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Device Modeling Report



COMPONENTS: Power MOSFET (Model Parameters)
PART NUMBER: TPCF8104
MANUFACTURER: TOSHIBA
Body Diode (Model Parameters) / ESD Protection Diode




                   Bee Technologies Inc.


     All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Circuit Configuration




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
MOSFET MODEL

PSpice model
                                       Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
    RG         Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
     N         Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
  DELTA        Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Mobility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
    UO         Surface Mobility




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Transconductance Characteristic

Circuit Simulation Result

         15
         14
         13
         12
         11
         10
         9
   gfs




         8
         7
         6
         5
         4
         3
                                                                       Measurement
         2
                                                                       Simulation
         1
              0              1             2             3             4              5
                                      - ID - Drain Current - A

Comparison table


                                                gfs
                  - Id(A)                                                  Error(%)
                                 Measurement           Simulation
                       0.1                1.400                   1.429         2.071
                       0.2                2.300                   2.333         1.435
                       0.5                3.800                   3.846         1.211
                         1                6.100                   6.263         2.672
                         2                9.400                   9.524         1.319
                         5               13.500                  13.889         2.881




                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Vgs-Id Characteristic

Circuit Simulation result
   -10A




    -8A




    -6A




    -4A




    -2A




     0A
          0V             -1.0V         -2.0V            -3.0V     -4.0V      -5.0V
               I(V3)
                                                 V_V1

Evaluation circuit



                       U11
                                          V3



                                          0Vdc


                                                         V2


                 V1                                     -10
                       TPCF8104

                 0



                 0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result

                             5
                                                 Measurement
                                                 BeeTech


                             4
  - ID - Drain Current - A




                             3




                             2




                             1




                             0
                                 0.0               1.0           2.0            3.0           4.0           5.0
                                                         - VGS - Gate to Source Voltage - V

Simulation Result

                                                                   - VGS(V)
                                       - ID(A)                                                  Error (%)
                                                    Measurement               Simulation
                                           0.1                   1.800                1.848          2.667
                                           0.2                   1.900                1.902          0.105
                                           0.5                   1.950                1.984          1.744
                                             1                   2.050                 2.08          1.463
                                             2                   2.180                2.213          1.514
                                             5                   2.450                2.478          1.143




                                            All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Rds(on) Characteristic

Circuit Simulation result
   -3.5A



   -3.0A



   -2.5A



   -2.0A



   -1.5A



   -1.0A



   -0.5A



      0A
           0V                        -50mV            -100mV        -150mV      -200mV
                 I(V2)
                                                      V_VDS
Evaluation circuit

                               U11              V2




                                               0Vdc

                                                  0Vdc
                                                          VDS

                         VGS
                -10Vdc
                               TPCF8104




                         0



Simulation Result

      ID=-3A, VGS=-10V                       Measurement             Simulation          Error (%)
                 R DS (on)                            0.021            0.021                   0



                         All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Gate Charge Characteristic
Circuit Simulation result



   16V




   12V




    8V




    4V




    0V
         0                  10n                20n              30n                40n       50n
             -V(W1:4)
                                                     Time*1mA
Evaluation circuit



                                  ION = 0uA
                                  IOFF = 1mA
                                  W                                    D2      I2
                                       -
              I1 = 0                +                                          6
                            I1                                        Dbreak
              I2 = 1m             W1                      U11
              TD = 0                           TPCF8104
              TR = 10n                                                             V1
              TF = 10n
              PW = 600u
              PER = 1000u                                                          -24




                                           0



Simulation Result

             VDD=-24V,ID=-6A
                                               Measurement            Simulation             Error (%)
                ,VGS=-10V
                 Qgs(nC)                                   -4.700                   -4.680      -0.426
                 Qgd(nC)                                   -7.200                   -7.191      -0.125
                   Qg                                     -34.000                  -28.522     -16.112



                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Capacitance Characteristic


                                                     Measurement
                                                     Simulation




Simulation Result


                                     Cbd(pF)
           VDS(V)                                                 Error(%)
                          Measurement         Simulation
                    0.2          90.000               90.000            0.000
                    0.5          73.000               73.300            0.411
                      1          55.000               55.600            1.091
                      2          40.000               39.800           -0.500
                      5          20.000               20.000            0.000
                    10           10.000               10.300            3.000




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Switching Time Characteristic

Circuit Simulation result

  -14V



  -12V



  -10V



   -8V



   -6V



   -4V



   -2V



    0V
    1.98us  2.00us                        2.05us                        2.10us       2.13us
         V(L1:2)   V(L2:1)/1.5
                                             Time


