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Device Modeling Report



COMPONENTS: Power MOSFET (Model Parameter)
PART NUMBER: 2SK3454
MANUFACTURER: NEC
Body Diode (Model Parameter) / ESD Protection Diode




                  Bee Technologies Inc.




    All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
MOSFET MODEL

Pspice model
                                      Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
     RG        Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
      N        Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
   DELTA       Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Modility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
     UO        Surface Mobility




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Transconductance Characteristic

Circuit Simulation Result


         5
                     Measurement
                     Simulation


         4




         3
   gfs




         2




         1




         0
             0           1             2             3             4            5
                                    ID : Drain Current A


Comparison table

         Id(A)                             gfs                          Error(%)

                       Measurement               Simulation

             0.001                 0.012                   0.013                 4.839
             0.002                 0.048                   0.050                 4.167
             0.005                 0.080                   0.083                 3.750
              0.01                 0.106                   0.111                 4.717
              0.02                 0.213                   0.222                 4.225
              0.05                 0.257                   0.263                 2.335
               0.1                 0.475                   0.455                -4.211
               0.2                 0.634                   0.659                 3.943
               0.5                 1.002                   1.042                 3.992
                 1                 1.246                   1.300                 4.334


                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Vgs-Id Characteristic

Circuit Simulation result



      1.0KA


       100A


        10A


       1.0A


      100mA


       10mA


      1.0mA


      100uA
           0V             4V            8V             12V            16V       20V
                I(V3)
                                               V_V2


Evaluation circuit



                                          V3


                                        U1      0Vdc
                                        2SK3454



                                                         Vv ariable

                10Vdc
                                                             10Vdc


                V2




                                    0




                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Comparison Graph

Circuit Simulation Result

                           100.000
                                            Measurement
                                            Simulation


                            10.000
    ID : Drain Current A




                             1.000




                             0.100




                             0.010




                             0.001
                                  0.00          4.00           8.00        12.00           16.00        20.00
                                                         VGS : Gate to Source Voltage V


Simulation Result


                           ID(A)                              VGS(V)                               Error (%)
                                           Measurement                 Simulation

                              0.001                       3.640                    3.564                 -2.088
                              0.002                       3.730                    3.592                 -3.700
                              0.005                       3.760                    3.636                 -3.298
                              0.010                       3.810                    3.685                 -3.281
                              0.020                       3.865                    3.755                 -2.846
                              0.050                       4.053                    3.892                 -3.972
                              0.100                       4.213                    4.053                 -3.798
                              0.200                       4.420                    4.265                 -3.507
                              0.500                       4.770                    4.708                 -1.300
                              1.000                       5.070                    5.238                  3.314
                              2.000                       5.665                    5.929                  4.660
                              5.000                       7.012                    7.362                  4.991


                                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Rds(on) Characteristic

Circuit Simulation result

        7.0A


        6.0A


        5.0A


        4.0A


        3.0A


        2.0A


        1.0A


          0A
            0V                    1.0V                    2.0V               3.0V
                 I(V3)
                                             V_VDS


Evaluation circuit


                                            V3


                                         U1        0Vdc
                                         2SK3454




                                                          VDS

                 10Vdc
                                                          0Vdc


                 VGS




                                    0



Simulation Result

       ID=4A, VGS=10V             Measurement              Simulation            Error (%)
         R DS (on) ()                           0.500              0.499           -0.200



                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Gate Charge Characteristic
Circuit Simulation result

           14V



           12V



           10V



            8V



            6V



            4V



            2V



            0V
                 0                      5n                      10n              15n               20n
                     V(W1:3)
                                                            Time*1mS




Evaluation circuit

                                                                            V2


                                                                                     0Vdc
                                                                           U1
                                                                           2SK3454

