Three-dimensional VLSI Matthew Johnson Seminar: Engineering Frontiers March 7, 2001
Contents Traditional (2D) VLSI origins scientific background manufacturing process 3D VLSI origins advantages over 2D VLSI challenges  solutions
Contents Influential participants Marketing information Impact societal semiconductor industry
VLSI Very Large Scale Integration design/manufacturing of extremely small, complex circuitry using modified semiconductor material integrated circuit (IC) may contain millions of transistors, each a few   m in size applications wide ranging: most electronic logic devices
Origins of VLSI Much development motivated by WWII need for improved electronics, especially for radar 1940 - Russell Ohl (Bell Laboratories) - first p-n junction 1948 - Shockley, Bardeen, Brattain (Bell Laboratories) - first transistor 1956 Nobel Physics Prize Late 1950s - purification of Si advances to acceptable levels for use in electronics 1958 - Seymour Cray (Control Data Corporation) - first transistorized computer - CDC 1604
Origins of VLSI 1959 - Jack St. Claire Kilby (Texas Instruments) - first integrated circuit - 10 components on 9 mm 2 1959 - Robert Norton Noyce (founder, Fairchild Semiconductor) - improved integrated circuit 1968 - Noyce, Gordon E. Moore found Intel 1971 - Ted Hoff (Intel) - first microprocessor (4004) - 2300 transistors on 9 mm 2 Since then - continued improvement in technology has allowed for increased performance as predicted by Moore’s Law
Moore’s  Law Gordon E. Moore - Chairman Emeritus of Intel Corporation 1965 - observed trends in industry - number of transistors on ICs vs. release dates Noticed number of transistors doubling with release of each new IC generation release dates (separate generations) were all 18-24 months apart Moore’s Law - The number of transistors on an integrated circuit will double every 18 months Semiconductor industry has followed this prediction with surprising accuracy
Moore’s Law From Intel’s 4040 (2300 transistors) to Pentium II (7,500,000 transistors) and beyond Relative sizes of ICs in graph
Limits of Moore’s Law? Growth expected until 30 nm gate length (currently: 180 nm) size halved every 18 mos. - reached in  2001 + 1.5 log 2 ((180/30) 2 ) =  2009 what then? Paradigm shift needed in fabrication process
Scientific principles Semiconductors Crystalline solids Impurities element groups n-type material p-type material p-n junctions
Semiconductors A material whose properties are such that it is not quite a conductor, not quite an insulator Some common semiconductors elemental Si - Silicon (most common) Ge - Germanium compound GaAs - Gallium arsenide GaP - Gallium phosphide AlAs - Aluminum arsenide AlP - Aluminum phosphide InP - Indium Phosphide
Crystalline  Solids “ In a crystalline solid, the periodic arrangement of atoms… is repeated over the entire crystal.” [Bhatt] Silicon crystal - “diamond lattice”
Impurities Silicon crystal in pure form is good insulator - all electrons are bonded to silicon atom Replacement of Si atoms can alter electrical properties of semiconductor Group number - indicates number of electrons in valence level (Si - Group IV)
Impurities Replace Si atom in crystal with Group V atom substitution of 5 electrons for 4 electrons in outer shell extra electron not needed for crystal bonding structure can move to other areas of semiconductor current flows more easily - resistivity decreases many extra electrons  -->  “donor” or n-type material Replace Si atom with Group III atom substitution of 3 electrons for 4 electrons  extra electron now needed for crystal bonding structure “ hole” created (missing electron) hole can move to other areas of semiconductor if electrons continually fill holes again, current flows more easily - resistivity decreases electrons needed  -->  “acceptor” or p-type material
P-N Junction Also known as a diode One of the basics of semiconductor technology - Created by placing n-type and p-type material in close contact Diffusion - mobile charges (holes) in p-type combine with mobile charges (electrons) in n-type
P-N Junction Region of charges left behind (dopants fixed in crystal lattice) Group III in p-type (one less proton than Si- negative charge) Group IV in n-type (one more proton than Si - positive charge) Region is totally depleted of mobile charges - “depletion region” Electric field forms due to fixed charges in the depletion region Depletion region has high resistance due to lack of mobile charges
P-N Junction Reverse bias: positive voltage placed on n-type material electrons in n-type move closer to positive terminal, holes in p-type move closer to negative terminal width of depletion region increases allowed current is essentially zero (small “drift” current)
