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Device Modeling Report



COMPONENTS: Power MOSFET (Professional)
PART NUMBER: SSM3J109TU
MANUFACTURER: TOSHIBA
Body Diode (Professional) / ESD Protection Diode




                  Bee Technologies Inc.




    All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Equivalent Circuit


                                                                       D




                                       S
                                   -   -
                                   +   +
                                                   R3
                                  S2               10MEG    DGD


                         R1      CGD
                          10M                          S1
                                                       +    +
                                                       -    -

                                                            S     M1
         G




                                                                       S




             All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
MOSFET MODEL

Pspice model
                                      Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
     RG        Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
      N        Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
   DELTA       Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Modility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
     UO        Surface Mobility




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Transconductance Characteristic

Circuit Simulation Result




Comparison table


                                             gfs
          Id(A)                                                            Error(%)
                           Measurement               Simulation
            -0.010                     0.342                    0.350            2.339
            -0.020                     0.487                    0.498            2.259
            -0.050                     0.776                    0.789            1.675
            -0.100                     1.100                    1.114            1.273
            -0.200                     1.551                    1.569            1.161
            -0.500                     2.437                    2.459            0.903
            -1.000                     3.428                    3.442            0.408
            -2.000                     4.782                    4.797            0.314



                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Vgs-Id Characteristic

Circuit Simulation result


               -10A




              -10mA
                      0V -0.2V   -0.6V    -1.0V          -1.4V    -1.8V   -2.2V
                         I(V3)
                                                  V_V1



Evaluation circuit


                                              V3


                                                    0Vdc

                                     U1
                                     SSM3J109TU

                                                                  V2


                                                                 -3

                           V1




                                     0




                All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Comparison Graph

Circuit Simulation Result




Simulation Result


                                      VGS(V)
       ID(mA)                                                           Error (%)
                      Measurement               Simulation
        -10.000                  -0.890                   -0.900                1.124
        -20.000                  -0.932                   -0.923               -0.966
        -50.000                  -1.001                   -0.969               -3.197
       -100.000                  -1.055                   -1.022               -3.128
       -200.000                  -1.130                   -1.096               -3.009
       -500.000                  -1.264                   -1.245               -1.503
      -1000.000                  -1.420                   -1.414               -0.423
      -2000.000                  -1.645                   -1.657                0.729


                All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Rds(on) Characteristic

Circuit Simulation result

             -1.0A




             -0.5A




                0A
                     0V                      -50mV                    -100mV
                          I(V3)
                                              V_V2




Evaluation circuit

                                              V3


                                              0Vdc


                                       U1
                                       SSM3J109TU       V2




                          V1


                          -4



                                      0



Simulation Result

       ID=-1A, VGS=-4V            Measurement           Simulation             Error (%)
        R DS (on) (m)                      91.000               91.155            0.170



                All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Gate Charge Characteristic
Circuit Simulation result

                -4.0V




                -3.0V




                -2.0V




                -1.0V




                     0V
                          0    -0.4n        -1.2n      -2.0n         -2.8n       -3.6n
                              V(W1:4)
                                                     Time*-1mA




Evaluation circuit




                                                               U1
                                                               SSM3J109TU
                                   ION = 0uA
                                   IOFF = 1mA
                                   W
                                        -
                                     +                                                     I2
                                                                                  D2       1
                                   W1                                             Dbreak
             I1 = 0           I1
             I2 = 1m
             TD = 0                                                                        V1
             TR = 10n
             TF = 10n
             PW = 600u                                                                     -15
             PER = 1000u


                                                               0




Simulation Result

       VDD=-15V,ID=-1A
                                        Measurement                Simulation            Error (%)
          ,VGS=-4V
                Qgs(nc)                             0.240                    0.241                0.417
               Qgd(nc)                              0.300                    0.296               -1.333
                 Qg(nc)                             1.280                    1.279               -0.078


                All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Gate Charge Characteristic                                         Reference




           All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Capacitance Characteristic



                                                            Measurement
                                                             Simulation




Simulation Result


                                      Cbd(pF)
           VDS(V)                                                   Error(%)
                        Measurement           Simulation
              0.100              44.000                43.800             -0.455
              0.200              40.000                40.460              1.150
              0.500              34.000                33.800             -0.588
              1.000              28.000                27.890             -0.393
              2.000              22.000                21.950             -0.227
              5.000              15.000                15.280              1.867
             10.000              11.500                11.430             -0.609
             20.000               8.500                 8.570              0.824




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Switching Time Characteristic

Circuit Simulation result

              -20V

              -18V

              -16V

              -14V

              -12V

              -10V

                -8V

                -6V

                -4V

                -2V

                 0V
                 1.90us      1.94us     1.98us               2.02us          2.06us   2.10us
                      V(L1:1)*4   V(R3:2)
                                                      Time



Evaluation circuit


                                                              L2             R3


                                                              30nH           10


                                                                U1
                                                                SSM3J109TU

                                R1          L1
                                                                                         VDD
              PER = 200u
              PW = 10u                      30nH                                         -10Vdc
              TF = 4n           4.7
              TR = 4n                  R2
              TD = 2u
              V2 = 5       V2          4.7
              V1 = 0




