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All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
1
Device Modeling Report
Bee Technologies Inc.
COMPONENTS: MOSFET (Professional Model)
PART NUMBER: TPCA8064-H
MANUFACTURER: TOSHIBA
REMARK: Body Diode (Professional Model)
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
2
MOSFET MODEL
PSpice model
parameter
Model description
LEVEL
L Channel Length
W Channel Width
KP Transconductance
RS Source Ohmic Resistance
RD Ohmic Drain Resistance
VTO Zero-bias Threshold Voltage
RDS Drain-Source Shunt Resistance
TOX Gate Oxide Thickness
CGSO Zero-bias Gate-Source Capacitance
CGDO Zero-bias Gate-Drain Capacitance
CBD Zero-bias Bulk-Drain Junction Capacitance
MJ Bulk Junction Grading Coefficient
PB Bulk Junction Potential
FC Bulk Junction Forward-bias Capacitance Coefficient
RG Gate Ohmic Resistance
IS Bulk Junction Saturation Current
N Bulk Junction Emission Coefficient
RB Bulk Series Resistance
PHI Surface Inversion Potential
GAMMA Body-effect Parameter
DELTA Width effect on Threshold Voltage
ETA Static Feedback on Threshold Voltage
THETA Mobility Modulation
KAPPA Saturation Field Factor
VMAX Maximum Drift Velocity of Carriers
XJ Metallurgical Junction Depth
UO Surface Mobility
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
3
Transconductance Characteristics
Circuit Simulation result
Comparison table
ID (A)
gfs (S)
%Error
Measurement Simulation
2 21.000 21.395 1.88
4 29.700 29.967 0.90
8 42.000 41.812 -0.45
16 58.500 58.031 -0.80
24 71.000 70.073 -1.31
32 81.500 79.965 -1.88
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
4
V_V1
0V 1.0V 2.0V 3.0V 4.0V 5.0V
I(V3)
0A
8A
16A
24A
32A
40A
V1
0Vdc
V2
10
0
V3
0
U1
TPCA8064-H
Vgs-Id Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
5
Comparison Graph
Simulation result
Comparison table
ID(A)
VGS (V)
%Error
Measurement Simulation
1 2.470 2.485 0.60
2 2.530 2.539 0.37
4 2.600 2.617 0.66
8 2.720 2.728 0.31
16 2.870 2.889 0.64
24 2.990 3.013 0.78
32 3.100 3.120 0.64
40 3.200 3.215 0.46
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
6
0
V3
0
VDS
0Vdc
V1
10
U1
TPCA8064-H
V_VDS
0V 20mV 40mV 60mV
I(V3)
0A
2A
4A
6A
8A
10A
Rds(on) Characteristics
Circuit Simulation result
Evaluation circuit
Test condition: ID=10 (A), VGS =10 (V)
Parameter Unit Measurement Simulation %Error
RDS(on) mΩ 5.800 5.800 0.00
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
7
Time*1mA
0 6n 12n 18n 24n 30n
V(W1:2)
0V
4V
8V
12V
VDD
24
I1
TD = 0
TF = 5n
PW = 600u
PER = 1000u
I1 = 0
I2 = 1m
TR = 5n
-
+
W1
ION = 0uA
IOFF = 1mA
W
I2
20
0
Dmod
D1
0
U1
TPCA8064-H
Gate Charge Characteristics
Circuit Simulation result
Evaluation circuit
Test condition: VDD=24 (V), ID=20 (A), VGS =10 (V)
Parameter Unit Measurement Simulation %Error
Qgs nc 5.100 5.102 0.05
Qgd nc 2.500 2.585 3.39
Qg nc 23.000 22.064 -4.07
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
8
Capacitance Characteristics
Simulation result
Comparison table
VDS(V)
Cbd (pF)
%Error
Measurement Simulation
0.1 860.000 859.000 -0.12
0.2 800.000 799.000 -0.13
0.5 675.000 675.400 0.06
1 555.000 556.800 0.32
2 440.000 435.900 -0.93
5 296.000 298.130 0.72
10 222.000 218.000 -1.80
20 160.000 157.738 -1.41
30 133.000 130.116 -2.17
Simulation
Measurement
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
9
Time
0.92us 0.96us 1.00us 1.04us 1.08us 1.12us
