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Device Modeling Report



COMPONENTS: Power MOSFET (Professional)
PART NUMBER: SSM3J108TU
MANUFACTURER: TOSHIBA
Body Diode (Professional) / ESD Protection Diode




                  Bee Technologies Inc.




    All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
MOSFET MODEL

Pspice model
                                      Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
     RG        Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
      N        Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
   DELTA       Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Modility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
     UO        Surface Mobility




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Transconductance Characteristic

Circuit Simulation Result

      100.00
                        Measurement
                        Simulation



       10.00
gfs




        1.00




        0.10




        0.01
               0.0         0.2          0.4          0.6           0.8          1.0
                                     - ID : Drain Curre nt A

Comparison table



                                         gfs
        -Id(A)                                                           Error(%)
                       Measurement              Simulation
           0.001                     0.048                 0.050                 4.167
           0.002                     0.097                 0.100                 3.093
           0.005                     0.164                 0.167                 1.829
           0.010                     0.246                 0.250                 1.626
           0.020                     0.328                 0.333                 1.524
           0.050                     0.620                 0.625                 0.806
           0.100                     0.902                 0.909                 0.776
           0.200                     1.241                 1.250                 0.725
           0.500                     1.776                 1.786                 0.563
           1.000                     2.483                 2.500                 0.685



                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Vgs-Id Characteristic

Circuit Simulation result


     -10A




   -1.0mA
         0V     -0.2V -0.4V -0.6V -0.8V -1.0V -1.2V -1.4V -1.6V -1.8V
              I(V3)
                                         V_V1

Evaluation circuit


                                         V3


                                               0Vdc


                                  U1
                                  SSM3J108TU
                                                       V2


                                                      -3

                     V1


                   -1.2



                              0




                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Comparison Graph

Circuit Simulation Result

                                10.00
                                                Measurement
                                                Simulation




                                 1.00
       - ID : Drain Current A




                                 0.10




                                 0.01
                                        0.0                                1.0                         2.0
                                                             - VGS : Gate to Source Voltage V

Simulation Result


                                                                 -VGS(V)
       -ID(A)                                                                                   Error (%)
                                              Measurement                  Simulation
                                0.001                        0.820                     0.843             2.805
                                0.002                        0.834                     0.853             2.278
                                0.005                        0.850                     0.873             2.706
                                0.010                        0.900                     0.895            -0.556
                                0.020                        0.930                     0.925            -0.538
                                0.050                        1.000                     0.988            -1.200
                                0.100                        1.060                     1.057            -0.283
                                0.200                        1.150                     1.155             0.435
                                0.500                        1.340                     1.350             0.746
                                1.000                        1.530                     1.571             2.680




                                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Rds(on) Characteristic

Circuit Simulation result

        -1.0A




        -0.5A




          0A
            0V                    -50mV                           -100mV           -150mV
                 I(V3)
                                                   V_VDS


Evaluation circuit


                                           V3


                                           0Vdc


                                      U1
                                      SSM3J108TU           VDS


                                                           0Vdc



                     V1


                     -4



                                  0




Simulation Result

      ID=-0.8A, VGS=-4V           Measurement                         Simulation       Error (%)
        R DS (on) (m)                             125.000                 124.967          -0.026



                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Gate Charge Characteristic
Circuit Simulation result

               -10V




                -8V




                -6V




                -4V




                -2V




                0V
                      0      -1n    -2n        -3n   -4n      -5n      -6n     -7n    -8n    -9n
                          V(W1:4)
                                                           Time*-1mA


Evaluation circuit



                                                                             U1
                                                                             SSM3J108TU
                                      ION = 0uA
                                      IOFF = 1mA
                                      W
                                           -
                                          +                                                             I2
                                                                                              D2        1.5
                I1 = 0                W1                                                      Dbreak
                               I1
                I2 = 1m
                TD = 0                                                                                  V1
                TR = 10n
                TF = 10n
                PW = 600u                                                                               -15
                PER = 1000u