P-N Junction Forward bias: positive voltage placed on p-type material holes in p-type move away from positive terminal, electrons in n-type move further from negative terminal depletion region becomes smaller - resistance of device decreases voltage increased until critical voltage is reached, depletion region disappears, current can flow freely
P-N Junction - V-I characteristics Voltage-Current relationship for a p-n junction (diode)
Manufacturing Crystal growth Photolithography (masks, patterning) Doping Packaging/assembly Manufacturing environment
Crystal Growth Czochralski method Silicon must be crystal to be used in ICs Crystal growth - the process of creating crystalline silicon Seed crystal (solid piece of crystalline silicon) “brought into contact with the surface of the same material in liquid phase, and then pulled slowly from the melt” [Neaman] Liquid cools, solidifies following crystal form
Crystal Growth Ingot cut to uniform diameter, then sliced into wafers Wafers machined into uniformed thickness Chemically and mechanically smoothed during “lapping” and “polishing” phases Completed silicon wafer is known as the substrate material Unmodified ingots
Photolithography Lithography - process of applying circuitry patterns to substrate Photolithography - most common lithography technique wafer covered with photoresist (light sensitive chemical) light shown through a mask onto the photoresist coating exposure to light alters properties of photoresist (“hardening”), giving it resistance to certain chemicals non-hardened photoresist washed away allows for patterns of insulation (SiO 2 ), interconnection (Al), or doping many masks/photolithography steps used for complex circuits
Doping “ The technique of adding impurity atoms (dopants) to a semiconductor in order to alter its conductivity” [Neamen] Ratio of Si atoms to dopant atoms ranges from  10 4 :1 to 10 9 :1 low level of impurity has large impact on conductivity of substrate Impurity diffusion  substrate placed in high temp. (~1000 C) gaseous atmosphere temp. lowered, impurities remain Ion implantation beam of impurity ions accelerated to high energy, directed at surface of substrate
Testing/Packaging Each circuit on wafer tested, then cut apart Circuits are encapsulated in plastic or ceramic molding, retested Packages created with leads that allow IC to be attached to printed circuit board
Three Dimensional VLSI The fabrication of a single integrated circuit whose functional parts (transistors, etc) extend in three dimensions The vertical orientation of several bare integrated circuits in a single package
Advantages of 3D VLSI Speed - the time required for a signal to travel between the functional circuit blocks in a system (delay) reduced. Delay depends on resistance/capacitance of interconnections resistance proportional to interconnection length
Advantages of 3D VLSI Noise - “unwanted disturbances on a useful signal” [Al-sarawi] reflection noise (varying impedance along interconnect) crosstalk noise (interference between interconnects) electromagnetic interference (EMI) (caused by current in pins) 3D chips fewer, shorter interconnects fewer pins
Advantages of 3D VLSI Power consumption power used charging an interconnect capacitance P = fCV 2 power dissipated through resistive material P = V 2 /R capacitance/resistance proportional to length reduced interconnect lengths will reduce power
Advantages of 3D VLSI Interconnect capacity (connectivity) more connections between chips increased functionality, ease of design
Advantages of 3D VLSI Printed circuit board size/weight planar size of PCB reduced with negligible IC height increase weight reduction due to more circuitry per package/smaller PCBs estimated 40-50 times reduction in size/weight
3D VLSI - Challenges and Solutions Challenge: Thermal management smaller packages increased circuit density  increased power density Solutions: circuit layout (design stage) high power sections uniformly distributed advancement in cooling techniques  (heat pipes)
3D VLSI - Challenges and Solutions Challenge: lack of software to deal with complexity of 3D development Solution: same as with increasing 2D complexity - design of improved software Challenge: industry’s resistance to change ($) Solution: time/research - if proven to be most promising way to continue Moore’s Law growth, investment  will be  made
Influential Participant - Academia Georgia Tech’s Low Cost Electronics Packaging Research Center $40 million facility headed by Dr. Rao R. Tummala former IBM semiconductor researcher goals:  To carry out research, development and prototype manufacturing  To transfer this knowledge to industry.   To train future leaders in electronic package engineering