V(U1:4) V(U1:5)/1.505
0V
2V
4V
6V
8V
10V
12V
VDD
15.05Vdc
U1
TPCA8064-H
0
V2
TD = 1u
TF = 5n
PW = 10u
PER = 20u
V1 = 0
TR = 5n
V2 = 20
R2
4.7
R14.7L130nH
L2
50nH
RL
1.5
Switching Time Characteristics
Circuit Simulation result
Evaluation circuit
Test condition: ID=10 (A), VDD=15 (V), VGS=10/0 (V)
Parameter Unit Measurement Simulation %Error
ton ns 9.200 9.199 -0.01
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
10
V_V2
0V 0.4V 0.8V 1.2V 1.6V 2.0V
I(V3)
0A
10A
20A
30A
40A
50A
V2
2
V1
0
V3
0Vdc
U1
TPCA8064-H
Output Characteristics
Circuit Simulation result
Evaluation circuit
VGS=2.8V
V
3V
3.2V
3.4V
3.6V4V
4.5V
5V
6V
8V
10V
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
11
V_VDS
0V -0.2V -0.4V -0.6V -0.8V -1.0V
I(Vsense)
100mA
1.0A
10A
100A
VDS
0
U1
TPCA8064-H
Vsense
0Vdc
VGS
0Vdc
FWD Forward Current Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
12
Comparison Graph
Simulation result
Comparison table
IDR(A)
-VDS (V)
%Error
Measurement Simulation
0.1 0.6350 0.6338 -0.18
0.2 0.6550 0.6554 0.05
0.5 0.6830 0.6841 0.16
1 0.7050 0.7064 0.20
2 0.7300 0.7296 -0.06
5 0.7650 0.7633 -0.22
10 0.7950 0.7939 -0.14
20 0.8300 0.8331 0.38
40 0.8900 0.8879 -0.23
60 0.9300 0.9308 0.09
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
13
Time
0.88us 0.96us 1.04us 1.12us 1.20us 1.28us
I(R1)
-400mA
-300mA
-200mA
-100mA
-0mA
100mA
200mA
300mA
400mA
R1
50
0
U1
DTPCA8064-H_P
V1
TD = 30n
TF = 10n
PW = 1u
PER = 100u
V1 = -9.35
TR = 10n
V2 = 10.7
Reverse Recovery Characteristics
Circuit Simulation result
Evaluation circuit
Compare Measurement vs. Simulation
Parameter Unit Measurement Simulation %Error
trj ns 15.200 15.339 0.91
trb ns 27.200 27.125 -0.28
trr ns 42.400 42.464 0.15
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
14
Reverse Recovery Characteristics Reference
Trj = 15.20 (ns)
Trb = 27.20 (ns)
Conditions: Ifwd = lrev = 0.2(A), Rl = 50
Relation between trj and trb
Example
Measurement

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SPICE MODEL of TPCA8064-H (Professional+BDP Model) in SPICE PARK

  • 1. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 1 Device Modeling Report Bee Technologies Inc. COMPONENTS: MOSFET (Professional Model) PART NUMBER: TPCA8064-H MANUFACTURER: TOSHIBA REMARK: Body Diode (Professional Model)
  • 2. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 2 MOSFET MODEL PSpice model parameter Model description LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility
  • 3. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 3 Transconductance Characteristics Circuit Simulation result Comparison table ID (A) gfs (S) %Error Measurement Simulation 2 21.000 21.395 1.88 4 29.700 29.967 0.90 8 42.000 41.812 -0.45 16 58.500 58.031 -0.80 24 71.000 70.073 -1.31 32 81.500 79.965 -1.88
  • 4. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 4 V_V1 0V 1.0V 2.0V 3.0V 4.0V 5.0V I(V3) 0A 8A 16A 24A 32A 40A V1 0Vdc V2 10 0 V3 0 U1 TPCA8064-H Vgs-Id Characteristics Circuit Simulation result Evaluation circuit
  • 5. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 5 Comparison Graph Simulation result Comparison table ID(A) VGS (V) %Error Measurement Simulation 1 2.470 2.485 0.60 2 2.530 2.539 0.37 4 2.600 2.617 0.66 8 2.720 2.728 0.31 16 2.870 2.889 0.64 24 2.990 3.013 0.78 32 3.100 3.120 0.64 40 3.200 3.215 0.46
