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IRJET- Reduction of Power, Leakage and Area of a Standard Cell Asics using Threshold Logic Flip Flops and Power Gating Techniques
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IRJET- Reduction of Power, Leakage and Area of a Standard Cell Asics using Threshold Logic Flip Flops and Power Gating Techniques
1.
International Research Journal
of Engineering and Technology (IRJET) e-ISSN: 2395-0056 Volume: 06 Issue: 05 | May 2019 www.irjet.net p-ISSN: 2395-0072 © 2019, IRJET | Impact Factor value: 7.211 | ISO 9001:2008 Certified Journal | Page 4867 Reduction of Power, Leakage and Area of a Standard Cell ASICs using Threshold Logic Flip Flops and Power Gating Techniques Karthika Aravind1, Nidiya Habeeb2, Saju A3 1PG Scholar, Dept. Of ECE, MCET, Pathanamthitta, Kerala 2Associate Professor, Dept. of ECE, MCET, Pathanamthitta, Kerala 3Research Scholar, VTU, Karnataka ----------------------------------------------------------------------------------***---------------------------------------------------------------------------------- Abstract - In this paper, a new approach to reduce dynamic power, leakage, and area of standard cell ASICs, without sacrificing itsperformance isdescribed.The approachisbased on designing a threshold logic gates (TLGs) and its integration with the conventional standard-cell design flow.Thethreshold gate behaves as a multi-input, single- output, edge triggered flip-flop,whichcomputesathreshold functionofthe inputson the clockedge.The functionrealized bya giventhresholdgate is determined by how signals are mapped to its inputs. Here pulsed inputs of varying width are provided at the input. The resulting circuits, with both conventional and TLGs (called hybrid circuits), are placed and routed using commercial tools. Here the tool used is Tanner tool v13. The power gating techniques is used along with threshold logic gates to reduce the leakage and dynamic power dissipation. This power gating method along with TLF improves the area and power of the ASIC circuits. The proposed circuit is designed in 45nm technology. A significant reduction in power, leakage, and area of the hybrid circuits when compared with the conventional logic circuits is observed. Key Words: MTCMOS, Threshold logic Flip flop (TLF), Power Gating Techniques. 1. INTRODUCTION The demand and popularity of portable electronicsisdriving designers to strive for smaller silicon area, higher speed, longer battery life and more reliability. Power is one of the premium resource a designer tries to save when designing a system. In every circuit, power dissipation occurs. It is not possible to eliminate it completely but the amount of dissipation can be reduced. Conventional ASIC design involves constructing network of CMOS logic gates to implement a given function. Low power Application specific integratedcircuit(ASIC) design resultsinincreased battery life and reliability enhancement. In this paper, a threshold logic gate methodology is used along with some power reduction techniques to improve the ASIC performance. This methodology is based on the design of threshold logic gates and its integration with conventional standard cell design. Threshold gate is a multiple input, single output, edge triggered flip flop. This flip flop computes the threshold function of the inputs on the clock edge. The resulting circuit is a hybrid circuit which is the combination of conventional logic gates and threshold logic cells. By using this hybrid circuit, the power dissipation can be reduced compared to conventional designs. First we have analysed the architecture and operation of basic PNAND cell. After that a new approach for computing threshold is implemented. Finally this new approach is combined with power gating techniques to reduce the dynamic and leakagepowerdissipationinthecircuit.Sothe final design will have the combination of conventional standardcells(AND,OR, NAND,NOR)andPNANDcell. 2. THRESHOLDLOGICFLIPFLOP The fig-1 shows the basic schematic of threshold gate with k- inputs, referred to as PNAND-k cell. The circuit consists of three parts, namely, input network, sense amplifier and SR latch. The input network is divided into two networks namely Left input network (LIN) and Rightinputnetwork(RIN).Both these networks arecomplement to each other.
2.
International Research Journal
of Engineering and Technology (IRJET) e-ISSN: 2395-0056 Volume: 06 Issue: 05 | May 2019 www.irjet.net p-ISSN: 2395-0072 © 2019, IRJET | Impact Factor value: 7.211 | ISO 9001:2008 Certified Journal | Page 4868 Fig -1: Basic PNAND cell In the circuit, CLK is used as the reset pin. If CLK = 0, the circuitwillreset.IfCLKmakesachangefrom0to1,thenthe circuitwill be enabled. The cell operates in two phases. One is the reset phase and the other is the evaluation phase. When CLK = 0, the circuit is in reset phase and when CLK changes from 0 to 1, it is in evaluation phase. So here the difference in conductivity betweenthetwoinputnetworki.e. LIN (Leftinput network)andRIN(Rightinput network)is sensedandamplified.Thegreater the difference, the faster and more reliably the cell operates. The difference in conductance is mainly determined by the number of active devices intheinput networks.Hereinthisbasic PNANDcell, asignalassignmentmethodcalledopticalsignal assignment is used to compute the threshold function of thegiveninputs. In the basic PNAND-k cell, the library of PNAND-k cells with k = 3,5,7,9 can realize 71 basic functions. By using the OSA method a set of valid threshold functioncan be generatedfor a given set ofinputs. 3. ANEWAPPROACH FOR TLF For a threshold gate, here we are using the basic PNAND cell with a different logic method. Instead of using OSA method for computing the threshold function to realize a given functionality, a pulsed input of varying width is applied to the input network. This is due to the reason that when the thresholdincreases,thedepletionwidthalsoincreasesand hencetheleakage decreases and when threshold decreases, the depletion width decreases and therefore leakage increases. So in order to reduce the leakage, the threshold valueneedtobeincreased.Thiscanbeachievedbyadjusting theaccesstransistorintheinput networks.Byadjustingthe access transistor, the threshold voltagecan be varied. 4. POWER GATINGTECHNIQUES Power gating technique is one of the most efficient techniques used to reduce the power consumption. This technique is used in integrated circuit design to reduce power consumption, byshutting offthecurrent blocksofthe circuit that are not in use which means it transfers the energytocircuitonlyduringtheactivemodeandnotinthe standby mode. Thereareanumberofpowergatingtechniquesareexistbut hereinthis paperonlythree suchtechnique is considered, namely stack, sleep and MTCMOS techniques. In sleep method the sleep transistor isolate the logic network and hence it reduces the leakage power during the sleepmode. Theleakagepowerreductioninstacktechnique is achieved by splitting an existing transistor into two half sizetransistors.The Sleepy Stack Technique joins the Stack and Sleep systems. The current transistors splitted into two half size transistors in the Sleepy Stack system like as Stack procedure. Between the splitted transistors one of the sleep transistors will be placed in parallel. The leakage current is suppressed by the stack transistor and saves the state. While the sleep transistor will be off during the sleep mode. Sleep transistor is placed in parallel to the one of the stacked transistor andin activemodeitreduces delay&resistance of thepath. So power gating uses low-leakage PMOS transistors as header switches to shut off power supplies to parts of a circuit in
3.
