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All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
1
Device Modeling Report
Bee Technologies Inc.
COMPONENTS: Power MOSFET (Standard)
PART NUMBER: TPCA8108
MANUFACTURER: TOSHIBA
Body Diode (Standard) / ESD Protection Diode
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
2
U1
TPCA8108
1 2 3 4
5678
Circuit Configuration
MOSFET MODEL
PSpice model
parameter
Model description
LEVEL
L Channel Length
W Channel Width
KP Transconductance
RS Source Ohmic Resistance
RD Ohmic Drain Resistance
VTO Zero-bias Threshold Voltage
RDS Drain-Source Shunt Resistance
TOX Gate Oxide Thickness
CGSO Zero-bias Gate-Source Capacitance
CGDO Zero-bias Gate-Drain Capacitance
CBD Zero-bias Bulk-Drain Junction Capacitance
MJ Bulk Junction Grading Coefficient
PB Bulk Junction Potential
FC Bulk Junction Forward-bias Capacitance Coefficient
RG Gate Ohmic Resistance
IS Bulk Junction Saturation Current
N Bulk Junction Emission Coefficient
RB Bulk Series Resistance
PHI Surface Inversion Potential
GAMMA Body-effect Parameter
DELTA Width effect on Threshold Voltage
ETA Static Feedback on Threshold Voltage
THETA Mobility Modulation
KAPPA Saturation Field Factor
VMAX Maximum Drift Velocity of Carriers
XJ Metallurgical Junction Depth
UO Surface Mobility
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
3
0
10
20
30
40
50
60
70
0 10 20 30 40
Gfs(S)
Drain Current ID (-A)
Measurement
Simulation
Transconductance Characteristics
Circuit Simulation Result
Comparison table
-Id(A)
gfs(S)
%Error
Measurement Simulation
5 23.000 22.869 -0.57
10 32.500 32.027 -1.46
20 45.000 44.675 -0.72
30 53.500 54.126 1.17
40 60.000 61.981 3.30
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
4
V1
0Vdc
V2
-10
0
V3
0Vdc
U1
TPCA8108
V_V1
0V -1.0V -2.0V -3.0V -4.0V -5.0V
I(V3)
0A
-20A
-40A
-60A
-80A
-100A
Vgs-Id Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
5
0
20
40
60
80
100
0.0 1.0 2.0 3.0 4.0 5.0
DrainCurrentID(-A)
Gate - Source Voltage VGS (-V)
Measurement
Simulation
Comparison Graph
Circuit Simulation Result
Simulation Result
-ID(A)
-VGS(V)
%Error
Measurement Simulation
2 3.100 3.071 -0.95
5 3.250 3.231 -0.59
10 3.400 3.413 0.38
20 3.600 3.673 2.03
40 3.950 4.048 2.47
60 4.250 4.340 2.12
80 4.550 4.590 0.87
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
6
0
U1
TPCA8108
V3
0Vdc
VDS
0Vdc
V1
-10
V_VDS
0V -40mV -80mV -120mV -160mV
I(V3)
0A
-5A
-10A
-15A
-20A
Rds(on) Characteristics
Circuit Simulation result
Evaluation circuit
Simulation Result
Condition: ID= -20A, VGS= -10V
Parameter Measurement Simulation %Error
RDS (on) mΩ 7.700 7.700 0.00
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
7
VDD
-32
I1TD = 0
TF = 5n
PW = 600u
PER = 1000u
I1 = 0
I2 = 1m
TR = 5n
-
+
W1
ION = 0uA
IOFF = 1mA
W
I2
40
0
D2
Dbreak
0
U1
TPCA8108
Time*1mA
0 40n 80n 120n 160n
V(W1:4)
0V
-4V
-8V
-12V
-16V
Gate Charge Characteristics
Circuit Simulation result
Evaluation circuit
Simulation Result
VDD=-32V, ID=-40A, VGS=-10V
Parameter Measurement Simulation %Error
Qgs nC 20.000 20.140 0.70
Qgd nC 32.000 32.406 1.27
Qg nC 100.000 77.033 -22.97
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
8
Capacitance Characteristics
Simulation Result
-VDS (V)
Cbd(pF)
%Error
Measurement Simulation
0.1 600.000 594.840 -0.86
0.2 570.000 569.640 -0.06
0.5 510.000 508.700 -0.25
1 440.000 438.000 -0.45
2 355.000 352.500 -0.70
5 240.000 240.700 0.29
10 170.000 171.250 0.74
20 120.000 118.660 -1.12
40 80.000 81.000 1.25
Simulation
Measurement
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
9
Time
0.90us 0.95us 1.00us 1.05us 1.10us
V(U1:4) V(U1:5)/2
0V
-2V
-4V
-6V
-8V
-10V
-12V
Switching Time Characteristics
Circuit Simulation result
Evaluation circuit
Simulation Result
Condition: VGS=0/-10V, ID= -20A, VDD= -20V
Parameter Measurement Simulation %Error
