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Device Modeling Report



COMPONENTS: Power MOSFET (Model Parameter)
PART NUMBER: 2SK3108
MANUFACTURER: NEC
Body Diode (Model Parameter) / ESD Protection Diode




                    Bee Technologies Inc.


      All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
MOSFET MODEL

PSpice model
                                       Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
    RG         Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
      N        Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
  DELTA        Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Mobility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
    UO         Surface Mobility




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Transconductance Characteristic

Circuit Simulation Result


                                     5
                                                  Measurement
                                                  Simulation
                                     4
           TRANSCONDUCTANCE Gfs(s)




                                     3



                                     2



                                     1



                                     0
                                         0        2              4            6       8         10
                                                               DRIAN CURRENT ID (A)


Comparison table

                                                                     gfs
                          Id(A)                                                            Error (%)
                                               Measurement                 Simulation
                                         0.1           0.478                       0.495        3.455
                                         0.2           0.685                       0.715        4.390
                                         0.5           1.085                       1.120        3.264
                                           1           1.534                       1.534        0.000
                                           2           2.179                       2.172       -0.337
                                           5           3.425                       3.400       -0.720
                                          10           4.840                       4.900        1.234




                                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Vgs-Id Characteristic

Circuit Simulation result

     10A




    1.0A




   100mA




    10mA



           0V      1V      2V   3V       4V        5V   6V       7V   8V   9V   10V
                I(V2)
                                                V_VGS



Evaluation circuit

                                           V2




                                         U2

                                                             VDS
                                                              10Vdc
                                         2SK3108
                    VGS
                    0Vdc




                                     0




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Comparison Graph

Circuit Simulation Result

                              10
                                                    Measurement
                                                    Simulation
     ID - Drain Current -A




                               1




                              0.1




                             0.01
                                    0              2            4            6            8            10

                                                       VGS - Gate to Source Voltage - V
Comparison table

                                                                 VGS(V)
                              ID(A)                                                              Error (%)
                                                Measurement                Simulation
                                    0.01                      4.050                    4.111           1.499
                                    0.02                      4.150                    4.166           0.386
                                    0.05                      4.400                    4.276           -2.820
                                     0.1                      4.550                    4.400           -3.305
                                     0.2                      4.800                    4.575           -4.694
                                     0.5                      5.100                    4.922           -3.488
                                         1                    5.350                    5.314           -0.680
                                         2                    5.850                    5.868           0.299
                                         5                    7.000                    6.966           -0.480
                                      10                      8.300                    8.206           -1.139



                                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Rds(on) Characteristic

Circuit Simulation result

   4.0A




   3.2A




   2.4A




   1.6A




   0.8A




     0A
          0V             0.256V        0.512V            0.768V      1.024V   1.280V
               I(V2)
                                                 V_VDS

Evaluation circuit

                                        V2




                                       U2
                                       2SK3108



                                                           VDS
                   VGS                                      10Vdc
                   10Vdc




                                   0




Comparison table

      ID=4.0A, VGS=10V                  Measurement                 Simulation         Error (%)
               R DS (on)                                 0.32                0.32          0.00



                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Gate Charge Characteristic
Circuit Simulation result

   16V


   14V


   12V


   10V


    8V


    6V


    4V


    2V


    0V
         0        2.5n        5.0n        7.5n    10.0n     12.5n     15.0n      17.5n
              V(W1:3)
                                                 Time*1mA
Evaluation circuit

                                                                      Vsense




                                                                                             I1
                                                                 U1                D1
                                 W1                              2SK3108          Dbreak    8.0Adc
                                      +
                     TD = 0
                                      -
              I2       ION = 0A   W
                       IOFF = 1mA                                                           VD
                                                                                            160Vdc


                                                             0



Comparison table

             VDD=160V,ID=8A,
                                          Measurement               Simulation             Error (%)
                VGS=10V
                   Qgs           nC                   3.50                      3.48               -0.63
                   Qgd           nC                  10.00                     10.03                0.30
                   Qg            nC                  18.00                     14.95              -16.96


                         All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Capacitance Characteristic




                                                      Measurement
                                                      Simulation




Comparison table


                                      Cbd(pF)
           VDS(V)                                                  Error(%)
                         Measurement           Simulation
                     1                270                 265           -1.852
                     2                160                 168            4.375
                     5                 95                  93           -2.105
                    10                 55                  56            1.818
                    20                 37                  35           -4.054




             All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Switching Time Characteristic

Circuit Simulation result

   20V


   16V


   12V


    8V


    4V


    0V


   -4V


   -8V
    0.94us 0.96us 0.98us 1.00us             1.02us   1.04us        1.06us   1.08us
         V(L3:2) V(Vsense:+)/10
                                             Time