Evaluation circuit

                                                                   L2            R2

                                                                                 5
                                                                   50nH

                                                                                              -15Vdc
                              RG   L1
         PER = 2000u                                                                          V1
         PW = 10u
         TF = 1n                   30nH
         TR = 1n            4.7                          U11
                                   R1         TPCF8104
         TD = 2u
         V2 = 20       V2          4.7

         V1 = 0



                                                               0



Simulation Result

         ID=-3A, VDD=-15V
                                         Measurement           Simulation                Error(%)
            VGS=-0/10V
              Ton(ns)                              12.000                  11.768               -1.933



                   All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Output Characteristic

Circuit Simulation result

 -10A
                           -3
                                                            -2.8

  -8A


                                                                   -2.7
                                                                                  -2.6
  -6A

                                                                                  -2.5


  -4A                                                                             -2.4


                                                                                  -2.3

  -2A                                                                             -2.2



                                                                           VGS=-2.1 V
   0A
        0V             -1.0V         -2.0V                -3.0V           -4.0V    -5.0V
             I(V3)
                                              V_V2




Evaluation circuit


                     U11
                                       V3



                                       0Vdc


                                                     V2

                V1
                                                 0
                     TPCF8104
                0




                0




                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
BODY DIODE SPICE MODEL

Forward Current Characteristic

Circuit Simulation Result
   100A




    10A




   1.0A
          0V                 0.4V       0.8V          1.2V         1.6V       2.0V
               I(R1)
                                               V_V1
Evaluation Circuit



                            R1
                            0.01m


                        V1
                0Vdc

                                                       U26
                                                       TPCF8104




                        0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result
                         100.00
                                                     Measurement
                                                     Simulation
    Drain reverse current IDR(A)




                                   10.00




                                    1.00
                                        0.00               0.40              0.80           1.20              1.60

                                                              Source-Drain voltage VSD(V)
Simulation Result

                                                                  - VSD(V)
                                           - IDR(A)                                                %Error
                                                          Measurement   Simulation
                                                      1              0.720             0.722           0.278
                                                      2              0.760             0.758          -0.263
                                                      5              0.820             0.825           0.610
                                                     10              0.900             0.896          -0.444
                                                     20              1.000             1.000           0.000




                                               All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic

Circuit Simulation Result
    400mA



    300mA



    200mA



    100mA



     -0mA



   -100mA



   -200mA



   -300mA



   -400mA
       1.00us             1.04us             1.08us          1.12us       1.16us   1.20us
            I(R1)
                                                      Time
Evaluation Circuit

                                   R1


                                        50




            V1 = -9.4v    V1
            V2 = 10.6v
            TD = 50n
            TR = 10ns                                          U27
            TF = 9ns                                           TPCF8104
            PW = 1us
            PER = 100us




                          0



Compare Measurement vs. Simulation

               Trr(ns)             Measurement                  Simulation         Error (%)
               Trj+Trb                    35.000                    35.044               0.126




                   All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic                                        Reference




Trj=6.000ns)
Trb=29.000(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
ESD PROTECTION DIODE SPICE MODEL

Zener Voltage Characteristic
Circuit Simulation Result

   10mA


    9mA


    8mA


    7mA


    6mA


    5mA


    4mA


    3mA


    2mA


    1mA


     0A
          0V      5V      10V         15V   20V   25V    30V      35V   40V   45V   50V
               I(R1)
                                                  V_V1
Evaluation Circuit

                                U26




                 0.01m     R1                            R2
                                TPCF8104
                                                         100MEG

                          V1
                  0Vdc



                          0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Zener Voltage Characteristic                                          Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

