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Device Modeling Report



COMPONENTS: Power MOSFET (Model Parameter)
PART NUMBER: SSM3J113TU
MANUFACTURER: TOSHIBA
REMARK: P Channel Model
Body Diode (Parameter) / ESD Protection Diode




                 Bee Technologies Inc.



   All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
                                                                  1
Circuit Configuration




    SS M3J11 3TU


MOSFET MODEL
 PSpice model
                                           Model description
  parameter
   LEVEL
       L           Channel Length
      W            Channel Width
      KP           Transconductance
      RS           Source Ohmic Resistance
      RD           Ohmic Drain Resistance
     VTO           Zero-bias Threshold Voltage
     RDS           Drain-Source Shunt Resistance
     TOX           Gate Oxide Thickness
    CGSO           Zero-bias Gate-Source Capacitance
    CGDO           Zero-bias Gate-Drain Capacitance
     CBD           Zero-bias Bulk-Drain Junction Capacitance
      MJ           Bulk Junction Grading Coefficient
      PB           Bulk Junction Potential
      FC           Bulk Junction Forward-bias Capacitance Coefficient
     RG            Gate Ohmic Resistance
      IS           Bulk Junction Saturation Current
       N           Bulk Junction Emission Coefficient
      RB           Bulk Series Resistance
     PHI           Surface Inversion Potential
   GAMMA           Body-effect Parameter
   DELTA           Width effect on Threshold Voltage
     ETA           Static Feedback on Threshold Voltage
   THETA           Modility Modulation
   KAPPA           Saturation Field Factor
    VMAX           Maximum Drift Velocity of Carriers
      XJ           Metallurgical Junction Depth
     UO            Surface Mobility




             All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
                                                                            2
Transconductance Characteristic

Circuit Simulation Result

              4
                                                                           Measurement
                                                                           Simulation


              3
    gfs (S)




              2




              1




              0
                  0             0.2            0.4           0.6             0.8                1

                                          -ID : Drain Current (-A)
Comparison table


                                                 gfs
              ID(A)                                                            Error(%)
                                Measurement             Simulation
                      -0.01                 0.320                  0.327              2.188
                      -0.02                 0.470                  0.462             -1.702
                      -0.05                 0.725                  0.729              0.552
                       -0.1                 1.022                  1.028                0.538
                       -0.2                 1.453                  1.446             -0.482
                       -0.5                 2.280                  2.266             -0.614
                         -1                 3.233                  3.172             -1.881



                      All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
                                                                                                    3
Vgs-Id Characteristic

Circuit Simulation result

     -10A




    -10mA
            0V            -0.5V            -1.0V            -1.5V   -2.0V   -2.5V
                 I(V3)
                                                     V_V1
Evaluation circuit


                                      V3


                                             0V dc



                              U1                               V2
                              SS M3J11 3TU

                                                              -10

                     V1


                    -3




                             0




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
                                                                                    4
Comparison Graph

Circuit Simulation Result

                                      10
                                                 Measurement
                                                 Simulation




                                       1
         - ID - Drain Current - A




                                     0.1




                                    0.01
                                           0       0.5          1          1.5         2          2.5
                                                      - VGS - Gate to Source Voltage - V

Simulation Result

                                                               VGS(V)
       ID(A)                                                                                      Error (%)
                                               Measurement                Simulation
                -0.01                                     -0.993                     -1.014             2.064
                -0.02                                     -1.040                     -1.039             -0.115
                -0.05                                     -1.112                     -1.089             -2.041
                                    -0.1                  -1.180                     -1.146             -2.847
                                    -0.2                  -1.260                     -1.227             -2.659
                                    -0.5                  -1.410                     -1.388             -1.546
                                      -1                  -1.580                     -1.572             -0.494



                                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
                                                                                                                 5
Rds(on) Characteristic

Circuit Simulation result

  -700mA



  -600mA



  -500mA



  -400mA



  -300mA



  -200mA



  -100mA



      0A
           0V             -20mV        -40mV              -60mV          -80mV     -100mV
                I(V2)
                                                 V_V3

Evaluation circuit

                                                 V2


                                                        0V dc


                                  U1
                                  SS M3J113 TU
                                                                    V3
                                                            0V dc


