National Instruments' cofounder reflects on 40 years in test and measurement and discusses the future of the industry. Key points:
- NI helped transition the industry from hardware-focused to software-centric, with tools like LabVIEW and the philosophy that "the software is the instrument."
- Moore's Law and parallel computing allowed NI to leverage advances in hardware to continually improve software tools and deliver more value.
- Emerging technologies like IoT, wireless, and data analytics will further drive the industry, and NI is well-positioned with its software-centric approach and ecosystem of partners.
NI is a company that provides platform-based systems for test and measurement and embedded control and monitoring. Their platforms include PXI, CompactRIO, and LabVIEW software. These platforms provide modular and flexible solutions that span the design flow from design to production. Customers in industries like semiconductor testing have been able to significantly improve test speeds, coverage, and reduce development times using NI's solutions compared to traditional instrumentation. NI is focusing on growing markets like industrial internet of things, wireless infrastructure testing, and smart machines.
The document describes an RFIC test system from NI for characterizing and testing power amplifiers and front-end modules. The system provides solutions for digital pre-distortion, envelope tracking, and power amplifier characterization. It uses PXI modular instruments along with application software and example programs to automate testing of power amplifiers.
STS Characterization to Production TestHank Lydick
The document discusses bridging the gap between RF front-end module characterization and production testing. It describes how NI's semiconductor test system (STS) uses a common PXI hardware and software platform to allow characterization and production teams to use the same instrumentation and share test data, reducing time to market. The STS integrates RF and non-RF instruments into an enclosed test head and supports various wireless standards and RF measurements.
The Semiconductor Test System (STS) provides fully integrated RF test capability for testing RF front-end ICs with production-ready test systems. The STS combines NI's PXI platform, TestStand software, and LabVIEW inside an enclosed test head for RF measurements. Key features include a configurable multiport RF subsystem built around the NI vector signal transceiver for integrated RF testing, flexibility to scale from characterization to production, and world-class support from NI.
The document discusses National Instruments' (NI) semiconductor test system (STS) for high volume manufacturing at IDT. It provides an overview of IDT's tester evolution from off-the-shelf to a hybrid to NI's STS platform. The STS uses modular PXI instrumentation in a scalable tester family with excellent AC performance for testing IDT's precision timing devices.
Raymond J. O'Connell has over 30 years of experience in networking systems engineering, with a focus on the design, modeling, and development of advanced peer-to-peer networking algorithms in RF communications systems. He has held positions at several companies where he performed work on projects involving wireless networking, routing protocols, simulation modeling, and embedded systems design. Currently, he works as an independent consultant, providing expertise in areas such as wireless network design, routing protocols, and general wireless networking.
Damian Budd is an experienced electronics design engineer with over 21 years of experience. He has skills in hardware and software design, systems engineering, and project leadership. He has experience with embedded systems, DSP, wireless communications, and industrial equipment. His background includes positions at security, sensor, and avionics companies where he led projects from concept to production.
Leonid Semakov presentation Enhanced Network Performance EvaluationAlexMinov
Why Operations Support Systems (OSS) Are Not the Answer to All? Enhanced Network Performance Evaluation with Mobile Probes", Leonid Semakov, Product Engineer, Rohde & Schwarz, Germany
NI is a company that provides platform-based systems for test and measurement and embedded control and monitoring. Their platforms include PXI, CompactRIO, and LabVIEW software. These platforms provide modular and flexible solutions that span the design flow from design to production. Customers in industries like semiconductor testing have been able to significantly improve test speeds, coverage, and reduce development times using NI's solutions compared to traditional instrumentation. NI is focusing on growing markets like industrial internet of things, wireless infrastructure testing, and smart machines.
The document describes an RFIC test system from NI for characterizing and testing power amplifiers and front-end modules. The system provides solutions for digital pre-distortion, envelope tracking, and power amplifier characterization. It uses PXI modular instruments along with application software and example programs to automate testing of power amplifiers.
STS Characterization to Production TestHank Lydick
The document discusses bridging the gap between RF front-end module characterization and production testing. It describes how NI's semiconductor test system (STS) uses a common PXI hardware and software platform to allow characterization and production teams to use the same instrumentation and share test data, reducing time to market. The STS integrates RF and non-RF instruments into an enclosed test head and supports various wireless standards and RF measurements.
The Semiconductor Test System (STS) provides fully integrated RF test capability for testing RF front-end ICs with production-ready test systems. The STS combines NI's PXI platform, TestStand software, and LabVIEW inside an enclosed test head for RF measurements. Key features include a configurable multiport RF subsystem built around the NI vector signal transceiver for integrated RF testing, flexibility to scale from characterization to production, and world-class support from NI.
The document discusses National Instruments' (NI) semiconductor test system (STS) for high volume manufacturing at IDT. It provides an overview of IDT's tester evolution from off-the-shelf to a hybrid to NI's STS platform. The STS uses modular PXI instrumentation in a scalable tester family with excellent AC performance for testing IDT's precision timing devices.
Raymond J. O'Connell has over 30 years of experience in networking systems engineering, with a focus on the design, modeling, and development of advanced peer-to-peer networking algorithms in RF communications systems. He has held positions at several companies where he performed work on projects involving wireless networking, routing protocols, simulation modeling, and embedded systems design. Currently, he works as an independent consultant, providing expertise in areas such as wireless network design, routing protocols, and general wireless networking.
Damian Budd is an experienced electronics design engineer with over 21 years of experience. He has skills in hardware and software design, systems engineering, and project leadership. He has experience with embedded systems, DSP, wireless communications, and industrial equipment. His background includes positions at security, sensor, and avionics companies where he led projects from concept to production.
Leonid Semakov presentation Enhanced Network Performance EvaluationAlexMinov
Why Operations Support Systems (OSS) Are Not the Answer to All? Enhanced Network Performance Evaluation with Mobile Probes", Leonid Semakov, Product Engineer, Rohde & Schwarz, Germany
Juswanto Wardojo is an experienced electrical engineer with 22 years of experience developing RF, microwave, wireless, and fiber optic communication systems. He has expertise in C/C++, MATLAB, and CAD tools like ADS, Xilinx ISE, and PADS. Currently he works as a staff test engineer at Peregrine Semiconductor designing RF power amplifier production test platforms.
This bilingual engineer has 19 years of experience designing hardware and software architectures for embedded systems in various industries. He has extensive skills in programming languages like C/C++ and software tools. He has experience working with processors like ARM and FPGAs from Altera and Xilinx. His work experience includes projects in medical devices, telecommunications, and research involving designing electronic boards, coding firmware, and developing software.
This resume summarizes Gene Cernilli's experience as a senior engineering professional with expertise in telecom and military electronics systems design. Over 30 years of experience includes roles in embedded systems design, PCB layout, FPGA design, software development, and project engineering. He has worked on projects for companies such as Alcatel-Lucent, Aviat Networks, Qualcomm, and Ultra Electronics, leading development of products like optical network terminals, sonar systems, and medical devices.
Syed Kashan Ali is seeking a position that allows him to utilize his skills in integrity, professionalism, and career development. He has over 8 years of experience in fields including research, engineering, planning, and optimization for companies such as Ericsson, L-3, Huawei, and Telecard. He has expertise in areas like antenna design, radio frequency planning, network optimization, and software like ADS, HFSS, and TEMS.
NI Delivers Next-Generation Test Systems with PXIHank Lydick
The document discusses how NI's PXI platform addresses the needs of next-generation test systems across several markets, including wireless production test, semiconductor characterization, and semiconductor production test. It highlights examples of customers in these markets reducing their test costs and times by 50% or more by leveraging the high-performance and flexible PXI hardware along with NI's powerful algorithm and test management software.
Tool-Driven Technology Transfer in Software EngineeringHeiko Koziolek
This talk presentst the tool-driven technology transfer process ABB Corporate Research applies in selected software engineering University collaborations. As an example, we have created an add-in to a popular UML tool and developed the tooling in close interaction with the target users. Centering the technology transfer around tool implementations brings many benefits such as the need to make conceptual contributions applicable and the ability to quickly benefit from the new concepts. A challenge to this form of technology transfer is the long-term commitment to the maintenance of the tooling, which we try to address by creating an open developer community. Tool-driven technology transfer projects have proven to be valuable a instrument of bringing advanced software engineering technologies into our organization.
The document discusses test and measurement topics including:
1) A project profile about a company that tests uninterruptible power supplies by simulating power failures while monitoring inputs and outputs.
2) A cover story about how engineers at PSC design test access ports into their data capture equipment to test shrinking circuitry.
3) An article on whether to use multiplexed or pure-pin in-circuit testers and how their tradeoffs are evolving.
Embedded software, hardware design and automation softwarePaul Dao
We're looking forward to the new business,long term partnership,long term relationship in software and IT industry.
We're strong in:
- Embedded software
- Instruments control, automation software, automation test architecture
- Mobile solutions includes server side and mobile side
- Hardware design
- System integration
- Home automation based on AllJoyn
Protocols:
GPIB, Ethenet, Bluetooth, CATs, D-Bus AllJoyn, C-Bus, ZigBee, Z-Wave, NI-Visa USB, IEEE 1588, PXI, CRDC
This individual has over 23 years of experience in hardware/RF design engineering, including experience in automotive camera and video processing systems. They are seeking a challenging position in hardware/RF R&D in the automotive or consumer electronics industries utilizing their experience in bringing ideas from concept to production, including prototyping, testing, and manufacturing.
High Performance DSP with Xilinx All Programmable Devices (Design Conference ...Analog Devices, Inc.
