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Device Modeling Report



    COMPONENTS: MOSFET (Model Parameters)
    PART NUMBER: 2SK2963
    MANUFACTURER: TOSHIBA
    Body Diode (Model Parameters) / ESD Protection Diode




                          Bee Technologies Inc.

.

            All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
MOSFET MODEL PARAMETERS

PSpice model
                                       Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
    RG         Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
      N        Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
  DELTA        Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Mobility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
    UO         Surface Mobility




         All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Transconductance Characteristic

Circuit Simulation Result

                              10
                                                   Measurement
                                                   Simulation
    TRANSCONDUCTANCE Gfs(s)




                               1




                              0.1
                                    0.1         0.6             1.1        1.6           2.1      2.6
                                                                  DRIAN CURRENT ID (A)

Comparison table

                                                                       Gfs(S)
                                           Id(A)                                                   Error(%)
                                                       Measurement               Simulation
                                          0.1                     0.5001                 0.5000         -0.0240
                                          0.2                     0.6500                 0.6510         0.1538
                                          0.4                     0.9311                 0.9302         -0.0942
                                          0.8                     1.4056                 1.4109         0.3827
                                          1.2                     1.8333                 1.8440         0.5844
                                          1.6                     2.1900                 2.1891         -0.0434
                                          2                       2.5111                 2.5000         -0.4424




                                          All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Vgs-Id Characteristic

Circuit Simulation result

   2.0A

   1.8A

   1.6A

   1.4A

   1.2A

   1.0A

   0.8A

   0.6A

   0.4A

   0.2A

     0A
          0V          1.0V              2.0V           3.0V             4.0V   5.0V
               I(Vsense)
                                               V_VGS
Evaluation circuit

                                          Vsense


                                                              U1
                                                              2SK2963




                                                              VDS
                                                              10Vdc



               VGS




                                    0




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result

                                 2
                                                  Measurement
                                                  Simulation

                                1.6
         DRAIN CURRENT ID (A)




                                1.2



                                0.8



                                0.4



                                 0
                                      0       1           2            3         4          5
                                             GATE-SOURCE VOLTAGE VGS (V)

Simulation Result


                                                              VGS(V)
                                  ID(A)                                               Error (%)
                                              Measurement           Simulation
                                      0.1              2.2000              2.1980        -0.0909
                                      0.4              2.5200              2.5340         0.5556
                                      0.8              2.8000              2.8138         0.4929
                                      1.2              3.0000              3.0295         0.9833
                                      1.6              3.2000              3.2122         0.3813
                                      2                3.4000              3.4278         0.8176




                                  All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Rds(on) Characteristic

Circuit Simulation result

   500mA

   450mA

   400mA

   350mA

   300mA

   250mA

   200mA

   150mA

   100mA

    50mA

      0A
           0V     50mV 100mV         200mV           300mV             400mV   500mV
                I(Vsense)
                                             V_VDS

Evaluation circuit

                                           Vsense


                                                             U1
                                                             2SK2963




                                                              VDS

            VGS
            10Vdc




                                     0



Simulation Result

           ID=0.5A, VGS=10V           Measurement            Simulation        Error (%)
                    R DS (on)               0.500            0.5000              0.000




                    All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Gate Charge Characteristic
Circuit Simulation result

   16V


   14V


   12V


   10V


    8V


    6V


    4V


    2V


    0V
         0      1.0n             2.0n       3.0n     4.0n     5.0n       6.0n        7.0n 8.0n
             V(W1:3)
                                                   Time*1mA
Evaluation circuit

                                                                Vsense


                                                                                      U1
                                                                                      2SK2963


                                                                                       I1
                                                                             D1
                                                                            Dbreak    1Adc

                                  W1
                                     +

                                     -
             I2
                    TD = 0         W                                                  VD
                             ION = 0A                                                 80Vdc
                             IOFF = 1mA