                     V1

                    -4




                                   0



Simulation Result

      ID=-0.65A, VGS=-4.0V                Measurement                    Simulation         Error (%)
            R DS (on) (m)                              129.000                  129.06          0.047


                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
                                                                                                         6
Gate Charge Characteristic
Circuit Simulation result

   -10V




    -8V




    -6V




    -4V




    -2V




     0V
          0                 2.0n                     4.0n             6.0n                   8.0n 9.0n
              V(W1:4)
                                                      Time*1mA

Evaluation circuit



                                                                 U1
                                                                 SS M3J113 TU
                                    W
                                         -
                                        +                                                   I2
                                                                                 D1
                                    W1                                          Db re ak   -1.3
                                  IOFF = 1mA
               I1   TD = 0        ION = 0
                    TF = 1n       RO FF = 1 e6
                    PW = 6 00u    RO N = 1.0                                                V1
                    PE R = 15 00u
                    I1 = 0
                    I2 = 1m                                                                -16
                    TR = 1 n



                                                 0


Simulation Result

     VDD=-16V,ID=-1.3A
                                             Measurement            Simulation                    Error (%)
        ,VGS=-10V
         Qgs(nC)                                       0.800                    0.803                  0.375
         Qgd(nC)                                       1.200                    1.197                 -0.250
          Qg(nC)                                       7.650                    5.993                -21.665

                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
                                                                                                               7
Capacitance Characteristic




                                                            Measurement
                                                            Simulation




Simulation Result


                                      Cbd(pF)
           VDS(V)                                                   Error(%)
                          Measurement          Simulation
                    0.5         125.000               125.500             0.400
                      1         103.000               102.800            -0.194
                      2          79.000                79.500             0.633
                      5          54.000                54.300             0.556
                     10          41.000                40.800            -0.488
                     20          30.000                30.000             0.000




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
                                                                                  8
Switching Time Characteristic

Circuit Simulation result


          -11V

          -10V

           -9V

           -8V

           -7V

           -6V

           -5V

           -4V

           -3V

           -2V

           -1V

            0V
            1.8us                           2.0us                              2.2us        2.3us
                V(U1:G)*4         V(U1:D)
                                                    Time

Evaluation circuit

                                                               L1         R3

                                                               30nH
                                                                          16


                                                           U1
                                                           SSM3J113TU
                            R4
                                     L2


                                    30nH                                       -10     V1
                            4.7
           V1 = 0      V2           R2
           V2 = -5
           TD = 2u                  4.7
           TR = 10n
           TF = 10n
           PW = 10u
           PER = 50u


                                                           0




Simulation Result

      ID=-0.65A, VDD=-10V
                                     Measurement               Simulation              Error(%)
           VGS=-2.5V
             ton(ns)                           33.000                   32.900                -0.303


                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
                                                                                                       9
Output Characteristic

Circuit Simulation result

   -3.0A
                  -10.0V
                        -4.0V
                                     -2.5V
   -2.5A

                                                                                    -2.0V

   -2.0A




   -1.5A                                                                             -1.8V



   -1.0A
                                                                                     -1.6V

   -0.5A
                                                                                VGS= -1.4V


      0A
           0V                    -0.5V                      -1.0V               -1.5V        -2.0V
                I(V3)
                                                                V_V2

Evaluation circuit

                                                   V3


                                                        0V dc


                                         U1
                                         SS M3J113 TU

                                                                           V2


                                                                       0
                       V1


                   0




                                         0




                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
                                                                                                     10
BODY DIODE SPICE MODEL
Forward Current Characteristic

Circuit Simulation Result

   -2.0A




   -1.5A




   -1.0A




   -0.5A




      0A
           0V                                   0.5V                          1.0V
                -I(R1)
                                                V_V1



Evaluation Circuit


                                       R1

                                       0.0 1m



                         V1
                0V dc                                      U1
                                                           SS M3J113 TU




                                            0




                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
                                                                                       11
Comparison Graph

Circuit Simulation Result

                                             2
                                                         Measurement
                                                         Simulation



                                     1.5
            - Drain reverse current IDR(A)




                                             1




                                     0.5




                                             0
                                                 0                         0.5                         1

                                                               Drain Source voltage VDS(V)