                     PER = 1000u                                                       Dbreak
                     PW = 600u                   W1
                     TF = 10n                      +                                    D1
                     TR = 10n                                                                   I2
                                                   -
                     TD = 0                                                                     7Adc
                     I2 = 1m                     W
                                   I1        IOFF = 0.1mA
                     I1 = 0                  ION = 0uA

                                                                                                V1
                                                                                                200Vdc



                                                            0



Simulation Result

        VDD=200V,ID=7A                  Measurement                    Simulation               Error (%)
           ,VGS=10V
                 Qgs(nc)                                3.500                  3.509                 0.257
                Qgd(nc)                                10.000                 10.060                 0.600
                  Qg(nc)                               18.000                 14.930               -17.056


                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Capacitance Characteristic




                                                        Measurement
                                                        Simulation




Simulation Result


           VDS(V)                     Cbd(pF)                        Error(%)
                          Measurement          Simulation

                    0.1         179.000               179.070             0.039
                    0.2         169.200               169.180            -0.012
                    0.5         147.900               147.850            -0.034
                      1         128.500               128.498            -0.002
                      2         108.000               108.021             0.019
                      5          68.000                67.985            -0.022




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Switching Time Characteristic

Circuit Simulation result


         15.0V




         12.5V




         10.0V




          7.5V




          5.0V




          2.5V




           0V
           1.85us          1.90us     1.95us        2.00us     2.05us          2.10us     2.15us
                V(2)     V(3)/12.5
                                                     Time


Evaluation circuit


                                                               3         L2

                                                                         10u


                                                                   U1
                                                                   2SK3454                    RL
                                R1           L1       2
                                                                                              31.25
             V1 = 0
                                 10          30nH
             V2 = 20      V2                                                              VDD
             TD = 2u                   R2                                      125Vdc
             TR = 6n
             TF = 7n                    10
             PW = 1u
             PER = 10u


                                                                                          0



Simulation Result

        ID=4A, VDD=125V               Measurement            Simulation                 Error(%)
            VGS=10V
            Ton(ns)                               11.000             11.066                        0.600


                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Output Characteristic

Circuit Simulation result


        30A




                                                                        VGS=10V


        20A




        10A




         0A
           0V            10V        20V         30V          40V        50V       60V
                I(Vdsense)
                                            V_Vvariable


Evaluation circuit



                                             Vdsense


                                                    0Vdc
                                          U1
                                          2SK3454



                                                           Vv ariable
                 10Vdc

                                                           0Vdc

                 Vstep




                                      0




                   All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
BODY DIODE SPICE MODEL

Forward Current Characteristic

Circuit Simulation Result

      100A




       10A




      1.0A




     100mA
          0V                0.2V      0.4V      0.6V        0.8V       1.0V     1.2V
               I(R1)
                                                V_V1


Evaluation Circuit


                              R1


                              0.01m


                        V1
               0Vdc

                                                        2SK3454
                                                        U1




                        0




                      All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Comparison Graph

Circuit Simulation Result


                                   100.00
                                                   Measurement
                                                   Simulation



                                    10.00
    Drain reverse current IDR(A)




                                     1.00




                                     0.10




                                     0.01
                                            0        0.2        0.4      0.6        0.8        1           1.2

                                                           Source: Drain voltage VSD(V)


Simulation Result


                                   IDR(A)              VDS(V)                    VDS(V)                %Error
                                                     Measurement                Simulation
                                       0.010                  0.630                      0.625                   -0.794
                                       0.020                  0.645                      0.643                   -0.310
                                       0.050                  0.660                      0.666                    0.909
                                       0.100                  0.680                      0.686                    0.882
                                       0.200                  0.700                      0.709                    1.286
                                       0.500                  0.740                      0.747                    0.946
                                       1.000                  0.780                      0.787                    0.897
                                       2.000                  0.850                      0.837                   -1.529
                                       5.000                  0.930                      0.934                    0.430


                                            All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Reverse Recovery Characteristic