This session includes a discussion on rapid prototyping concepts using Xilinx All Programmable FPGAs and SoCs with Analog Devices high speed and precision products. Covered in this session will be common use cases for Xilinx devices in DSP applications that interface to high speed analog. An overview will be provided of how Xilinx accelerates development with DSP platforms that can be used to quickly evaluate and prototype systems that include high speed analog, programmable logic, and embedded processing. Also covered will be an introduction to Xilinx’s new Vivado Design Suite development environment that shortens design cycles by providing an IP centric design flow, easy to use design analysis and debug, and high level design flows supporting C/C++ and MATLAB/Simulink.
Ajith Kumar has over 7 years of experience in telecommunications optimization. He has worked on 4G/3G/2G networks for various customers like Ericsson, ZTE, Alcatel-Lucent, and Huawei. His roles have included network optimization, parameter tuning, drive testing, troubleshooting, and performance analysis using various tools. Currently he works as a senior engineer optimizing 4G, 3G, and 2G networks for Vodafone Spain.
RNS International is a test equipment supplier and manufacturer that provides solutions for in-circuit, functional, and special test applications. They offer test fixtures, probes, and programming solutions for various test systems. RNS has over 25 years of experience developing test fixtures and was an early innovator in technologies like pneumatic test fixtures, split top plates, and guided probe technology. Their capabilities include fixtures for ICT, FCT, and other test applications.
Euro india2006 wirelessradioembeddedchallengesArpan Pal
This document discusses challenges in developing embedded systems for wireless radio technologies. It describes the engineering and technology challenges, including needing to support field upgrades, comprehensive testing, delayed hardware availability, and stringent development schedules while keeping costs and power consumption low. It also outlines some common hardware platforms used for wireless radio, including ASICs, DSPs, FPGAs, and software-defined radios. The document then provides two case studies on developing a 3G protocol conformance tester and an IEEE 802.16 WiMAX MAC system to demonstrate challenges and solutions.
Basics of performance measurement in umtsEkwere Udoh
This document discusses performance measurement in UMTS networks. It provides definitions for key performance indicators (KPIs) and explains how KPIs can be calculated from raw performance data collected from network elements. Specifically, it notes that proper KPI definitions require considering factors like protocol message types, network topology, and how measurements are aggregated. The document also outlines the basic approach for performance measurement equipment to capture and filter relevant data from UTRAN interfaces in order to compute meaningful KPIs.
GenerationRFID Test & Embedded Electronics Technology CompanyÀngels Pinyol Escala
This document provides an overview of an electronics company that specializes in embedded electronics development, interim personnel outsourcing, and EOL tester solutions. The company has 30 engineers across hardware prototyping, embedded software, sales, and EOL testing divisions. Recent income has declined from over €1 million in 2011-2014 to €80,000 in 2018. The company develops embedded electronics across several markets including automotive, IoT, and power electronics. It offers hardware and software development services following an ISO9001 certified process. The company also provides interim personnel outsourcing and designs EOL test solutions including test scheduling software, test fixtures, and automated optical inspection systems.
eInfochips proven physical design flow, methodologies, and rich experience helps us to deliver physical design implementation with superior performance across 180 -16nm technology node. Our comprehensive internal checklist for Sign off ensures Netlist to GDSII in < 3 iterations.
Stephen Kramer has over 18 years of experience in telecom network design, implementation, and client services. He has worked extensively with wireless technologies such as GSM, UMTS, LTE, and WiFi networks. Kramer has held senior engineering and project management roles where he was responsible for network design, equipment configuration, testing, and troubleshooting for major telecom companies.
Industrial Ethernet Facts - The 5 major technologiesStephane Potier
This document provides a summary and comparison of five major industrial Ethernet communication systems: PROFINET, POWERLINK, EtherNet/IP, EtherCAT, and SERCOS III. It discusses how each system works, including approaches to real-time communication, organization structures, and criteria for evaluating long-term investment viability. Performance metrics like theoretically achievable cycle times and network load are also analyzed. The document aims to objectively assess the technical and economic characteristics of these industrial Ethernet standards.
Shajeer P is seeking a position in electronics, communication, or allied software fields. He has over 5 years of experience in telecommunications engineering, including roles with Batco Telecom and Integrated Wireless Solutions. His experience includes tasks like network fault troubleshooting, equipment configuration and software upgrades, radio link installation and optimization, and drive testing to analyze network performance. He is proficient in telecom software like OMS 1410 and has a Bachelor's degree in Electronics and Communication Engineering.
The document discusses emerging technology trends related to the Internet of Things (IoT) and how a platform-based approach can help address challenges in product development and testing for connected devices. It notes that the number of connected devices is expected to grow dramatically and these devices will need to be both intelligent and connected. A platform-based approach using modular, reusable components can help innovation keep pace with this growth by allowing developers to focus on unique aspects of each product rather than recreating common functionality.
Tesla GPU computing has seen tremendous growth in 2010, with many new milestones achieved. Key metrics like conference attendance and CUDA downloads increased substantially. GPU computing is now being widely adopted by supercomputers and top companies in industries like oil and gas. Cloud providers also launched GPU-enabled cloud instances, lowering the barrier to entry for GPU computing. NVIDIA's GPU Technology Conference saw a large increase in attendance and submissions. Going forward, GPUs paired with CPUs are emerging as the preferred architecture for processing large datasets efficiently.
Juswanto Wardojo is an experienced electrical engineer with 22 years of experience developing RF, microwave, wireless, and fiber optic communication systems. He has expertise in C/C++, MATLAB, and CAD tools like ADS, Xilinx ISE, and PADS. Currently he works as a staff test engineer at Peregrine Semiconductor designing RF power amplifier production test platforms.
This bilingual engineer has 19 years of experience designing hardware and software architectures for embedded systems in various industries. He has extensive skills in programming languages like C/C++ and software tools. He has experience working with processors like ARM and FPGAs from Altera and Xilinx. His work experience includes projects in medical devices, telecommunications, and research involving designing electronic boards, coding firmware, and developing software.
This resume summarizes Gene Cernilli's experience as a senior engineering professional with expertise in telecom and military electronics systems design. Over 30 years of experience includes roles in embedded systems design, PCB layout, FPGA design, software development, and project engineering. He has worked on projects for companies such as Alcatel-Lucent, Aviat Networks, Qualcomm, and Ultra Electronics, leading development of products like optical network terminals, sonar systems, and medical devices.
Syed Kashan Ali is seeking a position that allows him to utilize his skills in integrity, professionalism, and career development. He has over 8 years of experience in fields including research, engineering, planning, and optimization for companies such as Ericsson, L-3, Huawei, and Telecard. He has expertise in areas like antenna design, radio frequency planning, network optimization, and software like ADS, HFSS, and TEMS.
NI Delivers Next-Generation Test Systems with PXIHank Lydick
The document discusses how NI's PXI platform addresses the needs of next-generation test systems across several markets, including wireless production test, semiconductor characterization, and semiconductor production test. It highlights examples of customers in these markets reducing their test costs and times by 50% or more by leveraging the high-performance and flexible PXI hardware along with NI's powerful algorithm and test management software.
Tool-Driven Technology Transfer in Software EngineeringHeiko Koziolek
This talk presentst the tool-driven technology transfer process ABB Corporate Research applies in selected software engineering University collaborations. As an example, we have created an add-in to a popular UML tool and developed the tooling in close interaction with the target users. Centering the technology transfer around tool implementations brings many benefits such as the need to make conceptual contributions applicable and the ability to quickly benefit from the new concepts. A challenge to this form of technology transfer is the long-term commitment to the maintenance of the tooling, which we try to address by creating an open developer community. Tool-driven technology transfer projects have proven to be valuable a instrument of bringing advanced software engineering technologies into our organization.
The document discusses test and measurement topics including:
1) A project profile about a company that tests uninterruptible power supplies by simulating power failures while monitoring inputs and outputs.
2) A cover story about how engineers at PSC design test access ports into their data capture equipment to test shrinking circuitry.
3) An article on whether to use multiplexed or pure-pin in-circuit testers and how their tradeoffs are evolving.
Embedded software, hardware design and automation softwarePaul Dao
We're looking forward to the new business,long term partnership,long term relationship in software and IT industry.
We're strong in:
- Embedded software
- Instruments control, automation software, automation test architecture
- Mobile solutions includes server side and mobile side
- Hardware design
- System integration
- Home automation based on AllJoyn
Protocols:
GPIB, Ethenet, Bluetooth, CATs, D-Bus AllJoyn, C-Bus, ZigBee, Z-Wave, NI-Visa USB, IEEE 1588, PXI, CRDC
This individual has over 23 years of experience in hardware/RF design engineering, including experience in automotive camera and video processing systems. They are seeking a challenging position in hardware/RF R&D in the automotive or consumer electronics industries utilizing their experience in bringing ideas from concept to production, including prototyping, testing, and manufacturing.
High Performance DSP with Xilinx All Programmable Devices (Design Conference ...Analog Devices, Inc.
This session includes a discussion on rapid prototyping concepts using Xilinx All Programmable FPGAs and SoCs with Analog Devices high speed and precision products. Covered in this session will be common use cases for Xilinx devices in DSP applications that interface to high speed analog. An overview will be provided of how Xilinx accelerates development with DSP platforms that can be used to quickly evaluate and prototype systems that include high speed analog, programmable logic, and embedded processing. Also covered will be an introduction to Xilinx’s new Vivado Design Suite development environment that shortens design cycles by providing an IP centric design flow, easy to use design analysis and debug, and high level design flows supporting C/C++ and MATLAB/Simulink.
