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Lithography
BY
GOTTMYERS MELWYN J
1766001
M.E MANUFACTURING
SREC
1
2
Overview of photolithography
(ctnd.)
 Lithography consists of patterning substrate by
employing the interaction of beams of photons
or
particles with materials.
 Photolithography is widely used in the integrated
circuits (ICs) manufacturing.
 The process of IC manufacturing consists of a
series of 10-20 steps or more, called mask
layers
where layers of materials coated with resists are
patterned then transferred onto the material
layer.
3
Overview of photolithography
(ctnd.)
 A photolithography system consists of a light
source, a mask, and a optical projection
system.
 Photoresists are radiation sensitive materials
that usually consist of a photo-sensitive
compound, a polymeric backbone, and a
solvent.
 􀂄 Resists can be classified upon their
solubility after exposure into: positive resists
(solubility of exposed area increases) and
negative resists (solubility of exposed area
decreases).
4
Lithography
 I. Basic lithography processes
 II. Types of lithography
5
6
7
Basic Photo-Lithography
Processes
 Resist Coating
 Surface preparation
 Spin coating
 Soft bake (pre-bake)
 Exposure
 Alignment
 Exposure
 Development
 Development
 Hard bake (post-bake)
 Stripping
 Pattern Transfer
 Etching
 Lift off/deposition
8
Substrate Cleaning
 Particularly troublesome grease, oil or wax stains
 2-5 min ultrasonic bath in trichloroethylene (TCE)
 or trichloroethane (TCA), 65-75ºC (carcinogenic)
 Standard grease removal
 2-5 min ultrasonic bath in acetone
 2-5 min ultrasonic bath in methanol
 2-5 min ultrasonic bath in D.I. H2O
 Repeat the first three steps 3 times
 30 sec rinse under free flowing D.I. H2O
 Oxide and other material removal
 5 min H2O:H2O2:NH3OH 4:1:1 70-80ºC (cleaning Ge)
 30 sec 50% HF (Glass or SiO2)
 D.I. H2O 3 rinses
 5 min H2O:H2O2:HCl 5:1:1 70-80ºC
 D.I. H2O 3 rinses
 Spin dry (wafer) / N2 blow dry
9
Spin Coating -A
10
11
Softbake
 Remove the resist solvent
 Convection Oven
90-100 ºC, 15-20 min
removal starts at surface
solvent trapping
 Conduction (hotplate)
75-85ºC, 40-60 sec
removal starts at bottom
uniform heating
12
13
14
15
Hardbake
 Stabilize the developed resist for subsequent
processes
 Can make removal very difficult
 Remove residual solvent
 Not necessary for lift-off
 Temperature/time can change the profile
16
17
18
19
20
21
22
ADVANTAGES
• Large field size
• Large amount of chips
• Capable of handling
complexity
• Volume manufacturing
23

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Photolithography

  • 2. 2
  • 3. Overview of photolithography (ctnd.)  Lithography consists of patterning substrate by employing the interaction of beams of photons or particles with materials.  Photolithography is widely used in the integrated circuits (ICs) manufacturing.  The process of IC manufacturing consists of a series of 10-20 steps or more, called mask layers where layers of materials coated with resists are patterned then transferred onto the material layer. 3
  • 4. Overview of photolithography (ctnd.)  A photolithography system consists of a light source, a mask, and a optical projection system.  Photoresists are radiation sensitive materials that usually consist of a photo-sensitive compound, a polymeric backbone, and a solvent.  􀂄 Resists can be classified upon their solubility after exposure into: positive resists (solubility of exposed area increases) and negative resists (solubility of exposed area decreases). 4
  • 5. Lithography  I. Basic lithography processes  II. Types of lithography 5
  • 6. 6
  • 7. 7
  • 8. Basic Photo-Lithography Processes  Resist Coating  Surface preparation  Spin coating  Soft bake (pre-bake)  Exposure  Alignment  Exposure  Development  Development  Hard bake (post-bake)  Stripping  Pattern Transfer  Etching  Lift off/deposition 8
  • 9. Substrate Cleaning  Particularly troublesome grease, oil or wax stains  2-5 min ultrasonic bath in trichloroethylene (TCE)  or trichloroethane (TCA), 65-75ºC (carcinogenic)  Standard grease removal  2-5 min ultrasonic bath in acetone  2-5 min ultrasonic bath in methanol  2-5 min ultrasonic bath in D.I. H2O  Repeat the first three steps 3 times  30 sec rinse under free flowing D.I. H2O  Oxide and other material removal  5 min H2O:H2O2:NH3OH 4:1:1 70-80ºC (cleaning Ge)  30 sec 50% HF (Glass or SiO2)  D.I. H2O 3 rinses  5 min H2O:H2O2:HCl 5:1:1 70-80ºC  D.I. H2O 3 rinses  Spin dry (wafer) / N2 blow dry 9
  • 11. 11
  • 12. Softbake  Remove the resist solvent  Convection Oven 90-100 ºC, 15-20 min removal starts at surface solvent trapping  Conduction (hotplate) 75-85ºC, 40-60 sec removal starts at bottom uniform heating 12
  • 13. 13
  • 14. 14
  • 15. 15
  • 16. Hardbake  Stabilize the developed resist for subsequent processes  Can make removal very difficult  Remove residual solvent  Not necessary for lift-off  Temperature/time can change the profile 16
  • 17. 17
  • 18. 18
  • 19. 19
  • 20. 20
  • 21. 21
  • 22. 22
  • 23. ADVANTAGES • Large field size • Large amount of chips • Capable of handling complexity • Volume manufacturing 23