Influential Participants - Industry Mitsubishi, TI, Intel, CTS Microelectronics, Hitachi, Irvine Sensors, others... high density memories AT&T high density “multiprocessor” Many other applications/participants
Ball Semiconductor, Inc. Unique approach to 3D VLSI applying 2D VLSI technologies to surface of 1 mm sphere three-dimensional layout tool, called ABLE   (Advanced Ball Layout Editor) traditional techniques for long rectangle adapted to spherical surface over 60% of surface covered
Ball Semiconductor, Inc. Computer Simulation
Ball Semiconductor, Inc  Product Developed
Ball Semiconductor, Inc. Complex circuitry achieved with ball stacking “ Cubic VLSI by Clustering”
Market Electronics market - $668 billion 3D VLSI can influence market only with high quality products improved quality/low cost will sell Little immediate impact expected more research and small scale development needed  expensive change of fabrication process required long time-to-market Long term impact - today’s will likely be leaders in any 3D IC sales 3D VLSI will not likely change semiconductor market, only what is sold
Impact - Society Performance improvements will occur even without 3D VLSI increased influence of computers, cell phones, other common electronic devices solution to possible Moore’s Law roadblock Size reductions drastic compared to 2D VLSI Public - ignorant of causes, observant of improvements
Impact  Semiconductor Industry 3D VLSI requires major paradigm shift in industry Initial participants - large capital risk to modify fabrication process Success of one company will require shift in industry as a whole (competition) ECE/CS improvements in hardware open software and application possibilities
Three Dimensional VLSI Moore’s Law approaching physical limit Increased performance expected by market Paradigm shift needed - 3D VLSI many advantages over 2D VLSI economic limitations of fabrication overhaul will be overcome by market demand Three Dimensional VLSI may be the savior of Moore’s Law
End

Mj 3 Dvlsi

  • 1.
    Three-dimensional VLSI MatthewJohnson Seminar: Engineering Frontiers March 7, 2001
  • 2.
    Contents Traditional (2D)VLSI origins scientific background manufacturing process 3D VLSI origins advantages over 2D VLSI challenges solutions
  • 3.
    Contents Influential participantsMarketing information Impact societal semiconductor industry
  • 4.
    VLSI Very LargeScale Integration design/manufacturing of extremely small, complex circuitry using modified semiconductor material integrated circuit (IC) may contain millions of transistors, each a few  m in size applications wide ranging: most electronic logic devices
  • 5.
    Origins of VLSIMuch development motivated by WWII need for improved electronics, especially for radar 1940 - Russell Ohl (Bell Laboratories) - first p-n junction 1948 - Shockley, Bardeen, Brattain (Bell Laboratories) - first transistor 1956 Nobel Physics Prize Late 1950s - purification of Si advances to acceptable levels for use in electronics 1958 - Seymour Cray (Control Data Corporation) - first transistorized computer - CDC 1604
  • 6.
    Origins of VLSI1959 - Jack St. Claire Kilby (Texas Instruments) - first integrated circuit - 10 components on 9 mm 2 1959 - Robert Norton Noyce (founder, Fairchild Semiconductor) - improved integrated circuit 1968 - Noyce, Gordon E. Moore found Intel 1971 - Ted Hoff (Intel) - first microprocessor (4004) - 2300 transistors on 9 mm 2 Since then - continued improvement in technology has allowed for increased performance as predicted by Moore’s Law
  • 7.
    Moore’s LawGordon E. Moore - Chairman Emeritus of Intel Corporation 1965 - observed trends in industry - number of transistors on ICs vs. release dates Noticed number of transistors doubling with release of each new IC generation release dates (separate generations) were all 18-24 months apart Moore’s Law - The number of transistors on an integrated circuit will double every 18 months Semiconductor industry has followed this prediction with surprising accuracy
  • 8.
    Moore’s Law FromIntel’s 4040 (2300 transistors) to Pentium II (7,500,000 transistors) and beyond Relative sizes of ICs in graph
  • 9.
    Limits of Moore’sLaw? Growth expected until 30 nm gate length (currently: 180 nm) size halved every 18 mos. - reached in 2001 + 1.5 log 2 ((180/30) 2 ) = 2009 what then? Paradigm shift needed in fabrication process
  • 10.
    Scientific principles SemiconductorsCrystalline solids Impurities element groups n-type material p-type material p-n junctions
  • 11.