Ajith Kumar has over 7 years of experience in telecommunications optimization. He has worked on 4G/3G/2G networks for various customers like Ericsson, ZTE, Alcatel-Lucent, and Huawei. His roles have included network optimization, parameter tuning, drive testing, troubleshooting, and performance analysis using various tools. Currently he works as a senior engineer optimizing 4G, 3G, and 2G networks for Vodafone Spain.
RNS International is a test equipment supplier and manufacturer that provides solutions for in-circuit, functional, and special test applications. They offer test fixtures, probes, and programming solutions for various test systems. RNS has over 25 years of experience developing test fixtures and was an early innovator in technologies like pneumatic test fixtures, split top plates, and guided probe technology. Their capabilities include fixtures for ICT, FCT, and other test applications.
Euro india2006 wirelessradioembeddedchallengesArpan Pal
This document discusses challenges in developing embedded systems for wireless radio technologies. It describes the engineering and technology challenges, including needing to support field upgrades, comprehensive testing, delayed hardware availability, and stringent development schedules while keeping costs and power consumption low. It also outlines some common hardware platforms used for wireless radio, including ASICs, DSPs, FPGAs, and software-defined radios. The document then provides two case studies on developing a 3G protocol conformance tester and an IEEE 802.16 WiMAX MAC system to demonstrate challenges and solutions.
Basics of performance measurement in umtsEkwere Udoh
This document discusses performance measurement in UMTS networks. It provides definitions for key performance indicators (KPIs) and explains how KPIs can be calculated from raw performance data collected from network elements. Specifically, it notes that proper KPI definitions require considering factors like protocol message types, network topology, and how measurements are aggregated. The document also outlines the basic approach for performance measurement equipment to capture and filter relevant data from UTRAN interfaces in order to compute meaningful KPIs.
GenerationRFID Test & Embedded Electronics Technology CompanyÀngels Pinyol Escala
This document provides an overview of an electronics company that specializes in embedded electronics development, interim personnel outsourcing, and EOL tester solutions. The company has 30 engineers across hardware prototyping, embedded software, sales, and EOL testing divisions. Recent income has declined from over €1 million in 2011-2014 to €80,000 in 2018. The company develops embedded electronics across several markets including automotive, IoT, and power electronics. It offers hardware and software development services following an ISO9001 certified process. The company also provides interim personnel outsourcing and designs EOL test solutions including test scheduling software, test fixtures, and automated optical inspection systems.
eInfochips proven physical design flow, methodologies, and rich experience helps us to deliver physical design implementation with superior performance across 180 -16nm technology node. Our comprehensive internal checklist for Sign off ensures Netlist to GDSII in < 3 iterations.
Stephen Kramer has over 18 years of experience in telecom network design, implementation, and client services. He has worked extensively with wireless technologies such as GSM, UMTS, LTE, and WiFi networks. Kramer has held senior engineering and project management roles where he was responsible for network design, equipment configuration, testing, and troubleshooting for major telecom companies.
Industrial Ethernet Facts - The 5 major technologiesStephane Potier
This document provides a summary and comparison of five major industrial Ethernet communication systems: PROFINET, POWERLINK, EtherNet/IP, EtherCAT, and SERCOS III. It discusses how each system works, including approaches to real-time communication, organization structures, and criteria for evaluating long-term investment viability. Performance metrics like theoretically achievable cycle times and network load are also analyzed. The document aims to objectively assess the technical and economic characteristics of these industrial Ethernet standards.
Shajeer P is seeking a position in electronics, communication, or allied software fields. He has over 5 years of experience in telecommunications engineering, including roles with Batco Telecom and Integrated Wireless Solutions. His experience includes tasks like network fault troubleshooting, equipment configuration and software upgrades, radio link installation and optimization, and drive testing to analyze network performance. He is proficient in telecom software like OMS 1410 and has a Bachelor's degree in Electronics and Communication Engineering.
The document discusses emerging technology trends related to the Internet of Things (IoT) and how a platform-based approach can help address challenges in product development and testing for connected devices. It notes that the number of connected devices is expected to grow dramatically and these devices will need to be both intelligent and connected. A platform-based approach using modular, reusable components can help innovation keep pace with this growth by allowing developers to focus on unique aspects of each product rather than recreating common functionality.
Tesla GPU computing has seen tremendous growth in 2010, with many new milestones achieved. Key metrics like conference attendance and CUDA downloads increased substantially. GPU computing is now being widely adopted by supercomputers and top companies in industries like oil and gas. Cloud providers also launched GPU-enabled cloud instances, lowering the barrier to entry for GPU computing. NVIDIA's GPU Technology Conference saw a large increase in attendance and submissions. Going forward, GPUs paired with CPUs are emerging as the preferred architecture for processing large datasets efficiently.
The document summarizes key developments in 2010 regarding Tesla GPU computing technology:
1) Tesla computing reached "escape velocity", with momentum growing unstoppably as more customers deployed GPUs. Major conferences cemented Tesla's position.
2) Applications saw major performance increases using Tesla, such as Amber seeing up to 100x faster simulations.
3) Major OEMs like IBM and Dell began offering Tesla-based server solutions, indicating the technology had matured for broad adoption.
The Architecture Of Software Defined Radios EssayDivya Watson
This project aims to build a smart assistant to help users purchase books online by integrating
multiple sources of information about books and the purchasing process into a single system. By
consolidating data from sources about books, reviews, prices and retailers, the assistant can provide
users all the necessary information to make an informed purchase decision in one place. The goal is
to streamline the online book buying experience for users by eliminating the need to search across
multiple websites during the purchase process.
Converged IoT Systems: Bringing the Data Center to the Edge of EverythingDana Gardner
Transcript of a discussion on the rapidly evolving architectural shift of moving advanced information technology (IT) capabilities to the edge to support Internet of Things (IoT) requirements for operational integrity benefits.
OpenPOWER and AI workshop at Barcelona Supercomputing CenterGanesan Narayanasamy
This two-day workshop at the Barcelona Supercomputing Center focuses on artificial intelligence and OpenPOWER/PowerAI systems. Day 1 provides introductions to POWER9, PowerAI, and deep learning tools. Attendees will learn about large model support, distributed deep learning, and see demonstrations. Day 2 allows for deeper exploration of challenges through exercises using various infrastructures. Speakers will discuss OpenPOWER, PowerAI features, CFD simulations, machine learning frameworks, and InfiniBand technologies. The workshop aims to help attendees use AI and OpenPOWER systems for their projects.
In our recap of the final day of International Supercomputing 2016, we explore how OpenPOWER members are working in the HPC industry and continue the conversation around cognitive computing, deep learning, and machine learning.
The document announces an upcoming AI and OpenPOWER meetup event on March 25, 2018 in San Ramon, CA from 4:00 pm to 7:30 pm. Prominent speakers will discuss latest advances in deep learning tools and techniques from industry, research, and the financial sector. The meetup aims to share cutting-edge insights from pioneers in different industries.
The document announces an upcoming AI and OpenPOWER meetup on March 25th, 2018 from 4-7:30pm at 2603 Camino Ramon #200, San Ramon, CA 94583, USA. Prominent speakers will discuss advances in deep learning tools and techniques from leading innovators across industry, research, and the financial sector. Attendees will learn about AI's latest real-world impact and gather cutting-edge insights from pioneers in their industry.
Syslog Technologies is a fast growing technology solutions and services provider founded in 2005. It has highly skilled IT professionals who provide customized solutions to industries like biomedical, communication, networking, and image processing. Syslog offers staffing, projects, software development, web services, and outsourcing. It also provides industry-oriented training to professionals, students, and freshers designed by experienced experts. With over 8 years of experience in training and placement, Syslog is committed to placement excellence.
A new design reuse approach for voip implementation into fpsocs and asicsijsc
The aim of this paper is to present a new design reuse approach for automatic generation of Voice over Internet protocol (VOIP) hardware description and implementation into FPSOCs and ASICs. Our motivation behind this work is justified by the following arguments: first, VOIP based System on chip (SOC) implementation is an emerging research and development area, where innovative applications can be implemented. Second, these systems are very complex and due to time to market pressure, there is a need to built platforms that help the designer to explore with different architectural possibilities and choose the circuit that best correspond to the specifications. Third, we aim to develop in hardware, design, methods and tools that are used in software like the MATLAB tool for VOIP implementation. To achieve our goal, the proposed design approach is based on a modular design of the VOIP architecture. The originality of our approach is the application of the design for reuse (DFR) and the design with reuse (DWR) concepts. To validate the approach, a case study of a SOC based on the OR1K processor is studied. We demonstrate that the proposed SoC architecture is reconfigurable, scalable and the final RTL code can be reused for any FPSOC or ASIC technology. As an example, Performances measures, in the VIRTEX-5 FPGA device family, and ASIC 65nm technology are shown through this paper.
Accelerating Innovation with Java: The Future is TodayJohn Duimovich
IBM Community Keynote at JavaOne 2016
Innovations for Java driven by new use cases in the cloud, containers and microservices. Extending your application with cognitive functionality and do it all with open source and the community.
Internet of Things is technological break through that affects our lives in ways unimaginable before. It has a wide spectrum of application ranging from the Micro to the Macro, from our daily essentials to nuclear reactors and much more.
Getting an IoT product out in the market is an extremely task. There are challenges involved are in design of Hardware, Software, Cloud and Analytic’s components.