Circuit Simulation Result

        400mA


        300mA


        200mA


        100mA


         -0mA


       -100mA


       -200mA


       -300mA


       -400mA
           18.8us           19.6us         20.4us          21.2us             22.0us   22.8us
                I(R1)
                                                    Time

Evaluation Circuit



                                      R1


                                      50

                  V1 = -9.4v     V1
                  V2 = 10.7v
                  TD = 100n
                  TR = 10ns
                  TF = 19ns                                         2SK3454
                  PW = 20us                                         U1
                  PER = 100us




                                 0



Compare Measurement vs. Simulation

                                Measurement                 Simulation                 Error (%)
        Trr(ns)                   680.000                    680.518                     0.076




                All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Reverse Recovery Characteristic                                        Reference




Trj=416(ns)
Trb=264(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
ESD PROTECTION DIODE SPICE MODEL

Zener Voltage Characteristic

Circuit Simulation Result
        10mA

         9mA

         8mA

         7mA

         6mA

         5mA

         4mA

         3mA

         2mA

         1mA

          0A
            0V      10V   20V   30V        40V   50V     60V      70V   80V   90V
                 I(R1)
                                                 V_V1




Evaluation Circuit


                                      R1



                                 0.01m




                          V1
                  0Vdc

                                  R2                    U1
                                                        2SK3454
                                 100MEG


                          0




                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Zener Voltage Characteristic                                         Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2008