International Research Journal
of Engineering and Technology (IRJET) e-ISSN: 2395-0056 Volume: 06 Issue: 05 | May 2019 www.irjet.net p-ISSN: 2395-0072 © 2019, IRJET | Impact Factor value: 7.211 | ISO 9001:2008 Certified Journal | Page 4869 standby or sleep mode. NMOS footer switches can also be used as sleep transistors. Inserting the sleep transistors splits the power network into a permanent power network connectedto thepowersupply anda virtual power network that drives the cells and can be turned off. Usually a high VT sleep transistors are used for powergating, in a technique also known as multi-threshold CMOS (MTCMOS). The sizing of sleep transistor is an important design parameter. 4.1. CircuitworkingusingPowergatingtechniques ThecircuitdiagramincorporatingtheTLFandPowergating techniques is shown inFig-2. Fig -2: The proposed architecture The sleep technique is applied at the CLK circuit. Here the header switch conducts only in the active mode which is used to reduce the leakage power dissipation. Footer switch conducts during the standby mode to reduce the dynamic power dissipation. By using MTCMOS technique, a boot up voltage is applied to the body bias terminal. It causes the threshold voltage to increases which helps to reduce the leakage powerdissipation. 5. SIMULATION RESULT Fig -3: Simulation result for proposed design
4.
International Research Journal
of Engineering and Technology (IRJET) e-ISSN: 2395-0056 Volume: 06 Issue: 05 | May 2019 www.irjet.net p-ISSN: 2395-0072 © 2019, IRJET | Impact Factor value: 7.211 | ISO 9001:2008 Certified Journal | Page 4870 Table -1: Result Comparison Average power consumed (mW) Technology Implemented Conventional Threshold Logic Flip flop 9.665 65 TLF with Power gating Techniques 2.65 45 6. CONCLUSION In this paper, a new approach for power reduction in standard cell ASIC using a combination of conventional logic gate, threshold flip flop and power gating technique is described. It is observed from the output that the new approach consumes less power compared to the existing design and occupies less area without satisfying the speed. Use of power reduction techniques in TLF improves the performanceoftheoverallcircuit.Asignificantimprovement in power, leakage and area were observed. About 73% power reduction is achieved in the proposed design. The proposed design can also be implementedusingregistersso that more data can be stored. Finfet and CNT can be viewed as the future implantation for this design for standard cell ASICs. REFERENCES [1] Niranjan Kulkarni, Jinghua Yang, Jae-Sun Seo and Sarma Vrudhula, ”Reducing Power, Leakage, and Area of Standard-Cell ASICs Using Threshold LogicFlip-Flops,” IEEE Trans. Very Large Scale Integration (VLSI) Systems,2016. [2] N. Kulkarni, N. Nukala, and S. Vrudhula, “Minimizing area and power of sequential CMOS circuits using threshold decomposition,” in Proc. Int. Conf. Comput.- Aided Design, 2012, pp.605–612. [3] T. Gowda, S. Vrudhula, N. Kulkarni, and K. Berezowski, “Identification of threshold functions and synthesis of threshold networks,”IEEETrans.Comput.-AidedDesign Integr. Circuits Syst., vol. 30, no. 5, pp. 665–677,May 2011. [4] S. Leshner, “Modeling and implementation of threshold logic circuits and architectures,” Ph.D. dissertation, Comput. Sci., ArizonaStateUniv.,Tempe,AZ,USA,2010. [5] Mishchenko, A., S. Cho, S. Chatterjee and R. Brayton, “Combinational and sequential mapping with priority cuts”, in “Proc. ICCAD’07”, pp. 354–361. [6] F. Gao and J. P. Hayes , "Total Power Reduction in CMOS Circuits via Gate Sizing and Multiple Threshold Voltages," in Proc. Design Automation Conference,2005, pp.31-36. [7] A. Abdollahi, F. Fallah, and M. Pedram, "Leakage Current Reduction in CMOS VLSI Circuits by Input Vector Control," IEEE Transactions on Very Large Scale Integration(VLSI)Systems,vol.12,no.2,pp.140-154, 2004. [8] Mishchenko, A., S. Cho, S. Chatterjee and R. Brayton (2007), “Combinational and sequential mapping with priority cuts”,in“Proc.ICCAD’07”, pp. 354–361.
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