Oracle acquired Sun Microsystems in 2010 for $7.3 billion. This allowed Oracle to optimize the performance of its database software by integrating Sun's hardware systems and operating systems. It also ensured Oracle obtained valuable products and technologies from Sun before a competitor could acquire them. The acquisition expanded Oracle's product portfolio and strengthened its position in the server and storage markets.
This document provides definitions for various terms related to Industry 4.0, the Industrial Internet of Things (IIoT), and digital transformation in manufacturing. It includes definitions for over 50 terms in its second edition of "The MachineMetrics IIoT Manufacturing Dictionary." The dictionary is intended to help those new to digital manufacturing concepts and terminology better understand commonly used buzzwords and technologies in this field.
A significant proportion of developments in the Internet of Things (IoT) is driven by non-technical innovators and ambitious hobbyists. Node-RED targets this audience and offers a widely used rapid prototyping platform for IoT data plumbing on the basis of JavaScript. Data platforms for the IoT provide storage facilities and value in the form of visualisation & analytics to business and end users alike. This report details how Node-RED connects to 11 different platforms and what additional services these provide.
Toobler Technologies is an IT solutions provider that offers various services including web, mobile, and cloud applications, UI/UX design, Big Data analytics, IoT, and SAAS. They have over 7 years of experience working with 200+ projects for 170 clients. Their technical stack includes languages and tools like Node.js, AngularJS, Python, MongoDB, AWS, and more. They have successfully completed several projects across different domains for startups and enterprises.
Toobler Technologies is an IT solutions provider that offers various services including web and mobile applications, cloud solutions, UX/UI design, Big Data analytics, IoT, and machine learning. It has been in operation for 7 years, completed over 200 projects for 170 clients, and employs 60 engineers. The document provides details about the company's services and technical capabilities and includes case studies of projects implemented for clients in various domains like feedback apps, social events platforms, hotel room service apps, price comparison engines, question/answer apps, and permit request platforms.
The most popular National Instruments Semiconductor Test System (STS) enclosure for production test is the T2, not the T1 as some may assume. The T2 enclosure, which has two bays for PXI instruments, provides twice the capacity as the T1 enclosure with a only 25% higher acquisition cost. This small increase in upfront cost is offset by the benefits of avoiding delays and limitations that could arise from running out of space in the smaller T1 enclosure for testing new devices. While the T1 may be sufficient for characterization and sample testing, the T2 is favored for production testing as it provides flexibility to adapt to changing test needs over time without constraints on the number of instruments that can be used.
STS is Bridging Semiconductor Test from the Lab to ProductionHank Lydick
NI aims to bridge the gap between semiconductor design, lab characterization, and production testing. Currently, different tools, methods, and databases are used at each stage, making it difficult to reproduce failures and correlate results. NI's solution is to use a common PXI and LabVIEW platform from characterization through production. This allows test cases developed in the lab to be reused in production, improves debugging and productivity across stages, and helps accelerate the path to validating chips and production testing.
Charlie has been greeting a customer at a family-owned pump service business for 41 years, showing the business's commitment to both employees and customers. The encounter reminded the customer of the history of semiconductor testing from research labs to mass production, which began around the same time Charlie started at the pump business in the late 1970s. The customer pondered what semiconductor testing equipment may look like 70 years in the future, guessing it will be an open modular platform controlled by graphical software.
Study NI STS tester at University of FloridaHank Lydick
This document outlines the syllabus for a course on mixed signal integrated circuit testing, including contact information for the professor and teaching assistant, course goals of understanding analog and digital circuit testing, topics to be covered such as parametric testing, data analysis, and labs using test equipment, and requirements including homework, exams, and use of an online course platform.
Learn NI STS tester at Univiversity of FloridaHank Lydick
This document outlines the course syllabus for EEE 4930/5934 Mixed Signal IC Test I, Spring 2016. The course will cover fundamentals of testing integrated circuits and mixed-signal systems through lectures, labs, homework, and exams. Topics include test specifications, parametric testing, measurement accuracy, test hardware, and more. Labs will focus on testing passive components, voltage regulators, op-amps, and mixed-signal ICs using National Instruments testing equipment and LabVIEW. The course is taught by Professor Byul
This document summarizes the curriculum developed for a graduate course on advanced modular testing methods for integrated circuits. The course was designed to train students on how to properly utilize a state-of-the-art semiconductor test system donated to the university. The curriculum covers key topics like probability and statistics, solid state physics, testing strategies, pin mapping, and using National Instruments TestStand and semiconductor test modules. The goal is for students to gain skills needed for industry test standards and semiconductor product engineering jobs. Assessment of the initial course offerings showed students achieved the expected learning outcomes of understanding modular testing concepts and learning to use the test equipment and software.
This document discusses improving the flexibility and usability of semiconductor test equipment donated to Texas Tech University. The current setup has limitations for student projects, which aim to test a variety of devices. A new interface board was designed to allow testing more pin configurations with simplified setup. It incorporates relays to route signals from measurement modules to device pins. Additional daughter boards provide breakouts for different device packages. The goal is to enable a wider scope of student testing projects with easier access to the donated National Instruments Semiconductor Test System.
The document discusses how PXI-based test systems are providing complete solutions to meet the increased testing demands of advanced devices. It describes how standards like LTE and 802.11ac have made testing of RF power amplifiers more complex by requiring support for techniques like digital pre-distortion and envelope tracking. It then provides examples of PXI test solutions from National Instruments, Keysight, and LitePoint that are designed to automate testing of power amplifiers implementing these techniques through modular instrumentation and software. It also discusses a PXI-based semiconductor test system from National Instruments for production testing of RF integrated circuits.
The document discusses the increasing adoption of PXI (PCI eXtension for Instrumentation) modular test systems as devices become more complex and traditional instrumentation is no longer able to meet evolving test requirements. PXI offers benefits like flexibility, scalability, speed, and a large portfolio of modules that make it well-suited for applications requiring high precision and specification like wireless testing. Its adoption is accelerating, with a projected compound annual growth rate of 17.6% over the next few years. PXI can be customized to meet the needs of emerging applications in communications, semiconductor testing, and the Internet of Things.
STS. Smarter devices. Smarter test systems.Hank Lydick
This document provides an overview of trends in automated test and measurement. It discusses how semiconductor companies are using real-time data analytics to reduce manufacturing test costs by harvesting production test data. It also discusses how test management software is becoming more important for handling new programming languages. Additionally, it discusses how RFIC companies are reusing IP and standardizing hardware to reduce costs and time to market across the product design cycle from characterization to production.
This document provides an agenda for the GAIN Superior Business and Technical Insight Through Strategic Collaboration conference taking place August 3-4, 2015 in Austin, Texas. The agenda includes keynote speeches, panel discussions, and breakout sessions on aerospace, automotive, and semiconductor topics. Attendees can network and learn about novel test strategies, reducing costs, and how new technologies impact various industries.
This document discusses trends in automated test systems and strategies. It covers topics like harvesting production test data through real-time analytics, challenges of life-cycle management for long-term projects due to software obsolescence and compatibility issues, and how off-the-shelf test executives can help address the influx of new programming languages. It also discusses standardizing platforms across product design cycles to reduce costs, and adopting modular solutions to validate high-frequency components economically.
This document provides information about the NIDays 2015 conference in Singapore hosted by National Instruments. It includes an overview of the event, highlights of keynote speakers and sessions, the full agenda, and information about sponsors and exhibitors. The event will feature over 15 hours of technical sessions across various tracks including measurements, automated testing, and embedded systems. There will also be a keynote on using a platform-based approach to create the Internet of Things, as well as a session highlighting customer success stories. Attendees can learn new techniques, network with peers, and see demonstrations of the latest technologies.
The Merlin project developed a high-speed X-ray imaging system for synchrotron beam lines using NI FlexRIO and LabVIEW. This allowed a small team to complete the project faster and with less embedded design expertise. Using off-the-shelf NI technologies avoided complex embedded design and reduced development time by six months compared to traditional methods. The system will promote wider adoption of advanced detector chips and provide an upgrade path for future improvements.
The document appears to be an agenda for the NIDays ISRAEL 2014 conference. It includes a schedule of presentations from 08:00 to 16:00 that cover topics like developing field test solutions for harsh environments, simulating RF/microwave transceiver modules, graduating innovation ready students, looking inside NI's semiconductor test system, advances in RF and microwave measurement technology, and developing SIGINT ISR systems with COTS technologies. The agenda also lists registration and opening remarks, breaks for discussion, and a lunch break.
This document discusses a cost effective RF MEMS wafer test solution using PXI hardware. Some key points:
1) PXI provides a flexible test platform that can handle both device characterization and high-volume production testing, reusing the same software and reducing costs compared to separate benchtop and ATE solutions.
2) A motherboard and daughterboard hardware solution is proposed, allowing up to 16 RF MEMS switches to be tested in various configurations with low non-recurring engineering costs.
3) Initial test results show the system can accurately measure low resistances. The solution aims to meet production testing needs at a lower capital expenditure compared to traditional automatic test equipment.
IDT adopted the NI Semiconductor Test System (STS) to lower the cost of testing its mixed-signal semiconductor devices. The traditional expensive automated test equipment required costly upgrades that provided unused capabilities. IDT had previously built its own test systems but they sacrificed benefits of commercial platforms. The open PXI architecture of the NI STS provided flexibility to reconfigure systems as needs evolved without replacing the entire platform. Using the NI STS, IDT increased test performance while reducing overall costs by retiring older difficult to support systems.