  • 6. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 6 0 V3 0 VDS 0Vdc V1 10 U1 TPCA8064-H V_VDS 0V 20mV 40mV 60mV I(V3) 0A 2A 4A 6A 8A 10A Rds(on) Characteristics Circuit Simulation result Evaluation circuit Test condition: ID=10 (A), VGS =10 (V) Parameter Unit Measurement Simulation %Error RDS(on) mΩ 5.800 5.800 0.00
  • 7. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 7 Time*1mA 0 6n 12n 18n 24n 30n V(W1:2) 0V 4V 8V 12V VDD 24 I1 TD = 0 TF = 5n PW = 600u PER = 1000u I1 = 0 I2 = 1m TR = 5n - + W1 ION = 0uA IOFF = 1mA W I2 20 0 Dmod D1 0 U1 TPCA8064-H Gate Charge Characteristics Circuit Simulation result Evaluation circuit Test condition: VDD=24 (V), ID=20 (A), VGS =10 (V) Parameter Unit Measurement Simulation %Error Qgs nc 5.100 5.102 0.05 Qgd nc 2.500 2.585 3.39 Qg nc 23.000 22.064 -4.07
  • 8. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 8 Capacitance Characteristics Simulation result Comparison table VDS(V) Cbd (pF) %Error Measurement Simulation 0.1 860.000 859.000 -0.12 0.2 800.000 799.000 -0.13 0.5 675.000 675.400 0.06 1 555.000 556.800 0.32 2 440.000 435.900 -0.93 5 296.000 298.130 0.72 10 222.000 218.000 -1.80 20 160.000 157.738 -1.41 30 133.000 130.116 -2.17 Simulation Measurement
  • 9. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 9 Time 0.92us 0.96us 1.00us 1.04us 1.08us 1.12us V(U1:4) V(U1:5)/1.505 0V 2V 4V 6V 8V 10V 12V VDD 15.05Vdc U1 TPCA8064-H 0 V2 TD = 1u TF = 5n PW = 10u PER = 20u V1 = 0 TR = 5n V2 = 20 R2 4.7 R14.7L130nH L2 50nH RL 1.5 Switching Time Characteristics Circuit Simulation result Evaluation circuit Test condition: ID=10 (A), VDD=15 (V), VGS=10/0 (V) Parameter Unit Measurement Simulation %Error ton ns 9.200 9.199 -0.01
  • 10. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 10 V_V2 0V 0.4V 0.8V 1.2V 1.6V 2.0V I(V3) 0A 10A 20A 30A 40A 50A V2 2 V1 0 V3 0Vdc U1 TPCA8064-H Output Characteristics Circuit Simulation result Evaluation circuit VGS=2.8V V 3V 3.2V 3.4V 3.6V4V 4.5V 5V 6V 8V 10V
  • 11. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 11 V_VDS 0V -0.2V -0.4V -0.6V -0.8V -1.0V I(Vsense) 100mA 1.0A 10A 100A VDS 0 U1 TPCA8064-H Vsense 0Vdc VGS 0Vdc FWD Forward Current Characteristics Circuit Simulation result Evaluation circuit
  • 12. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 12 Comparison Graph Simulation result Comparison table IDR(A) -VDS (V) %Error Measurement Simulation 0.1 0.6350 0.6338 -0.18 0.2 0.6550 0.6554 0.05 0.5 0.6830 0.6841 0.16 1 0.7050 0.7064 0.20 2 0.7300 0.7296 -0.06 5 0.7650 0.7633 -0.22 10 0.7950 0.7939 -0.14 20 0.8300 0.8331 0.38 40 0.8900 0.8879 -0.23 60 0.9300 0.9308 0.09
  • 13. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 13 Time 0.88us 0.96us 1.04us 1.12us 1.20us 1.28us I(R1) -400mA -300mA -200mA -100mA -0mA 100mA 200mA 300mA 400mA R1 50 0 U1 DTPCA8064-H_P V1 TD = 30n TF = 10n PW = 1u PER = 100u V1 = -9.35 TR = 10n V2 = 10.7 Reverse Recovery Characteristics Circuit Simulation result Evaluation circuit Compare Measurement vs. Simulation Parameter Unit Measurement Simulation %Error trj ns 15.200 15.339 0.91 trb ns 27.200 27.125 -0.28 trr ns 42.400 42.464 0.15
  • 14. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 14 Reverse Recovery Characteristics Reference Trj = 15.20 (ns) Trb = 27.20 (ns) Conditions: Ifwd = lrev = 0.2(A), Rl = 50 Relation between trj and trb Example Measurement