                                                               0




Simulation Result

        ID=-1A, VDD=-10V
                                      Measurement               Simulation              Error(%)
            VGS=-2.5V
             Ton(ns)                               20.000                19.949                   -0.255


                All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Output Characteristic

Circuit Simulation result

         -5.0A

                               -10V

                                                 -4V
         -4.0A                                                         -2.5V



         -3.0A
                                                                                  -1.8V



         -2.0A


                                                                                  -1.5V

         -1.0A


                                                                           VGS= -1.2V

             0A
                  0V           -0.2V     -0.4V            -0.6V           -0.8V      -1.0V
                       I(V3)
                                                  V_V2



Evaluation circuit

                                                 V3


                                                       0Vdc



                                          U1
                                          SSM3J109TU
                                                                  V2




                       V1


                       -1.2



                                          0




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Forward Current Characteristic

Circuit Simulation Result

             10A




            1.0A




           100mA




            10mA




           1.0mA
                   0V        0.2V      0.4V      0.6V      0.8V     1.0V    1.2V   1.4V
                        I(VD_Sense)
                                                       V_VDS


Evaluation Circuit


                                      VD_Sense


                                      0Vdc



                                                               U1
                        VDS                                    SSM3J109TU




                                                   0




               All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Comparison Graph

Circuit Simulation Result




Simulation Result


                           VDS(V)                     VDS(V)
       IDR(A)                                                              %Error
                         Measurement                Simulation
            0.001                 0.420                      0.411             -2.143
            0.002                 0.440                      0.435             -1.136
            0.005                 0.468                      0.467             -0.214
            0.010                 0.490                      0.492              0.408
            0.020                 0.510                      0.519              1.765
            0.050                 0.550                      0.561              2.000
            0.100                 0.590                      0.599              1.525
            0.200                 0.640                      0.644              0.625
            0.500                 0.715                      0.710             -0.699
            1.000                 0.775                      0.766             -1.161
            2.000                 0.840                      0.831             -1.071
            5.000                 0.945                      0.949              0.423



                All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Reverse Recovery Characteristic

Circuit Simulation Result

                  400mA




                  200mA




                     0A




               -200mA




               -400mA
                   0.98us       1.02us        1.06us             1.10us       1.14us    1.18us
                        I(R1)
                                                       Time



Evaluation Circuit


                                                       R1


                                                            50            U1
                                                                          DSSM3J109TU

                          V1 = -9.5v     V1
                          V2 = 10.6v
                          TD = 55n
                          TR = 6ns
                          TF = 6ns
                          PW = 1us
                          PER = 100us




                                                                              0



Compare Measurement vs. Simulation

                          Measurement                            Simulation               Error (%)
        Trj(ns)                    7.500                                 7.568                  0.907
        trb(ns)                    9.300                                 9.319                  0.204
        trr(ns)                   16.800                                16.887                  0.518


               All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Reverse Recovery Characteristic                                        Reference




Trj=7.500(ns)
Trb=9.300(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Zener Voltage Characteristic

Circuit Simulation Result

             0A


            1mA


            2mA


            3mA


            4mA


            5mA


            6mA


            7mA


            8mA


            9mA

           10mA
              50V       45V   40V   35V   30V           25V     20V   15V   10V   5V   0V
                     I(R1)
                                                        V_V1



Evaluation Circuit


                                              R1


                                              0.01m

                                                   U1



                      V1

                                    R2
                     0Vdc
                                    1G             SSM3J109TU




                                          0




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
Zener Voltage Characteristic                                         Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2008

