This document discusses a cost effective RF MEMS wafer test solution using PXI hardware. Some key points: 1) PXI provides a flexible test platform that can handle both device characterization and high-volume production testing, reusing the same software and reducing costs compared to separate benchtop and ATE solutions. 2) A motherboard and daughterboard hardware solution is proposed, allowing up to 16 RF MEMS switches to be tested in various configurations with low non-recurring engineering costs. 3) Initial test results show the system can accurately measure low resistances. The solution aims to meet production testing needs at a lower capital expenditure compared to traditional automatic test equipment.