    Semiconductors A materialwhose properties are such that it is not quite a conductor, not quite an insulator Some common semiconductors elemental Si - Silicon (most common) Ge - Germanium compound GaAs - Gallium arsenide GaP - Gallium phosphide AlAs - Aluminum arsenide AlP - Aluminum phosphide InP - Indium Phosphide
  • 12.
    Crystalline Solids“ In a crystalline solid, the periodic arrangement of atoms… is repeated over the entire crystal.” [Bhatt] Silicon crystal - “diamond lattice”
  • 13.
    Impurities Silicon crystalin pure form is good insulator - all electrons are bonded to silicon atom Replacement of Si atoms can alter electrical properties of semiconductor Group number - indicates number of electrons in valence level (Si - Group IV)
  • 14.
    Impurities Replace Siatom in crystal with Group V atom substitution of 5 electrons for 4 electrons in outer shell extra electron not needed for crystal bonding structure can move to other areas of semiconductor current flows more easily - resistivity decreases many extra electrons --> “donor” or n-type material Replace Si atom with Group III atom substitution of 3 electrons for 4 electrons extra electron now needed for crystal bonding structure “ hole” created (missing electron) hole can move to other areas of semiconductor if electrons continually fill holes again, current flows more easily - resistivity decreases electrons needed --> “acceptor” or p-type material
  • 15.
    P-N Junction Alsoknown as a diode One of the basics of semiconductor technology - Created by placing n-type and p-type material in close contact Diffusion - mobile charges (holes) in p-type combine with mobile charges (electrons) in n-type
  • 16.
    P-N Junction Regionof charges left behind (dopants fixed in crystal lattice) Group III in p-type (one less proton than Si- negative charge) Group IV in n-type (one more proton than Si - positive charge) Region is totally depleted of mobile charges - “depletion region” Electric field forms due to fixed charges in the depletion region Depletion region has high resistance due to lack of mobile charges
  • 17.
    P-N Junction Reversebias: positive voltage placed on n-type material electrons in n-type move closer to positive terminal, holes in p-type move closer to negative terminal width of depletion region increases allowed current is essentially zero (small “drift” current)
  • 18.
    P-N Junction Forwardbias: positive voltage placed on p-type material holes in p-type move away from positive terminal, electrons in n-type move further from negative terminal depletion region becomes smaller - resistance of device decreases voltage increased until critical voltage is reached, depletion region disappears, current can flow freely
  • 19.
    P-N Junction -V-I characteristics Voltage-Current relationship for a p-n junction (diode)
  • 20.
    Manufacturing Crystal growthPhotolithography (masks, patterning) Doping Packaging/assembly Manufacturing environment
  • 21.
    Crystal Growth Czochralskimethod Silicon must be crystal to be used in ICs Crystal growth - the process of creating crystalline silicon Seed crystal (solid piece of crystalline silicon) “brought into contact with the surface of the same material in liquid phase, and then pulled slowly from the melt” [Neaman] Liquid cools, solidifies following crystal form
  • 22.
    Crystal Growth Ingotcut to uniform diameter, then sliced into wafers Wafers machined into uniformed thickness Chemically and mechanically smoothed during “lapping” and “polishing” phases Completed silicon wafer is known as the substrate material Unmodified ingots
  • 23.
    Photolithography Lithography -process of applying circuitry patterns to substrate Photolithography - most common lithography technique wafer covered with photoresist (light sensitive chemical) light shown through a mask onto the photoresist coating exposure to light alters properties of photoresist (“hardening”), giving it resistance to certain chemicals non-hardened photoresist washed away allows for patterns of insulation (SiO 2 ), interconnection (Al), or doping many masks/photolithography steps used for complex circuits
  • 24.
    Doping “ Thetechnique of adding impurity atoms (dopants) to a semiconductor in order to alter its conductivity” [Neamen] Ratio of Si atoms to dopant atoms ranges from 10 4 :1 to 10 9 :1 low level of impurity has large impact on conductivity of substrate Impurity diffusion substrate placed in high temp. (~1000 C) gaseous atmosphere temp. lowered, impurities remain Ion implantation beam of impurity ions accelerated to high energy, directed at surface of substrate
  • 25.