                                                                         0



Simulation Result

       VDD=-15V,ID=-1.5A
                          Measurement                                  Simulation              Error (%)
          ,VGS=-10V
                  Qgs(nc)        0.800                                               0.802              0.250
                  Qgd(nc)        0.800                                               0.802              0.250
                   Qg(nc)        9.000                                               8.986             -0.156


                All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Capacitance Characteristic




                                                            Measurement
                                                            Simulation




Simulation Result


                                      Cbd(pF)
           VDS(V)                                                   Error(%)
                        Measurement            Simulation
              1.000               17.600               17.598            -0.011
              2.000               15.200               15.202             0.013
              5.000               12.200               12.211             0.090
             10.000               10.200               10.203             0.029
             20.000                8.500                8.516             0.188




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Switching Time Characteristic

Circuit Simulation result


            -20V




            -15V




            -10V




              -5V




                  0V
                  1.80us      1.88us       1.96us          2.04us           2.12us    2.20us
                       V(L1:2)*4   V(R2:2)
                                                    Time


Evaluation circuit

                                                              L2              R2


                                                                   50nH          40



                                                                    U1
                                                                    SSM3J108TU
                                      L1
                                                                                               V1
         PER = 200u                                                                            -10Vdc
         PW = 10u                     30nH
         TF = 1n
         TR = 1n                     R1
         TD = 2u
         V2 = 2.5      V2             4.7

         V1 = 0



                                                               0



Simulation Result

      ID=-0.25A, VDD=-10V
                                    Measurement              Simulation               Error(%)
           VGS=-2.5V
             Ton(ns)                          12.000                      12.072           0.600


                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Output Characteristic

Circuit Simulation result


        -5.0A




        -4.0A
                                                                               -2.5V


        -3.0A




        -2.0A

                                                                               -1.8V


        -1.0A                                                                  -1.5V


                                                                        VGS=-1.2V
          0A
            0V                  -0.2V   -0.4V            -0.6V         -0.8V       -1.0V
                 I(V3)
                                                 V_V2


Evaluation circuit



                                                V3


                                                     0Vdc



                                            U1
                                            SSM3J108TU
                                                                  V2


                                                                 -1

                          V1


                         -1.2



                                        0




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Forward Current Characteristic

Circuit Simulation Result


     1.0A




    100mA




     10mA




    1.0mA
         0V            0.2V              0.4V           0.6V         0.8V   1.0V
              I(VD_Sense)
                                                V_VDS



Evaluation Circuit


                              VD_Sense


                              0Vdc



                                                        U1
                                                        SSM3J108TU
                 VDS
                10Vdc




                                            0




                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Comparison Graph

Circuit Simulation Result

                                      1.00
                                                     Measurement
                                                     Simulation
       Drain reverse current IDR(A)




                                      0.10




                                      0.01




                                      0.00
                                             0           0.2          0.4        0.6           0.8          1

                                                               Drain : Source voltage VDS(V)


Simulation Result


                                                        VDS(V)                     VDS(V)
       IDR(A)                                                                                           %Error
                                                      Measurement                Simulation
                                       0.001                   0.425                      0.420                 -1.176
                                       0.002                   0.440                      0.441                  0.227
                                       0.005                   0.465                      0.469                  0.860
                                       0.010                   0.490                      0.493                  0.612
                                       0.020                   0.525                      0.520                 -0.952
                                       0.050                   0.565                      0.565                  0.000
                                       0.100                   0.600                      0.605                  0.833
                                       0.200                   0.650                      0.651                  0.154
                                       0.500                   0.730                      0.724                 -0.822
                                       1.000                   0.795                      0.799                  0.503


                                             All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Reverse Recovery Characteristic

Circuit Simulation Result

       400mA




       200mA




          0A




      -200mA




      -400mA
          0.98us             1.00us             1.02us              1.04us        1.06us   1.08us
               I(R1)
                                                         Time