                                                        0




Simulation Result

                  VDD=80V,
                                          Measurement         Simulation        Error (%)
                   ID=1A
                    Qgs                     0.9950 nC          0.9960 nC              0.1005
                    Qgd                     2.8000 nC          2.8010 nC              0.0357




                       All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Capacitance Characteristic



                                                       Measurement
                                                       Simulation




Simulation Result


                                     Cbd(pF)
           VDS(V)                                                 Error(%)
                        Measurement           Simulation
              1                 65.0000             64.9020          -0.1508
              2                 50.0000             50.2170           0.4340
              5                 35.0000             34.6660          -0.9543
             10                 26.0000             25.9100          -0.3462
             20                 19.0000             19.2520           1.3263
             50                 12.5000             12.9170           3.3360
             100                10.0000               9.6640         -3.3600




              All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Switching Time Characteristic

Circuit Simulation result

   12V
   11V
   10V
     9V
     8V
     7V
     6V
     5V
     4V
     3V
     2V
     1V
     0V
   -1V
   -2V
    0.85us 0.90us 0.95us 1.00us 1.05us                         1.10us 1.15us
         V(L3:1)  V(L2:2)/5
                              Time

Evaluation circuit

                                                              Vsense               RL
                                                                               3

                                                                                   50
                                                         U1 2SK2963
          V1 = 0

          V2 = 20           R2             L3   2
          TD = 1u                                                                         VD
                                         30nH
                                                                                            50Vdc
          TR = 10n     V1   50
                                   R1
          TF = 10n
                                    50
          PW = 10u

          PER = 10m

                                                         0



Simulation Result

            ID=1A,
          VDD= 80V,                 Measurement                 Simulation              Error(%)
          VGS=0/10V
           Td(on)                          13.000   ns                13.071   ns         0.5462




                      All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Output Characteristic

Circuit Simulation result

    1.0A
                5.0V
                                             4.0V             3.0V
                6.0V                                                           2.8V
    0.8A
                8.0V

                10V
    0.6A
                                                                              2.6V


    0.4A
                                                                              2.4 V


    0.2A
                                                         VGS= 2.0V            2.2V


      0A
           0V          0.4V                  0.8V             1.2V          1.6V      2.0V
                I(Vsense)
                                                    V_VDS
Evaluation circuit

                                                Vsense



                                                               U1 2SK2963



                                                               VDS




                VGS




                                         0




                      All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
BODY DIODE SPICE MODEL
Forward Current Characteristic

Circuit Simulation Result

     3.0A




     1.0A




   100mA




     40mA
     500mV                                                                   1.0V
               I(R1)
                                              V_V1


Evaluation Circuit

                               R1


                                0.01m           U1
                                                     2SK2963


                      V1
             0Vdc




                                 0




                    All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result

                                        10
                                                          Measurement
                                                          Simulation
       DRAIN REVERSE CURRENT IDR (A)




                                         1




                                        0.1




                                       0.01
                                              0.5                    0.7                      0.9
                                                             SOURCE-DRAIN VOLTAGE VSD (V)



Simulation Result

                                                                    VSD(V)
                                         IDR(A)                                                      %Error
                                                          Measurement    Simulation
                                              0.04              0.6700         0.6742                   0.6203
                                              0.05              0.6850         0.6844                  -0.0835
                                               0.1              0.7180         0.7209                   0.4040
                                               0.2              0.7700         0.7660                  -0.5182
                                               0.5              0.8400         0.8416                   0.1848
                                                1               0.9200         0.9196                  -0.0418




                                               All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Reverse Recovery Characteristic (Body Diode)

Circuit Simulation Result

     400mA




     200mA




         0A




    -200mA




    -400mA
        0.8us   1.0us                     1.2us       1.4us        1.6us 1.8us
            I(R1)
                                              Time

