Desktop ATE for Data Converter
                       Characterization and Production Testing

Purpose
•Simplicity and efficiency for converter evaluation and low volume production test
•Combining advantage of ATE and bench-top instrument
•Fully coverage of performance, DC and timing parameters
•IEEE 1241, 1658 converter test standard compliance
•Industry open standard hardware interface and software programming environment
•Low initial capital investment with scalability to a 1152-pin SoC tester


Converter testing signal processor
                                                          •Support both ADC and DAC testing
                                                          •Enable test automation for converter testing using
                                                          bench-top instruments
                                                          •Customized signal filtering at up-to 4 frequencies for
                                                          superior dynamic test performance
                                                          •Signal combiner for IMD measurement
                                                          •Support ADC aperture jitter measurement
                                                          •Single-ended to differential transform
                                                          •Dual channel for I/Q converter testing
                                                          •Support accurate signal level calibration

Digital and Device Power Supply Unit
System Features

•5-slot AXIe expandable to 28 slots
•Cable or hard docking interface
•DUT power supplies
•32 General purpose Control Bit                                    •8 general purpose Bi-Directional PFI front
•General purpose I2C interface to DUT site                         panel triggers with programmable thresholds
•Internal 10MHz VCXO or external frequency                         •4 star distributed internal differential triggers
reference                                                          per slot

48-channel Dynamic Digital Subsystem
               Pattern Generator Features                          Timing & Formatting Features
               •32M Unrestricted (128M in High Speed               •100/200/400 Mvps data rates
               Mode) vector memory                                 •32 per pin flexible edge sets
               •3 unique 1G SCAN chains per board                  •32 period sets (10ns to 671mS periods)
               •128M digital sample source/capture                 •127 global timing sets on the fly
               memory parallel per channel                         •Window and strobe compare formats
               •Match mode, parallel and serial.                   •Flexible mixed-signal drive formats
               •Flexible micro-instructions supporting             •250ps standard timing accuracy
               nested loops and subroutines                        •50ps focused calibration timing accuracy
               •Flexible mixed signal triggering
               •8-channel granularity of most functions
                                                                   Per Pin PMU Features
               for test & cost efficiency
               Driver, Comparator & Load Features                  •Force Voltage, Measure Current
                                                                   •Force Current, Measure Voltage
               •3 level driver ( Vih, Vil, Vtt)                    •5 current ranges (2uA to 32mA)
               •-2v to +6.0v Range                                 •-2v to +6.0v Range
               •Active load up to 12mA source and sink             •Hardware measurement averaging &
               •Voltage clamps                                     histogram support
Polytope Solutions
        Your out-of-box solution partner



               12-channel Device Power Supply Source & Measurement Unit

                  Analog Functionality & Features

                  •16 bit Force Voltage resolution                    •Window Comparator per Channel
                  •Measure Voltage 16 Bit                             •250KHz w/ 1M AWG Source per channel
                  •Measure Current 16 Bit                             •250KHz w/ 1M PMU Memory per channel
                  •-12.0V to +12.0V Range                             •Multiple Triggering Capability
                  •0V to +22V Range                                   •Programmable Slew Rates
                  •6 Current Ranges (25uA to 1.2A)                    •Programmable load compensation
                  •Current Clamps and Alarms                          •User Analog Bus for channel connect flexibility
                  •Active guard per channel                           •Gate ON / OFF
                  •Full Kelvin Sense / Alarm per channel              •Built-in Ramp Function
                  •Channel Ganging                                    •Broadcast mode channel setup




Analog subsystem


 Extensive choice of analog/clock source

 •PXI or LXI/GPIB bench top instruments

 •Vast availability of vendor and large installation base

 •Fully integrated with NI virtual instrument driver

 •Wide range of performance selection

 •Flexibility of system configuration


Tester operating system

 Fully Integrated Test Development

 •Test programming development
 •Test result visualization
 •Debug link of test result and test program
 •Native multi-site support
 •Native multi-threading for shorter test time
 •Data converter test signal processing library