Evaluation Circuit


                                      R1


                                           50


               V1 = -9.5v     V1                                    U1
               V2 = 10.6v                                           DSSM3J108TU
               TD = 12n
               TR = 5ns
               TF = 5ns
               PW = 1us
               PER = 100us




                                                                0


Compare Measurement vs. Simulation

                               Measurement                              Simulation            Error (%)
        Trj(ns)                         4.200                                   4.220               0.476
        trb(ns)                         8.800                                   8.817               0.193
        trr(ns)                        13.000                                  13.037               0.285


                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Reverse Recovery Characteristic                                        Reference




Trj=4.2(ns)
Trb=8.8(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Zener Voltage Characteristic

Circuit Simulation Result


        0uA




        2uA




        4uA




        6uA




        8uA




       10uA
          20V      18V        16V    14V        12V      10V     8V   6V   4V   2V   0V
                I(R1)
                                                         V_V1

Evaluation Circuit


                                               R1


                                               0.01m

                                                    U1



                         V1
                0Vdc
                                    R2


                                100MEG              SSM3J108TU



                                           0




                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Zener Voltage Characteristic                                         Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2008

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SPICE MODEL of SSM3J108TU (Professional+BDP Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Professional) PART NUMBER: SSM3J108TU MANUFACTURER: TOSHIBA Body Diode (Professional) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 2. MOSFET MODEL Pspice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Modility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 3. Transconductance Characteristic Circuit Simulation Result 100.00 Measurement Simulation 10.00 gfs 1.00 0.10 0.01 0.0 0.2 0.4 0.6 0.8 1.0 - ID : Drain Curre nt A Comparison table gfs -Id(A) Error(%) Measurement Simulation 0.001 0.048 0.050 4.167 0.002 0.097 0.100 3.093 0.005 0.164 0.167 1.829 0.010 0.246 0.250 1.626 0.020 0.328 0.333 1.524 0.050 0.620 0.625 0.806 0.100 0.902 0.909 0.776 0.200 1.241 1.250 0.725 0.500 1.776 1.786 0.563 1.000 2.483 2.500 0.685 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 4. Vgs-Id Characteristic Circuit Simulation result -10A -1.0mA 0V -0.2V -0.4V -0.6V -0.8V -1.0V -1.2V -1.4V -1.6V -1.8V I(V3) V_V1 Evaluation circuit V3 0Vdc U1 SSM3J108TU V2 -3 V1 -1.2 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 5. Comparison Graph Circuit Simulation Result 10.00 Measurement Simulation 1.00 - ID : Drain Current A 0.10 0.01 0.0 1.0 2.0 - VGS : Gate to Source Voltage V Simulation Result -VGS(V) -ID(A) Error (%) Measurement Simulation 0.001 0.820 0.843 2.805 0.002 0.834 0.853 2.278 0.005 0.850 0.873 2.706 0.010 0.900 0.895 -0.556 0.020 0.930 0.925 -0.538 0.050 1.000 