Evaluation Circuit

                                  R1 50


                                                          U1 2SK2963
               V1 = -9.3V

               V2 = 10.8V

               TD = 150n

               TR = 6ns     V1

               TF = 5.7ns

               PW = 1us

               PER = 50us

                                                  0




Compare Measurement vs. Simulation

                     Measurement                      Simulation            Error (%)
         trj                     86.000     ns             86.062      ns        0.0720




               All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Reverse Recovery Characteristic (Body Diode)                                 Reference




Trj= (86ns)
Trb= (64ns)
Conditions:Ifwd=0.2,lrev=0.2(A),Rl=50




                                                       Example




                                 Relation between trj and trb




              All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Zener Voltage Characteristic
Circuit Simulation Result

   10mA

    9mA

    8mA

    7mA

    6mA

    5mA

    4mA

    3mA

    2mA

    1mA

      0A
           0V     5V 10V 15V 20V 25V 30V 35V 40V 45V
                I(R1)
                                 V_V1
Evaluation Circuit


                                          U1 2SK2963


                         R1


                         0.01m

                                                            IOPEN
                                                             0Adc
                   V1
            0Vdc




                          0




                   All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
Zener Voltage Characteristic                                              Reference




           All Rights Reserved Copyright (C) Bee Technologies Inc. 2006

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SPICE MODEL of 2SK2963 (Standard+BDS Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: MOSFET (Model Parameters) PART NUMBER: 2SK2963 MANUFACTURER: TOSHIBA Body Diode (Model Parameters) / ESD Protection Diode Bee Technologies Inc. . All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 2. MOSFET MODEL PARAMETERS PSpice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 3. Transconductance Characteristic Circuit Simulation Result 10 Measurement Simulation TRANSCONDUCTANCE Gfs(s) 1 0.1 0.1 0.6 1.1 1.6 2.1 2.6 DRIAN CURRENT ID (A) Comparison table Gfs(S) Id(A) Error(%) Measurement Simulation 0.1 0.5001 0.5000 -0.0240 0.2 0.6500 0.6510 0.1538 0.4 0.9311 0.9302 -0.0942 0.8 1.4056 1.4109 0.3827 1.2 1.8333 1.8440 0.5844 1.6 2.1900 2.1891 -0.0434 2 2.5111 2.5000 -0.4424 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 4. Vgs-Id Characteristic Circuit Simulation result 2.0A 1.8A 1.6A 1.4A 1.2A 1.0A 0.8A 0.6A 0.4A 0.2A 0A 0V 1.0V 2.0V 3.0V 4.0V 5.0V I(Vsense) V_VGS Evaluation circuit Vsense U1 2SK2963 VDS 10Vdc VGS 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 5. Comparison Graph Circuit Simulation Result 2 Measurement Simulation 1.6 DRAIN CURRENT ID (A) 1.2 0.8 0.4 0 0 1 2 3 4 5 GATE-SOURCE VOLTAGE VGS (V) Simulation Result VGS(V) ID(A) Error (%) Measurement Simulation 0.1 2.2000 2.1980 -0.0909 0.4 2.5200 2.5340 0.5556 0.8 2.8000 2.8138 0.4929 1.2 3.0000 3.0295 0.9833 1.6 3.2000 3.2122 0.3813 2 3.4000 3.4278 0.8176 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 