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SPICE MODEL of TPCF8104 (Standard+BDS Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Model Parameters) PART NUMBER: TPCF8104 MANUFACTURER: TOSHIBA Body Diode (Model Parameters) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 2. Circuit Configuration All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 3. MOSFET MODEL PSpice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 4. Transconductance Characteristic Circuit Simulation Result 15 14 13 12 11 10 9 gfs 8 7 6 5 4 3 Measurement 2 Simulation 1 0 1 2 3 4 5 - ID - Drain Current - A Comparison table gfs - Id(A) Error(%) Measurement Simulation 0.1 1.400 1.429 2.071 0.2 2.300 2.333 1.435 0.5 3.800 3.846 1.211 1 6.100 6.263 2.672 2 9.400 9.524 1.319 5 13.500 13.889 2.881 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 5. Vgs-Id Characteristic Circuit Simulation result -10A -8A -6A -4A -2A 0A 0V -1.0V -2.0V -3.0V -4.0V -5.0V I(V3) V_V1 Evaluation circuit U11 V3 0Vdc V2 V1 -10 TPCF8104 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 6. Comparison Graph Circuit Simulation Result 5 Measurement BeeTech 4 - ID - Drain Current - A 3 2 1 0 0.0 1.0 2.0 3.0 4.0 5.0 - VGS - Gate to Source Voltage - V Simulation Result - VGS(V) - ID(A) Error (%) Measurement Simulation 0.1 1.800 1.848 2.667 0.2 1.900 1.902 0.105 0.5 1.950 1.984 1.744 1 2.050 2.08 1.463 2 2.180 2.213 1.514 5 2.450 2.478 1.143 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 7. Rds(on) Characteristic Circuit Simulation result -3.5A -3.0A -2.5A -2.0A -1.5A -1.0A -0.5A 0A 0V -50mV -100mV -150mV -200mV I(V2) V_VDS Evaluation circuit U11 V2 0Vdc 0Vdc VDS VGS -10Vdc TPCF8104 0 Simulation Result ID=-3A, VGS=-10V Measurement Simulation Error (%) R DS (on) 0.021  0.021  0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 8. Gate Charge Characteristic Circuit Simulation result 16V 12V 8V 4V 0V 0 10n 20n 30n 40n 50n -V(W1:4) Time*1mA Evaluation circuit ION = 0uA IOFF = 1mA W D2 I2 - I1 = 0 + 6 I1 Dbreak I2 = 1m W1 U11 TD = 0 TPCF8104 TR = 10n V1 TF = 10n PW = 600u PER = 1000u -24 0 Simulation Result VDD=-24V,ID=-6A Measurement Simulation Error (%) ,VGS=-10V Qgs(nC) -4.700 -4.680 -0.426 Qgd(nC) -7.200 -7.191 -0.125 Qg -34.000 -28.522 -16.112 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 9. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 0.2 90.000 90.000 0.000 0.5 73.000 73.300 0.411 1 55.000 55.600 1.091 2 40.000 39.800 -0.500 5 20.000 20.000 0.000 10 10.000 10.300 3.000 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 10. Switching Time Characteristic Circuit Simulation result -14V -12V -10V -8V -6V -4V -2V 0V 1.98us 2.00us 2.05us 2.10us 2.13us V(L1:2) V(L2:1)/1.5 Time Evaluation circuit L2 R2 5 50nH -15Vdc RG L1 PER = 2000u V1 PW = 10u TF = 1n 30nH TR = 1n 4.7 U11 R1 TPCF8104 TD = 2u V2 = 20 V2 4.7 V1 = 0 0 Simulation Result ID=-3A, VDD=-15V Measurement Simulation Error(%) VGS=-0/10V Ton(ns) 12.000 11.768 -1.933 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 11. Output Characteristic Circuit Simulation result -10A -3 -2.8 -8A -2.7 -2.6 -6A -2.5 -4A -2.4 -2.3 -2A -2.2 VGS=-2.1 V 0A 0V -1.0V -2.0V -3.0V -4.0V -5.0V I(V3) V_V2 Evaluation circuit U11 V3 0Vdc V2 V1 0 TPCF8104 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 12. BODY DIODE SPICE MODEL Forward Current Characteristic Circuit Simulation Result 100A 10A 1.0A 0V 0.4V 0.8V 1.2V 1.6V 2.0V I(R1) V_V1 Evaluation Circuit R1 0.01m V1 0Vdc U26 TPCF8104 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 13. Comparison Graph Circuit Simulation Result 100.00 Measurement Simulation Drain reverse current IDR(A) 10.00 1.00 0.00 0.40 0.80 1.20 1.60 Source-Drain voltage VSD(V) Simulation Result - VSD(V) - IDR(A) %Error Measurement Simulation 1 0.720 0.722 0.278 2 0.760 0.758 -0.263 5 0.820 0.825 0.610 10 0.900 0.896 -0.444 20 1.000 1.000 0.000 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 14. Reverse Recovery Characteristic Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 1.00us 1.04us 1.08us 1.12us 1.16us 1.20us I(R1) Time Evaluation Circuit R1 50 V1 = -9.4v V1 V2 = 10.6v TD = 50n TR = 10ns U27 TF = 9ns TPCF8104 PW = 1us PER = 100us 0 Compare Measurement vs. Simulation Trr(ns) Measurement Simulation Error (%) Trj+Trb 35.000 35.044 0.126 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 15. Reverse Recovery Characteristic Reference Trj=6.000ns) Trb=29.000(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 16. ESD PROTECTION DIODE SPICE MODEL Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 5V 10V 15V 20V 25V 30V 35V 40V 45V 50V I(R1) V_V1 Evaluation Circuit U26 0.01m R1 R2 TPCF8104 100MEG V1 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 17. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2006