0.988 -1.200 0.100 1.060 1.057 -0.283 0.200 1.150 1.155 0.435 0.500 1.340 1.350 0.746 1.000 1.530 1.571 2.680 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 6. Rds(on) Characteristic Circuit Simulation result -1.0A -0.5A 0A 0V -50mV -100mV -150mV I(V3) V_VDS Evaluation circuit V3 0Vdc U1 SSM3J108TU VDS 0Vdc V1 -4 0 Simulation Result ID=-0.8A, VGS=-4V Measurement Simulation Error (%) R DS (on) (m) 125.000 124.967 -0.026 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 7. Gate Charge Characteristic Circuit Simulation result -10V -8V -6V -4V -2V 0V 0 -1n -2n -3n -4n -5n -6n -7n -8n -9n V(W1:4) Time*-1mA Evaluation circuit U1 SSM3J108TU ION = 0uA IOFF = 1mA W - + I2 D2 1.5 I1 = 0 W1 Dbreak I1 I2 = 1m TD = 0 V1 TR = 10n TF = 10n PW = 600u -15 PER = 1000u 0 Simulation Result VDD=-15V,ID=-1.5A Measurement Simulation Error (%) ,VGS=-10V Qgs(nc) 0.800 0.802 0.250 Qgd(nc) 0.800 0.802 0.250 Qg(nc) 9.000 8.986 -0.156 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 8. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 1.000 17.600 17.598 -0.011 2.000 15.200 15.202 0.013 5.000 12.200 12.211 0.090 10.000 10.200 10.203 0.029 20.000 8.500 8.516 0.188 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 9. Switching Time Characteristic Circuit Simulation result -20V -15V -10V -5V 0V 1.80us 1.88us 1.96us 2.04us 2.12us 2.20us V(L1:2)*4 V(R2:2) Time Evaluation circuit L2 R2 50nH 40 U1 SSM3J108TU L1 V1 PER = 200u -10Vdc PW = 10u 30nH TF = 1n TR = 1n R1 TD = 2u V2 = 2.5 V2 4.7 V1 = 0 0 Simulation Result ID=-0.25A, VDD=-10V Measurement Simulation Error(%) VGS=-2.5V Ton(ns) 12.000 12.072 0.600 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 10. Output Characteristic Circuit Simulation result -5.0A -4.0A -2.5V -3.0A -2.0A -1.8V -1.0A -1.5V VGS=-1.2V 0A 0V -0.2V -0.4V -0.6V -0.8V -1.0V I(V3) V_V2 Evaluation circuit V3 0Vdc U1 SSM3J108TU V2 -1 V1 -1.2 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 11. Forward Current Characteristic Circuit Simulation Result 1.0A 100mA 10mA 1.0mA 0V 0.2V 0.4V 0.6V 0.8V 1.0V I(VD_Sense) V_VDS Evaluation Circuit VD_Sense 0Vdc U1 SSM3J108TU VDS 10Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 12. Comparison Graph Circuit Simulation Result 1.00 Measurement Simulation Drain reverse current IDR(A) 0.10 0.01 0.00 0 0.2 0.4 0.6 0.8 1 Drain : Source voltage VDS(V) Simulation Result VDS(V) VDS(V) IDR(A) %Error Measurement Simulation 0.001 0.425 0.420 -1.176 0.002 0.440 0.441 0.227 0.005 0.465 0.469 0.860 0.010 0.490 0.493 0.612 0.020 0.525 0.520 -0.952 0.050 0.565 0.565 0.000 0.100 0.600 0.605 0.833 0.200 0.650 0.651 0.154 0.500 0.730 0.724 -0.822 1.000 0.795 0.799 0.503 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 13. Reverse Recovery Characteristic Circuit Simulation Result 400mA 200mA 0A -200mA -400mA 0.98us 1.00us 1.02us 1.04us 1.06us 1.08us I(R1) Time Evaluation Circuit R1 50 V1 = -9.5v V1 U1 V2 = 10.6v DSSM3J108TU TD = 12n TR = 5ns TF = 5ns PW = 1us PER = 100us 0 Compare Measurement vs. Simulation Measurement Simulation Error (%) Trj(ns) 4.200 4.220 0.476 trb(ns) 8.800 8.817 0.193 trr(ns) 13.000 13.037 0.285 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 14. Reverse Recovery Characteristic Reference Trj=4.2(ns) Trb=8.8(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 15. Zener Voltage Characteristic Circuit Simulation Result 0uA 2uA 4uA 6uA 8uA 10uA 20V 18V 16V 14V 12V 10V 8V 6V 4V 2V 0V I(R1) V_V1 Evaluation Circuit R1 0.01m U1 V1 0Vdc R2 100MEG SSM3J108TU 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 16. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2008