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SPICE MODEL of 2SK3454 (Standard+BDS Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Model Parameter) PART NUMBER: 2SK3454 MANUFACTURER: NEC Body Diode (Model Parameter) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 2. MOSFET MODEL Pspice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Modility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 3. Transconductance Characteristic Circuit Simulation Result 5 Measurement Simulation 4 3 gfs 2 1 0 0 1 2 3 4 5 ID : Drain Current A Comparison table Id(A) gfs Error(%) Measurement Simulation 0.001 0.012 0.013 4.839 0.002 0.048 0.050 4.167 0.005 0.080 0.083 3.750 0.01 0.106 0.111 4.717 0.02 0.213 0.222 4.225 0.05 0.257 0.263 2.335 0.1 0.475 0.455 -4.211 0.2 0.634 0.659 3.943 0.5 1.002 1.042 3.992 1 1.246 1.300 4.334 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 4. Vgs-Id Characteristic Circuit Simulation result 1.0KA 100A 10A 1.0A 100mA 10mA 1.0mA 100uA 0V 4V 8V 12V 16V 20V I(V3) V_V2 Evaluation circuit V3 U1 0Vdc 2SK3454 Vv ariable 10Vdc 10Vdc V2 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 5. Comparison Graph Circuit Simulation Result 100.000 Measurement Simulation 10.000 ID : Drain Current A 1.000 0.100 0.010 0.001 0.00 4.00 8.00 12.00 16.00 20.00 VGS : Gate to Source Voltage V Simulation Result ID(A) VGS(V) Error (%) Measurement Simulation 0.001 3.640 3.564 -2.088 0.002 3.730 3.592 -3.700 0.005 3.760 3.636 -3.298 0.010 3.810 3.685 -3.281 0.020 3.865 3.755 -2.846 0.050 4.053 3.892 -3.972 0.100 4.213 4.053 -3.798 0.200 4.420 4.265 -3.507 0.500 4.770 4.708 -1.300 1.000 5.070 5.238 3.314 2.000 5.665 5.929 4.660 5.000 7.012 7.362 4.991 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 6. Rds(on) Characteristic Circuit Simulation result 7.0A 6.0A 5.0A 4.0A 3.0A 2.0A 1.0A 0A 0V 1.0V 2.0V 3.0V I(V3) V_VDS Evaluation circuit V3 U1 0Vdc 2SK3454 VDS 10Vdc 0Vdc VGS 0 Simulation Result ID=4A, VGS=10V Measurement Simulation Error (%) R DS (on) () 0.500 0.499 -0.200 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 7. Gate Charge Characteristic Circuit Simulation result 14V 12V 10V 8V 6V 4V 2V 0V 0 5n 10n 15n 20n V(W1:3) Time*1mS Evaluation circuit V2 0Vdc U1 2SK3454 PER = 1000u Dbreak PW = 600u W1 TF = 10n + D1 TR = 10n I2 - TD = 0 7Adc I2 = 1m W I1 IOFF = 0.1mA I1 = 0 ION = 0uA V1 200Vdc 0 Simulation Result VDD=200V,ID=7A Measurement Simulation Error (%) ,VGS=10V Qgs(nc) 3.500 3.509 0.257 Qgd(nc) 10.000 10.060 0.600 Qg(nc) 18.000 14.930 -17.056 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 8. Capacitance Characteristic Measurement Simulation Simulation Result VDS(V) Cbd(pF) Error(%) Measurement Simulation 0.1 179.000 179.070 0.039 0.2 169.200 169.180 -0.012 0.5 147.900 147.850 -0.034 1 128.500 128.498 -0.002 2 108.000 108.021 0.019 5 68.000 67.985 -0.022 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 9. Switching Time Characteristic Circuit Simulation result 15.0V 12.5V 10.0V 7.5V 5.0V 2.5V 0V 1.85us 1.90us 1.95us 2.00us 2.05us 2.10us 2.15us V(2) V(3)/12.5 Time Evaluation circuit 3 L2 10u U1 2SK3454 RL R1 L1 2 31.25 V1 = 0 10 30nH V2 = 20 V2 VDD TD = 2u R2 125Vdc TR = 6n TF = 7n 10 PW = 1u PER = 10u 0 Simulation Result ID=4A, VDD=125V Measurement Simulation Error(%) VGS=10V Ton(ns) 11.000 11.066 0.600 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 10. Output Characteristic Circuit Simulation result 30A VGS=10V 20A 10A 0A 0V 10V 20V 30V 40V 50V 60V I(Vdsense) V_Vvariable Evaluation circuit Vdsense 0Vdc U1 2SK3454 Vv ariable 10Vdc 0Vdc Vstep 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 11. BODY DIODE SPICE MODEL Forward Current Characteristic Circuit Simulation Result 100A 10A 1.0A 100mA 0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V I(R1) V_V1 Evaluation Circuit R1 0.01m V1 0Vdc 2SK3454 U1 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 12. Comparison Graph Circuit Simulation Result 100.00 Measurement Simulation 10.00 Drain reverse current IDR(A) 1.00 0.10 0.01 0 0.2 0.4 0.6 0.8 1 1.2 Source: Drain voltage VSD(V) Simulation Result IDR(A) VDS(V) VDS(V) %Error Measurement Simulation 0.010 0.630 0.625 -0.794 0.020 0.645 0.643 -0.310 0.050 0.660 0.666 0.909 0.100 0.680 0.686 0.882 0.200 0.700 0.709 1.286 0.500 0.740 0.747 0.946 1.000 0.780 0.787 0.897 2.000 0.850 0.837 -1.529 5.000 0.930 0.934 0.430 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 13. Reverse Recovery Characteristic Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 18.8us 19.6us 20.4us 21.2us 22.0us 22.8us I(R1) Time Evaluation Circuit R1 50 V1 = -9.4v V1 V2 = 10.7v TD = 100n TR = 10ns TF = 19ns 2SK3454 PW = 20us U1 PER = 100us 0 Compare Measurement vs. Simulation Measurement Simulation Error (%) Trr(ns) 680.000 680.518 0.076 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 14. Reverse Recovery Characteristic Reference Trj=416(ns) Trb=264(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 15. ESD PROTECTION DIODE SPICE MODEL Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 10V 20V 30V 40V 50V 60V 70V 80V 90V I(R1) V_V1 Evaluation Circuit R1 0.01m V1 0Vdc R2 U1 2SK3454 100MEG 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 16. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2008