This document contains a map of an area near Lake Austin, listing street and place names such as Metropolitan Park, Rivercrest Drive, Bunny Run, and Smokey Ridge. It indicates the area for a proposed limited purpose annexation by the City of Austin, showing the annexation area, streets, lot lines, lake, and current jurisdictional boundaries between Austin's full purpose and limited purpose areas.
1. Automated Test Outlook 2017
Through the Eyes of NI’s Cofounder: A Special Issue Guest-Edited by Dr. James Truchard
2. Reflections on 40 Years
of Test and Measurement
and What Lies Ahead
As I approach the end of my 40-year career as CEO
of National Instruments, I am reminded of the great
progress and innovations the test and measurement
industry has witnessed since 1976. We have gone from
an industry driven by vacuum tube technology in the
era of General Radio to a time when the transistor ruled
with Hewlett Packard to today, when software truly is
the instrument—a transition that NI helped shepherd.
Moore’s law has taken us for a wild, fast ride to say the
least, and just when you think it’s run its course, process
innovations extend into new dimensions (literally) and
push performance even further.
Just like the transistor, NI started from humble
beginnings, but it has relentlessly focused on
engineering great products and empowering world-
changing innovation through our customers and platform
technology. Allow me to reminisce on what the past
40 years have taught me and where I see this market
heading as I shift into the next phase of my career.
“Do for Test and Measurement What the
Spreadsheet Did for Financial Analysis”
When Jeff Kodosky, Bill Nowlin, and I started NI in
1976, we saw tremendous room for innovation in how
engineers and scientists interacted with and built
test and measurement equipment. We founded the
company on the premise that there had to be a better
way to serve the test and measurement needs that
we, engineers and scientists, faced. We couldn’t buy
it off the shelf but at least we wouldn’t have to build
it from scratch.
The general purpose interface bus (GPIB, IEEE 488)
was our gateway. Our vision, as stated in 1983, was
to “do for test and measurement what the spreadsheet
did for financial analysis.” Stated today, the sentence
loses some of its power, but think about the early ’80s.
At the time, the tools for financial analysis were “locked
up” and too expensive for anyone without a big budget
to access them. The early incarnations of spreadsheets
3. turned this situation on its head, and that is exactly
what we wanted to do. We wanted to make it so that
any engineer or scientist could access the same tools
or platform used by the R&D teams of the leading
technology companies. It was a radically empowering
view at the time and, in many ways, it still is.
“The Software is the Instrument”
While others might have seen GPIB as a hardware
play, we recognized it for what it enabled in terms
of software. As the PC industry evolved (as well as
Apple’s Mac, which we had a special affinity for given
its graphical user interface), that GPIB cable made it
easy to analyze and present data in a customized way
for our customers’ needs. They were no longer confined
to the front panel of an instrument and their pencils and
notepads for data acquisition. The opportunity to innovate
then shifted to the software world, where programming
languages needed instrument drivers for the connected
boxes. Our strategy of writing and supporting those
drivers offered a critical service that continues today as
NI supports more than 10,000 drivers on the company’s
Instrument Driver Network.
But that world still left engineers and scientists with the
burden of using tools designed for computer science
to perform engineering, test, and measurement tasks.
Our answer was twofold: LabWindows™/CVI, to offer
engineering-specific tools in ANSI C programming, and
LabVIEW, a graphical programming paradigm that took
the way we think about solving a problem (in flowcharts
and pictures) and turned it into compiled code. The
story was simple: acquire, analyze, and present. Do it in
software tools designed for a customer’s use case that
were easy to learn yet extremely powerful. We coined
the phrase ”The software is the instrument” to describe
this approach, and seeing engineers and scientists save
valuable time and get to results faster was all the market
validation we ever needed.
Evolving With Moore’s Law
People talk about Moore’s law like it’s about hardware,
but computational hardware exists only to run software
(and maybe firmware). Once we made test and
measurement all about software, we had effectively
enlisted Intel, Xilinx, and many other billion dollar
companies in our R&D staff. With customers and
partners building proficiency with our software tools,
we just had to follow the chips to deliver increasing
value to test and embedded systems. This has
happened, so far, along two key dimensions: multicore
processors and FPGAs.
Because LabVIEW is graphical and, therefore, not
obviously sequential, it is tailor-made for parallel
processing. LabVIEW users were among the first
programmers to easily migrate from single-core
processors to multiple threads and multiple cores and
see almost instant speed improvements. Obviously, it’s
possible to take advantage of these trends with other
languages, just like it’s still possible to write highly
efficient code in machine or assembly language, but why
would you? The pace of change in modern electronics
means you can’t waste time doing by hand what a tool
can easily do for you, and we hear that over and over
from LabVIEW users.
That goes to an entirely different level with FPGAs.
Some problems are just better solved in the highly
parallel, deterministic world of silicon. But the toolchains
and programming constructs were inaccessible to most
mechanical engineers or medical researchers who
were experts in their measurements and problems to
solve (not digital design). We recognized this in the late
1990s with LabVIEW’s graphical paradigm. We were
on a quest to deliver the power of FPGAs to LabVIEW
programmers, and we’ve done that. A quick look at our
Engineering Impact Awards winners demonstrates the
power of this technology: applications ranging from
regenerating and restoring organ function damaged
by disease or trauma to setting a world record in 5G
wireless spectrum efficiency with massive MIMO.
A Software-Centric Approach
to Hardware Design
When you think about software as uniquely as we
have, it’s easy to think differently about hardware,
too. Modular, PC-based plug-in boards were a natural
by-product. Make the hardware as lightweight and
cost-effective as possible (no dedicated screens, power
supplies, fixed buttons/knobs, and so on) and focus on
ADCs, DACs, signal conditioning, and data movement.
I have yet to see a test and measurement vendor design
a user interface better than a customer, for any specific
task, that makes the customer more productive. Even
the best front panels on box instruments are cluttered
with unused buttons or menu structures. Many of our
hardware products have size constraints dictated by
the I/O connector. Can it get more efficient than that?
The reality is our strategy is more than just efficient;
it’s right. Take the new Vector Signal Transceiver (VST),
which combines an RF analyzer, RF generator, parallel
and serial digital interfaces, and high-performance
signal processing into a 2-slot PXI module. This product
4. delivers industry-leading bandwidth (1 GHz), amazing
RF performance, and scalability for MIMO applications
for one reason: software. We moved as many technical
problems into the FPGA as we could, and Moore’s law
(along with Xilinx) delivered a vehicle capable of handling
the computation. We, in turn, passed the keys to that
vehicle over to our customers by allowing them to
customize that FPGA with LabVIEW. From 5G cellular
technology development to automotive radar and driver
assist algorithm development to reductions in the cost
of Internet of Things (IoT) devices, the VST and LabVIEW
are helping customers achieve goals conventional
instruments quite simply prevent them from obtaining.
The Future
We are seeing glimpses of the future everywhere we
look. A modern factory features what we call “cyber-
physical systems,” which combine software-centric
computing technology with electromechanical systems
and human operators to improve safety, efficiency,
and cost structures. The acquire, analyze, and present
concept is still valid, but we’ve added “sense, compute,
and connect” as a parallel flow for IoT devices. Wireless
technology in general is pervasive. We’ve been saying
this a while, but if you aren’t an RF engineer today, you
will be. And the more you connect things, the more
you’d be crazy not to take advantage of the data you can
collect for billions of sensor nodes. For us, this is Big
Analog Data™ solutions, and it’s the richest set of data
in the world. NI customers are acquiring terabytes and
terabytes of it every day.
But even as our capabilities become more advanced
and the scale of the problems we try to solve grows
vaster, the tools we use must be easier to navigate.
Just as machine language migrated to assembly
and to object-oriented, other paradigms, including
graphical dataflow programming, are critical to offer
the right level of abstraction. The multirate diagram in
our LabVIEW Communications System Design Suite
is a great example; no single software tool delivered
the productivity needed to prototype 5G algorithms
until we were bold enough to tackle multiple models
of computation inside a single flow that could deploy
directly to hardware.
No great innovation will be done alone. The best
platforms we use today are effective because they’ve
fostered an ecosystem. Our software-centric approach
at NI spawned a partner network of more than 1,000
companies and 300,000 active LabVIEW users. The rise
of mobile devices and “apps” is possible only because
of a healthy ecosystem built on developer-friendly
platforms. Team-based development, code sharing, and
community support soon will no longer be novel or best
in class. They will be expected.
In Closing
It would be impossible to have witnessed what I’ve
witnessed in our industry for the past 40 years and not
be excited about where all of these technologies and
trends are leading us. My advice to any new engineer
is simple: develop a vision for the future and pursue
it with intensity. And, at the end of the day, don’t be
afraid to have fun.
Thank you for 40 great years. I believe the following five
selections from the Automated Test Outlook archive are
as true today as the day they were published initially.
May they inform your vision for the future and bring you
and your organization prosperity and success.
“All engineers, scientists, and vendors need
to embrace new approaches like this to
foster the innovation that will ultimately
address the grand engineering challenges
of our time.”
—James Truchard, PhD, President, CEO, and Cofounder,
National Instruments
5. Table of Contents
04 Optimizing Test Organizations
Transforming a test organization into a strategic asset requires
commitment to a long-term phased approach, from creating standard test
platforms to building a data infrastructure to improve decision making.
06 Reconfigurable Instrumentation
Test systems are reconfigured for endless reasons, from adapting to
new test requirements to accommodating instrument substitutions
during calibration and repair cycles.