ton ns 26.000 25.888 -0.43
0
VDD
-20Vdc
V2
TD = 1u
TF = 5n
PW = 10u
PER = 1000u
V1 = 0
TR = 5n
V2 = 20
U1
TPCA8108
L2
50nH
R2
4.7
R1
4.7
L1
30nH
RL
1
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
10
V2
-5
V1
0
0
V3
0Vdc
U1
TPCA8108
V_V2
0V -1.0V -2.0V -3.0V -4.0V -5.0V
I(V3)
0A
-20A
-40A
-60A
-80A
-100A
Output Characteristics
Circuit Simulation result
Evaluation circuit
VGS= -3.5
-8
-4
-5
-4.5
-5.5-6
-10
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
11
VDS
U1
TPCA8108
0
Vsense
0Vdc
V_VDS
0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V
I(Vsense)
-1.0A
-1.0KA
BODY DIODE SPICE MODEL
Forward Current Characteristics
Circuit Simulation Result
Evaluation Circuit
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
12
1
10
100
1,000
0 0.2 0.4 0.6 0.8 1 1.2
DrainreversecurrentIDR(-A)
Drain - Source voltage VDS (V)
Measurement
Simulation
Comparison Graph
Circuit Simulation Result
Simulation Result
-IDR(A)
VDS (V)
%Error
Measurement Simulation
1 0.680 0.679 -0.19
2 0.700 0.701 0.10
5 0.735 0.738 0.35
10 0.775 0.774 -0.18
20 0.820 0.819 -0.18
50 0.900 0.901 0.13
100 1.000 1.000 -0.03
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
13
V1
TD = 60ns
TF = 10ns
PW = 1us
PER = 100us
V1 = -9.4v
TR = 10ns
V2 = 10.65v
R1
50
0
U1
TPCA8108
Time
0.7us 0.8us 0.9us 1.0us 1.1us 1.2us 1.3us 1.4us 1.5us 1.6us
I(R1)
-400mA
-300mA
-200mA
-100mA
-0mA
100mA
200mA
300mA
400mA
Reverse Recovery Characteristics
Circuit Simulation Result
Evaluation Circuit
Compare Measurement vs. Simulation
Parameter Measurement Simulation %Error
trj ns 28.000 27.977 -0.08
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
14
Reverse Recovery Characteristics Reference
Trj= 28.0(ns)
Trb= 104.0 (ns)
Conditions: Ifwd=lrev=0.2(A),Rl=50
Relation between trj and trb
Example
Measurement
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
15
R1
0.001mV1
0Vdc
0
U1
TPCA8108
R2
100MEG
V_V1
0V -5V -10V -15V -20V -25V -30V -35V -40V -45V
I(R1)
0A
-2mA
-4mA
-6mA
-8mA
-10mA
ESD PROTECTION DIODE SPICE MODEL
Zener Voltage Characteristics
Circuit Simulation Result
Evaluation Circuit
All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
16
Zener Voltage Characteristics Reference

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SPICE MODEL of TPCA8108 (Standard+BDS Model) in SPICE PARK

  • 1. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 1 Device Modeling Report Bee Technologies Inc. COMPONENTS: Power MOSFET (Standard) PART NUMBER: TPCA8108 MANUFACTURER: TOSHIBA Body Diode (Standard) / ESD Protection Diode
  • 2. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 2 U1 TPCA8108 1 2 3 4 5678 Circuit Configuration MOSFET MODEL PSpice model parameter Model description LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility
  • 3. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 3 0 10 20 30 40 50 60 70 0 10 20 30 40 Gfs(S) Drain Current ID (-A) Measurement Simulation Transconductance Characteristics Circuit Simulation Result Comparison table -Id(A) gfs(S) %Error Measurement Simulation 5 23.000 22.869 -0.57 10 32.500 32.027 -1.46 20 45.000 44.675 -0.72 30 53.500 54.126 1.17 40 60.000 61.981 3.30
  • 4. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 4 V1 0Vdc V2 -10 0 V3 0Vdc U1 TPCA8108 V_V1 0V -1.0V -2.0V -3.0V -4.0V -5.0V I(V3) 0A -20A -40A -60A -80A -100A Vgs-Id Characteristics Circuit Simulation result Evaluation circuit
  • 5. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 5 0 20 40 60 80 100 0.0 1.0 2.0 3.0 4.0 5.0 DrainCurrentID(-A) Gate - Source Voltage VGS (-V) Measurement Simulation Comparison Graph Circuit Simulation Result Simulation Result -ID(A) -VGS(V) %Error Measurement Simulation 2 3.100 3.071 -0.95 5 3.250 3.231 -0.59 10 3.400 3.413 0.38 20 3.600 3.673 2.03 40 3.950 4.048 2.47 60 4.250 4.340 2.12 80 4.550 4.590 0.87