Evaluation circuit

                                                          Vsense                RL


                                                                                     25


                                       L3



                                                          U2
         V1 = 0                                           2SK3108                          VDD
         V2 = 10     V1                                                                      100Vdc
         TD = 1u                 R1
         TR = 20n
         TF = 20n                 10
         PW = 10u
         PER = 20u


                                                      0



Comparison table

    ID=4.0A, VDD=100V,
                                   Measurement                     Simulation             Error(%)
       VGS=0V~10V
          ton             ns                    12.00                         12.83              6.92




                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Output Characteristic

Circuit Simulation result

   10A
               10V               9V                                                   8V
    9A


    8A


    7A


    6A

                                                                                      7V
    5A


    4A


    3A
                                                                                VGS=6 V
    2A


    1A


    0A
         0V       2V        4V        6V            8V    10V       12V   14V   16V    18V   20V
              I(V2)
                                                         V_VDS


Evaluation circuit

                                             V2




                                          U1
                                          2SK3108                VDS
                                                                  10Vdc


                     VGS
                     0Vdc




                                      0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Output Characteristic                                                     Reference




                                         Measurement




           All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
BODY DIODE
Forward Current Characteristic

Circuit Simulation Result

     10A




    1.0A




   100mA
           0V       0.2V      0.4V         0.6V   0.8V    1.0V     1.2V   1.4V   1.6V
                I(R1)
                                                  V_V1

Evaluation Circuit

                               R1

                               0.01m

                                                         U1
                                                         2SK3108
                       V1
                0Vdc




                                       0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Comparison Graph


Circuit Simulation Result

                                 10
                                                        Measurement
                                                        Simulation
     Diode Forward Current - A




                                  1




                                 0.1
                                       0.4       0.5     0.6      0.7    0.8     0.9       1      1.1       1.2

                                                               Source to Drain Voltage - V
Comparison table


                                                                        VSD(V)
                                       ISD(A)           Measurement              Simulation             %Error
                                             0.1                0.700                    0.700           -0.043
                                             0.2                0.720                    0.720           -0.056
                                             0.5                0.750                    0.752            0.267
                                               1                0.790                    0.786           -0.506
                                               2                0.830                    0.833            0.361
                                               5                0.930                    0.928           -0.215
                                              10                1.050                    1.051            0.095




                                             All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Reverse Recovery Characteristic

Circuit Simulation Result

    400mA


    300mA


    200mA


    100mA


     -0mA


   -100mA


   -200mA


   -300mA


   -400mA
       4.4us 4.8us             5.6us              6.4us 6.8us        7.6us    8.4us
           I(R1)
                                                   Time
Evaluation Circuit

                                       R1


                                            50

                                                                U1
            V1 = -9.4     V1                                    2SK3108
            V2 = 10.7
            TD = 0
            TR = 10ns
            TF = 10ns
            PW = 5.7us
            PER = 100us




                                             0



Comparison table

                               Measurement                  Simulation         Error (%)
             trr                                 580.00              580.39           0.07




                All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Reverse Recovery Characteristic                                        Reference




                                                   Measurement




Trj=342(ns)
Trb=238(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb



              All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
ESD PROTECTION DIODE
Zener Voltage Characteristic
Circuit Simulation Result

   10mA

    9mA

    8mA

    7mA

    6mA

    5mA

    4mA

    3mA

    2mA

    1mA

     0A
          0V      5V        10V   15V      20V    25V    30V   35V      40V     45V 50V
               I(R1)
                                                  V_V1



Evaluation Circuit

                                      R1


                                   0.01m

                                           open
                                                                 open

                                  U1 2SK3108
                       V1
               0Vdc                                                     Ropen
                                                                         100MEG


                                                                     0


                            0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
Zener Voltage Characteristic                                         Reference