08 Software-Centric Ecosystems
The software-centric nature of technology can transform the capability
of automated test systems to drive increased levels of productivity
and collaboration.
10 Managed Test Systems
As Moore’s law continues to influence the performance of test
systems, new data and communication technologies help test
managers optimize their test systems to lower the cost of test.
12 Driven by Necessity
Safety regulations and software are pushing hardware-in-the-loop
test to the forefront of transportation manufacturing in an increasingly
software-driven world.
6. Editor’s Note: I love seeing test leaders and organizations turn their
“necessary cost centers” into strategic assets to improve profitability,
time to market, and product quality. Having led, and lived through, multiple
organizational inflection points, I can attest that it’s both hard work and
worth it, personally and professionally. Take advantage of others’ insights
and experiences via the global communities of test engineering leaders
we host throughout the year: the Test Leadership Forum, regional advisory
councils, and online LinkedIn group. You’ll be amazed at what you can learn
from your colleagues, both inside and outside your industry.
Optimizing Test Organizations
In tough economic conditions, companies are diligently
looking for opportunities to gain a competitive advantage
while growing revenue, profits, and customer loyalty.This
has led to a strong adoption of business improvement
strategies such as Six Sigma, Lean Manufacturing,
Capability Maturity Model Integration (CMMI), and Agile
Product Development. Additionally, companies will elevate
and strategically take advantage of a support function
within an organization as a marketplace differentiator.
The role of information technology (IT) has changed
dramatically over the last two decades. IT was originally
a support function that provided standard computing
applications, data storage, and routine task automation.
In leading organizations, IT can now streamline critical
line-of-business processes and help executives make
real-time decisions at the core of a company’s business.
The strategic importance of IT was confirmed by the Chief
Information Officer (CIO) magazine 2010 State of the CIO
Survey, which revealed that 70 percent of CIOs are now
members of their companies’ executive committees.
Similar to IT, product testing has been historically viewed
as a support function during product development and
manufacturing—just a necessary cost center. Hence, many
companies invest at much higher rates in other areas of
“strategic” value such as product development and sales
enablement.This leaves the test organization fragmented,
outmatched to meet business requirements, and outdated
with old technologies and test methodologies that often
create bottlenecks for their organizations. However, as
research has shown, test is critical because it validates
a product’s performance, reduces development time,
increases quality and reliability, and lowers return rates.
By catching defects earlier in product development
and collecting the data to improve a design or process,
test delivers tremendous value to the organization.
An emerging trend for electronics manufacturing
companies is using product test for competitive
differentiation.This has resulted in elevating the test
engineering function from a cost center to a strategic
asset.This shift was confirmed by a recent global NI
survey of test engineering leaders who said their top
goal over the next one to two years is to reorganize their
test organization structures for increased efficiency.This
strategic realignment reduces the cost of quality and
impacts a company’s financials by getting better products
to market faster. Research has revealed that “optimized”
is the ideal maturity level—when a test engineering
organization provides a centralized test strategy that
spans the product life cycle.This optimized organization
develops standardized test architectures with strong
reuse components, enables dynamic resource utilization,
and provides systematic enterprise data management
and analysis that result in company-level business impact.
OPTIMIZING TEST ORGANIZATIONS—2012
7. ni.com/ato 05
Companies making this transformation must commit
to a long-term strategy because, according to NI
research, it generally takes three to five years to realize
the full benefit. A company must have a disciplined
and innovative investment strategy to transform the
test organization through the four maturity levels:
ad-hoc, reactive, proactive, and optimized. Each level
includes people, process, and technology elements.
The right people are required to develop and maintain
the cohesive test strategy. Process improvements are
required to streamline test development and reuse
throughout product development. And finally, tracking
and incorporating the latest technologies are required
to improve system performance while lowering cost.
When companies implement changes to process,
people, or technology, they are sometimes tempted to
bypass transition projects because they believe they can
attain a higher level of maturity more quickly. However,
before an organization can achieve an optimized level,
it must first reach the proactive level in each major
competency area: enterprise alignment, business
planning, deployment life cycle, system development,
and test technologies and architectures.
An organization steadily builds a foundation for strategic
transformation by sticking to a sequential approach and
identifying short-term initiatives that help the company
improve its maturity level and that map to annual
operating objectives. And as the foundation gets built,
test productivity and asset utilization increase, paying
dividends on the original investment.This phased approach
enables organizations to realize benefits early on—after the
completion of just one or two projects. Examples of these
transition projects include the following:
■■
Standardized Test Architecture/Process
(Ad-Hoc->Reactive)—Adopting standardized software
and hardware architectures and test methodologies
improves productivity with faster test code
development and increased test asset utilization.
■■
TestTotal Cost of Ownership (TCO) Financial Model
(Reactive->Proactive)—Creating a TCO financial
model for test helps companies calculate business
productivity metrics and financial metrics (return
on investment, payback period, net present
value, internal rate of return, and so on) for test
improvement initiatives.
■■
Enterprise Test Data Management
(Proactive->Optimized)—Developing a comprehensive
test data infrastructure that spans across sites with
universal access improves real-time decision making.
This transformation requires a shift from only supporting
ongoing operations to developing innovation-based
initiatives alongside ongoing operations.The test industry
is still early in its transformation. Using the IT industry
as an external benchmark, IBM published in its 2010
global technology outlook that highly efficient companies
that strategically transformed their IT organizations
spend only 60 percent of their IT budgets for ongoing
operations, leaving 40 percent for new and innovative
initiatives, compared to other organizations with an 85/15
split in their legacy business models. Similarly for test,
leading companies gain a competitive edge by keeping
their test organizations agile and matching the level of
innovation leveraged in other strategic departments.
When test engineering organizations become strategic
assets, they create standard test platforms, develop
valuable test-based intellectual property, deliver a more
productive workforce while lowering operating costs,
and align with the business objectives by continually
contributing to better product margins, quality, and
time to market.
COMMITTING TO A LONG-TERM PHASED APPROACH
AD-HOC (COST CENTER) REACTIVE (CONTRIBUTOR) PROACTIVE (BUSINESS ENABLER) OPTIMIZED (STRATEGIC ASSET)
Enterprise Alignment Monitored Business Objectives
Business Planning
Centralized Strategy; Standardized
Architectures, Tools, and Processes
Deployment Life Cycle
Strong Reuse From Design
to Production
System Development Dynamic Resource Usage
Test Technology and Architecture
Systematic Enterprise Test
Data Management
8. “The ability to customize the measurement
hardware itself represents yet another
milestone in the path toward a completely
software-defined test system. In 10 years, we
will wonder how we ever programmed test
systems effectively without this capability.”
—Mike Santori, Business and Technology Fellow,
National Instruments
Reconfigurable Instrumentation
Software-defined instrumentation, also known as virtual
instrumentation, is based on a modular architecture that
enables a high degree of reconfigurability. Software-
defined instruments consist of modular acquisition/
generation hardware whose functionality is characterized
through user-defined software running on a host
multicore processor. This basic model is ideal for most
automated test applications in use today, but new
technologies and test methodologies on the horizon
are creating the need to push the reconfigurability down
to the hardware to achieve required performance. One
example of this is testing a modern RF receiver, where
coding/decoding, modulation/demodulation, packing/
unpacking, and other data-intensive tasks may need
to occur inside a clock cycle of the device under test
(DUT). In these cases, the software defined architecture
needs to be flexible enough to incorporate user-
programmable hardware—often a field-programmable
gate array (FPGA)—to place the necessary intelligence
inside the instrument. User-programmable instruments
create an architecture where data can be acted upon
in real time on the FPGA and/or processed centrally
by the host processor (see figure). FPGAs are a key
enabling technology because they combine the best
parts of ASICs and processor-based systems. At the
highest level, FPGAs are reprogrammable silicon chips.
Using prebuilt logic blocks and programmable routing
resources, engineers can configure these chips to
implement custom hardware functionality. They can
develop digital computing tasks in software and compile
them down to a configuration file or bit stream that
programs the FPGA components. In addition, FPGAs
are completely reconfigurable and instantly take on
a new personality when recompiled with a different
configuration of circuitry.
Beyond being user-programmable, FPGAs offer
hardware-timed execution speed as well as high
determinism and reliability. They are truly parallel so
different processing operations do not have to compete
for the same resources. Each independent processing
task has its own dedicated section of the chip, and each
task can function autonomously without any influence
RECONFIGURABLE INSTRUMENTATION—2010
Editor’s Note: Three years after this article ran in the 2010 Automated Test
Outlook, NI introduced the Vector Signal Transceiver, a PXI module that
revolutionized RF instrumentation and created a new class of software-
designed instruments that users can reprogram. At first, others in the industry
called it “cute” and dismissed the notion that users would want to own the
functionality of their instruments at that level. But the VST became the most
successful hardware product from NI to date and redefined the future of
instrumentation. If your organization isn’t considering software-designed
instrumentation yet, I strongly recommend it.
9. ni.com/ato 07
Multicore Processor
Common Software Development Tools
User-Programmable FPGA
Modular Instrument
I/O (ADCs, DACs)
Reconfigurable instruments provide a Host + FPGA configuration that delivers both performance and flexibility.
from other logic blocks. As a result, adding more
processing does not affect the performance of another
part of the application.
