The document outlines the migration and conversion process from UNIX to Windows for Heron cards, detailing the history and features of various hardware models like the Agilent 3070 series and the Medalist series. It highlights the benefits of a Windows graphical user interface, improvements in reliability and performance through new components, and provides guidance on preparing for the transition, including changes to test procedures and handling common error messages. Technical specifications and examples of failure messages are included, along with resolutions for improved testing and performance optimization.

1. Migration From UX to
Windows
Heron Cards

2. Agenda
History
of 3070
Benefits of
Windows
Conversion
Process
What to
do
before?
Heron
Cards

3. History of 3070
HP 3060
HP 3065
HP 3070
HP 3070
Series II
Agilent
3070
Series 3
UNIX
WN-based
Agilent 3070
Medalist
i5000
1970 1980 1990 1999 2001 2002 Feb 2005 Feb 2007 2009 2013
Medalist
i3070
Series 5
Medalist
i3070
Series 5
In-line
HP announced the
Manufacturing Discontinue for
PA-RISC UNIX Workstation
Medalist
i3070

4. Benefits of Windows
Graphical User Interface
IPG Enhancements
Auto-Optimizer Interface
• Just by a click of a button
• The Optimizer can save from 10% to
50% of test time per test!

5. Benefits of Windows
Interactive Pin
Locator
Gone are the days when you
have to find the probe/pin
based on the BBRRCC!

6. What to do before?
Keep the board
File structure
Verify
Licenses
Change
Control
Cards
Verify
Program
Name
(brd &fix)
Change
Testorder
Verify
Autofile &
Names in
BD

8. codeword –l

10. Conversion Process
Start the
Conversion Tool

11. Interoperability

12. Package
Run IPG Test
Consultant

13. Package
Run IPG Test
Consultant

14. Package
Packaging

15. Extract
Selecting Extract

16. Extract
Running Agilent Test Consultant

17. Heron Cards
RELAYS DRIVER/ RECEIVER IC
OLD PART NUMBER 0490-2788 1822-2278
NEW PART NUMBER 0490-1839 1822-4415
Improve reliability performance
Replace Obsolete Part

18. Relays-Modification Comparison
Characteristic Current (MDSR7) New (RI-27)
Voltage 200 V 200 V
Current Switching 0.5A 0.5A
Power 10 W 10 W
Resistance 100 mOhm 115mOhm
Capacitance 0.3 pF 0.3 pF
Operating Temperature -40 °C to +125 °C -55°C to +125 °C
• similar specifications
• test data shows new relays are more reliable

19. Main Differences
Receiver pull-
up/pull-down
exhibits slower
transience.
Higher sensitivity
in the overvoltage
protection (OVP).
Difference in
“Tri-state”
characteristics

20. Receiver pull-up/pull-down exhibits slower
transience
Description:
The Heron pin card receiver exhibits slower transience than current pin card.
Resolution:
-Execute “Diagnose Fault, Verbose”
-Apply recommendations on Vector cycle or Receive delay, “rh / rl”, “dh / dl”, slew rate”, “pull up/pull down” and “noload”
Note: Similar to debug a test for
different ICs Vendor
0.5
0
1
1.5
2
3.5
3
2.5
Time
Current
pin card
Heron
pin card
2
0

21. Receiver pull-up/pull-down has slower transience
Examples of failure messages and resolutions:
u5pl HAS FAILED u118 HAS FAILED
15-8031-01 IC-LIN,ANALOG 15-9367-01 IC-LOGIC,,SI-GATE CMOS.5V
SW,NC7SB3157,SC TOL
vector = 5 vector = 4
user vector = 5 Status: 15H
source line = 202 Pass/Fail error on following pins:
source file = digital/u5pl BRRCC NODE PIN
Status: 15H 21176 JTAG_MAIN_TMS U118.7
Pass/Fail error on following pins: U118.16
BRRCC NODE PIN Sequencer halted
12233 PWR_GRN_SEL U5PL.1
vector cycle
receive
delay
Original
500n
400n
Changes
1u
800
n
vector cycle
receive
delay
Original
500n
400n
Changes
700n
560n
Modified test is backward compatible
Agilent
Restrict2
1

