The PinPoint system provides benchtop diagnostic testing of printed circuit boards. It offers fixtureless testing through multiple strategies like in-circuit, impedance signatures, and reverse engineering. PinPoint can rapidly diagnose faults down to the component level. It features various test methods like in-circuit, analog functional, and analog signature analysis. PinPoint integrates with functional test systems and has typical fault coverage including opens, shorts, voltage, and functional failures. It provides automated diagnostic programming to reduce time to identify issues.

1. PinPoint System
Technical Presentation

2. PinPoint System

3. PinPoint
 Leading PCB Benchtop Diagnostic solution
 Fixtureless testing
 Multiple test Strategies:
 In-Circuit
 Impedance Signatures
 Reverse Engineering
 Full Analog and Digital
 Provides rapid diagnostics to Component Level

4. Test Methods
 In-Circuit & Card-Edge Tests  Trace Tests between components
 Dynamic Digital Functional
 Automatic Program Generation
 Analog Functional
 IC Identifier for unknowns
 Analog Signature Analysis
 In-Circuit/Out of Circuit tests
 Hybrid Functional
 Reverse Engineering  Boundary Scan Integration
 Schematic Generation  PXI integration

5. Typical Fault Coverage
 Opens  Component tests include:
 Shorts  Memory
 Voltage  Processors
 Functional failures  Counters
 Leakage  Registers
 Cold Solder  Programmable
 Broken Trace  DTL, TTL, ECL, CMOS Etc
 Corrupt firmware  Analog
 Incorrect Component values  Many More….

6. Typical Test Process
FAULTY
TPS
GOOD
FAULTY
In-Circuit
FAULTY Test

7. Where PinPoint Fits
Two-Tiered Test Approach
LRU’s
SRU’s
EADS/Aerospatiale
ATEC Any Functional
Test Set
Air Force Navy Bombardier

8. Test Result Server &
ATML Interfaces
• Interfacing between any
functional test system and
PinPoint
• Uses open interface software
• ATML standard interface to
extract indictment lists and write
diagnostic results

9. US Air Force AWACS
Saving Programming Time
Typical TPS programming time.
GO/NOGO DIAGNOSTICS
12 Weeks 36 Weeks
Diagnostics programming with the PinPoint
GO/NOGO DIAGNOSTICS
12 Weeks 2 weeks

10. Automatic Fixtureless Test Methods
Providing Test, Consistency and Result Data
 Analog Functional  Dynamic Digital
 Network Signatures  Boundary Scan
TMS
TCK
TDI TDO

11. Device Test Interface
• Robust custom Interfaces
• Fatigue Life of over 1,000,000 cycles
• Ergonomic Handles for Even Weight Dist.
• Repairable should a pin fail
• Down to 0.4mm pin-pitch

12. DTI Package Range
SSOP TSOP TSSOP
TSOP1 QVSOP QFP
PQFP TQFP PGA
DIP ZIP PLCC

13. Programming
Simple In-Circuit Graphical Environments
TestVue™ - Software

14. TestFlow

15. Seawave & Debug

16. Reverse Engineering

17. In-Built Instrumentation
Interactive or Automatic Use with a Test Program
Functional Analogue
 DMM
 Dual Timer Counter
 Arbitrary Waveform Generators, 4 Max per Card
 Oscilloscope, 100MHz dual channel
 16 Single Ended / 8 Differential Analogue Inputs
 Avionics Reference Output, 400Hz 26V
Analogue Signature Analyser
 Fully Programmable
 Current Limit Protection

18. In-Built Instrumentation
 4 ½ Digit Digital Multi Meter
 100Mhz Dual Channel Oscilloscope
 Dual Channel Frequency / Timer Counter
 Arbitrary Waveform Generator 4 max per card
 16 Single Ended / 8 Differential Analog Inputs

19. Vectorless Test – V / I signatures
• Fully programmable Frequency Range 5Hz to 3Khz
(1 Hz Res)
• 256 Voltage / Current ranges
• Multiple Waveform types (Sine Square Triangle,
etc)
• Pulse Generator for Gate-Fired devices
• Current limit protection

20. Vectorless Test – Shorts Locator
• Interactive tool to determine the exact point
at which a short circuit has occurred
• Intuitive User Interface
• Audible and graphical display to guide the
user
• Specification summary:
– 500mV max o/c voltage
– 1A max s/c current
– 3 sense ranges (x1, x10, x100)
– User selectable audio frequency output

21. Vectorless Test – LCR Bridge
• Used to measure the values of Inductors,
Capacitors and Resistors
• Measures secondary characteristics
– D factor (Dissipation factor – capacitors)
– Q (characterises a resonators bandwidth)
– ESR (Equivalent Series Resistance)
• Series / Parallel equivalent circuits
• Kelvin measurement system
• Multiplexed to intenal rows A and D
Specification summary:
• Inductance 1uH to 1000H
• Capacitance 1pF to 1F
• Resistance 10mΩ to 100MΩ

22. Vectorless Test – PTU
Parametric Test Unit
• Four independent channels dedicated to precision DC voltage and current sources
• Provide functional testing of discrete components in and out of circuit:
• Programmable voltage and current on each channel
• Each channel can sink or source current or voltage
• Semiconductor junction forward voltage
• Output drive levels of devices or circuits
• Tri-state leakage current
• hFE of transistors
Specification summary
• + / - 10V
• + / - 20mA
• 2.5mV resolution
• 5uA resolution

23. Analog Programming
Graphical Instrument Strategizer
 Providing the ability to rapidly use
any external instrument that has a
VISATM software driver
 Eliminates the need to create
instrument specific software
drivers
 Automatic self-configuring of the
software
 Simple insertion of the VISATM
Driver into a directory

24. Analog Programming
‘C’ Function Editor
‘C’ Function Editor
 Providing the power of the ‘C’ programming language
 Easily included in the standard TestFlow structure using the drag-and-drop icon provided

25. Boundary Scan
TMS
TCK
TDI TDO
 Leading Boundary Scan System
 JTAG Compliant System
 Quick & easy to Use
 Tests BGA Components
 Tests complete boards
 Provides device status
 Pin Points Faults

26. Data Capture Pod
Capture
Input
Data Pass stimulus data to
PPII
Reset
or
Sync
Inputs driven
Program Generated
Outputs collected

27. Bed of Nails Option
Provides:
Interface for fixtures (VP G12)
Housing for multiplexer cards
Automatic testing of devices
Includes:
Bed of Nails Software

28. PinPoint Range
PCB Benchtop
Diagnostic
system
UDA Diagnostic
sub-system
Mixed Signal Functional Test
with In-circuit diagnostic
system.
Module and PCB

29. Diagnostic Sub-System
19” rack Diagnostic sub-
system
10U
 Integration with third-party functional test sets to
provide excellent and proven PCB component level
diagnostic capability
 Rugged versions for deployable applications
 Scaleable diagnostic capabilities through an industry
standard 19” rack mounting
 Runs under the proven TestVUETM suite

30. PinPoint UDA
PCB Diagnostics
Module Test To component and network
 Digital level
 Analog  Guided Probe
 Mixed Signal  Dynamic functional
 Analog Signatures
 Component Functionality
 Values of Passive devices

31. Keeping your electronics working