While FPGAs have been used inside instruments for
over a decade, test engineers were seldom given access
to embed their own algorithms on them. To be useful
in a software-defined instrumentation context, FPGAs
must be reprogrammable by the engineer in software;
in other words, they should be used to push software
programmability down into the hardware itself. In the
past, FPGA technology was available only to engineers
with a deep understanding of digital hardware design
software, such as hardware description languages like
Verilog or VHDL, which use low-level syntax to describe
hardware behavior. Most test engineers do not have
expertise in these tools. However, the rise of high-level
design tools is changing the rules of FPGA programming,
with new technologies that convert graphical block
diagrams or even C code into digital hardware circuitry.
These system-level tools that abstract the details of
FPGA programming can bridge this gap.
Clearly, there are advantages to performing different
types of processing on a host processor versus an
FPGA. For example, an FPGA is generally well-suited for
inline analysis such as simple decimations on point-to-
point I/O, whereas complex modulation might achieve
better performance running on a multicore processor
due to the large amount of floating-point calculations
required. The ideal solution for developing a software-
defined test system is a single graphical system design
development environment that provides the ability
to quickly partition the processing on the host or an
FPGA to see which offers superior performance.
This new software-defined architecture can meet
application challenges that are impossible to solve
with traditional methods such as the previous example
that requires real-time decision making by the host to
properly test the device. Instead, engineers can fully
deploy the intelligence to the FPGA embedded on the
instrument for pass/fail guidance. This is often the only
way to supply the intense timing and determinism
required by the DUT. Examples of this type of device
include RFID tags, memory, microcontrollers, and
engine control units (ECUs). For some applications,
engineers also perform the communication over
a protocol—wireless or wired—which requires a
significant layer of coding and decoding before
making a decision.
Reconfigurable instruments will continue to find more
mainstream applications as test engineers continue to
look for creative ways to reduce test time and system
cost. Take, for example, a digitizer that has an FPGA
inline with an analog-to-digital converter. An engineer
can deploy functions to the FPGA such as filtering, peak
detection, fast Fourier transforms (FFTs), or custom
triggering. Not all data is created equal, but an FPGA-
based digitizer can make quick decisions on which
data is worthless and can be discarded and which data
has value. This can ultimately reduce measurement
time substantially. Test engineers in the military
and aerospace industry have been early adopters of
FPGA-based instrumentation through their synthetic
instrumentation initiatives, but this technology also has
potential for telecommunications, automotive, medical
device, and consumer electronics applications.
10. Software-Centric Ecosystems
The transition under way in mobile devices offers insight
into an important trend for test and measurement: the
power of a software-centric ecosystem. Early-model
mobile telephones were built to make calls first and later
send text messages, but the capabilities were almost
completely defined by the vendor. Once the software
on these devices was opened up to the user, capability
ranging from music players to cameras to email quickly
followed. But the effectiveness of the transition was
more than just an open software experience. Apple,
and later Google, built robust ecosystems around their
products and created a community of developers for
“apps” that accelerated usefulness.
The inherent openness and community concept for
mobile phones arguably could have been fostered
by mobile phone providers themselves, but in this
case it was Apple and Google that worked on software
environments first and deployed hardware second. By
exposing an appropriate level of customization to users
or third-party developers, they succeeded in changing the
way consumers view their mobile phones.
This same concept is making an impact on the test and
measurement industry. Communities of developers and
integrators, building on standard software platforms,
are using commercial off-the-shelf technology to extend
the functionality of complex hardware into applications
previously impossible. The level of productivity and
collaboration delivered by software-centric ecosystems
will have a profound effect on test system design over
the next three to five years.
Ecosystems Defined
In his book The Death of Competition: Leadership
and Strategy in the Age of Business Ecosystems,
James F. Moore defines a business ecosystem in the
following way: “An economic community supported
by a foundation of interacting organizations and
individuals—the organisms of the business world. The
economic community produces goods and services of
value to customers, who are themselves members of
the ecosystem. The member organisms also include
suppliers, lead producers, competitors, and other
stakeholders. Over time, they coevolve their capabilities
and roles, and tend to align themselves with the
directions set by one or more central companies.”
For test and measurement, cross-industry collaboration
is nothing new. Active industry groups such as the IVI
Foundation, PXI Systems Alliance, and LXI Consortium
have been bringing industry players together for
decades but often with key gaps as outlined in Moore’s
description. With active participation in these groups
now including software-specific, hardware-specific, and
joint hardware/software vendors, the focus on enabling
SOFTWARE-CENTRIC ECOSYSTEMS—2013
Editor’s Note: For the past several years, I’ve used the bagpipe tuners in the
iOS App Store to demonstrate the power of vibrant ecosystems. Like Apple,
NI has an ecosystem. It’s built on our open LabVIEW platform and clearly
defined APIs and hardware specifications. With ecosystems, users don’t
have to start from scratch unless they want to. Critical to the health and
productivity of an engineering platform, a vibrant ecosystem delivers an
order of magnitude more value faster than any test vendor’s R&D department
ever could. Understand the ecosystems surrounding your test systems and
embrace them.
11. interoperability for proprietary architectures and ease
of use for open architectures is fostering business
ecosystems.The most successful examples of current
ecosystems in this industry, though, are rooted in
software. LabVIEW is an example of application software
made more valuable through its ecosystem. Significant
numbers of engineers have been trained on LabVIEW and
developed add-ons suitable for private application needs
as well as others through commercial vehicles like the
LabVIEWTools Network. System integrators in the NI
Alliance Partner Network as well as LabVIEW Consultants
work to deploy this ecosystem. With every additional
supplier, producer, competitor, or other stakeholder, the
value of the software to each user grows.
Ecosystems in Open and Proprietary
Software/Hardware Architectures
A useful ecosystem standardizes the way we
communicate with instruments—Interchangeable Virtual
Instrument (IVI) drivers. By offering a common means
of communicating to similar instruments across multiple
vendors at the application programming interface level,
the IVI Foundation reduced the learning curve for users
and the development cycle for vendors.This allowed
third parties to create drivers, aggregation websites to
house them (like IDNet on ni.com), and abstraction layers
to be created on top. With well-architected hardware
abstraction layers, technology insertion for systems
designed to last decades became not only possible but
routine.The ecosystem fostered by standardization was
crucial in achieving this, and it continues to grow with the
ratification of native Microsoft .NET implementations for
IVI in the past few years. When programming FPGAs in
applications like inline signal processing or DUT control,
most test engineers require hardware and software from
a single vendor to achieve the abstraction necessary
to meet their skill levels. When these solutions are
delivered in the context of a software-centric business
ecosystem, the platform can retain as much user flexibility
as a disparate or interchangeable hardware/software
approach. For example, the FPGA programming capability
of the LabVIEW reconfigurable I/O (RIO) architecture can
incorporate third-party VHDL or Xilinx CORE Generator
IP inside the LabVIEW system design toolchain.The
LabVIEWTools Network helps users exchange sample
projects and compiled code to support different application
spaces among users and vendors in automated test.
This ecosystem opens the doors of FPGA programming
to nontraditional automated test spaces and offers the
IP necessary to be successful. Without a software-
centric ecosystem, many viable open platforms have
struggled.The xTCA platforms have seen adoption in
telecommunications and interest from the high-energy
physics community, but they have failed to develop
a strong ecosystem in automated test.The multiple
form factor, communication bus, and software options
presented by the platform have delayed or complicated
adoption by leading vendors. While efforts to rein in those
options and improve them for automated test are under
way in the AXIe Consortium, success or failure will be
dictated by the use of a software-centric ecosystem.
The Future of Ecosystems
in Automated Test
Over the next three to five years, automated test
systems will become more software-centric and
ecosystems will have more impact on the value users
derive from these platforms.The previous examples
of instrument communication and abstracted FPGA
programming are just the beginning for automated test
ecosystems. As software vendors take greater advantage
of their ecosystems and leverage commercialization
models for third-party IP, the scenario unfolding for mobile
devices will transform the test and measurement industry.
ni.com/ato 09
MARKETPLACE DEVELOPMENT TOOLS
Consultants
Value-Added Resellers
Add-On Providers
Software Platform
Customers
Technology Suppliers
Derived Standards
DEPLOYMENT PLATFORMS (HARDWARE)
As software platforms develop ecosystems that grow with each additional customer, supplier, add-on provider, and so on, they become more valuable
to each user. Software-centric ecosystems will make a large impact on the value that engineers derive from software-based test platforms.
12. Managed Test Systems
As Moore’s law continues to influence the performance
and complexity of test systems, the need for robust
system management capabilities is increasingly
apparent. Test managers responsible for maintaining
the uptime of a test system are looking for improved
management features in their test equipment. Simply
defined, manageability comprises the set of features that
support the ability to identify and supervise a computing
system. Borrowing from a rich heritage established in
the information technology (IT) industry, manageability
features enhance a test system’s ability to perform its
primary task (testing and measuring) by ensuring the
components of the system are up to date, healthy, and
meeting performance expectations.
In the same way that IT administrators rely on
manageability features to efficiently maintain client and
server computing assets in a corporate environment,
test engineers and operators will benefit from
manageability features when developing, deploying,
and supporting the operation of test systems.
Elements and Operating Modes
of Managed Test Systems
Managed test systems are composed of the system
infrastructure, peripherals, and hardware and software
elements that manage them, including management
consoles and APIs. For example, management console
software, such as NI Measurement & Automation
Explorer (MAX), can run directly on the test system
being managed or be executed remotely via a network
on a separate computer. In both cases, the management
console issues configuration, calibration, platform
monitoring, and deployment requests on behalf of the
test engineer or operator managing the system, and the
managed system fulfills those requests. In addition to
vendor-provided management consoles, users can define
their own or integrate manageability features directly
into test applications using APIs. With these standard
elements, manageability features can operate in two
distinct modes: in-band and out-of-band.