    Testing/Packaging Each circuiton wafer tested, then cut apart Circuits are encapsulated in plastic or ceramic molding, retested Packages created with leads that allow IC to be attached to printed circuit board
  • 26.
    Three Dimensional VLSIThe fabrication of a single integrated circuit whose functional parts (transistors, etc) extend in three dimensions The vertical orientation of several bare integrated circuits in a single package
  • 27.
    Advantages of 3DVLSI Speed - the time required for a signal to travel between the functional circuit blocks in a system (delay) reduced. Delay depends on resistance/capacitance of interconnections resistance proportional to interconnection length
  • 28.
    Advantages of 3DVLSI Noise - “unwanted disturbances on a useful signal” [Al-sarawi] reflection noise (varying impedance along interconnect) crosstalk noise (interference between interconnects) electromagnetic interference (EMI) (caused by current in pins) 3D chips fewer, shorter interconnects fewer pins
  • 29.
    Advantages of 3DVLSI Power consumption power used charging an interconnect capacitance P = fCV 2 power dissipated through resistive material P = V 2 /R capacitance/resistance proportional to length reduced interconnect lengths will reduce power
  • 30.
    Advantages of 3DVLSI Interconnect capacity (connectivity) more connections between chips increased functionality, ease of design
  • 31.
    Advantages of 3DVLSI Printed circuit board size/weight planar size of PCB reduced with negligible IC height increase weight reduction due to more circuitry per package/smaller PCBs estimated 40-50 times reduction in size/weight
  • 32.
    3D VLSI -Challenges and Solutions Challenge: Thermal management smaller packages increased circuit density increased power density Solutions: circuit layout (design stage) high power sections uniformly distributed advancement in cooling techniques (heat pipes)
  • 33.
    3D VLSI -Challenges and Solutions Challenge: lack of software to deal with complexity of 3D development Solution: same as with increasing 2D complexity - design of improved software Challenge: industry’s resistance to change ($) Solution: time/research - if proven to be most promising way to continue Moore’s Law growth, investment will be made
  • 34.
    Influential Participant -Academia Georgia Tech’s Low Cost Electronics Packaging Research Center $40 million facility headed by Dr. Rao R. Tummala former IBM semiconductor researcher goals: To carry out research, development and prototype manufacturing To transfer this knowledge to industry. To train future leaders in electronic package engineering
  • 35.
    Influential Participants -Industry Mitsubishi, TI, Intel, CTS Microelectronics, Hitachi, Irvine Sensors, others... high density memories AT&T high density “multiprocessor” Many other applications/participants
  • 36.
    Ball Semiconductor, Inc.Unique approach to 3D VLSI applying 2D VLSI technologies to surface of 1 mm sphere three-dimensional layout tool, called ABLE (Advanced Ball Layout Editor) traditional techniques for long rectangle adapted to spherical surface over 60% of surface covered
  • 37.
    Ball Semiconductor, Inc.Computer Simulation
  • 38.
    Ball Semiconductor, Inc Product Developed
  • 39.
    Ball Semiconductor, Inc.Complex circuitry achieved with ball stacking “ Cubic VLSI by Clustering”
  • 40.
    Market Electronics market- $668 billion 3D VLSI can influence market only with high quality products improved quality/low cost will sell Little immediate impact expected more research and small scale development needed expensive change of fabrication process required long time-to-market Long term impact - today’s will likely be leaders in any 3D IC sales 3D VLSI will not likely change semiconductor market, only what is sold
  • 41.
    Impact - SocietyPerformance improvements will occur even without 3D VLSI increased influence of computers, cell phones, other common electronic devices solution to possible Moore’s Law roadblock Size reductions drastic compared to 2D VLSI Public - ignorant of causes, observant of improvements
  • 42.
    Impact SemiconductorIndustry 3D VLSI requires major paradigm shift in industry Initial participants - large capital risk to modify fabrication process Success of one company will require shift in industry as a whole (competition) ECE/CS improvements in hardware open software and application possibilities
  • 43.
    Three Dimensional VLSIMoore’s Law approaching physical limit Increased performance expected by market Paradigm shift needed - 3D VLSI many advantages over 2D VLSI economic limitations of fabrication overhaul will be overcome by market demand Three Dimensional VLSI may be the savior of Moore’s Law
  • 44.