Simulation Result


                                                          VDS(V)                   VDS(V)
         -IDR(A)                                                                                       %Error
                                                        Measurement              Simulation
                                             0.050              0.560                    0.556              -0.732
                                             0.100              0.595                    0.598               0.504
                                             0.200              0.648                    0.647              -0.231
                                             0.250              0.667                    0.664              -0.495
                                             0.500              0.725                    0.721              -0.552
                                             1.000              0.795                    0.796               0.126
                                             1.500              0.850                    0.855               0.588
                                             2.000              0.910                    0.907              -0.385



                                             All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
                                                                                                                     12
Reverse Recovery Characteristic

Circuit Simulation Result

    400mA




    200mA




       0A




   -200mA




   -400mA
      19.88us         19.96us      20.04us           20.12us        20.20us   20.28us
           I(RL)
                                              Time

Evaluation Circuit

                                     RL


                                    50


             V1 = -9 .4     V1
             V2 = 10.6
             TD = 3 5n                                    U1
             TR = 1 0n                                    SS M3J113 TU
             TF = 10n
             PW = 2 0u
             PE R = 10 0u




                                          0



Compare Measurement vs. Simulation

                                 Measurement            Simulation            Error (%)
             Trj(ns)                    12.800               12.697               -0.805


                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
                                                                                           13
Reverse Recovery Characteristic                                        Reference




Trj=12.8(ns)
Trb=19.2(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
                                                                                   14
ESD PROTECTION DIODE SPICE MODEL
Zener Voltage Characteristic
Circuit Simulation Result

   10mA




    5mA




     0A
          0V      5V        10V      15V   20V       25V        30V        35V   40V   45V   50V
               I(R1)
                                                     V_V1


Evaluation Circuit




                                                 U1
                                                 SS M3J113 TU

                             R1
                                                                      R2

                            0.0 1m                                    1G
                       V1
               0V dc




                                                 0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
                                                                                                   15
Zener Voltage Characteristic                                         Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
                                                                                 16