  • 6. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 6 0 U1 TPCA8108 V3 0Vdc VDS 0Vdc V1 -10 V_VDS 0V -40mV -80mV -120mV -160mV I(V3) 0A -5A -10A -15A -20A Rds(on) Characteristics Circuit Simulation result Evaluation circuit Simulation Result Condition: ID= -20A, VGS= -10V Parameter Measurement Simulation %Error RDS (on) mΩ 7.700 7.700 0.00
  • 7. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 7 VDD -32 I1TD = 0 TF = 5n PW = 600u PER = 1000u I1 = 0 I2 = 1m TR = 5n - + W1 ION = 0uA IOFF = 1mA W I2 40 0 D2 Dbreak 0 U1 TPCA8108 Time*1mA 0 40n 80n 120n 160n V(W1:4) 0V -4V -8V -12V -16V Gate Charge Characteristics Circuit Simulation result Evaluation circuit Simulation Result VDD=-32V, ID=-40A, VGS=-10V Parameter Measurement Simulation %Error Qgs nC 20.000 20.140 0.70 Qgd nC 32.000 32.406 1.27 Qg nC 100.000 77.033 -22.97
  • 8. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 8 Capacitance Characteristics Simulation Result -VDS (V) Cbd(pF) %Error Measurement Simulation 0.1 600.000 594.840 -0.86 0.2 570.000 569.640 -0.06 0.5 510.000 508.700 -0.25 1 440.000 438.000 -0.45 2 355.000 352.500 -0.70 5 240.000 240.700 0.29 10 170.000 171.250 0.74 20 120.000 118.660 -1.12 40 80.000 81.000 1.25 Simulation Measurement
  • 9. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 9 Time 0.90us 0.95us 1.00us 1.05us 1.10us V(U1:4) V(U1:5)/2 0V -2V -4V -6V -8V -10V -12V Switching Time Characteristics Circuit Simulation result Evaluation circuit Simulation Result Condition: VGS=0/-10V, ID= -20A, VDD= -20V Parameter Measurement Simulation %Error ton ns 26.000 25.888 -0.43 0 VDD -20Vdc V2 TD = 1u TF = 5n PW = 10u PER = 1000u V1 = 0 TR = 5n V2 = 20 U1 TPCA8108 L2 50nH R2 4.7 R1 4.7 L1 30nH RL 1
  • 10. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 10 V2 -5 V1 0 0 V3 0Vdc U1 TPCA8108 V_V2 0V -1.0V -2.0V -3.0V -4.0V -5.0V I(V3) 0A -20A -40A -60A -80A -100A Output Characteristics Circuit Simulation result Evaluation circuit VGS= -3.5 -8 -4 -5 -4.5 -5.5-6 -10
  • 11. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 11 VDS U1 TPCA8108 0 Vsense 0Vdc V_VDS 0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V I(Vsense) -1.0A -1.0KA BODY DIODE SPICE MODEL Forward Current Characteristics Circuit Simulation Result Evaluation Circuit
  • 12. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 12 1 10 100 1,000 0 0.2 0.4 0.6 0.8 1 1.2 DrainreversecurrentIDR(-A) Drain - Source voltage VDS (V) Measurement Simulation Comparison Graph Circuit Simulation Result Simulation Result -IDR(A) VDS (V) %Error Measurement Simulation 1 0.680 0.679 -0.19 2 0.700 0.701 0.10 5 0.735 0.738 0.35 10 0.775 0.774 -0.18 20 0.820 0.819 -0.18 50 0.900 0.901 0.13 100 1.000 1.000 -0.03
  • 13. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 13 V1 TD = 60ns TF = 10ns PW = 1us PER = 100us V1 = -9.4v TR = 10ns V2 = 10.65v R1 50 0 U1 TPCA8108 Time 0.7us 0.8us 0.9us 1.0us 1.1us 1.2us 1.3us 1.4us 1.5us 1.6us I(R1) -400mA -300mA -200mA -100mA -0mA 100mA 200mA 300mA 400mA Reverse Recovery Characteristics Circuit Simulation Result Evaluation Circuit Compare Measurement vs. Simulation Parameter Measurement Simulation %Error trj ns 28.000 27.977 -0.08
  • 14. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 14 Reverse Recovery Characteristics Reference Trj= 28.0(ns) Trb= 104.0 (ns) Conditions: Ifwd=lrev=0.2(A),Rl=50 Relation between trj and trb Example Measurement
  • 15. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 15 R1 0.001mV1 0Vdc 0 U1 TPCA8108 R2 100MEG V_V1 0V -5V -10V -15V -20V -25V -30V -35V -40V -45V I(R1) 0A -2mA -4mA -6mA -8mA -10mA ESD PROTECTION DIODE SPICE MODEL Zener Voltage Characteristics Circuit Simulation Result Evaluation Circuit
  • 16. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 16 Zener Voltage Characteristics Reference