               Measurement




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2007

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SPICE MODEL of 2SK3108 (Standard+BDS Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Model Parameter) PART NUMBER: 2SK3108 MANUFACTURER: NEC Body Diode (Model Parameter) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 2. MOSFET MODEL PSpice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 3. Transconductance Characteristic Circuit Simulation Result 5 Measurement Simulation 4 TRANSCONDUCTANCE Gfs(s) 3 2 1 0 0 2 4 6 8 10 DRIAN CURRENT ID (A) Comparison table gfs Id(A) Error (%) Measurement Simulation 0.1 0.478 0.495 3.455 0.2 0.685 0.715 4.390 0.5 1.085 1.120 3.264 1 1.534 1.534 0.000 2 2.179 2.172 -0.337 5 3.425 3.400 -0.720 10 4.840 4.900 1.234 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 4. Vgs-Id Characteristic Circuit Simulation result 10A 1.0A 100mA 10mA 0V 1V 2V 3V 4V 5V 6V 7V 8V 9V 10V I(V2) V_VGS Evaluation circuit V2 U2 VDS 10Vdc 2SK3108 VGS 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 5. Comparison Graph Circuit Simulation Result 10 Measurement Simulation ID - Drain Current -A 1 0.1 0.01 0 2 4 6 8 10 VGS - Gate to Source Voltage - V Comparison table VGS(V) ID(A) Error (%) Measurement Simulation 0.01 4.050 4.111 1.499 0.02 4.150 4.166 0.386 0.05 4.400 4.276 -2.820 0.1 4.550 4.400 -3.305 0.2 4.800 4.575 -4.694 0.5 5.100 4.922 -3.488 1 5.350 5.314 -0.680 2 5.850 5.868 0.299 5 7.000 6.966 -0.480 10 8.300 8.206 -1.139 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 6. Rds(on) Characteristic Circuit Simulation result 4.0A 3.2A 2.4A 1.6A 0.8A 0A 0V 0.256V 0.512V 0.768V 1.024V 1.280V I(V2) V_VDS Evaluation circuit V2 U2 2SK3108 VDS VGS 10Vdc 10Vdc 0 Comparison table ID=4.0A, VGS=10V Measurement Simulation Error (%) R DS (on)  0.32 0.32 0.00 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 7. Gate Charge Characteristic Circuit Simulation result 16V 14V 12V 10V 8V 6V 4V 2V 0V 0 2.5n 5.0n 7.5n 10.0n 12.5n 15.0n 17.5n V(W1:3) Time*1mA Evaluation circuit Vsense I1 U1 D1 W1 2SK3108 Dbreak 8.0Adc + TD = 0 - I2 ION = 0A W IOFF = 1mA VD 160Vdc 0 Comparison table VDD=160V,ID=8A, Measurement Simulation Error (%) VGS=10V Qgs nC 3.50 3.48 -0.63 Qgd nC 10.00 10.03 0.30 Qg nC 18.00 14.95 -16.96 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 8. Capacitance Characteristic Measurement Simulation Comparison table Cbd(pF) VDS(V) Error(%) Measurement Simulation 1 270 265 -1.852 2 160 168 4.375 5 95 93 -2.105 10 55 56 1.818 20 37 35 -4.054 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 9. Switching Time Characteristic Circuit Simulation result 20V 16V 12V 8V 4V 0V -4V -8V 0.94us 0.96us 0.98us 1.00us 1.02us 1.04us 1.06us 1.08us V(L3:2) V(Vsense:+)/10 Time Evaluation circuit Vsense RL 25 L3 U2 V1 = 0 2SK3108 VDD V2 = 10 V1 100Vdc TD = 1u R1 TR = 20n TF = 20n 10 PW = 10u PER = 20u 0 Comparison table ID=4.0A, VDD=100V, Measurement Simulation Error(%) VGS=0V~10V ton ns 12.00 12.83 6.92 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 10. Output Characteristic Circuit Simulation result 10A 10V 9V 8V 9A 8A 7A 6A 7V 5A 4A 3A VGS=6 V 2A 1A 0A 0V 2V 4V 6V 8V 10V 12V 14V 16V 18V 20V I(V2) V_VDS Evaluation circuit V2 U1 2SK3108 VDS 10Vdc VGS 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 11. Output Characteristic Reference Measurement All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 12. BODY DIODE Forward Current Characteristic Circuit Simulation Result 10A 1.0A 100mA 0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V 1.4V 1.6V I(R1) V_V1 Evaluation Circuit R1 0.01m U1 2SK3108 V1 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 13. Comparison Graph Circuit Simulation Result 10 Measurement Simulation Diode Forward Current - A 1 0.1 0.4 0.5 0.6 0.7 0.8 0.9 1 1.1 1.2 Source to Drain Voltage - V Comparison table VSD(V) ISD(A) Measurement Simulation %Error 0.1 0.700 0.700 -0.043 0.2 0.720 0.720 -0.056 0.5 0.750 0.752 0.267 1 0.790 0.786 -0.506 2 0.830 0.833 0.361 5 0.930 0.928 -0.215 10 1.050 1.051 0.095 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 14. Reverse Recovery Characteristic Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 4.4us 4.8us 5.6us 6.4us 6.8us 7.6us 8.4us I(R1) Time Evaluation Circuit R1 50 U1 V1 = -9.4 V1 2SK3108 V2 = 10.7 TD = 0 TR = 10ns TF = 10ns PW = 5.7us PER = 100us 0 Comparison table Measurement Simulation Error (%) trr 580.00 580.39 0.07 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 15. Reverse Recovery Characteristic Reference Measurement Trj=342(ns) Trb=238(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 16. ESD PROTECTION DIODE Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 5V 10V 15V 20V 25V 30V 35V 40V 45V 50V I(R1) V_V1 Evaluation Circuit R1 0.01m open open U1 2SK3108 V1 0Vdc Ropen 100MEG 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
  • 17. Zener Voltage Characteristic Reference Measurement All Rights Reserved Copyright (c) Bee Technologies Inc. 2007