22. Higher sensitivity in the overvoltage protection
Upstream
IC
1
2
3
4
8
7
6
5
9 10
1 8
“1”
Resolution:
“Diagnose Fault, Verbose” is not helpful in
this case.
1)If end of Test:
a) If the failure is not on a disable
node,
i. Swap vectors or units where possible,
OR
ii. Add a vector to drive the failed input pins
to “1”, OR
b) If it is a disable node, add a vector to
drive “1”.
2) If in between Vectors:
Change the “Z” state to “1” after the
overdrive “0”.
DUT
2
3
4
7
6
5
9 10
Tester drives “0”

23. Higher sensitivity in the overvoltage protection
- Swap Vector or Units
u359 HAS FAILED
15-6424-01 IC-LOGIC,GTL2005,GTL
to LVTTL
vector
Status:
near 17
193H
Stopped on halt instruction
Sequencer halted due to fatal
Swap these 2 unit tests
End of test failure
Total number of vectors in test = 15
Swap vectors or units so that the failed input pins are not
being overdriven to “0” at the last vector of the test
Failure message VCL Example
 Test coverage does
not change
 Modified test is
backward compatible
error
Fatal error on module: 0
Overvoltage on following input
pins:
BRRCC
107165
NODE
AG_TDO_3V3_PCH0
PIN
U359.9
Sequencer halted
U359.9

24. Higher sensitivity in the overvoltage protection
- Add drive “1”
u359 HAS FAILED
15-6424-01 IC-LOGIC,GTL2005,GTL
to LVTTL
vector near 17
End of test failure .
Total number of vectors in test = 15
Add a vector to drive the failed input pins to “1” as
the last vector of the test
Failure message VCL Example
 Test coverage does
not change
 Modified test is
backward compatible
Status: 193H
Stopped on halt instruction
Sequencer halted due to fatal
error
Fatal error on module: 0
Overvoltage on following input
pins:
BRRCC NODE PIN
107165 AG_TDO_3V3_PCH0 U359.9
Sequencer halted
Add a unit test to drive “1”
Example:
unit “B0 to A0, Drive 1”
execute B0_1
end unit

25. Higher sensitivity in the overvoltage protection
- Add drive “1” for Disable nodes
..
assign DIS to nodes“PIT_RST-”
Failure message
End of test failure
Total number of vectors in test = 45
If the failure is on a disable node, add a vector to drive
the disable node to ”1” as the last vector of the test
VCL Example
 Test coverage does
not change
 Modified test is
backward compatible
..
..
vector Dis_Node_1
Set DIS to “1”
end vector
..
..
unit “DIS_Hi”
ExecuteDis_Node_1
end unit
Add
Last unit test

26. Higher sensitivity in the overvoltage protection
- Modify “Z” to “1”
In between vectors, for PCF,
1. Identify and locate failed pin in the “pcf order”.
2. Display vector graphics starting from failed vector (line 51).
3. Scroll forward or backward, identify vector when changes
from “0” to “Z”.
1. Modify “Z” to “1”
PCF ExampleFailure message
u41 HAS FAILED
1820-8864, Location H 9.4
 Test coverage does
not change
 Modified test is
backward compatible
Change “Z” to “1”
vector near 51
user vector near 51
source line near 201
source file = digital/u41
Status: 13H
Sequencer halted due to fatal
error
Fatal error on module: 2
Overvoltage on following input
pins:
PINBRRCC NODE
21050 SYNC_DRAM_STRB- U41.17

27. Difference in “Tri-State” Characteristic
Description:
“Z” characteristics is slightly different compared to current pin card.
Happened on UART tests only.
Resolution:
Execute “Diagnose Fault, Verbose”
If recommendations are to set the default states for all input pins in VCL source to
“K” with the command “assign”, then do not follow.
What we did was
In the “KEEP” vector only, change all the
input pins with “X” or “Z” state to “K”.
Do not change any output pins.

28. Difference in “Tri-State” Characteristic
– change “Z” to “K”
• Found only one UART IC failing with this symptom from all boards tested.
• This failure message is the same as in Case #1.
• Change all the input pins in KEEP vector from “X” or “Z” to “K”.
Failure message VCL Example
 Test coverage does
not change
 Modified test is
backward compatible
u10s HAS FAILED
15-9722-01 IC-
COMM,FIFO,ST16C2550,DUART,
vector = 1324
user vector = 1324
source line = 955
source file = digital/u10s
Status: 15H
Pass/Fail error on following
pins:
RRCC NODE PIN
12057 DUARTA_INT U10S.30
“X” is treated as “Z” by system.

29. ¡Gracias!