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SPICE MODEL of SSM3J113TU (Standard+BDS Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Model Parameter) PART NUMBER: SSM3J113TU MANUFACTURER: TOSHIBA REMARK: P Channel Model Body Diode (Parameter) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2008 1
  • 2. Circuit Configuration SS M3J11 3TU MOSFET MODEL PSpice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Modility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2008 2
  • 3. Transconductance Characteristic Circuit Simulation Result 4 Measurement Simulation 3 gfs (S) 2 1 0 0 0.2 0.4 0.6 0.8 1 -ID : Drain Current (-A) Comparison table gfs ID(A) Error(%) Measurement Simulation -0.01 0.320 0.327 2.188 -0.02 0.470 0.462 -1.702 -0.05 0.725 0.729 0.552 -0.1 1.022 1.028 0.538 -0.2 1.453 1.446 -0.482 -0.5 2.280 2.266 -0.614 -1 3.233 3.172 -1.881 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008 3
  • 4. Vgs-Id Characteristic Circuit Simulation result -10A -10mA 0V -0.5V -1.0V -1.5V -2.0V -2.5V I(V3) V_V1 Evaluation circuit V3 0V dc U1 V2 SS M3J11 3TU -10 V1 -3 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008 4
  • 5. Comparison Graph Circuit Simulation Result 10 Measurement Simulation 1 - ID - Drain Current - A 0.1 0.01 0 0.5 1 1.5 2 2.5 - VGS - Gate to Source Voltage - V Simulation Result VGS(V) ID(A) Error (%) Measurement Simulation -0.01 -0.993 -1.014 2.064 -0.02 -1.040 -1.039 -0.115 -0.05 -1.112 -1.089 -2.041 -0.1 -1.180 -1.146 -2.847 -0.2 -1.260 -1.227 -2.659 -0.5 -1.410 -1.388 -1.546 -1 -1.580 -1.572 -0.494 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008 5
  • 6. Rds(on) Characteristic Circuit Simulation result -700mA -600mA -500mA -400mA -300mA -200mA -100mA 0A 0V -20mV -40mV -60mV -80mV -100mV I(V2) V_V3 Evaluation circuit V2 0V dc U1 SS M3J113 TU V3 0V dc V1 -4 0 Simulation Result ID=-0.65A, VGS=-4.0V Measurement Simulation Error (%) R DS (on) (m) 129.000 129.06 0.047 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008 6
  • 7. Gate Charge Characteristic Circuit Simulation result -10V -8V -6V -4V -2V 0V 0 2.0n 4.0n 6.0n 8.0n 9.0n V(W1:4) Time*1mA Evaluation circuit U1 SS M3J113 TU W - + I2 D1 W1 Db re ak -1.3 IOFF = 1mA I1 TD = 0 ION = 0 TF = 1n RO FF = 1 e6 PW = 6 00u RO N = 1.0 V1 PE R = 15 00u I1 = 0 I2 = 1m -16 TR = 1 n 0 Simulation Result VDD=-16V,ID=-1.3A Measurement Simulation Error (%) ,VGS=-10V Qgs(nC) 0.800 0.803 0.375 Qgd(nC) 1.200 1.197 -0.250 Qg(nC) 7.650 5.993 -21.665 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008 7
  • 8. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 0.5 125.000 125.500 0.400 1 103.000 102.800 -0.194 2 79.000 79.500 0.633 5 54.000 54.300 0.556 10 41.000 40.800 -0.488 20 30.000 30.000 0.000 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008 8
  • 9. Switching Time Characteristic Circuit Simulation result -11V -10V -9V -8V -7V -6V -5V -4V -3V -2V -1V 0V 1.8us 2.0us 2.2us 2.3us V(U1:G)*4 V(U1:D) Time Evaluation circuit L1 R3 30nH 16 U1 SSM3J113TU R4 L2 30nH -10 V1 4.7 V1 = 0 V2 R2 V2 = -5 TD = 2u 4.7 TR = 10n TF = 10n PW = 10u PER = 50u 0 Simulation Result ID=-0.65A, VDD=-10V Measurement Simulation Error(%) VGS=-2.5V ton(ns) 33.000 32.900 -0.303 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008 9
  • 10. Output Characteristic Circuit Simulation result -3.0A -10.0V -4.0V -2.5V -2.5A -2.0V -2.0A -1.5A -1.8V -1.0A -1.6V -0.5A VGS= -1.4V 0A 0V -0.5V -1.0V -1.5V -2.0V I(V3) V_V2 Evaluation circuit V3 0V dc U1 SS M3J113 TU V2 0 V1 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008 10
  • 11. BODY DIODE SPICE MODEL Forward Current Characteristic Circuit Simulation Result -2.0A -1.5A -1.0A -0.5A 0A 0V 0.5V 1.0V -I(R1) V_V1 Evaluation Circuit R1 0.0 1m V1 0V dc U1 SS M3J113 TU 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008 11
  • 12. Comparison Graph Circuit Simulation Result 2 Measurement Simulation 1.5 - Drain reverse current IDR(A) 1 0.5 0 0 0.5 1 Drain Source voltage VDS(V) Simulation Result VDS(V) VDS(V) -IDR(A) %Error Measurement Simulation 0.050 0.560 0.556 -0.732 0.100 0.595 0.598 0.504 0.200 0.648 0.647 -0.231 0.250 0.667 0.664 -0.495 0.500 0.725 0.721 -0.552 1.000 0.795 0.796 0.126 1.500 0.850 0.855 0.588 2.000 0.910 0.907 -0.385 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008 12
  • 13. Reverse Recovery Characteristic Circuit Simulation Result 400mA 200mA 0A -200mA -400mA 19.88us 19.96us 20.04us 20.12us 20.20us 20.28us I(RL) Time Evaluation Circuit RL 50 V1 = -9 .4 V1 V2 = 10.6 TD = 3 5n U1 TR = 1 0n SS M3J113 TU TF = 10n PW = 2 0u PE R = 10 0u 0 Compare Measurement vs. Simulation Measurement Simulation Error (%) Trj(ns) 12.800 12.697 -0.805 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008 13
  • 14. Reverse Recovery Characteristic Reference Trj=12.8(ns) Trb=19.2(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2008 14
  • 15. ESD PROTECTION DIODE SPICE MODEL Zener Voltage Characteristic Circuit Simulation Result 10mA 5mA 0A 0V 5V 10V 15V 20V 25V 30V 35V 40V 45V 50V I(R1) V_V1 Evaluation Circuit U1 SS M3J113 TU R1 R2 0.0 1m 1G V1 0V dc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008 15
  • 16. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2008 16