 Software compatibility

 •Microsoft Visual studio .NET
 •NI LabWindows/CVI




Polytope Solutions                         www.ConvertRule.com                         17 Orris St, Newton, MA 02466, U.S.A.
                                                            phone +1 617 462 6810 +86 150 1048 7717 email: fang.xu@ieee.org

Convertrule

  • 1.
    Desktop ATE forData Converter Characterization and Production Testing Purpose •Simplicity and efficiency for converter evaluation and low volume production test •Combining advantage of ATE and bench-top instrument •Fully coverage of performance, DC and timing parameters •IEEE 1241, 1658 converter test standard compliance •Industry open standard hardware interface and software programming environment •Low initial capital investment with scalability to a 1152-pin SoC tester Converter testing signal processor •Support both ADC and DAC testing •Enable test automation for converter testing using bench-top instruments •Customized signal filtering at up-to 4 frequencies for superior dynamic test performance •Signal combiner for IMD measurement •Support ADC aperture jitter measurement •Single-ended to differential transform •Dual channel for I/Q converter testing •Support accurate signal level calibration Digital and Device Power Supply Unit System Features •5-slot AXIe expandable to 28 slots •Cable or hard docking interface •DUT power supplies •32 General purpose Control Bit •8 general purpose Bi-Directional PFI front •General purpose I2C interface to DUT site panel triggers with programmable thresholds •Internal 10MHz VCXO or external frequency •4 star distributed internal differential triggers reference per slot 48-channel Dynamic Digital Subsystem Pattern Generator Features Timing & Formatting Features •32M Unrestricted (128M in High Speed •100/200/400 Mvps data rates Mode) vector memory •32 per pin flexible edge sets •3 unique 1G SCAN chains per board •32 period sets (10ns to 671mS periods) •128M digital sample source/capture •127 global timing sets on the fly memory parallel per channel •Window and strobe compare formats •Match mode, parallel and serial. •Flexible mixed-signal drive formats •Flexible micro-instructions supporting •250ps standard timing accuracy nested loops and subroutines •50ps focused calibration timing accuracy •Flexible mixed signal triggering •8-channel granularity of most functions Per Pin PMU Features for test & cost efficiency Driver, Comparator & Load Features •Force Voltage, Measure Current •Force Current, Measure Voltage •3 level driver ( Vih, Vil, Vtt) •5 current ranges (2uA to 32mA) •-2v to +6.0v Range •-2v to +6.0v Range •Active load up to 12mA source and sink •Hardware measurement averaging & •Voltage clamps histogram support
  • 2.
    Polytope Solutions Your out-of-box solution partner 12-channel Device Power Supply Source & Measurement Unit Analog Functionality & Features •16 bit Force Voltage resolution •Window Comparator per Channel •Measure Voltage 16 Bit •250KHz w/ 1M AWG Source per channel •Measure Current 16 Bit •250KHz w/ 1M PMU Memory per channel •-12.0V to +12.0V Range •Multiple Triggering Capability •0V to +22V Range •Programmable Slew Rates •6 Current Ranges (25uA to 1.2A) •Programmable load compensation •Current Clamps and Alarms •User Analog Bus for channel connect flexibility •Active guard per channel •Gate ON / OFF •Full Kelvin Sense / Alarm per channel •Built-in Ramp Function •Channel Ganging •Broadcast mode channel setup Analog subsystem Extensive choice of analog/clock source •PXI or LXI/GPIB bench top instruments •Vast availability of vendor and large installation base •Fully integrated with NI virtual instrument driver •Wide range of performance selection •Flexibility of system configuration Tester operating system Fully Integrated Test Development •Test programming development •Test result visualization •Debug link of test result and test program •Native multi-site support •Native multi-threading for shorter test time •Data converter test signal processing library Software compatibility •Microsoft Visual studio .NET •NI LabWindows/CVI Polytope Solutions www.ConvertRule.com 17 Orris St, Newton, MA 02466, U.S.A. phone +1 617 462 6810 +86 150 1048 7717 email: fang.xu@ieee.org