                   0




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Zener Voltage Characteristic                                         Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2008

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SPICE MODEL of 2SK3454 (Professional+BDP Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Professional) PART NUMBER: 2SK3454 MANUFACTURER: TOSHIBA Body Diode (Professional) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 2. MOSFET MODEL Pspice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Modility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 3. Transconductance Characteristic Circuit Simulation Result 5 Measurement Simulation 4 3 gfs 2 1 0 0 1 2 3 4 5 ID : Drain Curre nt A Comparison table Id(A) gfs Error(%) Measurement Simulation 0.001 0.012 0.013 4.839 0.002 0.048 0.050 4.167 0.005 0.080 0.083 3.750 0.01 0.106 0.111 4.717 0.02 0.213 0.222 4.225 0.05 0.257 0.263 2.335 0.1 0.475 0.455 -4.211 0.2 0.634 0.659 3.943 0.5 1.002 1.042 3.992 1 1.246 1.300 4.334 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 4. Vgs-Id Characteristic Circuit Simulation result 100A 10A 1.0A 100mA 10mA 1.0mA 100uA 0V 4V 8V 12V 16V 20V I(V3) V_V2 Evaluation circuit V3 0Vdc U1 2SK3454 Vv ariable 10Vdc 10Vdc V2 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 5. Comparison Graph Circuit Simulation Result 100.000 Measurement Simulation 10.000 ID : Drain Current A 1.000 0.100 0.010 0.001 0.00 4.00 8.00 12.00 16.00 20.00 VGS : Gate to Source Voltage V Simulation Result ID(A) VGS(V) Error (%) Measurement Simulation 0.001 3.640 3.570 -1.923 0.002 3.730 3.593 -3.673 0.005 3.760 3.636 -3.298 0.010 3.810 3.685 -3.281 0.020 3.865 3.758 -2.768 0.050 4.053 3.894 -3.923 0.100 4.213 4.050 -3.869 0.200 4.420 4.270 -3.394 0.500 4.770 4.708 -1.300 1.000 5.070 5.213 2.821 2.000 5.665 5.929 4.660 5.000 7.012 7.345 4.749 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 6. Rds(on) Characteristic Circuit Simulation result 7.0A 6.0A 5.0A 4.0A 3.0A 2.0A 1.0A 0A 0V 1.0V 2.0V 3.0V I(V3) V_VDS Evaluation circuit V3 0Vdc U1 2SK3454 VDS 10Vdc 0Vdc VGS 0 Simulation Result ID=4A, VGS=10V Measurement Simulation Error (%) R DS (on) () 0.500 0.499 -0.200 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 7. Gate Charge Characteristic Circuit Simulation result 14V 12V 10V 8V 6V 4V 2V 0V 0 5n 10n 15n 20n V(W1:3) Time*1mS Evaluation circuit V2 0Vdc U1 2SK3454 PER = 1000u Dbreak PW = 600u W1 TF = 10n + D1 TR = 10n I2 - TD = 0 7Adc I2 = 1m W I1 IOFF = 0.1mA I1 = 0 ION = 0uA V1 200Vdc 0 Simulation Result VDD=200V,ID=7A Measurement Simulation Error (%) ,VGS=10V Qgs(nc) 3.500 3.508 0.229 Qgd(nc) 13.500 13.509 0.067 Qg(nc) 11.000 10.995 -0.045 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 8. Capacitance Characteristic Measurement Simulation Simulation Result VDS(V) Cbd(pF) Error(%) Measurement Simulation 0.1 179.000 179.070 0.039 0.2 169.200 169.180 -0.012 0.5 147.900 147.850 -0.034 1 128.500 128.498 -0.002 2 108.000 108.021 0.019 5 68.000 67.985 -0.022 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 9. Switching Time Characteristic Circuit Simulation result 15.0V 12.5V 10.0V 7.5V 5.0V 2.5V 0V 1.85us 1.90us 1.95us 2.00us 2.05us 2.10us 2.15us V(2) V(3)/12.5 Time Evaluation circuit 3 L2 10u U1 2SK3454 RL R1 L1 2 31.25 V1 = 0 10 30nH V2 = 20 V2 VDD TD = 2u R2 125Vdc TR = 6n TF = 7n 10 PW = 1u PER = 10u 0 Simulation Result ID=4A, VDD=125V Measurement Simulation Error(%) VGS=10V Ton(ns) 11.000 10.995 -0.045 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 10. Output Characteristic Circuit Simulation result 30A 20A VGS=10V 10A 0A 0V 10V 20V 30V 40V 50V 60V I(Vdsense) V_Vvariable Evaluation circuit Vdsense 0Vdc U1 2SK3454 Vv ariable 10Vdc 0Vdc Vstep 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 11. Forward Current Characteristic Circuit Simulation Result 100A 10A 1.0A 100mA 10mA 0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V I(R1) V_V1 Evaluation Circuit R1 0.01m V1 0Vdc U1 2SK3454 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 12. Comparison Graph Circuit Simulation Result 100.00 Measurement Simulation 10.00 Drain reverse current IDR(A) 1.00 0.10 0.01 0 0.2 0.4 0.6 0.8 1 1.2 Source: Drain voltage VSD(V) Simulation Result IDR(A) VDS(V) VDS(V) %Error Measurement Simulation 0.010 0.630 0.626 -0.635 0.020 0.645 0.643 -0.310 0.050 0.660 0.666 0.909 0.100 0.680 0.686 0.882 0.200 0.700 0.709 1.286 0.500 0.740 0.748 1.081 1.000 0.780 0.787 0.897 2.000 0.850 0.836 -1.647 5.000 0.930 0.934 0.430 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 13. Reverse Recovery Characteristic Circuit Simulation Result 400mA 0A -400mA 18.8us 19.6us 20.4us 21.2us 22.0us 22.8us I(R1) Time Evaluation Circuit R1 50 V1 = -9.4v V1 V2 = 10.7v U1 TD = 100n D2SK3454 TR = 10ns TF = 19ns PW = 20us PER = 100us 0 Compare Measurement vs. Simulation Measurement Simulation Error (%) Trj(ns) 416.000 416.536 0.129 trb(ns) 264.000 263.071 -0.352 trr(ns) 680.000 679.607 -0.058 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 14. Reverse Recovery Characteristic Reference Trj=416(ns) Trb=264(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 15. Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 10V 20V 30V 40V 50V 60V 70V 80V 90V 100V I(R1) V_V1 Evaluation Circuit R1 0.01m V1 0Vdc U1 R2 2SK3454 100MEG 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 16. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2008