In-band management uses the primary computing
resources, including the system controller’s main CPU,
network interface, and operating system, to manage the
system. In addition to running the test application, the
system controller runs software to enable manageability
features, including management consoles and supporting
infrastructure. In this way, in-band management can
support a rich set of manageability features while the
system is operating in the “fully on” state. If the system
controller is powered off, unprovisioned, or not operating
normally because of a failure, out-of-band management
is required.
Out-of-band management can be particularly useful
for those diagnosing a system that has failed. While
rare today, more test equipment is incorporating these
MANAGED TEST SYSTEMS—2014
Editor’s Note: The media tends to focus on the consumer Internet of Things,
but thinking of a test system as an IoT device presents additional opportunities.
On the small scale, test organizations can optimize the performance of their
test hardware assets. On a larger scale, the insights from managed test
systems can improve yield, quality, productivity, uptime, and much more.
A great example is how large semiconductor manufacturers use real-time
data to optimize their processes, and this trend will only increase as test
systems become smarter than the devices they’re testing.
13. ni.com/ato 11
features by using dedicated computing resources,
including a secondary management processor, network
interface, and operating system, to manage the test
system independently of the system controller’s
computing resources. For example, if the system
controller is unable to boot normally because it
has experienced a hard drive failure, out-of-band
management can be used to remotely power the
system on and execute diagnostics on the hard drive,
allowing for remote analysis to determine the cause of
the failure. Further, because out-of-band management
does not require the use of the system controller’s
computing resources, the system controller can remain
fully dedicated to executing the application. This is
particularly important for applications that are sensitive
to disruptions in CPU or data bus usage, including real-
time and high-throughput measurements.
Trends in Managed Test Systems
As modular instrumentation platforms continue to
displace traditional box instruments, the need for asset
management capabilities is increasingly important.
Because modular test systems separate the system
into components (system controllers, chassis, and
instruments), the number of assets to be managed
naturally increases. By knowing which test assets
are being used and how they are being applied, test
managers can lower costs by maximizing the use of
available equipment. In a validation lab, for example, it
is critical that the location and operational state of all
assets are known so that components not actively being
used can be redeployed in other test systems. The same
applies to high-volume production test environments but
on a much larger scale.
Increasingly complex measurement devices are also
driving the need for comprehensive manageability
support, particularly in platform monitoring and control.
Modern modular instruments, especially RF instruments,
offer unprecedented measurement flexibility and speed
by taking full advantage of the power and cooling
capabilities of the modular platforms that support
them. Test system designers can maximize the long-
term reliability, usability, and measurement accuracy
of these systems by selecting platform elements that
use monitoring and control features. For example, by
monitoring the cooling requirements of the instruments
in a chassis, a chassis can optimize its fan speeds to
minimize acoustics. This is especially important in an
environment where noise must be minimized such
as a validation lab. Further, measurement accuracy is
optimized when an instrument is operating as close as
possible to its calibrated temperature. By monitoring
the temperature of an instrument, a chassis can
precisely control its fans so that the instrument can
maintain a steady temperature at or near its calibrated
value to ensure the integrity and repeatability of
the measurement.
Benefits of a Managed Test System
Test managers can significantly benefit from improved
manageability features, which lower the test system’s
integration risks by ensuring that issues can be
diagnosed and resolved efficiently, especially for large
and complex testers and testers in remote locations.
Additional benefits include minimizing a test system’s
“time to value” by ensuring that initial and subsequent
test station deployments can be managed in a fast and
repeatable manner. Finally, manageability features lower
the total cost of ownership of a test system by enabling
the ability to proactively monitor and diagnose problems
as well as convert unplanned outages into planned
outages. Just as manageability features helped drive
the transformation of the IT and telecom industries,
they will play an increasing role in test systems in the
years to come.
Configuration Calibration
System Monitoring Diagnostics
Logging/Alerting Software Deployment
LaptopManagement Console
Manageability Features
Test Systems
Tablet
PXI Instrumentation Rack
Manageability features
enhance a test system’s
ability to perform its
primary task by ensuring
the components of the
system are up to date,
healthy, and meeting
performance expectations.
14. Driven by Necessity
In the aerospace and defense industry, reducing release
cycles and preventing program delays have become
increasingly difficult. In automotive, consumer demands
are driving up test complexity and introducing new
costs in areas like infotainment. In response, test
managers must find affordable ways to incorporate RF
testing for wireless signals and machine vision testing
for assisted parking to meet the widening I/O spread
of test coverage.
Though industry regulations provide a guide to ensure
safety in embedded electronics, compliance with these
regulations requires the thorough testing of embedded
software across an exhaustive range of real-world
scenarios. Developing and testing embedded software
with an emphasis on quality can strain the balance of
business needs such as short time to market, low test
cost, and the ability to meet the technical requirements
driven by customer demand for new features and product
differentiation. All embedded system manufacturers face
similar demands, but they cannot sacrifice quality when
it comes to safety-critical applications. Organizations that
can evolve their development strategies to incorporate
advanced hardware-in-the-loop (HIL) testing can reduce
spending on quality-related problems, improve their
market perception, and, most importantly, ensure
customer safety.
HIL Test Helps Meet Safety
and Business Needs
Complying with safety standards requires an
understanding of all potential health risks and hazards as
well as the capability to rigorously test those scenarios.
HIL testing meets many of these growing test needs at
a lower cost and in a shorter time frame than physical
tests and field tests. With this method, companies
dynamically simulate real-world environments using
mathematical models to provide closed-loop feedback to
the controller being tested. HIL test becomes even more
valuable as the need to offload test time in the field or
the test cell intensifies with the addition of functionalities
to controllers and the increase in test cases. Hybrid
electric vehicle motor controllers are establishing
new levels of functionality by managing safe power
control between an internal combustion engine and
HIL test becomes even more valuable as
the need to offload test time in the field or
the test cell intensifies with the addition of
functionalities to controllers and the increase
in test cases.
DRIVEN BY NECESSITY—2015
Editor’s Note: If you’re in the automotive industry, you can’t use test
capabilities designed looking in the “rearview mirror.” As a test equipment
manufacturer and a Tesla owner, I’ve had a front-row seat to the promise
and challenge of autonomous vehicles, from the thrill of receiving new
features via over-the-air software updates to discussions with automotive
engineers on the challenges of meeting safety regulations. If you’re affected
by technology convergence, you’ll find the NI platform and ecosystem
uniquely capable of addressing these unsolved problems.
15. ni.com/ato 13
an electric motor. While designing Subaru’s first hybrid
electric vehicle, the Subaru XV Crosstrek, engineers at
Fuji Heavy Industries needed to deliver complete test
coverage of their innovative powertrain technology.
Subaru Uses FPGAs for
Greater Safety and Reliability
Testing the hybrid motor controller required advanced
test tools and new methodologies to provide high-quality
software within the engineers’ timeline. Subaru chose
to use FPGA technology to meet its high-performance
needs and verify a wide range of tests. For instance,
when the vehicle slipped on ice, the controller had to
recognize the loss of traction and provide the appropriate
response to the hybrid powertrain. Re-creating these
conditions on the proving grounds inconsistently
yielded accurate data, and traditional processors for
HIL could not accurately simulate the fidelity and speed
required of an electric motor model.
Using open and flexible FPGA modules, which
significantly reduced communication time by collocating
the processing node and I/O node, Subaru engineers
offloaded taxing calculations and performed HIL tests
on their system for corner cases such as traction loss
on ice to provide greater safety and reliability. With the
open architecture, they programmed their system to use
a high-fidelity JMAG-RT model and achieve the 1.2 μs
simulation rate required to accurately simulate the safety
handling of an electric motor. The ability to move more
field tests into the lab resulted in a 20X reduction in
test time, so the engineers did not have to compromise
innovative technology, shorter time to market, and lower
test cost to achieve high-quality software. Subaru’s HIL
testing platform provided cheaper, more comprehensive,
and faster testing than physical testing.
Scalable Test Platforms Offer
Affordability While Ensuring Safety
Embedded software design and test teams must
continue to find new ways to use this practice to
ensure quality and make consumer safety a priority
without sacrificing release schedules. HIL testing
is mostly entrusted to only a specific test team,
but developers have also been performing manual
stimulus testing known as knob-box testing for quick
functionality checks. This restricted form of testing
allows them to spoof the controller by manually
changing a limited number of channels. However,
many functionality defects are still found in the later
stages of HIL testing, or even in the field, which cost
developers more resolution time. With higher levels
of automation and easily repeatable test scenarios,
developers can discover more of these functionality
defects so that test engineers can focus on identifying
performance and integration-based defects. Full-
rack HIL test systems are not necessary for this
application. Instead organizations must build scalable
test platforms to provide an affordable solution across
varying capabilities.
As increasing embedded controller capability drives
further innovation, safety regulations will be honed to
ensure even greater user safety. To keep up with feature
demand while preserving the quality of the overall
system, test capabilities will need to grow accordingly.
Simply adding more test bandwidth will not scale with
overhead; test managers need to adopt advanced HIL
test technology and new techniques. This ensures that
as industry regulations help guide system engineering
teams toward higher levels of safety for more advanced
products, test platforms can still meet critical cost and
time requirements.
NEXT-GENERATION DEVELOPMENT
Embedded Software
Cost
Innovation
Quality
Traditional Test HIL Test
HIL solutions help drive down test costs without sacrificing the growing quality requirements inherent with new innovations.