6. Rds(on) Characteristic Circuit Simulation result 500mA 450mA 400mA 350mA 300mA 250mA 200mA 150mA 100mA 50mA 0A 0V 50mV 100mV 200mV 300mV 400mV 500mV I(Vsense) V_VDS Evaluation circuit Vsense U1 2SK2963 VDS VGS 10Vdc 0 Simulation Result ID=0.5A, VGS=10V Measurement Simulation Error (%) R DS (on) 0.500  0.5000  0.000 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 7. Gate Charge Characteristic Circuit Simulation result 16V 14V 12V 10V 8V 6V 4V 2V 0V 0 1.0n 2.0n 3.0n 4.0n 5.0n 6.0n 7.0n 8.0n V(W1:3) Time*1mA Evaluation circuit Vsense U1 2SK2963 I1 D1 Dbreak 1Adc W1 + - I2 TD = 0 W VD ION = 0A 80Vdc IOFF = 1mA 0 Simulation Result VDD=80V, Measurement Simulation Error (%) ID=1A Qgs 0.9950 nC 0.9960 nC 0.1005 Qgd 2.8000 nC 2.8010 nC 0.0357 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 8. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 1 65.0000 64.9020 -0.1508 2 50.0000 50.2170 0.4340 5 35.0000 34.6660 -0.9543 10 26.0000 25.9100 -0.3462 20 19.0000 19.2520 1.3263 50 12.5000 12.9170 3.3360 100 10.0000 9.6640 -3.3600 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 9. Switching Time Characteristic Circuit Simulation result 12V 11V 10V 9V 8V 7V 6V 5V 4V 3V 2V 1V 0V -1V -2V 0.85us 0.90us 0.95us 1.00us 1.05us 1.10us 1.15us V(L3:1) V(L2:2)/5 Time Evaluation circuit Vsense RL 3 50 U1 2SK2963 V1 = 0 V2 = 20 R2 L3 2 TD = 1u VD 30nH 50Vdc TR = 10n V1 50 R1 TF = 10n 50 PW = 10u PER = 10m 0 Simulation Result ID=1A, VDD= 80V, Measurement Simulation Error(%) VGS=0/10V Td(on) 13.000 ns 13.071 ns 0.5462 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 10. Output Characteristic Circuit Simulation result 1.0A 5.0V 4.0V 3.0V 6.0V 2.8V 0.8A 8.0V 10V 0.6A 2.6V 0.4A 2.4 V 0.2A VGS= 2.0V 2.2V 0A 0V 0.4V 0.8V 1.2V 1.6V 2.0V I(Vsense) V_VDS Evaluation circuit Vsense U1 2SK2963 VDS VGS 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 11. BODY DIODE SPICE MODEL Forward Current Characteristic Circuit Simulation Result 3.0A 1.0A 100mA 40mA 500mV 1.0V I(R1) V_V1 Evaluation Circuit R1 0.01m U1 2SK2963 V1 0Vdc 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 12. Comparison Graph Circuit Simulation Result 10 Measurement Simulation DRAIN REVERSE CURRENT IDR (A) 1 0.1 0.01 0.5 0.7 0.9 SOURCE-DRAIN VOLTAGE VSD (V) Simulation Result VSD(V) IDR(A) %Error Measurement Simulation 0.04 0.6700 0.6742 0.6203 0.05 0.6850 0.6844 -0.0835 0.1 0.7180 0.7209 0.4040 0.2 0.7700 0.7660 -0.5182 0.5 0.8400 0.8416 0.1848 1 0.9200 0.9196 -0.0418 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 13. Reverse Recovery Characteristic (Body Diode) Circuit Simulation Result 400mA 200mA 0A -200mA -400mA 0.8us 1.0us 1.2us 1.4us 1.6us 1.8us I(R1) Time Evaluation Circuit R1 50 U1 2SK2963 V1 = -9.3V V2 = 10.8V TD = 150n TR = 6ns V1 TF = 5.7ns PW = 1us PER = 50us 0 Compare Measurement vs. Simulation Measurement Simulation Error (%) trj 86.000 ns 86.062 ns 0.0720 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 14. Reverse Recovery Characteristic (Body Diode) Reference Trj= (86ns) Trb= (64ns) Conditions:Ifwd=0.2,lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 15. Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 5V 10V 15V 20V 25V 30V 35V 40V 45V I(R1) V_V1 Evaluation Circuit U1 2SK2963 R1 0.01m IOPEN 0Adc V1 0Vdc 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2006
  • 16. Zener Voltage Characteristic Reference All Rights Reserved Copyright (C) Bee Technologies Inc. 2006