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SPICE MODEL of SSM3J109TU (Professional+BDP Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Professional) PART NUMBER: SSM3J109TU MANUFACTURER: TOSHIBA Body Diode (Professional) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 2. Equivalent Circuit D S - - + + R3 S2 10MEG DGD R1 CGD 10M S1 + + - - S M1 G S All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 3. MOSFET MODEL Pspice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Modility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 4. Transconductance Characteristic Circuit Simulation Result Comparison table gfs Id(A) Error(%) Measurement Simulation -0.010 0.342 0.350 2.339 -0.020 0.487 0.498 2.259 -0.050 0.776 0.789 1.675 -0.100 1.100 1.114 1.273 -0.200 1.551 1.569 1.161 -0.500 2.437 2.459 0.903 -1.000 3.428 3.442 0.408 -2.000 4.782 4.797 0.314 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 5. Vgs-Id Characteristic Circuit Simulation result -10A -10mA 0V -0.2V -0.6V -1.0V -1.4V -1.8V -2.2V I(V3) V_V1 Evaluation circuit V3 0Vdc U1 SSM3J109TU V2 -3 V1 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 6. Comparison Graph Circuit Simulation Result Simulation Result VGS(V) ID(mA) Error (%) Measurement Simulation -10.000 -0.890 -0.900 1.124 -20.000 -0.932 -0.923 -0.966 -50.000 -1.001 -0.969 -3.197 -100.000 -1.055 -1.022 -3.128 -200.000 -1.130 -1.096 -3.009 -500.000 -1.264 -1.245 -1.503 -1000.000 -1.420 -1.414 -0.423 -2000.000 -1.645 -1.657 0.729 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 7. Rds(on) Characteristic Circuit Simulation result -1.0A -0.5A 0A 0V -50mV -100mV I(V3) V_V2 Evaluation circuit V3 0Vdc U1 SSM3J109TU V2 V1 -4 0 Simulation Result ID=-1A, VGS=-4V Measurement Simulation Error (%) R DS (on) (m) 91.000 91.155 0.170 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 8. Gate Charge Characteristic Circuit Simulation result -4.0V -3.0V -2.0V -1.0V 0V 0 -0.4n -1.2n -2.0n -2.8n -3.6n V(W1:4) Time*-1mA Evaluation circuit U1 SSM3J109TU ION = 0uA IOFF = 1mA W - + I2 D2 1 W1 Dbreak I1 = 0 I1 I2 = 1m TD = 0 V1 TR = 10n TF = 10n PW = 600u -15 PER = 1000u 0 Simulation Result VDD=-15V,ID=-1A Measurement Simulation Error (%) ,VGS=-4V Qgs(nc) 0.240 0.241 0.417 Qgd(nc) 0.300 0.296 -1.333 Qg(nc) 1.280 1.279 -0.078 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 9. Gate Charge Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 10. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 0.100 44.000 43.800 -0.455 0.200 40.000 40.460 1.150 0.500 34.000 33.800 -0.588 1.000 28.000 27.890 -0.393 2.000 22.000 21.950 -0.227 5.000 15.000 15.280 1.867 10.000 11.500 11.430 -0.609 20.000 8.500 8.570 0.824 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 11. Switching Time Characteristic Circuit Simulation result -20V -18V -16V -14V -12V -10V -8V -6V -4V -2V 0V 1.90us 1.94us 1.98us 2.02us 2.06us 2.10us V(L1:1)*4 V(R3:2) Time Evaluation circuit L2 R3 30nH 10 U1 SSM3J109TU R1 L1 VDD PER = 200u PW = 10u 30nH -10Vdc TF = 4n 4.7 TR = 4n R2 TD = 2u V2 = 5 V2 4.7 V1 = 0 0 Simulation Result ID=-1A, VDD=-10V Measurement Simulation Error(%) VGS=-2.5V Ton(ns) 20.000 19.949 -0.255 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 12. Output Characteristic Circuit Simulation result -5.0A -10V -4V -4.0A -2.5V -3.0A -1.8V -2.0A -1.5V -1.0A VGS= -1.2V 0A 0V -0.2V -0.4V -0.6V -0.8V -1.0V I(V3) V_V2 Evaluation circuit V3 0Vdc U1 SSM3J109TU V2 V1 -1.2 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 13. Forward Current Characteristic Circuit Simulation Result 10A 1.0A 100mA 10mA 1.0mA 0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V 1.4V I(VD_Sense) V_VDS Evaluation Circuit VD_Sense 0Vdc U1 VDS SSM3J109TU 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 14. Comparison Graph Circuit Simulation Result Simulation Result VDS(V) VDS(V) IDR(A) %Error Measurement Simulation 0.001 0.420 0.411 -2.143 0.002 0.440 0.435 -1.136 0.005 0.468 0.467 -0.214 0.010 0.490 0.492 0.408 0.020 0.510 0.519 1.765 0.050 0.550 0.561 2.000 0.100 0.590 0.599 1.525 0.200 0.640 0.644 0.625 0.500 0.715 0.710 -0.699 1.000 0.775 0.766 -1.161 2.000 0.840 0.831 -1.071 5.000 0.945 0.949 0.423 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 15. Reverse Recovery Characteristic Circuit Simulation Result 400mA 200mA 0A -200mA -400mA 0.98us 1.02us 1.06us 1.10us 1.14us 1.18us I(R1) Time Evaluation Circuit R1 50 U1 DSSM3J109TU V1 = -9.5v V1 V2 = 10.6v TD = 55n TR = 6ns TF = 6ns PW = 1us PER = 100us 0 Compare Measurement vs. Simulation Measurement Simulation Error (%) Trj(ns) 7.500 7.568 0.907 trb(ns) 9.300 9.319 0.204 trr(ns) 16.800 16.887 0.518 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 16. Reverse Recovery Characteristic Reference Trj=7.500(ns) Trb=9.300(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 17. Zener Voltage Characteristic Circuit Simulation Result 0A 1mA 2mA 3mA 4mA 5mA 6mA 7mA 8mA 9mA 10mA 50V 45V 40V 35V 30V 25V 20V 15V 10V 5V 0V I(R1) V_V1 Evaluation Circuit R1 0.01m U1 V1 R2 0Vdc 1G SSM3J109TU 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
  • 18. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2008